TY - GEN A1 - Ahrendt, H. A1 - Gesatzke, Roger A1 - Hahn, G. A1 - Herrmann, P. A1 - Julien, H. A1 - Karger, R. A1 - Kaufmann, M. A1 - Krebs, H.-J. A1 - Lucht, J. A1 - Müller, A. A1 - Müller, R. A1 - Vetter, B. T1 - Überdruckmessgeräte nach DIN EN 837 - Auswahl und Anwendung KW - Druckmessgerät KW - Sicherheit PY - 2007 SN - 978-3-410-16626-9 IS - 1. Auflage SP - 1 EP - 89 PB - Beuth CY - Berlin AN - OPUS4-15994 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - RPRT A1 - Ebert, H.-P. A1 - Reichenauer, G. A1 - Brandt, R. A1 - Braxmeier, S. A1 - Bauer, T. A1 - Tamme, R. A1 - Langer, W. A1 - Hudler, B. A1 - Christ, M. A1 - Sextl, G. A1 - Müller, G. A1 - Helbig, U. A1 - Houbertz, R. A1 - Voigt, W. A1 - Schmidt, H. A1 - Zehl, T. A1 - Mach, Reinhard A1 - Maneck, Heinz-Eberhard A1 - Meyer-Plath, Asmus A1 - Oleszak, Franz A1 - Keuper, M. A1 - Reisert, M. A1 - Burkhardt, H. A1 - Günther, E. A1 - Mehling, H. T1 - Netzwerk zur Überwindung grundlegender Probleme bei der Entwicklung hocheffizienter Latentwärmespeicher auf Basis anorganischer Speichermaterialien KW - Latentwärmespeicher KW - Materialforschung KW - Plasmaverfahren KW - Graphit PY - 2008 SN - 978-3-00-024699-9 SP - 1 EP - 217 CY - Würzburg AN - OPUS4-18273 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Krumbholz, N. A1 - Jansen, A. A1 - Scheller, M. A1 - Müller-Wirts, T. A1 - Lübbecke, S. A1 - Holzwarth, R. A1 - Scheunemann, R. A1 - Wilk, R. A1 - Sartorius, B. A1 - Roehle, H. A1 - Stanze, D. A1 - Beckmann, Jörg A1 - von Chrzanowski, Lars A1 - Ewert, Uwe A1 - Koch, M. ED - Keith A. Krapels, ED - Neil A. Salmon, T1 - Handheld terahertz spectrometer for the detection of liquid explosives N2 - We present a handheld fiber-coupled terahertz spectrometer operating at a center wavelength of 1550 nm. The key elements are a fs-fiber laser, a fiber stretcher delay line and fiber-coupled antennas, which contain novel InAlAs-InGaAs multi layer chips. First experimental data obtained with this system demonstrates its great potential and robustness. In addition, we investigate different hazardous and harmless liquids in reflection geometry. These experiments show that liquids are in principle distinguishable by terahertz spectroscopy. Finally, first steps towards an algorithm that allows for an extraction of the liquids dielectric properties are discussed. The algorithm works for the analysis of reflection data even if the liquid is located inside a container. KW - Handheld terahertz spectrometer KW - Liquid explosives PY - 2009 DO - https://doi.org/10.1117/12.830381 SN - 0277-786X VL - 7485 SP - 748504-1 - 748504-12 AN - OPUS4-20268 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Faghani, A. A1 - Gholami, M. F. A1 - Trunk, M. A1 - Müller, J. A1 - Pachfule, P. A1 - Vogl, S. A1 - Donskyi, Ievgen A1 - Li, M. A1 - Nickl, Philip A1 - Shao, J. A1 - Huang, M. R. S. A1 - Unger, Wolfgang A1 - Arenal, R. A1 - Koch, C. T. A1 - Paulus, B. A1 - Rabe, J. P. A1 - Thomas, A. A1 - Haag, R. A1 - Adeli, M. T1 - Metal-Assisted and Solvent-Mediated Synthesis of Two-Dimensional Triazine Structures on Gram Scale N2 - Covalent triazine frameworks are an emerging material class that have shown promising performance for a range of applications. In this work, we report on a metal-assisted and solvent-mediated reaction between calcium carbide and cyanuric chloride, as cheap and commercially available precursors, to synthesize two-dimensional triazine structures (2DTSs). The reaction between the solvent, dimethylformamide, and cyanuric chloride was promoted by calcium carbide and resulted in dimethylamino-s-triazine intermediates, which in turn undergo nucleophilic substitutions. This reaction was directed into two dimensions by calcium ions derived from calcium carbide and induced the formation of 2DTSs. The role of calcium ions to direct the two-dimensionality of the final structure was simulated using DFT and further proven by synthesizing molecular intermediates. The water content of the reaction medium was found to be a crucial factor that affected the structure of the products dramatically. While 2DTSs were obtained under anhydrous conditions, a mixture of graphitic material/2DTSs or only graphitic material (GM) was obtained in aqueous solutions. Due to the straightforward and gram-scale synthesis of 2DTSs, as well as their photothermal and photodynamic properties, they are promising materials for a wide range of future applications, including bacteria and virus incapacitation. KW - XPS KW - Triazine KW - 2D PY - 2020 DO - https://doi.org/10.1021/jacs.0c02399 VL - 142 IS - 30 SP - 12976 EP - 12986 PB - ACS American Chemical Society AN - OPUS4-51203 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Abou-Ras, D. A1 - Caballero, R. A1 - Fischer, C.-H. A1 - Kaufmann, C.A. A1 - Lauermann, I. A1 - Mainz, R. A1 - Mönig, H. A1 - Schöpke, A. A1 - Stephan, C. A1 - Streeck, C. A1 - Schorr, S. A1 - Eicke, A. A1 - Döbeli, M. A1 - Gade, B. A1 - Hinrichs, J. A1 - Nunney, T. A1 - Dijkstra, H. A1 - Hoffmann, V. A1 - Klemm, D. A1 - Efimova, V. A1 - Bergmaier, A. A1 - Dollinger, G. A1 - Wirth, Thomas A1 - Unger, Wolfgang A1 - Rockett, A.A. A1 - Perez-Rodriguez, A. A1 - Alvarez-Garcia, J. A1 - Izquierdo-Roca, V. A1 - Schmid, T. A1 - Choi, P.-P. A1 - Müller, M. A1 - Bertram, F. A1 - Christen, J. A1 - Khatri, H. A1 - Collins, R.W. A1 - Marsillac, S. A1 - Kötschau, I. T1 - Comprehensive comparison of various techniques for the analysis of elemental distributions in thin films N2 - The present work shows results on elemental distribution analyses in Cu(In,Ga)Se2 thin films for solar cells performed by use of wavelength-dispersive and energy-dispersive X-ray spectrometry (EDX) in a scanning electron microscope, EDX in a transmission electron microscope, X-ray photoelectron, angle-dependent soft X-ray emission, secondary ion-mass (SIMS), time-of-flight SIMS, sputtered neutral mass, glow-discharge optical emission and glow-discharge mass, Auger electron, and Rutherford backscattering spectrometry, by use of scanning Auger electron microscopy, Raman depth profiling, and Raman mapping, as well as by use of elastic recoil detection analysis, grazing-incidence X-ray and electron backscatter diffraction, and grazing-incidence X-ray fluorescence analysis. The Cu(In,Ga)Se2 thin films used for the present comparison were produced during the same identical deposition run and exhibit thicknesses of about 2 µm. The analysis techniques were compared with respect to their spatial and depth resolutions, measuring speeds, availabilities, and detection limits. KW - Elemental distributions KW - Comparison KW - Depth profiling KW - Chemical mapping KW - Thin films KW - Solar cells KW - Chalcopyrite-type KW - Cu(In,Ga)Se2 PY - 2011 DO - https://doi.org/10.1017/S1431927611000523 SN - 1431-9276 SN - 1435-8115 VL - 17 IS - 5 SP - 728 EP - 751 PB - Cambridge University Press CY - New York, NY AN - OPUS4-24506 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Wipfler, B. A1 - Machida, R. A1 - Müller, Bernd R. A1 - Beutel, R.G. T1 - On the head morphology of Grylloblattodea (insecta) and the systematic position of the order, with a new nomenclature for the head muscles of Dicondylia N2 - External and internal head structures of adults of Galloisiana yuasai (Grylloblattodea) are described. The results are compared with conditions found in representatives of other lower neopteran lineages, notably in Austrophasma and Karoophasma (both Mantophasmatodea). Sutures and ridges of the head capsule are discussed. A new nomenclature for head muscles is presented for the entire Dicondylia (= Zygentoma + Pterygota). Galloisiana (like its sister taxon Grylloblatta) is mostly characterized by plesiomorphic features, such as the largely unspecialized orthopteroid mouthparts, the multisegmented filiform antennae, the presence of trabeculae tentorii, the absence of muscles associated with the antennal ampullae, the presence of musculus stipitalis transversalis (0mx11) and the presence of musculus tentoriofrontalis anterior (0te2). Autapomorphies of Grylloblattodea are: (i) compound eyes composed of only 60 ommatidia or less; (ii) a lacinia with a proximal tooth; (iii) a rounded submentum; (iv) loss of musculus craniohypopharyngealis (0hy3); and (v) loss of musculus labroepipharyngealis (0lb5). The phylogenetic evaluation of 104 characters of the head yields a branching pattern with Grylloblattodea as a sister group of Mantophasmatodea in clade Xenonomia. Putative synapomorphies of both taxa are: (i) a distinct angle (more than 60°) between the submentum and the mentum; (ii) posteriorly oriented labial palpi; (iii) a flat and lobe-like hypopharynx with a suspensorium far ventrad of the anatomical mouth opening; (iv) loss of musculus tentorioparaglossalis (0la6); and (v) a connection between the antennal ampulla and the supraoesophageal ganglion containing nuclei. Xenonomia is placed in a clade with the two dictyopteran terminals. Another monophyletic group is Embioptera + Phasmatodea. Most branches of the single tree obtained in our analysis are weakly supported. The results clearly show that more data and a much broader taxon sampling are required to clarify the phylogenetic interrelationships of the lower neopteran orders. However, our results narrow down the spectrum of possible solutions, and represent a starting point for future phylogenetic analyses, with an extensive concatenated dataset. KW - X-ray computed tomography KW - Grylloblattodea KW - Dicondylia PY - 2011 DO - https://doi.org/10.1111/j.1365-3113.2010.00556.x SN - 0307-6970 VL - 36 IS - 2 SP - 241 EP - 266 PB - Blackwell CY - Oxford [u.a.] AN - OPUS4-23190 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Rack, A. A1 - Riesemeier, Heinrich A1 - Zabler, S. A1 - Weitkamp, T. A1 - Müller, Bernd R. A1 - Weidemann, Gerd A1 - Modregger, P. A1 - Banhart, J. A1 - Helfen, L. A1 - Danilewsky, A.N. A1 - Gräber, H.G. A1 - Heldele, R. A1 - Mayzel, B. A1 - Goebbels, Jürgen A1 - Baumbach, T. ED - Stuart R. Stock, T1 - The high-resolution synchrotron-based imaging stations at the BAMline (BESSY) and TopoTomo (ANKA) N2 - The BAMline at the BESSY light source in Berlin and the TopoTomo beamline at the ANKA synchrotron facility in Karlsruhe (both Germany) operate in the hard X-ray regime (above 6 keV) with similiar photon flux density. For typical imaging applications, a double multilayer monochromator or a filtered white beam is used. In order to optimise the field of view and the resolution of the available indirect pixel detectors, different optical systems have been installed, adapted, respectively, to a large field of view (macroscope) and to high spatial resolution (microscope). They can be combined with different camera systems, ranging from 16-bit dynamic range slow-scan CCDs to fast CMOS cameras. The spatial resolution can be brought substantially beyond the micrometer limit by using a Bragg magnifier. The moderate flux of both beamlines compared to other 3rd generation light sources is compensated by a dedicated scintillator concept. For selected applications, X-ray beam collimation has proven to be a reliable approach to increase the available photon flux density. Absorption contrast, phase contrast, holotomography and refraction-enhanced imaging are used depending on the application. Additionally, at the TopoTomo beamline digital white beam synchrotron topography is performed, using the digital X-ray pixel detectors installed. KW - Microtomography KW - Non-destructive evaluation KW - Coherent imaging KW - X-ray refraction KW - X-ray phase contrast KW - Synchrotron-CT KW - Synchrotron instrumentation KW - Scintillator KW - Bragg magnification KW - Holotomography KW - X-ray topography PY - 2008 DO - https://doi.org/10.1117/12.793721 SN - 0277-786X VL - 7078 SP - 70780X-1 - 70780X-9 AN - OPUS4-18296 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Seah, M.P. A1 - Spencer, S.J. A1 - Bensebaa, F. A1 - Vickridge, I. A1 - Danzebrink, H. A1 - Krumrey, M. A1 - Gross, Thomas A1 - Österle, Werner A1 - Wendler, E. A1 - Rheinländer, B. A1 - Azuma, Y. A1 - Kojima, I. A1 - Suzuki, N. A1 - Suzuki, M. A1 - Tanuma, S. A1 - Moon, D.W. A1 - Lee, H.J. A1 - Cho, H.M. A1 - Chen, H.Y. A1 - Wee, A. T. S. A1 - Osipowicz, T. A1 - Pan, J.S. A1 - Jordaan, W.A. A1 - Hauert, R. A1 - Klotz, U. A1 - van der Marel, C. A1 - Verheijen, M. A1 - Tamminga, Y. A1 - Jeynes, C. A1 - Bailey, P. A1 - Biswas, S. A1 - Falke, U. A1 - Nguyen, N.V. A1 - Chandler-Horowitz, D. A1 - Ehrstein, J.R. A1 - Muller, D. A1 - Dura, J.A. T1 - Critical review of the current status of thickness measurements for ultrathin SiO2 on Si - Part V: Results of a CCQM pilot study N2 - Results are reported from a pilot study under the Consultative Committee for Amount of Substance (CCQM) to compare measurements of and resolve any relevant measurement issues in, the amount of thermal SiO2 oxide on (100) and (111) orientation Si wafer substrates in the thickness range 1.5 - 8 nm. As a result of the invitation to participate in this activity, 45 sets of measurements have been made in different laboratories using 10 analytical methods: medium-energy ion scattering spectrometry (MEIS), nuclear reaction analysis (NRA), RBS, elastic backscattering spectrometry (EBS), XPS, SIMS, ellipsometry, grazing-incidence x-ray reflectrometry (GIXRR), neutron reflectometry and transmission electron microscopy (TEM). The measurements are made on separate sets of 10 carefully prepared samples, all of which have been characterised by a combination of ellipsometry and XPS using carefully established reference conditions and reference parameters. The results have been assessed against the National Physical Laboratory (NPL) data and all show excellent linearity. The remaining data sets correlate with the NPL data with average root-mean-square scatters of 0.15 nm, half being better than 0.1 nm and a few at or better than 0.05 nm. Each set of data allows a relative scaling constant and a zero thickness offset to be determined. Each method has an inherent zero thickness offset between 0 nm and 1 nm and it is these offsets, measured here for the first time, that have caused many problems in the past. There are three basic classes of offset: water and carbonadeous contamination equivalent to ~1 nm as seen by ellipsometry; adsorbed oxygen mainly from water at an equivalent thickness of 0.5 nm as seen by MEIS, NRA, RBS and possibly GIXRR; and no offset as seen by XPS using the Si 2p peaks. Each technique has a different uncertainty for the scaling constant and consistent results have been achieved. X-Ray photoelectron spectroscopy has large uncertainties for the scaling constant but a high precision and, critically, if used correctly, has zero offset. Thus, a combination of XPS and the other methods allows the XPS scaling constant to be determined with low uncertainty, traceable via the other methods. XPS laboratories returning results early were invited to test a new reference procedure. All showed very significant improvements. The reference attenuation lengths thus need scaling by 0.986 ± 0.009 (at an expansion factor of 2) deduced from the data for the other methods. Several other methods have small offsets and, to the extent that these can be shown to be constant or measurable, then these methods will also show low uncertainty. Recommendations are provided for parameters for XPS, MEIS, RBS and NRA to improve their accuracy. KW - Calibration KW - Ellipsometry KW - GIXRR KW - Interlaboratory study KW - MEIS KW - Neutron reflectometry KW - NRA KW - RBS KW - Silicon dioxide KW - SIMS KW - XPS PY - 2004 DO - https://doi.org/10.1002/sia.1909 SN - 0142-2421 SN - 1096-9918 VL - 36 IS - 9 SP - 1269 EP - 1303 PB - Wiley CY - Chichester AN - OPUS4-5549 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - RPRT A1 - Seah, M.P. A1 - Spencer, S.J. A1 - Bensebaa, F. A1 - Vickridge, I. A1 - Danzebrink, H. A1 - Krumrey, M. A1 - Gross, Thomas A1 - Österle, Werner A1 - Wendler, E. A1 - Rheinländer, B. A1 - Azuma, Y. A1 - Kojima, I. A1 - Suzuki, N. A1 - Suzuki, M. A1 - Tanuma, S. A1 - Moon, D.W. A1 - Lee, H.J. A1 - Cho, H.M. A1 - Chen, H.Y. A1 - Wee, A. T. S. A1 - Osipowicz, T. A1 - Pan, J.S. A1 - Jordaan, W.A. A1 - Hauert, R. A1 - Klotz, U. A1 - van der Marel, C. A1 - Verheijen, M. A1 - Tamminga, Y. A1 - Jeynes, C. A1 - Bailey, P. A1 - Biswas, S. A1 - Falke, U. A1 - Nguyen, N.V. A1 - Chandler-Horowitz, D. A1 - Ehrstein, J.R. A1 - Muller, D. A1 - Dura, J.A. T1 - Ultra-thin SiO2 on Si, Part V: Results of a CCQM Pilot Study of Thickness Measurements KW - SiO2 KW - Thin films KW - Thickness KW - XPS KW - Ellipsometry KW - TEM PY - 2003 SN - 1473-2734 SP - 57 pages AN - OPUS4-4118 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Bernhardt, R. A1 - Scharnweber, D. A1 - Müller, B. A1 - Thurner, P. A1 - Schliephake, K. A1 - Wyss, P. A1 - Beckmann, F. A1 - Goebbels, Jürgen A1 - Worch, H. T1 - Comparison of microfocus- and synchrotron X-ray tomography for the analysis of osteointegration around T16AL4V-implants N2 - Micro-computed tomography (µCT) provides quantitative three-dimensional information of bone around titanium implants similar to classical histology. The study, based on an animal model, using cuboid-shaped biofunctionalised Ti6Al4V implants with surrounding bone after 4 weeks, is performed using 3 µCT-systems with X-ray tubes, one synchrotron-radiation-based µCT-system (SRµCT), and classical histology. Although the spatial resolution of the µCTsystems is comparable, only the results of SRµCT agree with results of classical histology. The X-ray tube sources give rise to huge artefacts in the tomograms (interface scattering, beam hardening), which impaired the quantitative analysis of bone up to about 200 µm from the implant surface. Due to the non-destructive character of µCT the specimens can be subsequently examined by classical histology without restriction. The quantitative comparison of bone formation uncovers the strong dependence of the detected amount of newly formed bone from the selected slice. This implies the necessity of 3D analysis. SRµCT and classical histology prove that surface modifications of the titanium implant significantly influence the bone formation. Using SRµCT, the preparation artefacts due to cutting and polishing are excluded. KW - X-ray micro computed tomography KW - Comparison of microfocus and synchrotron radiation KW - Osteointegration KW - Surface modification of titanium implants KW - Histology KW - Bone segmentation KW - Quantification of bone formation PY - 2004 UR - http://www.ecmjournal.org/journal/papers/vol007/vol007a05.php SN - 1473-2262 VL - 7 SP - 42 EP - 51 PB - Univ. of Wales CY - Aberystwyth, Wales AN - OPUS4-5600 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -