TY - JOUR A1 - Hahn, Oliver A1 - Malzer, W. A1 - Kanngießer, B. A1 - Beckhoff, B. T1 - Characterization of iron-gall inks in historical manuscripts and music compositions using x-ray fluorescence spectrometry N2 - The qualitative and quantitative investigation of historical iron-gall inks using micro-XRF spectrometry is a suitable method for analyzing composition fingerprints of different ink types. The quantitative analysis is based on a model that takes into account the inhomogeneity and the layer structure of archaeometric samples. Starting from these composition fingerprints, it is possible to characterize distinguishable inks of one artist to classify different chronological ink types and, further, to date unknown fragments that have not so far been integrated into the lifework of an artist. The first qualitative and quantitative investigations of the manuscript Faust I and II and of the music composition The Magic Flute demonstrate impressively the identification of J. W. v. Goethe's and W. A. Mozart's artistic work with modern scientific methods. Further investigations on A. v. Arnim's manuscript Studien zu Naturwissenschaften provide evidence that the diversity of various degradation mechanisms of iron-gall inks could be mainly caused by different inorganic compositions. PY - 2004 U6 - https://doi.org/10.1002/xrs.677 SN - 0049-8246 VL - 33 SP - 234 EP - 239 PB - Wiley CY - Chichester AN - OPUS4-3723 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hahn, Oliver A1 - Malzer, W. A1 - Kanngießer, B. A1 - Beckhoff, B. A1 - Waldschläger, U. T1 - Characterization of iron gall inks in historical manuscripts using micro X-ray fluorescence spectrometry T2 - European Conference on Energy Dispersive X-Ray Spectrometry (EDXRS) CY - Berlin, Germany DA - 2002-06-16 PY - 2002 SP - 83 AN - OPUS4-1404 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kim, K. J. A1 - Kim, A. S. A1 - Jang, J. S. A1 - Suh, J. K. A1 - Wirth, Thomas A1 - Hodoroaba, Vasile-Dan A1 - Unger, Wolfgang A1 - Araujo, J. R. A1 - Archanjo, B. S. A1 - Galhardo, C. E. A1 - Damasceno, J. A1 - Achete, C. A. A1 - Wang, H. A1 - Wang, M. A1 - Bennett, J. A1 - Simons, D. A1 - Kurokawa, A. A1 - Terauchi, S. A1 - Fujimoto, T. A1 - Streeck, C. A1 - Beckhoff, B. A1 - Spencer, S. A1 - Shard, A. T1 - Measurement of mole fractions of Cu, In, Ga and Se in Cu(In,Ga)Se2 films N2 - CCQM key comparison K-129 for the quantitative analysis of Cu(In,Ga)Se2 (CIGS) films has been performed by the Surface Analysis Working Group (SAWG) of the Consultative Committee for Amount of Substance (CCQM). The objective of this key comparison is to compare the equivalency of the National Metrology Institutes (NMIs) and Designated Institutes (DIs) for the measurement of mole fractions of Cu, In, Ga and Se in a thin CIGS film. The measurand of this key comparison is the average mole fractions of Cu, In, Ga and Se of a test CIGS alloy film in the unit of mole fraction (mol/mol). Mole fraction with the metrological unit of mol/mol can be practically converted to atomic fraction with the unit of at%. In this key comparison, a CIGS film with certified mole fractions was supplied as a reference specimen to determine the relative sensitivity factors (RSFs) of Cu, In, Ga and Se. The mole fractions of the reference specimen were certified by isotope dilution - inductively coupled plasma/mass spectrometry (ID-ICP/MS) and are traceable to the SI. A total number counting (TNC) method was recommended as a method to determine the signal intensities of the constituent elements acquired in the depth profiles by Secondary Ion Mass Spectrometry (SIMS), X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES). Seven NMIs and one DI participated in this key comparison. The mole fractions of the CIGS films were measured by depth profiling based-SIMS, AES and XPS. The mole fractions were also measured by non-destructive X-Ray Fluorescence (XRF) Analysis and Electron Probe Micro Analysis (EPMA) with Energy Dispersive X-ray Spectrometry (EDX). In this key comparison, the average degrees of equivalence uncertainties for Cu, In, Ga and Se are 0.0093 mol/mol, 0.0123 mol/mol, 0.0047 mol/mol and 0.0228 mol/mol, respectively. These values are much smaller than that of Fe in a Fe-Ni alloy film in CCQM K-67 (0.0330 mol/mol). This means that the quantification of multi-element alloy films is possible by depth profiling analysis using the TNC method. KW - CIGS KW - Key comparison KW - CCQM KW - SIMS KW - XPS KW - AES KW - XRF KW - EPMA PY - 2016 UR - http://iopscience.iop.org/article/10.1088/0026-1394/53/1A/08011 U6 - https://doi.org/10.1088/0026-1394/53/1A/08011 SN - 0026-1394 SN - 1681-7575 VL - 53, Technical Supplement SP - Article 08011, 1 EP - 19 PB - IOP Publishing AN - OPUS4-38110 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Grötzsch, D. A1 - Streeck, C. A1 - Nietzold, Carolin A1 - Malzer, W. A1 - Mantouvalou, I. A1 - Nutsch, A. A1 - Dietrich, Paul A1 - Unger, Wolfgang A1 - Beckhoff, B. A1 - Kanngießer, B. T1 - A sealable ultrathin window sample cell for the study of liquids by means of soft X-ray spectroscopy N2 - A new sample cell concept for the analysis of liquids or solid-liquid interfaces using soft X-ray spectroscopy is presented, which enables the complete sealing of the cell as well as the Transport into vacuum via, for example, a load-lock system. The cell uses pressure monitoring and active as well as passive pressure regulation systems, thereby facilitating the full control over the pressure during filling, sealing, evacuation, and measurement. The cell design and sample preparation as well as the crucial sealing procedure are explained in detail. As a first proof-of-principle experiment, successful nitrogen K-edge fluorescence yield near-edge X-ray absorption fine structure experiments of a biomolecular solution are presented. For this purpose, it is shown that the careful evaluation of all involved parameters, such as window type or photon flux, is desirable for optimizing the experimental result. KW - X-ray spectroscopy KW - Analysis of liquids KW - Wet cell KW - Concanavalin A KW - NEXAFS PY - 2017 U6 - https://doi.org/10.1063/1.5006122 SN - 0034-6748 SN - 1089-7623 VL - 88 IS - 12 SP - 123112-1 EP - 123112-7 PB - American Institute of Physics AN - OPUS4-43611 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kayser, Y. A1 - Gross, A. A1 - Hönicke, P. A1 - Osan, J. A1 - Pollakowski-Herrmann, B. A1 - Seeger, Stefan A1 - Beckhoff, B. T1 - Reliable chemical analysis of aerosols by reference-free X-ray spectrometry for monitoring airborne particulate matter N2 - The physical and chemical analysis of aerosols using reliable and physically traceable methods is important for the thorough investigation of airborne particles to support a better understanding of their origin as well as their health and climate impacts. Within the European Metrology Research AeroMet project,the aim of hysikalisch–Technische Bundesanstalt’s (PTB) X-ray spectrometry group is to develop and establish traceable and reliable X-ray methods to measure the elemental mass deposition per unit area, the elemental composition,and the chemical binding state of particulate matter supported by a flat substrate. This approach can substantially contribute to support quantitative analytical methods during on-site measurement campaigns where portable Instrumentation is employed by qualifying suitable calibration samples for commercial analytical X-ray instruments and by investigating samples collected during the field campaign. KW - AEROMET project KW - X-Ray analysis KW - TXRF KW - Aerosols KW - Particles KW - Air pollution KW - Elemental composition PY - 2020 UR - https://www.spectroscopyonline.com/view/reliable-chemical-analysis-of-aerosols-by-reference-free-x-ray-spectrometry-for-monitoring-airborne-particulate-matter SN - 0887-6703 VL - 35 IS - 10 SP - 42 EP - 46 PB - MJH Life Sciences CY - Cranbury, NJ AN - OPUS4-53357 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Beckhoff, B. A1 - Hahn, Oliver A1 - Weser, J. A1 - Wilke, M. A1 - Ulm, G. A1 - Jann, Oliver T1 - Environmental analysis by TXRF - NEXAFS and IR- spectroscopy: speciation of Br in organics and characterization of the organic matrix T2 - EXRS 2006 CY - Paris, France DA - 2006-06-19 PY - 2006 AN - OPUS4-13234 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Beckhoff, B. A1 - Hahn, Oliver A1 - Jann, Oliver A1 - Ulm, G. A1 - Wilke, M. A1 - Weser, J. T1 - Encviromental Analyses by TXRF-NEXAFS and IR-spectroscopy: Speciation of Bromine in Organics and Characterization of the Organic Matrix T2 - VVIII INternational Bonderence on "X-ray Optics and MIcroanlaysis" CY - Frascati, Italy DA - 2005-09-25 PY - 2005 AN - OPUS4-10543 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hahn, Oliver A1 - Beckhoff, B. A1 - Weser, J. A1 - Wilke, M. A1 - Ulm, G. A1 - Jann, Oliver T1 - Environmental analysis by TXRF - NEXAFS and IR- spectroscopy: speciation of Br in organics and characterization of the organic matrix T2 - PRORA (Fachtagung), Prozessnahe Röntgenanalytik, Wista Adlershof CY - Berlin, Germany DA - 2005-11-24 PY - 2005 AN - OPUS4-11482 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Kolbe, M. A1 - Beckhoff, B. A1 - Hahn, Oliver A1 - Karydas, A.G. A1 - Zarkadas, C. A1 - Sokaras, D. A1 - Mantler, M. T1 - Reference-free investigation of an ancient Chinese ceramic by X-ray fluorescence analysis KW - X-ray fluorescence analysis KW - Reference-free investigation PY - 2007 UR - http://www.helmholtz-berlin.de/media/media/oea/web/pr_webseite/druckschriften/berichte/bessy/annual_report_2006.pdf#page=32 SN - 0179-4159 SP - 32 EP - 34 PB - Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung CY - Berlin AN - OPUS4-14853 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Beckhoff, B. A1 - Kolbe, M. A1 - Hahn, Oliver A1 - Karydas, A.G. A1 - Zarkadas, C. A1 - Sokaras, D. A1 - Mantler, M. T1 - X-Ray fluorescence analysis: Part 1: Experiments with synchrotron radiation T2 - TECHNART 2007, Non-destructive and Microanalytikal Techniques in Art and Cultural Heritage Research CY - Lisbon, Portugal DA - 2007-04-25 PY - 2007 AN - OPUS4-15022 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Mantler, M. A1 - Beckhoff, B. A1 - Kolbe, M. A1 - Karydas, A.G. A1 - Zarkadas, C. A1 - Sokaras, D. T1 - Reference-Free X-Ray flourescence analysis: Part 2: Theoretical considerations T2 - TECHNART 2007, Non-destructive and Techniques in Art and Cultural Heritage Research CY - Lisbon, Portugal DA - 2007-04-25 PY - 2007 AN - OPUS4-15025 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Beckhoff, B. A1 - Hahn, Oliver A1 - Weser, J. A1 - Wilke, M. A1 - Ulm, G. A1 - Jann, Oliver T1 - Environmental Analyses by TXRF - NEXAFS and IR-Spectroscopy: Speciation of Br in Organics and Characterization of the Organic Matrix KW - TXRF-NEXAFS KW - FTIR KW - Environmental analyses PY - 2006 UR - http://www.helmholtz-berlin.de/media/media/oea/web/pr_webseite/druckschriften/berichte/bessy/annualreport2005.pdf#page=30 SN - 0179-4159 SP - 28 EP - 30 PB - Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung CY - Berlin AN - OPUS4-12410 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Beckhoff, B. A1 - Kolbe, M. A1 - Hahn, Oliver A1 - Karydas, A.G. A1 - Zarkadas, C. A1 - Sokaras, D. A1 - Mantler, M. T1 - Reference-free X-ray fluorescence analysis of an ancient Chinese ceramic N2 - The investigation of an ancient Chinese ceramic served to further develop and validate fundamental parameter-based quantitation procedures in reference-free x-ray fluorescence (XRF) analysis. The XRF measurements of this sample were performed at the four-crystal monochromator beamline of the Physikalisch-Technische Bundesanstalt (PTB) at the BESSY II synchrotron radiation facility employing different excitation energies. The parallel processing of the XRF spectra recorded at different excitation energies provides a means to simultaneously evaluate relevant fundamental parameters and secondary enhancement processes such as those induced by photoelectrons. Employing well-characterized and absolutely calibrated instrumentation, all experimental parameters involved in XRF are known for small relative uncertainties allowing for a completely reference-free quantitation. Apart from traces of rare earth elements, the analytical results of the Chinese ceramic achieved by reference-free XRF are in line with target values given within a proficiency test of the International Atomic Energy Agency (IAEA) involving atomic and nuclear methods. KW - XRF KW - Cultural heritage KW - Archaeometry PY - 2008 U6 - https://doi.org/10.1002/xrs.1073 SN - 0049-8246 VL - 37 SP - 462 EP - 465 PB - Wiley CY - Chichester AN - OPUS4-19095 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Dietrich, Paul A1 - Streeck, C. A1 - Glamsch, Stephan A1 - Ehlert, Christopher A1 - Lippitz, Andreas A1 - Nutsch, A. A1 - Kulak, N. A1 - Beckhoff, B. A1 - Unger, Wolfgang T1 - Quantification of silane molecules on oxidized silicon: Are there options for a traceable and absolute determination? N2 - Organosilanes are used routinely to functionalize various support materials for further modifications. Nevertheless, reliable quantitative information about surface functional group densities after layer formation is rarely available. Here, we present the analysis of thin organic nanolayers made from nitrogen containing silane molecules on naturally oxidized silicon wafers with reference-free total reflection X-ray fluorescence (TXRF) and X-ray photoelectron spectroscopy (XPS). An areic density of 2−4 silane molecules per nm2 was calculated from the layer’s nitrogen mass deposition per area unit obtained by reference-free TXRF. Complementary energy and angle-resolved XPS (ER/ARXPS) in the Si 2p core-level region was used to analyze the outermost surface region of the organic (silane layer)−inorganic (silicon wafer) interface. Different coexisting silicon species as silicon, native silicon oxide, and silane were identified and quantified. As a result of the presented proof-of-concept, absolute and traceable values for the areic density of silanes containing nitrogen as intrinsic marker are obtained by calibration of the XPS methods with reference-free TXRF. Furthermore, ER/AR-XPS is shown to facilitate the determination of areic densities in (mono)layers made from silanes having no heteroatomic marker other than silicon. After calibration with reference-free TXRF, these areic densities of silane molecules can be determined when using the XPS component intensity of the silane’s silicon atom. PY - 2015 U6 - https://doi.org/10.1021/acs.analchem.5b02846 SN - 0003-2700 SN - 1520-6882 VL - 87 IS - 19 SP - 10117 EP - 10124 PB - American Chemical Society CY - Washington, DC AN - OPUS4-34796 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Streeck, C. A1 - Wirth, Thomas A1 - Unger, Wolfgang A1 - Beckhoff, B. T1 - Qualifying calibration samples for advanced thin film materials characterisation N2 - In this article the question of the certification of calibration samples for the characterisation of advanced thin film materials is addressed within the framework of reliable process control or quality management purposes. Reference measurement techniques can be used in order to address the gap in appropriate certified reference materials (CRMs) for thin film analyses. They allow for qualifying out-of-production samples originating from an operating production line as calibration samples. As a template for this procedure, CIGS [Cu(In,Ga)Se2] layers, that are absorber layers for high efficiency thin-film solar cells, have been used for establishing and validating reference-free X-ray fluorescence (XRF) analysis and Auger-electron spectroscopy (AES) as reference measurement techniques. The focus was on determining the average mole fractions in the CIGS layers obtaining results traceable to the SI unit system. Reference-free XRF is physically traceable and is based upon radiometrically calibrated instrumentation and knowledge of atomic fundamental data. Sputter-assisted AES can be established as a chemically traceable method after careful calibration using a certified reference material (CRM) based on a total number counting method. KW - CIGS KW - X-ray fluorescence (XRF) KW - Auger-electron spectroscopy (AES) PY - 2018 UR - https://www.spectroscopyeurope.com/article/qualifying-calibration-samples-advanced-thin-film-materials-characterisation VL - 30 IS - 1 SP - 11 EP - 14 PB - John Wiley & Sons Ltd CY - Chichester, West Sussex PO19 8SQ, UK AN - OPUS4-44260 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hornemann, A. A1 - Eichert, D. A1 - Flemig, Sabine A1 - Ulm, G. A1 - Beckhoff, B. T1 - Qualifying label components for effective biosensing using advanced high-throughput SEIRA methodology N2 - The need for technological progress in bio-diagnostic assays of high complexity requires both fundamental research and constructing efforts on nano-scaled assay recognition elements that can provide unique selectivity and design-enhanced sensitivity features. Nanoparticle induced sensitivity enhancement and its application related to multiplexed capability Surface-Enhanced InfraRed Absorption (SEIRA) assay formats are well suitable for these purposes. The potential of diverse fluorophore–antibody conjugates, being chemisorbed onto low-cost gold nanoparticulate SEIRA substrates, has been explored with respect to their spectral discriminability. These novel biolabels deliver molecular SEIRA fingerprints that have been successfully analyzed by both uni- and multivariate analyzing tools, to discriminate their multiplexing capabilities. We show that this robust spectral encoding via SEIRA fingerprints opens up new opportunities for a fast, reliable and multiplexed high-end screening in biodiagnostics. KW - SEIRA methodology KW - bio-diagnostic KW - nanotechnology PY - 2015 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-351389 SN - 1463-9076 SN - 1463-9084 VL - 17 IS - 14 SP - 9471 EP - 9479 PB - The Royal Soc. of Chemistry CY - Cambridge AN - OPUS4-35138 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kim, K.J. A1 - Jang, J. S. A1 - Kim, A. S. A1 - Suh, J.K. A1 - Chung, Y.-D. A1 - Hodoroaba, Vasile-Dan A1 - Wirth, Thomas A1 - Unger, Wolfgang A1 - Kang, H. J. A1 - Popov, O. A1 - Popov, I. A1 - Kuselman, I. A1 - Lee, Y. H. A1 - Sykes, D. E. A1 - Wang, M. A1 - Wang, H. A1 - Ogiwara, T. A1 - Nishio, M. A1 - Tanuma, S. A1 - Simons, D. A1 - Szakal, C. A1 - Osborn, W. A1 - Terauchi, S. A1 - Ito, M. A1 - Kurokawa, A. A1 - Fujiimoto, T. A1 - Jordaan, W. A1 - Jeong, C. S. A1 - Havelund, R. A1 - Spencer, S. A1 - Shard, A. A1 - Streeck, C. A1 - Beckhoff, B. A1 - Eicke, A. A1 - Terborg, R. T1 - CCQM pilot study P-140: Quantitative surface analysis of multi-element alloy films N2 - A pilot study for the quantitative surface analysis of multi-element alloy films has been performed by the Surface Analysis Working Group (SAWG) of the Consultative Committee for Amount of Substance (CCQM). The aim of this pilot study is to ensure the equivalency in the measurement capability of national metrology institutes for the quantification of multi-element alloy films. A Cu(In,Ga)Se2 (CIGS) film with non-uniform depth distribution was chosen as a representative multi-element alloy film. The atomic fractions of the reference and the test CIGS films were certified by isotope dilution - inductively coupled plasma/mass spectrometry. A total number counting (TNC) method was used as a method to determine the signal intensities of the constituent elements, which are compared with their certified atomic fractions. The atomic fractions of the CIGS films were measured by various methods, such as Secondary Ion Mass Spectrometry (SIMS), Auger Electron Spectroscopy (AES), X-ray Photoelectron Spectroscopy (XPS), X-Ray Fluorescence (XRF) analysis and Electron Probe Micro Analysis (EPMA) with Energy Dispersive X-ray Spectrometry (EDX). Fifteen laboratories from eight National Metrology Institutes (NMIs), one Designated Institute (DI) and six non-NMIs participated in this pilot study. Although the average atomic fractions of 18 data sets showed rather poor relative standard deviations of about 5.5 % to 6.8 %, they were greatly improved to about 1.5 % to 2.2 % by excluding 5 strongly deviating data sets from the average atomic fractions. In this pilot study, the average expanded uncertainties of SIMS, XPS, AES, XRF and EPMA were 3.84%, 3.68%, 3.81%, 2.88% and 2.90%, respectively. These values are much better than those in the key comparison K-67 for composition of a Fe-Ni alloy film. As a result, the quantification of CIGS films using the TNC method was found to be a good candidate as a subject for a CCQM key comparison. KW - CCQM KW - Pilot study KW - Surface analysis KW - Alloy films KW - CIGS PY - 2015 U6 - https://doi.org/10.1088/0026-1394/52/1A/08017 SN - 0026-1394 SN - 1681-7575 VL - 52 IS - Technical Supplement SP - Article 08017 PB - Inst. of Physics Publ. CY - Bristol AN - OPUS4-35306 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Fischer, Tobias A1 - Dietrich, Paul A1 - Streeck, C. A1 - Ray, S. A1 - Nutsch, A. A1 - Shard, A. A1 - Beckhoff, B. A1 - Unger, Wolfgang A1 - Rurack, Knut T1 - Quantification of variable functional-group densities of mixed-silane monolayers on surfaces via a dual-mode fluorescence and XPS label N2 - The preparation of aminated monolayers with a controlled density of functional groups on silica surfaces through a simple vapor deposition process employing different ratios of two suitable monoalkoxysilanes, (3-aminopropyl)diisopropylethoxysilane (APDIPES) and (3-cyanopropyl)dimethylmethoxysilane (CPDMMS), and advances in the reliable quantification of such tailored surfaces are presented here. The one-step codeposition process was carried out with binary silane mixtures, rendering possible the control over a wide range of densities in a single step. In particular, APDIPES constitutes the functional silane and CPDMMS the inert component. The procedure requires only small amounts of silanes, several ratios can be produced in a single batch, the deposition can be carried out within a few hours and a dry atmosphere can easily be employed, limiting self-condensation of the silanes. Characterization of the ratio of silanes actually bound to the surface can then be performed in a facile manner through contact angle measurements using the Cassie equation. The reliable estimation of the number of surface functional groups was approached with a dual-mode BODIPY-type fluorescence label, which allows quantification by fluorescence and XPS on one and the same sample. We found that fluorescence and XPS signals correlate over at least 1 order of magnitude, allowing for a direct linking of quantitative fluorescence analysis to XPS quantification. Employment of synchrotron-based methods (XPS; reference-free total reflection X-ray fluorescence, TXRF) made the traceable quantification of surface functional groups possible, providing an absolute reference for quantitative fluorescence measurements through a traceable measurement chain. KW - Oberflächenanalytik KW - Fluoreszenz KW - XPS KW - TXRF KW - Funktionelle Gruppen PY - 2015 U6 - https://doi.org/10.1021/ac503850f SN - 0003-2700 SN - 1520-6882 VL - 87 IS - 5 SP - 2685 EP - 2692 PB - American Chemical Society CY - Washington, DC AN - OPUS4-34470 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hornemann, A. A1 - Eichert, D. A1 - Flemig, Sabine A1 - Hoehl, A. A1 - Ulm, G. A1 - Beckhoff, B. ED - Shen, Q. ED - Nelson, C. T1 - Probing biolabels for high throughput biosensing via synchrotron radiation SEIRA technique N2 - Bio-diagnostic assays of high complexity rely on nanoscaled assay recognition elements that can provide unique selectivity and design-enhanced sensitivity features. High throughput performance requires the simultaneous detection of various analytes combined with appropriate bioassay components. Nanoparticle induced sensitivity enhancement, and subsequent multiplexed capability Surface-Enhanced InfraRed Absorption (SEIRA) assay formats are fitting well these purposes. SEIRA constitutes an ideal platform to isolate the vibrational signatures of targeted bioassay and active molecules. The potential of several targeted biolabels, here fluorophore-labeled antibody conjugates, chemisorbed onto low-cost biocompatible gold nano-aggregates substrates have been explored for their use in assay platforms. Dried films were analyzed by synchrotron radiation based FTIR/SEIRA spectro-microscopy and the resulting complex hyperspectral datasets were submitted to automated statistical analysis, namely Principal Components Analysis (PCA). The relationships between molecular fingerprints were put in evidence to highlight their spectral discrimination capabilities. We demonstrate that robust spectral encoding via SEIRA fingerprints opens up new opportunities for fast, reliable and multiplexed high-end screening not only in biodiagnostics but also in vitro biochemical imaging. T2 - 12th International Conference on Synchrotron Radiation Instrumentation (SRI) CY - New York, NY, USA DA - 06.07.2015 KW - Biolabels KW - High throughput biosensing KW - Synchrotron radiation KW - SEIRA Technique PY - 2016 U6 - https://doi.org/10.1063/1.4952927 VL - 1741 SP - Article Number: 050007 PB - AIP Conference Proceedings AN - OPUS4-40113 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Seeger, Stefan A1 - Osan, J. A1 - Czömpöly, O. A1 - Gross, A. A1 - Stosnach, H. A1 - Stabile, L. A1 - Ochsenkuehn-Petropoulou, M. A1 - Tsakanika, L. A1 - Lymperopoulou, T. A1 - Goddard, S. A1 - Fiebig, M. A1 - Gaie-Levrel, F. A1 - Kayser, Y. A1 - Beckhoff, B. T1 - Quantification of Element Mass Concentrations in Ambient Aerosols by Combination of Cascade Impactor Sampling and Mobile Total Reflection X-ray Fluorescence Spectroscopy N2 - Quantitative chemical analysis of airborne particulate matter (PM) is vital for the understanding of health effects in indoor and outdoor environments, as well as for enforcing EU air quality regulations. Typically, airborne particles are sampled over long time periods on filters, followed by lab-based analysis, e.g., with inductively coupled plasma mass spectrometry (ICP-MS). During the EURAMET EMPIR AEROMET project, cascade impactor aerosol sampling is combined for the first time with on-site total reflection X-ray fluorescence (TXRF) spectroscopy to develop a tool for quantifying particle element compositions within short time intervals and even on-site. This makes variations of aerosol chemistry observable with time resolution only a few hours and with good size resolution in the PM10 range. The study investigates the proof of principles of this methodological approach. Acrylic discs and silicon wafers are shown to be suitable impactor carriers with sufficiently smooth and clean surfaces, and a non-destructive elemental mass concentration measurement with a lower limit of detection around 10 pg/m3 could be achieved. We demonstrate the traceability of field TXRF measurements to a radiometrically calibrated TXRF reference, and the results from both analytical methods correspond satisfactorily. KW - TXRF KW - Reference method KW - Cascade impactor KW - Ambient aerosols KW - Particles KW - Air quality monitoring KW - Element mass concentration KW - Size resolved chemical composition KW - Time resolved chemical composition KW - ICP-MS PY - 2021 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-521860 UR - http://www.aerometproject.com/ SN - 2073-4433 VL - 12 IS - 3 SP - 309 EP - 337 PB - MDPI CY - Basel, Schweiz AN - OPUS4-52186 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hahn, Oliver A1 - Beckhoff, B. A1 - Seeger, Stefan A1 - Weser, J. A1 - Ulm, G. A1 - Jann, Oliver T1 - Environmental analysis by TXRF - NEXAFS and IR- spectroscopy: speciation of Br in organics and characterization of the organic matrix T2 - Healthy Buildings 2006 CY - Lisbon, Portugal DA - 2006-06-04 PY - 2006 AN - OPUS4-12312 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -