TY - JOUR A1 - Beck, Uwe A1 - Reiners, Georg A1 - Urban, Ingrid A1 - Jehn, H.A. A1 - Kopacz, U. A1 - Schack, H. T1 - Decorative hard coatings: new layer systems without allergy risk PY - 1993 SN - 0257-8972 VL - 61 SP - 215 EP - 222 PB - Elsevier Science CY - Lausanne AN - OPUS4-6957 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Beck, Uwe A1 - Reiners, Georg A1 - Lerche, D. A1 - Rietz, U. A1 - Niederwald, H. T1 - Quantitative adhesion testing of optical coatings by means of centrifuge technology N2 - Although adhesion testing of coatings is of fundamental interest for quality assurance, it is still a challenge regarding reliable quantitative results. Because of the huge variety of coating/ substrate systems in terms of materials and thickness range, adhesion tests display the same variety as coating/substrate systems. Some tests are qualitative, many are quantitative but except for the pull (DIN EN ISO 15870) and pull-off test (DIN EN ISO 4624) adhesion is not measured in terms of force per area. For optical coatings, the standardized tests according to ISO 9211-4 apply, i.e. abrasion tests (cheese cloth or eraser test) and adhesion tests (tape or cross-hatch test) with different degrees of severity. Instead of the adhesion strength, all these single-sample tests provide only quantitative information on the abrasion or adhesion resistance of a particular coating/ substrate system. The centrifuge test has manifold advantages. First, it can be easily run as multiple-sample test. Second, adhesion strength is measured in absolute numbers (N/mm2). Third, the centrifuge test requires only a one-sided sample support instead of a two-sided sample clamping as the pull- and pull-off test do. Fourth, it is much easier and faster than many other tests. Fifth, the centrifuge technology additionally enables tests under defined climates or harsh environments. Last but not least, versatile test conditions (alternating loads at various load rates) important to fatigue testing can be easily realized by varying the number of revolutions. The centrifuge test was applied to the testing of optical coatings on glass and CaF2. It could be shown that there are significant advantages compared to other tests. In particular, the centrifuge test was able to discriminate the adhesion strength for coating/substrate systems until failure which all passed the standardized tests of ISO 9211-4. KW - Adhesion strength KW - Bonding strength KW - Optical coatings KW - Pull-off test KW - Centrifuge test KW - Quantitative adhesion testing PY - 2011 DO - https://doi.org/10.1016/j.surfcoat.2011.02.016 SN - 0257-8972 VL - 205 IS - Supplement 2 SP - S182 EP - S186 PB - Elsevier Science CY - Lausanne AN - OPUS4-23285 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - RPRT A1 - Jacobs, R. A1 - Meneve, J. A1 - Dyson, G. A1 - Jennett, N. M. A1 - von Stebut, J. A1 - Feuchter, P. A1 - Cavalleri, A. A1 - Ronkainen, H. A1 - Beck, Uwe A1 - Reiners, Georg A1 - Ingelbrecht, C. D. T1 - SMT4-CT98-2238 - A certified reference material for the scratch test - REMAST - Final technical report PY - 2002 SP - 1 EP - 110 PB - Vito CY - Mol, Belgium AN - OPUS4-25601 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - RPRT A1 - Jacobs, R. A1 - Meneve, J. A1 - Dyson, G. A1 - Jennett, N. A1 - von Stebut, J. A1 - Feuchter, P. A1 - Cavaleiro, A. A1 - Ronkainen, H. A1 - Beck, Uwe A1 - Reiners, Georg A1 - Ingelbrecht, C. T1 - SMT4-CT98-2238 - A certified reference material for the scratch test - REMAST - Synthesis report PY - 2002 SP - 1 EP - 9 PB - Vito CY - Mol, Belgium AN - OPUS4-25625 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Arwin, H. A1 - Beck, Uwe A1 - Schubert, M. T1 - Papers presented at the 4th International Conference on Spectroscopic Ellipsometry (ICSE 4) - Preface T2 - 4th International Conference on Spectroscopic Ellipsometry (ICSE 4) CY - Stockholm, Sweden DA - 2007-06-11 PY - 2008 DO - https://doi.org/10.1002/pssc.200860016 SN - 1610-1634 SN - 1862-6351 SN - 1610-1642 VL - 5 IS - 5 SP - 1000 EP - 1002 PB - Wiley-VCH CY - Berlin AN - OPUS4-25433 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Jacobs, R. A1 - Meneve, J. A1 - Dyson, G. A1 - Teer, D. G. A1 - Jennett, N. M. A1 - Harris, P. A1 - von Stebut, J. A1 - Comte, C. A1 - Feuchter, P. A1 - Cavaleiro, A. A1 - Ronkainen, H. A1 - Holmberg, K. A1 - Beck, Uwe A1 - Reiners, Georg A1 - Ingelbrecht, C. D. T1 - A certified reference material for the scratch test N2 - Adhesion and other mechanical behaviour of coatings is at present routinely tested in industry and research organisations using the scratch test. The test has been the subject of a European Standard prEN 1071-3:2000 established by the European Standards Committee CEN TC184 WG5. A previous European project on the development and validation of test methods for thin hard coatings—FASTE—revealed that uncertainties in the Rockwell C stylus tip shape represent a major source of error for the scratch-test method. Therefore a follow-up project—REMAST—was started to develop and certify a reference material as a quality control tool for the testing and qualification of scratch-test instruments. In addition, a considerable effort was devoted to improve the scratch stylus manufacturing process. This paper presents the results of the REMAST project. During a feasibility study, two candidate materials—titanium nitride (TiN) and diamond-like carbon (DLC) coatings both on high speed steel substrates—were evaluated. Because of the lower sensitivity to styli tip shape variations and higher data scatter observed for the TiN coating, DLC was chosen as the reference material to be certified. One thousand samples were produced, as well as qualified styli to carry out the certification campaign, including homogeneity and stability testing. Nine independent laboratories were involved in the certification exercise, and the data were statistically analysed to obtain the certified critical load values and their uncertainty ranges. A certified reference material BCR-692 is available for verification purposes. This presents three repeatable failure events at certified critical load intervals and can provide a good indication of overall scratch-test instrument performance, including stylus condition and calibration. It is also useful as a diagnostic tool, providing a means of sensitive monitoring of machine and stylus performance over extended periods. Considerable improvement of the quality of scratch styli was achieved by the strict control of all manufacturing steps. KW - Adhesion KW - Scratch test KW - Certified reference material PY - 2003 DO - https://doi.org/10.1016/S0257-8972(03)00470-5 SN - 0257-8972 VL - 174-175 SP - 1008 EP - 1013 PB - Elsevier Science CY - Lausanne AN - OPUS4-25435 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Lange, Thorid A1 - Hidde, Gundula A1 - Beck, Uwe A1 - Naumann, F. A1 - Kärkkänen, I. A1 - Gargouri, H. T1 - Nanoskalige Haftvermittler zur Erhöhung der Haft- bzw. Klebfestigkeit unter Verwendung von ALD-Hybridprozessen N2 - Ziel des Projektes HARFE (Haftfestigkeit Reproduzierbarkeit Festigkeit) war es, eine Er-höhung der Haft- bzw. Klebfestigkeit auf Niedrigenergie-Polymeren (PE, PP, PTFE) zu erreichen. SENTECH realisierte dazu plasmachemische Oberflächenaktivierungen mit O2 und die Abscheidung von Aluminiumoxidschichten (Al2O3) mittels Atomic Layer Deposition (ALD), wobei die Ellipsometrie zum in-situ Monitoring der ALD-Prozesse diente. Die BAM charakterisierte die modifizierten Oberflächen bezüglich der Oberflächenenergie (OFE) und bestimmte die Verbund- bzw. Klebfestigkeit mittels der Zentrifugentechnologie T2 - 14. ThGOT Thementage Grenz- und Oberflächentechnik und 6. Kolloquium Dünne Schichten in der Optik CY - Zeulenroda, Germany DA - 12.03.2019 KW - Haftvermittler KW - ALD-Hybridprozesse KW - Klebfestigkeit KW - Atomic Layer Deposition KW - Al2O3-Schichten KW - Oberflächenenergie PY - 2019 SN - 978-3-00-062102-4 SP - 1 EP - 2 CY - Zeulenroda, Germany AN - OPUS4-47656 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Juds, Carmen A1 - Schmidt, J. A1 - Weller, Michael G. A1 - Lange, Thorid A1 - Beck, Uwe A1 - Conrad, T. A1 - Boerner, H. G. T1 - Combining phage display and next-generation sequencing for materials sciences: A case study on probing polypropylene surfaces N2 - Phage display biopanning with Illumina next-generation sequencing (NGS) is applied to reveal insights into peptide-based adhesion domains for polypropylene (PP). One biopanning round followed by NGS selects robust PP-binding peptides that are not evident by Sanger sequencing. NGS provides a significant statistical base that enables motif analysis, statistics on positional residue depletion/enrichment, and data analysis to suppress false-positive sequences from amplification bias. The selected sequences are employed as water-based primers for PP-metal adhesion to condition PP surfaces and increase adhesive strength by 100% relative to nonprimed PP. KW - Polymers KW - Polypropylene KW - Glue KW - Plastics KW - Surface Activation KW - Primer KW - Peptide Library KW - Epoxy KW - Solid-binding Peptides KW - Functionalization KW - Polymer-binding Peptides KW - Adhesion KW - Material-binding Peptides KW - Adhesives PY - 2020 DO - https://doi.org/10.1021/jacs.0c03482 SN - 0002-7863 SN - 1520-5126 VL - 142 IS - 24 SP - 10624 EP - 10628 PB - ACS CY - Washington, DC, USA AN - OPUS4-51123 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - RPRT A1 - Beck, Uwe A1 - Baier, Jennifa A1 - Dähne, L. A1 - Lerche, K.-H. T1 - Schlussbericht zum BMWi/MNPQ-Verbundprojekt: PLASMA-FIT (PLASMA-kompatible Partikel zur gepulsten in-situ Injektion von ex-situ hergestellten Partikeln für add-on Funktionen und zur Identifizierung in BeschichTungen) N2 - Im Fokus steht die Qualitätssicherung mit Blick auf Herstellung, Modifizierung, Handling und Erprobung von PLASMA-kompatiblen Partikeln zur gepulsten in-situ Injektion von ex-situ hergestellten Partikeln für add-on Funktionen in und zur Identifikationsprüfung von BeschichTungen (PLASMA-FIT). Im Kern war zunächst zu prüfen, welche Klassen ex-situ hergestellter Partikel unterschiedlichster Materialien überhaupt bzw. unter welchen Bedingungen PLASMA-fit sind oder unter welchen Randbedingungen PLASMA-fit gemacht werden können. In den dazugehörenden Projektphasen Screening und Adaption stand dabei das komplexe Beanspruchungsszenario bestehend aus Vakuum-, Temperatur- und wenigstens kurzzeitiger Plasmabeständigkeit der ex-situ bereitgestellten Partikel im Fokus. In der Projektphase Applikation sollte dann unter Verwendung einer modifizierten Plasmaquelle (BAM-Patentanmeldung, beabsichtigte Lizenznahme durch Fa. CemeCon, Optionsvertrag) hinsichtlich der Realisierbarkeit, Prüfung und Qualitätssicherung von Plasmadispersionsschichten ein erster Praxistest zur in-situ Injektion von Partikeln in einen laufenden Beschichtungsprozess, zur Realisierung funktioneller Eigenschaften z.B. zur Identifikation oder Authentifizierung von Originalteilen, vorgenommen werden KW - Plasma-kompatible Partikel KW - Plasma-Injektion KW - add-on Funktionen PY - 2015 N1 - Das Dokument unterliegt der Vertraulichkeit und kann nicht zugänglich gemacht werden - The document is subject to confidentiality restrictions and cannot be made accessible - Projektlaufzeit: 17.11.2010-16.02.2015 - Project runtime: 17.11.2010-16.02.2015 SP - 1 EP - 10 AN - OPUS4-48360 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Reiners, Georg A1 - Beck, Uwe A1 - Jehn, H.A. T1 - Decorative optical coatings KW - Nitrides KW - Optical properties KW - Physical vapour desposition KW - Structural properties PY - 1994 SN - 0040-6090 VL - 253 SP - 33 EP - 40 PB - Elsevier CY - Amsterdam AN - OPUS4-6956 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Beck, Uwe A1 - Reiners, Georg A1 - Kopacz, U. A1 - Jehn, H.A. T1 - Decorative hard coatings: interdependence of optical, stoichiometric and structural properties PY - 1993 SN - 0257-8972 VL - 60 SP - 389 EP - 395 PB - Elsevier Science CY - Lausanne AN - OPUS4-6959 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Duwe, M. A1 - Quast, J.-H. A1 - Schneider, S. A1 - Fischer, Daniel A1 - Beck, Uwe T1 - Thin-film metrology of tilted and curved surfaces by imaging Mueller-matrix ellipsometry N2 - For the vast majority of ellipsometric measurements, the application of planar substrates is mandatory and requires a proper sample alignment prior to the measurement. Here, the authors present a generalized approach of how to extract the isotropic ellipsometric sample parameters from an imaging Mueller-matrix measurement even if the sample is significantly misaligned. They validate the method by layer-thickness calculations based on imaging Mueller-matrix measurements of flat crystalline silicon samples that were misaligned on purpose. Furthermore, they also exploit this method’s capabilities to perform spatially resolved layer-thickness measurements of a single-layer indium-tin-oxide coating on a fused-silica microlens without the need of realignment or repositioning of the sample during the measurement. T2 - 8th International conference on spectroscopic ellipsometry (ICSE-8) CY - Barcelona, Spain DA - 26.05.2019 KW - Metrology KW - Thin films KW - Polarization spectroscopy KW - Spectroskopic Imaging KW - Mueller-Matrix imaging ellipsometry PY - 2019 DO - https://doi.org/10.1116/1.5122757 SN - 2166-2746 SN - 2327-9877 VL - 37 IS - 6 SP - 062908 PB - AIP CY - New York, NY AN - OPUS4-50209 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Fischer, Daniel A1 - Griepentrog, Michael A1 - Beck, Uwe A1 - Duwe, M. A1 - Quast, J.-H. A1 - Schneider, S. T1 - Effect of curvature of spherical microscopic indentations on the ellipsometric readout N2 - The authors describe and interpret curvature-related changes to the ellipsometric readout. As model system for a concave curvature, a set of three spherical microscopic indents in silicon (100) of different sizes was prepared by instrumented indentation testing using a spherical indenter. For reference, these samples were characterized by AFM to reveal the topography of each structure. The concavelike indents were analyzed by Mueller-Matrix imaging ellipsometry to extract lateral intensity images of 12 elements of the Mueller-Matrix. As a result of the detailed analysis of the image elements m22, m23, and m14, it was possible to correlate intensity changes and symmetry properties to depolarization and cross polarization induced by the edge threshold and the curved surface of the indent. KW - Spectroskopic Imaging KW - Mueller-Matrix imaging ellipsometry KW - Structural anomalies KW - Structural inhomogenities PY - 2019 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-498105 DO - https://doi.org/10.1116/1.5122252 VL - 37 IS - 6 SP - 062906-1 EP - 062906-5 PB - American Vacuum Society AN - OPUS4-49810 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -