TY - GEN A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Hentschel, Manfred P. ED - Cohen, L. J. T1 - Non-Destructive Characterization of High Performance Composites by use of X-Ray Refraction Topography T2 - 48th International SAMPE symposium and exhibition CY - Long Beach, CA, USA DA - 2003-05-11 KW - Non-Destructive Inspection (NDI) KW - Characterization KW - Advanced Composite PY - 2003 SN - 0-938994-94-8 VL - 1 SP - 1203 EP - 1211 PB - SAMPE International Business Office CY - Covina, Calif. AN - OPUS4-2542 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kupsch, Andreas A1 - Lange, Axel A1 - Hentschel, Manfred P. T1 - Verbesserte Computertomographie durch iterative Brennfleckentschmierung T2 - DGZfP-Jahrestagung 2009 CY - Münster, Deutschland DA - 2009-05-18 KW - Computer-Tomographie KW - Rekonstruktionsalgorithmen KW - Ortsauflösung KW - Verschmierung KW - Brennfleck PY - 2009 SN - 978-3-940283-16-0 IS - DGZfP-BB 115 SP - 1 EP - 8 AN - OPUS4-20542 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Lange, Axel T1 - Rekonstruktion limitierter computertomographischer Datensätze von PEM-Brennstoffzellen mit DIRECTT T2 - DGZfP-Jahrestagung 2010 CY - Erfurt, Germany DA - 2010-05-01 PY - 2010 AN - OPUS4-21314 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Lange, Axel T1 - Bewertung von DIRECTT CT-Rekonstruktionen T2 - DGZfP-Jahrestagung 2013 CY - Dresden, Germany DA - 2013-05-05 PY - 2013 AN - OPUS4-28492 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Lange, Axel T1 - Correction of Diffuse X-Ray Detector Based Background T2 - International Symposium on Digital Industrial Radiology and Computed Tomography (DIR 2011) CY - Berlin, Germany DA - 2011-06-20 PY - 2011 AN - OPUS4-24121 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Lange, Axel T1 - Straightforward Correction of X-Ray Detector Backlighting T2 - 18th World Conference on Nondestructive Testing CY - Durban, South Africa DA - 2012-04-16 PY - 2012 AN - OPUS4-25800 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Lange, Axel T1 - Edge Artefacts of Radiographic Images X-ray Refraction T2 - 18th World Conference on Nondestructive Testing CY - Durban, South Africa DA - 2012-04-16 PY - 2012 AN - OPUS4-25801 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kupsch, Andreas A1 - Lange, Axel A1 - Hentschel, Manfred P. T1 - Modellrekonstruktionen unvollständiger computertomographischer Datensätze T2 - DGZfP-Jahrestagung 2010 CY - Erfurt, Deutschland DA - 2010-05-10 KW - Computer-Tomographie KW - Rekonstruktionsalgorithmen KW - Limited view KW - Few angles KW - Region of interest PY - 2010 SN - 978-3-940283-26-9 IS - DGZfP-BB 122 (Poster 17) SP - 1 EP - 7 CY - Berlin AN - OPUS4-21863 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Lange, Axel T1 - Korrektur des Hinterleuchtens an CT-Sychrotrondaten T2 - DGZfP-Jahrestagung 2011 CY - Bremen, Germany DA - 2011-05-30 PY - 2011 AN - OPUS4-23768 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Ewers, Benjamin A1 - Kupsch, Andreas A1 - Lange, Axel A1 - Müller, Bernd R. A1 - Hoehl, a. A1 - Müller, R. A1 - Ulm, G. T1 - Terahertz spectral computed tomography N2 - The novel technique of spectral THz computed tomography is demonstrated at an example of a small plastic figure. The data are reconstructed by conventional filtered back-projection. The reconstruction are discussed. T2 - IRMMW-THz 2009 - 34th International conference on infrared, millimeter, and terahertz waves CY - Busan, Korea DA - 2009-09-21 KW - THz KW - Computed tomography PY - 2009 SN - 978-1-4244-2120-6 SP - 1 EP - 2(?) AN - OPUS4-20546 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Hentschel, Manfred P. A1 - Kupsch, Andreas ED - Kastner, J. T1 - A comfortable procedure for correcting X-ray detector backlight T2 - Conference on industrial computed tomography CY - Wels, Austria DA - 2012-09-19 KW - X-ray detector backlighting KW - Radiography KW - Fluorescent screen KW - Diffuse background KW - Computed tomography PY - 2012 SN - 978-3-8440-1281-1 SN - 1610-4773 SP - 151 EP - 157 PB - Shaker CY - Aachen AN - OPUS4-26768 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Hentschel, Manfred P. A1 - Lange, Axel T1 - Non-destructive evaluation of advanced materials by synchrotron radiation refraction topography PY - 2002 UR - http://www.helmholtz-berlin.de/media/media/oea/web/pr_webseite/druckschriften/berichte/bessy/annualreport2001.pdf#page=233 SN - 0179-4159 SP - 233 EP - 234 PB - Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung CY - Berlin AN - OPUS4-1326 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -