TY - CONF A1 - Hertwig, Andreas A1 - Martin, Sven A1 - Krüger, Jörg A1 - Kautek, Wolfgang T1 - Interaction area dependence of the ablation threshold of ion doped glass T2 - EMRS Spring Meeting 2003 T2 - EMRS Spring Meeting 2003 CY - Strasbourg, France DA - 2003-06-10 PY - 2003 AN - OPUS4-4323 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hertwig, Andreas A1 - Martin, Sven A1 - Krüger, Jörg A1 - Kautek, Wolfgang T1 - Surface damage and color centers generated by femtosecond pulses in borosilicate glass and silica T2 - 7th International Conference on Laser Ablation (COLA' 03) T2 - 7th International Conference on Laser Ablation (COLA' 03) CY - Hersonissos, Greece DA - 2003-10-05 PY - 2003 AN - OPUS4-4324 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hertwig, Andreas A1 - Martin, Sven A1 - Krüger, Jörg A1 - Kautek, Wolfgang T1 - Ultra-short Pulse Laser Safety - a Challenge to Materials Science T2 - Optical Systems Design T2 - Optical Systems Design CY - Jena, Germany DA - 2005-09-12 PY - 2005 AN - OPUS4-7894 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hertwig, Andreas A1 - Krüger, Hannes A1 - Kemnitz, E. A1 - Beck, Uwe T1 - MgF2-moderate temperature sol-gel deposition for optical UV-applications T2 - International Symposium on Fluorine Chemistry T2 - International Symposium on Fluorine Chemistry CY - Bremen, Germany DA - 2006-07-30 PY - 2006 AN - OPUS4-12524 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hertwig, Andreas A1 - Beck, Uwe T1 - Standardisation in the analysis of complex thin film systems with ellipsometry T2 - Workshop Ellipsometry 2012 T2 - Workshop Ellipsometry 2012 CY - Leipzig, Germany DA - 2012-03-05 PY - 2012 AN - OPUS4-25686 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hertwig, Andreas A1 - Beck, Uwe A1 - Nooke, Alida A1 - Krause, Andreas A1 - Lohse, Volkmar A1 - Pavlik, J. A1 - Schröder, Volkmar A1 - Steinbach, J. T1 - On the use of plasma-deposited thin films for gas sensors with read-out based on the SPR effect T2 - PSE 2012, 13th International Conference on Plasma Surface Engineering T2 - PSE 2012, 13th International Conference on Plasma Surface Engineering CY - Garmisch-Partenkirchen, Germany DA - 2012-09-10 PY - 2012 AN - OPUS4-25971 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hertwig, Andreas T1 - Charakterisierung von Oberflächen und dünnen Schichten mit Ellipsometrie T2 - BLiX-Seminar, TU Berlin T2 - BLiX-Seminar, TU Berlin CY - Berlin, Germany DA - 2012-07-10 PY - 2012 AN - OPUS4-26147 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hertwig, Andreas A1 - Nooke, Alida A1 - Beck, Uwe A1 - Krause, Andreas A1 - Kormunda, M. A1 - Pavlik, J. A1 - Steinbach, J. A1 - Krüger, Hannes A1 - Lohse, Volkmar A1 - Schröder, Volkmar T1 - Gasdetektion mit komplexen SPR-Sensoren und ellipsometrischem Messprinzip T2 - Bunsentagung 2013 T2 - Bunsentagung 2013 CY - Karlsruhe, Germany DA - 2013-05-09 PY - 2013 AN - OPUS4-28804 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hertwig, Andreas A1 - Beck, Uwe A1 - Krüger, Jörg A1 - Weise, Matthias A1 - Männ, Marion T1 - Laser Safety: Ablation thresholds of fs-Pulses vs. optical constants evaluated by spectroscopic ellipsometry T2 - 4. Workshop Ellipsometry T2 - 4. Workshop Ellipsometry CY - Berlin, Germany DA - 2006-02-20 PY - 2006 AN - OPUS4-10885 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hertwig, Andreas A1 - Beck, Uwe T1 - Qualitätssicherung mit Optischen Methoden T2 - OptecBB Jahrestreffen T2 - OptecBB Jahrestreffen CY - Mittenwalde, Germany DA - 2007-12-06 PY - 2007 AN - OPUS4-16473 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -