TY - JOUR A1 - Hoffmann, Katrin A1 - Dietzel, B. A1 - Schulz, B. A1 - Reck, Günter A1 - Hoffmann, Angelika A1 - Orgzall, I. A1 - Resch-Genger, Ute A1 - Emmerling, Franziska T1 - Combined structural and fluorescence studies of methyl-substituted 2,5-diphenyl-1,3,4-oxadiazoles - relation between electronic properties and packing motifs N2 - Prerequisite for the rational design of functional organic materials with tailor-made electronic properties is the knowledge of the structure–property relationship for the specific class of molecules under consideration. This encouraged us to systematically study the influence of the molecular structure and substitution pattern of aromatically substituted 1,3,4-oxadiazoles on the electronic properties and packing motifs of these molecules and on the interplay of these factors. For this purpose, seven diphenyl-oxadiazoles equipped with methyl substituents in the ortho- and meta-position(s) were synthesized and characterized. Absorption and fluorescence spectra in solution served here as tools to monitor substitution-induced changes in the electronic properties of the individual molecules whereas X-ray and optical measurements in the solid state provided information on the interplay of electronic and packing effects. In solution, the spectral position of the absorption maximum, the size of Stokes shift, and the fluorescence quantum yield are considerably affected by ortho-substitution in three or four ortho-positions. This results in blue shifted absorption bands, increased Stokes shifts, and reduced fluorescence quantum yields whereas the spectral position and vibrational structure of the emission bands remain more or less unaffected. In the crystalline state, however, the spectral position and shape of the emission bands display a strong dependence on the molecular structure and/or packing motifs that seem to control the amount of dye–dye-interactions. These observations reveal the limited value of commonly reported absorption and fluorescence measurements in solution for a straightforward comparison of spectroscopic results with single X-ray crystallography. This underlines the importance of solid state spectroscopic studies for a better understanding of the interplay of electronic effects and molecular order. KW - Diphenyl-oxadiazoles KW - X-ray structure KW - Packing motif KW - Optical properties KW - Fluorescence quantum yield PY - 2011 DO - https://doi.org/10.1016/j.molstruc.2010.11.071 SN - 0022-2860 SN - 1872-8014 SN - 0377-046X VL - 988 IS - 1-3 SP - 35 EP - 46 PB - Elsevier CY - Amsterdam AN - OPUS4-23253 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Appelhans, Dietmar A1 - Oertel, U. A1 - Mazzeo, R. A1 - Komber, H. A1 - Hoffmann, J. A1 - Weidner, Steffen A1 - Brutschy, B. A1 - Voit, B. A1 - Ottaviani, M.F. T1 - Dense-shell glycodendrimers: UV/Vis and electron paramagnetic resonance study of metal ion complexation N2 - The development of dendritic metal ion carrier systems for use in a biological environment is a challenging task as the carrier system must possess multiple features (e.g. a protective shell for metal decomplexation, targeting functions, metal-intradendrimer complexes, etc.) to substitute for the function of metal proteins in processes such as copper metabolism. Thus, Cu(II) complexation by a series of poly(propyleneimine) glycodendrimers ranging up to the fifth generation that have either a dense maltose or maltotriose shell was investigated by UV/Vis spectroscopy and electron paramagnetic resonance (EPR). As a necessary step towards potential biological application, we elucidated the complexation capacity, location of the Cu(II)-dendrimer complexes and the Cu(II) coordination sphere in the dendritic environment. A generation-dependent Cu(II) complexation was found. Furthermore, analysis of the EPR spectra revealed that internal and external Cu(II) coordination and the symmetry (axial and rhombic) of the generated complexes depend on the oligosaccharide shell, dendrimer generation and the relative concentrations of Cu(II) and the dendrimers. Both axial and rhombic symmetries are generation dependent, but also distort with increasing generation number. External coordination of Cu(II) is supported by sugar groups and water molecules. Finally, a third-generation dendrimer with a maltose shell was used to explore the general complexation behaviour of the dendritic poly(propyleneimine) scaffold towards different metal ions [Cu(II), Ag(I), VO(IV), Ni(II), Eu(III) and UO2(VI)]. KW - Glycodendrimers KW - Metal ion complexation KW - Metal ion-intradendrimer complexes KW - Electron paramagnetic resonance study PY - 2010 DO - https://doi.org/10.1098/rspa.2009.0107 SN - 1364-5021 SN - 0962-8444 SN - 0080-4630 SN - 0950-1207 SN - 1471-2946 VL - 466 SP - 1489 EP - 1513 CY - London, UK AN - OPUS4-21622 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Bruna, F. G. A1 - Prokop, M. A1 - Bystron, T. A1 - Loukrakpam, R. A1 - Melke, J. A1 - Lobo, C. M. S. A1 - Fink, M. A1 - Zhu, M. A1 - Voloshina, E. A1 - Kutter, M. A1 - Hoffmann, H. A1 - Yusenko, Kirill A1 - de Oliveira Guilherme Buzanich, Ana A1 - Röder, B. A1 - Bouzek, K. A1 - Paulus, B. A1 - Roth, C. T1 - Following adsorbed intermediates on a platinum gas diffusion electrode in H3PO3‑containing electrolytes using in situ X‑ray absorption spectroscopy N2 - One of the challenges of high-temperature polymer electrolyte membrane fuel cells is the poisoning of the Pt catalyst with H3PO4. H3PO4 is imbibed into the routinely used polybenzimidazole-based membranes, which facilitate proton conductivity in the temperature range of 120−200 °C. However, when leached out of the membrane by water produced during operation, H3PO4 adsorbs on the Pt catalyst surface, blocking the active sites and hindering the oxygen reduction reaction (ORR). The reduction of H3PO4 to H3PO3, which occurs at the anode due to a combination of a low potential and the presence of gaseous H2, has been investigated as an additional important contributing factor to the observed poisoning effect. H3PO3 has an affinity toward adsorption on Pt surfaces even greater than that of H2PO4 −. In this work, we investigated the poisoning effect of both H3PO3 and H3PO4 using a half-cell setup with a gas diffusion electrode under ambient conditions. By means of in situ X-ray absorption spectroscopy, it was possible to follow the signature of different species adsorbed on the Pt nanoparticle catalyst (H, O, H2PO4 −, and H3PO3) at different potentials under ORR conditions in various electrolytes (HClO4, H3PO4, and H3PO3). It was found that H3PO3 adsorbs in a pyramidal configuration P(OH)3 through a Pt−P bond. The competition between H3PO4 and H3PO3 adsorption was studied, which should allow for a better understanding of the catalyst poisoning mechanism and thus assist in the development of strategies to mitigate this phenomenon in the future by minimizing H3PO3 generation by, for example, improved catalyst design or adapted operation conditions or changes in the electrolyte composition. KW - H3PO4 life cycle KW - XAS KW - In situ coupling KW - High-temperature fuel cells KW - Δμ XANES KW - H3PO3 PY - 2022 DO - https://doi.org/10.1021/acscatal.2c02630 SN - 2155-5435 VL - 12 IS - 18 SP - 11472 EP - 11484 PB - ACS CY - Washington, DC AN - OPUS4-55815 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Hoffmann, V. A1 - Steers, E. B. M. T1 - Exploitation of the hydrogen effect on an analytical glow discharge T2 - Final General Meeting of the EU-GDS Network CY - Wiener Neustadt, Austria DA - 2002-03-02 PY - 2002 SP - 1(?) EP - 6(?) AN - OPUS4-1467 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Hoffmann, V. A1 - Steers, E. B. M. A1 - Wetzig, K. T1 - Exploitation of the effect of hydrogen on an analytical glow discharge T2 - Winter Conference on Plasma Spectrochemistry 2002 CY - Scottsdale, AZ, USA DA - 2002-01-06 PY - 2002 SN - 0161-6951 SP - 261 EP - 262 PB - ICP Information Newsletter, Inc. CY - Amherst, Mass. AN - OPUS4-1589 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Resch-Genger, Ute A1 - Hoffmann, Katrin A1 - Nietfeld, W. A1 - Engel, A. A1 - Neukammer, J. A1 - Nitschke, R. A1 - Ebert, B. A1 - Macdonald, R. T1 - How to Improve Quality Assurance in Fluorometry: Fluorescence-Inherent Sources of Error and Suited Fluorescence Standards N2 - The scope of this paper is to illustrate the need for an improved quality assurance in fluorometry. For this purpose, instrumental sources of error and their influences on the reliability and comparability of fluorescence data are highlighted for frequently used photoluminescence techniques ranging from conventional macro- and microfluorometry over fluorescence microscopy and flow cytometry to microarray technology as well as in vivo fluorescence imaging. Particularly, the need for and requirements on fluorescence standards for the characterization and performance validation of fluorescence instruments, to enhance the comparability of fluorescence data, and to enable quantitative fluorescence analysis are discussed. Special emphasis is dedicated to spectral fluorescence standards and fluorescence intensity standards. KW - Fluorescence KW - Standard KW - Calibration KW - Microarray KW - In vivo imaging KW - Flow cytometry PY - 2005 DO - https://doi.org/10.1007/s10895-005-2630-3 SN - 1053-0509 SN - 1573-4994 VL - 15 IS - 3 SP - 337 EP - 362 PB - Plenum Publ. Corp. CY - New York, NY AN - OPUS4-10823 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Resch-Genger, Ute A1 - Pfeifer, Dietmar A1 - Monte, Christian A1 - Pilz, Walter A1 - Hoffmann, Angelika A1 - Spieles, Monika A1 - Rurack, Knut A1 - Hollandt, J. A1 - Taubert, D. A1 - Schönenberger, B. A1 - Nording, P. T1 - Traceability in Fluorometry: Part II. Spectral Fluorescence Standards N2 - The need for the traceable characterization of fluorescence instruments is emphasized from a chemist’s point of view, focusing on spectral fluorescence standards for the determination of the wavelength- and polarization-dependent relative spectral responsivity and relative spectral irradiance of fluorescence measuring systems, respectively. In a first step, major sources of error of fluorescence measurements and instrument calibration are revealed to underline the importance of this issue and to illustrate advantages and disadvantages of physical and chemical transfer standards for generation of spectral correction curves. Secondly, examples for sets of traceable chemical emission and excitation standards are shown that cover a broad spectral region and simple procedures for the determination of corrected emission spectra with acceptable uncertainties are presented. With proper consideration of the respective measurement principle and geometry, these dye-based characterization procedures can be not only applied to spectrofluorometers but also to other types of fluorescence measuring systems and even to Raman spectrometers. KW - Fluorescence KW - Standard KW - Spectral correction KW - Emission KW - Excitation KW - Traceability PY - 2005 DO - https://doi.org/10.1007/s10895-005-2629-9 SN - 1053-0509 SN - 1573-4994 VL - 15 IS - 3 SP - 315 EP - 336 PB - Plenum Publ. Corp. CY - New York, NY AN - OPUS4-10824 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Abou-Ras, D. A1 - Caballero, R. A1 - Fischer, C.-H. A1 - Kaufmann, C.A. A1 - Lauermann, I. A1 - Mainz, R. A1 - Mönig, H. A1 - Schöpke, A. A1 - Stephan, C. A1 - Streeck, C. A1 - Schorr, S. A1 - Eicke, A. A1 - Döbeli, M. A1 - Gade, B. A1 - Hinrichs, J. A1 - Nunney, T. A1 - Dijkstra, H. A1 - Hoffmann, V. A1 - Klemm, D. A1 - Efimova, V. A1 - Bergmaier, A. A1 - Dollinger, G. A1 - Wirth, Thomas A1 - Unger, Wolfgang A1 - Rockett, A.A. A1 - Perez-Rodriguez, A. A1 - Alvarez-Garcia, J. A1 - Izquierdo-Roca, V. A1 - Schmid, T. A1 - Choi, P.-P. A1 - Müller, M. A1 - Bertram, F. A1 - Christen, J. A1 - Khatri, H. A1 - Collins, R.W. A1 - Marsillac, S. A1 - Kötschau, I. T1 - Comprehensive comparison of various techniques for the analysis of elemental distributions in thin films N2 - The present work shows results on elemental distribution analyses in Cu(In,Ga)Se2 thin films for solar cells performed by use of wavelength-dispersive and energy-dispersive X-ray spectrometry (EDX) in a scanning electron microscope, EDX in a transmission electron microscope, X-ray photoelectron, angle-dependent soft X-ray emission, secondary ion-mass (SIMS), time-of-flight SIMS, sputtered neutral mass, glow-discharge optical emission and glow-discharge mass, Auger electron, and Rutherford backscattering spectrometry, by use of scanning Auger electron microscopy, Raman depth profiling, and Raman mapping, as well as by use of elastic recoil detection analysis, grazing-incidence X-ray and electron backscatter diffraction, and grazing-incidence X-ray fluorescence analysis. The Cu(In,Ga)Se2 thin films used for the present comparison were produced during the same identical deposition run and exhibit thicknesses of about 2 µm. The analysis techniques were compared with respect to their spatial and depth resolutions, measuring speeds, availabilities, and detection limits. KW - Elemental distributions KW - Comparison KW - Depth profiling KW - Chemical mapping KW - Thin films KW - Solar cells KW - Chalcopyrite-type KW - Cu(In,Ga)Se2 PY - 2011 DO - https://doi.org/10.1017/S1431927611000523 SN - 1431-9276 SN - 1435-8115 VL - 17 IS - 5 SP - 728 EP - 751 PB - Cambridge University Press CY - New York, NY AN - OPUS4-24506 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Noble, J.E. A1 - Wang, L. A1 - Cerasoli, E. A1 - Knight, A.E. A1 - Porter, R.A. A1 - Gray, E. A1 - Howe, C. A1 - Hannes, E. A1 - Corbisier, P. A1 - Wang, J. A1 - Wu, L. A1 - Altieri, I. A1 - Patriarca, M. A1 - Hoffmann, Angelika A1 - Resch-Genger, Ute A1 - Ebert, B. A1 - Voigt, Jan A1 - Shigeri, Y. A1 - Vonsky, M.S. A1 - Konopelko, L.A. A1 - Gaigalas, A.K. A1 - Bailey, M. J. A. T1 - An international comparability study to determine the sources of uncertainty associated with a non-competitive sandwich fluorescent ELISA KW - ELISA KW - Fluorescence KW - Interferon KW - Uncertainty KW - Round Robin KW - Immunoassay KW - Quality assurance KW - Fluorescein PY - 2008 SN - 1434-6621 SN - 1437-8523 VL - 46 IS - 7 SP - 1033 EP - 1045 PB - De Gruyter CY - Berlin AN - OPUS4-18283 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Unger, Wolfgang A1 - Jenett, H. A1 - Hoffmann, V. A1 - Hagenhoff, B. A1 - Kayser, S. A1 - Wetzig, K. T1 - Depth profiling of electrically non-conductive layered samples by RF-GDOES and HFM plasma SNMS N2 - The work is intended to compare the capabilities of two similar depth profiling techniques to analyse electrically non-conductive samples. In order to get a better evaluation of the depth resolution, various multilayer sandwiches, such as SiO2/TiO2 and Si3N4/SiO2 deposited on glass substrates have been investigated. Optimised depth profiles are presented for both methods, glow discharge optical emission spectrometry (GDOES) and radiofrequency mode (known as “HFM” in the SNMS literature) of plasma secondary neutral mass spectrometry (SNMS). The optimisation procedure, necessary to get the best set of plasma parameters, which result in the optimal depth resolution, is also described for one selected sample. Additionally, sputtering crater profilometry was carried out in order to check out the flatness of the sputtered crater. The influence of the thickness of the sample substrate on the sputtering rate is discussed. Finally, advantages and disadvantages of the use of these two depth profiling methods, especially for the non-conductive samples, are concluded from this comparative study. Time-of-flight secondary ion mass spectrometry (ToF-SIMS) analysis of a cross-sectioned sample was carried out in order to get supplementary information. KW - rf-Glow discharge KW - HFM plasma SNMS KW - Non-conductive layered samples KW - Depth resolution KW - Crater shape KW - ToF-SIMS PY - 2001 DO - https://doi.org/10.1016/S0169-4332(01)00259-8 SN - 0169-4332 SN - 1873-5584 VL - 179 IS - 1-4 SP - 30 EP - 37 PB - North-Holland CY - Amsterdam AN - OPUS4-6882 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -