TY - CONF A1 - Schade, U. A1 - Ritter, E. A1 - Aziz, E. F. A1 - Puskar, L. A1 - Beckmann, Jörg T1 - Spectroscopic ellipsometry on liquids in the far infrared N2 - The far infrared refractive indices and the extinction coefficients of liquids can be obtained by means of spectroscopic ellipsometry in attenuated total reflection configuration. Such optical constants will contribute to a spectroscopic data base in the far infrared and terahertz spectral regions. The experimental implementation and the calibration procedure of the method are described in detail. The temperature dependency of the optical constants for water over a broad spectral range is exemplarily presented. T2 - 42nd International Conference on Infrared, Millimeter and THz Waves CY - Cancun, Mexico DA - 27.08.2017 KW - Ellipsometry KW - Far Infrared KW - ATR KW - Attenuated total reflection KW - Calibration KW - Extinction coefficients KW - Refractive index measurement KW - Spectroscopic ellipsometry KW - Far infrared refractive index KW - Terahertz spectral region KW - Optical constant KW - Attenuated total reflection configuration KW - Liquid extinction coefficient KW - Optical refraction KW - Optical variables control KW - Optical reflection KW - Liquids KW - Optical films KW - Optical polarization KW - Optical variables measurement PY - 2017 UR - http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8066931&isnumber=8066832 DO - https://doi.org/10.1109/IRMMW-THz.2017.8066931 SN - 2162-2035 SP - MD.1.5-1 EP - MD.1.5-2 PB - IEEE CY - Danvers AN - OPUS4-42028 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schade, U. A1 - Ritter, E. A1 - Bawagan, A.D.O. A1 - Beckmann, Jörg A1 - Aziz, E. F. T1 - Far-infrared absorption measurements on thin polymer films N2 - Interference fringes in the far-infrared spectra of thin films are the result of the coherent adding up of waves and can influence the spectral interpretation by concealing smaller features. A number of methods have been developed in order to eliminate such oscillating features from the transmittance spectrum. The paper critically evaluates the total transmission-reflection technique and applies the method to quantify the spectra of different polymer films. T2 - IRMMW-THz 2014 - 39th International conference on infrared, millimeter, and terahertz waves CY - Tucson, Arizona, USA DA - 14.09.2014 KW - Far-infrared spectra KW - Thin films KW - Total transmission reflection technique KW - Infrared spectroscopy KW - Light absorption KW - Light reflection KW - Polymer films KW - Far-infrared absorption measurements KW - Thin polymer films KW - Interference fringes KW - Spectral interpretation KW - Transmittance spectrum KW - Oscillating features KW - Total transmission-reflection technique KW - Interference KW - Absorption KW - Finite impulse response filters KW - Optical films KW - Optical reflection PY - 2014 UR - http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6956145&isnumber=6955975 SN - 978-1-4799-3877-3 DO - https://doi.org/10.1109/IRMMW-THz.2014.6956145 IS - IEEE Catalog No.: CFP14IMM-ART SP - 1 EP - 2 AN - OPUS4-32700 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -