TY - CONF A1 - Elert, Anna Maria T1 - Application of NanoIR interdisciplinary research at BAM N2 - Atomic force microscopy based Infrared spectroscopy (AFM-IR) is a quickly evolving technique that provides chemical analysis and compositional mapping with spatial resolution far below conventional optical diffraction limits. This is possible since the detection method is based on a very sharp AFM tip which starts to oscillate when the sample starts to thermally expand (the changed is caused by the absorption of IR wavelength) where the thermal expansion is related to the IR absorption. This presentation briefly described the application of that new technique from polymer characterization and utilization of AFM-IR in material research, up to life science applications. T2 - AFM-IR Workshop: Nanoscale IR Spectroscopy CY - Dresden, Germany DA - 29.11.2017 KW - NanoIR KW - AFM KW - Composite KW - Polyurethane PY - 2017 AN - OPUS4-43221 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -