TY - JOUR A1 - Reiche, I. A1 - Radtke, Martin A1 - Berger, Achim A1 - Görner, Wolf A1 - Merchel, Silke A1 - Riesemeier, Heinrich A1 - Bevers, H. T1 - Spatially resolved synchrotron radiation induced X-ray fluorescence analyses of rare Rembrandt silverpoint drawings N2 - New analyses of a series of very rare silverpoint drawings that were executed by Rembrandt Harmensz. van Rijn (1606–1669) which are kept today in the Kupferstichkabinett (Museum of Prints and Drawings) of the State Museums of Berlin are reported here. Analysis of these drawings requires particular attention because the study has to be fully non-destructive and extremely sensitive. The metal alloy on the paper does not exceed some hundreds of µg/cm². Therefore, synchrotron radiation induced X-ray fluorescence (SR-XRF) is – together with external micro-proton-induced X-ray emission – the only well-suited method for the analyses of metalpoint drawings. In some primary work, about 25 German and Flemish metalpoint drawings were investigated using spatially resolved SR-XRF analysis at the BAMline at BESSY. This study enlarges the existing French–German database of metalpoint drawings dating from the 15th and 16th centuries, as these Rembrandt drawings originate from the 17th century where this graphical technique was even rarer and already obsolete. It also illustrates how SR-XRF analysis can reinforce art historical assumptions on the dating of drawings and their connection. KW - X-ray spectrometry KW - XRF KW - Röntgenfluoreszenzanalyse KW - RFA KW - Silverpoint drawing KW - Silberstiftzeichnung PY - 2006 DO - https://doi.org/10.1007/s00339-006-3505-4 SN - 0947-8396 VL - 83 IS - 2 SP - 169 EP - 173 PB - Springer CY - Berlin AN - OPUS4-12532 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Ecker, Klaus A1 - Wätjen, U. A1 - Berger, Achim A1 - Persson, L. A1 - Pritzkow, Wolfgang A1 - Radtke, Martin A1 - Riesemeier, Heinrich T1 - RBS, SY-XRF, INAA and ICP-IDMS of antimony implanted in silicon - A multi-method approach to characterize and certify a reference material N2 - A layer of Sb atoms, implanted with an energy of 400 keV and a nominal dose of 5×1016 atoms/cm2 into a high purity silicon wafer, was certified for its areal density (atoms/cm2) using Rutherford backscattering spectrometry (RBS), instrumental neutron activation analysis (INAA) and inductively coupled plasma isotope dilution mass spectrometry (ICP-IDMS) and for its isotope ratio using INAA and ICP-IDMS. Excellent agreement between the results of the different independent methods was found. In the present work, the measurements of the homogeneity of the areal density of Sb, previously determined with RBS in spots having 1 mm diameter, are improved with synchrotron X-ray fluorescence analysis: Higher precision in even smaller sample spots allows to estimate a reduced inhomogeneity of the whole batch of samples of the order of only 0.4%. Thus the uncertainty of the certified value can further be reduced. Down to fractions of a chip with 0.3×0.4 mm2 area, the areal density is now certified as (4.81±0.06)×1016 Sb atoms/cm2, where the expanded uncertainty 0.06 (coverage factor k=2) corresponds to only 1.2%. The relative merits of the different analytical methods are discussed. KW - Certified reference material KW - RBS KW - INAA KW - ICP-IDMS KW - XRF KW - SY-XRF PY - 2002 DO - https://doi.org/10.1016/S0168-583X(01)01038-2 SN - 0168-583X SN - 1872-9584 VL - 188 IS - 1-4 SP - 120 EP - 125 PB - Elsevier CY - Amsterdam AN - OPUS4-13870 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Reiche, I. A1 - Radtke, Martin A1 - Berger, Achim A1 - Görner, Wolf A1 - Ketelsen, T. A1 - Merchel, Silke A1 - Riederer, J. A1 - Riesemeier, Heinrich A1 - Roth, M. T1 - Spatially resolved synchrotron-induced X-ray fluorescence analyses of metal point drawings and their mysterious inscriptions N2 - Synchrotron-induced X-ray fluorescence (Sy-XRF) analysis was used to study the chemical composition of precious Renaissance silverpoint drawings. Drawings by famous artists such as Albrecht Dürer (1471–1528) and Jan van Eyck (approximately 1395–1441) must be investigated non-destructively. Moreover, extremely sensitive synchrotron- or accelerator-based techniques are needed since only small quantities of silver are deposited on the paper. New criteria for attributing these works to a particular artist could be established based on the analysis of the chemical composition of the metal points used. We illustrate how analysis can give new art historical information by means of two case studies. Two particular drawings, one of Albrecht Dürer, showing a profile portrait of his closest friend, “Willibald Pirckheimer” (1503), and a second one attributed to Jan van Eyck, showing a “Portrait of an elderly man”, often named “Niccolò Albergati”, are the object of intense art historical controversy. Both drawings show inscriptions next to the figures. Analyses by Sy-XRF could reveal the same kind of silverpoint for the Pirckheimer portrait and its mysterious Greek inscription, contrary to the drawing by Van Eyck where at least three different metal points were applied. Two different types of silver marks were found in this portrait. Silver containing gold marks were detected in the inscriptions and over-subscriptions. This is the first evidence of the use of gold points for metal point drawings in the Middle Ages. KW - Sy-XRF analysis KW - Drawing KW - Metal point KW - Albrecht Dürer KW - Jan van Eyck KW - Renaissance PY - 2004 DO - https://doi.org/10.1016/j.sab.2004.07.023 SN - 0584-8547 SN - 0038-6987 VL - 59 IS - 10-11 SP - 1657 EP - 1662 PB - Elsevier CY - Amsterdam AN - OPUS4-4575 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Reiche, I. A1 - Berger, Achim A1 - Görner, Wolf A1 - Merchel, Silke A1 - Radtke, Martin A1 - Riederer, J. A1 - Riesemeier, Heinrich A1 - Roth, M. T1 - Following the traces of Albrecht Dürer: analysis of silverpoint drawings by spatially resolved synchrotron-induced X-ray fluorescence analysis N2 - Spatially resolved X-ray fluorescence analysis using synchrotron radiation (SR-XRF) at the wavelength shifter beamline, BAMline, at BESSY was used to investigate Renaissance silverpoint drawings as it is extremely sensitive, non-destructive and can be carried out in air using an excitation spot in the hundred micrometer range. This paper deals with first results of the study of silverpoint drawings of Albrecht Dürer (1471–1528) belonging to the sketchbook that Albrecht Dürer used during a travel to the Netherlands in 1520/21. These results are compared to a PIXE study performed on drawings from the same sketchbook. The minor element composition of the silverpoint used for the drawings in the sketchbook was (10.6 ± 3.5) wt.% of Cu and traces of Zn. Mercury was found in the marks but does not belong to the initial composition of the silverpoint as it is attributed to an alteration phenomenon. One drawing of the sketchbook represents an exception. It consists of silver marks containing an additional minor element, Zn, in the marks and was, therefore, created with another silverpoint, probably at a different time than the other drawings. KW - Synchrotron KW - SR-XRF analysis KW - Drawing KW - Silverpoint KW - Albrecht Dürer PY - 2004 DO - https://doi.org/10.1016/j.nimb.2004.03.081 SN - 0168-583X SN - 1872-9584 VL - 226 IS - 1-2 SP - 83 EP - 91 PB - Elsevier CY - Amsterdam AN - OPUS4-4574 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Reiche, I. A1 - Berger, Achim A1 - Duval, A. A1 - Görner, Wolf A1 - Merchel, Silke A1 - Radtke, Martin A1 - Riederer, J. A1 - Riesemeier, Heinrich T1 - Metallstiftzeichnungen Albrecht Dürers KW - Synchrotron KW - XRF analysis KW - Drawings KW - Archaeometry KW - Röntgenfluoreszenzanalyse (RFA) KW - Zeichnungen KW - Archäometrie KW - Albrecht Dürer PY - 2004 SN - 1563-2628 VL - 5 IS - 2 SP - 30 EP - 38 PB - Foto Text Verl. CY - Stuttgart AN - OPUS4-3570 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kühn, Andreas A1 - Scharf, Oliver A1 - Ordavo, I. A1 - Riesemeier, Heinrich A1 - Reinholz, Uwe A1 - Radtke, Martin A1 - Berger, Achim A1 - Ostermann, Markus A1 - Panne, Ulrich T1 - Pushing the limits for fast spatially resolved elemental distribution patterns N2 - A new setup for fast spatially resolved measurements of elemental trace amounts under total reflection conditions using a new colour X-ray camera is described. Samples prepared on conventional total reflection X-ray fluorescence (TXRF) reflectors were measured at BESSY II synchrotron. A spatial resolution of 50 × 50 µm² was obtained, while the required time for the investigation of a 10 × 10 mm² sample is 30 seconds. The set-up is up to 350 times faster than conventional X-ray fluorescence systems for elemental traces. The major components of the X-ray camera are polycapillary optics and a pn-CCD chip with an active area of 13 × 13 mm². This area is divided into 264 × 264 pixels of 48 × 48 µm². A full X-ray spectrum with a resolution of 152 eV @ 5.9 keV and a chip temperature of 246 K is recorded for each pixel. The chip has a read-out rate of 400 Hz. PY - 2011 DO - https://doi.org/10.1039/c1ja10069f SN - 0267-9477 SN - 1364-5544 VL - 26 SP - 1986 EP - 1989 PB - Royal Society of Chemistry CY - London AN - OPUS4-24386 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Reiche, I. A1 - Berger, Achim A1 - Görner, Wolf A1 - Merchel, Silke A1 - Radtke, Martin A1 - Riederer, J. A1 - Riesemeier, Heinrich T1 - Silberstiftzeichnungen - Zerstörungsfreie Spurenanalyse mit Synchrotronstrahlung T2 - 10. IADA-Kongress (Internationale Arbeitsgemeinschaft der Archiv-, Bibliotheks- und Graphikrestauratoren) CY - Göttingen, Deutschland DA - 2003-09-21 PY - 2003 SN - 1563-2628 VL - 4 PB - Foto Text Verl. CY - Stuttgart AN - OPUS4-2663 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -