TY - CONF A1 - Berger, Achim A1 - Görner, Wolf A1 - Haase, Oskar T1 - With spezialized Irradiation and Detector Twins to High-Precision Photon T2 - Activation Analysis 14th Radiochemical Conference CY - Mariánské Lázne, Czech Republic DA - 2002-04-14 PY - 2002 AN - OPUS4-2969 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Berger, Achim A1 - Alber, D. T1 - Bestimmung von Kobalt in Nickel bei Gehalten im sub-mg/g Bereich T2 - GDCh Jahrestagung Chemie 2003, 19. Seminar Aktivierungsanalyse CY - Munich, Germany DA - 2003-10-06 PY - 2003 AN - OPUS4-3797 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Berger, Achim A1 - Alber, D. T1 - Bestimmung von Kobalt in Nickel bei Gehalten im sub-mu/g Bereich T2 - GDCh-Jahrestagung Chemie 2003 ; Jahrestagung der Fachgruppe Nuklearchemie ; 19. Seminar Aktivierungsanalyse CY - München, Deutschland DA - 2003-10-06 PY - 2003 SN - 3-936028-14-1 N1 - Serientitel: Kurzreferate / GDCh-Jahrestagung Chemie 2003 – Series title: Kurzreferate / GDCh-Jahrestagung Chemie 2003 IS - 5 SP - 4 PB - Gesellschaft Deutscher Chemiker CY - Frankfurt am Main AN - OPUS4-2675 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Berger, Achim A1 - Bukalis, Gregor A1 - Alber, D. T1 - Determination of cobalt in nickel in the SUB-PPM level with cold neutrons T2 - 11th International Conference on Modern Trends in Activation Analysis (MTAA-11) CY - Guildford, England DA - 2004-06-20 PY - 2004 AN - OPUS4-3635 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Görner, Wolf A1 - Berger, Achim A1 - Ecker, Klaus A1 - Haase, Oskar A1 - Hedrich, Martina A1 - Segebade, Christian A1 - Weidemann, Gerd A1 - Dudek, Gabriele T1 - Broad band application of combined instrumental photon and neutron activation analysis PY - 2001 SN - 0236-5731 SN - 1588-2780 SN - 1417-2097 N1 - Geburtsname von Dudek, Gabriele: Wermann, G. - Birth name of Dudek, Gabriele: Wermann, G. VL - 248 IS - 1 SP - 45 EP - 52 PB - Elsevier Sequoia CY - Lausanne AN - OPUS4-11229 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Reiche, I. A1 - Radtke, Martin A1 - Berger, Achim A1 - Görner, Wolf A1 - Merchel, Silke A1 - Riesemeier, Heinrich A1 - Bevers, H. T1 - Spatially resolved synchrotron radiation induced X-ray fluorescence analyses of rare Rembrandt silverpoint drawings N2 - New analyses of a series of very rare silverpoint drawings that were executed by Rembrandt Harmensz. van Rijn (1606–1669) which are kept today in the Kupferstichkabinett (Museum of Prints and Drawings) of the State Museums of Berlin are reported here. Analysis of these drawings requires particular attention because the study has to be fully non-destructive and extremely sensitive. The metal alloy on the paper does not exceed some hundreds of µg/cm². Therefore, synchrotron radiation induced X-ray fluorescence (SR-XRF) is – together with external micro-proton-induced X-ray emission – the only well-suited method for the analyses of metalpoint drawings. In some primary work, about 25 German and Flemish metalpoint drawings were investigated using spatially resolved SR-XRF analysis at the BAMline at BESSY. This study enlarges the existing French–German database of metalpoint drawings dating from the 15th and 16th centuries, as these Rembrandt drawings originate from the 17th century where this graphical technique was even rarer and already obsolete. It also illustrates how SR-XRF analysis can reinforce art historical assumptions on the dating of drawings and their connection. KW - X-ray spectrometry KW - XRF KW - Röntgenfluoreszenzanalyse KW - RFA KW - Silverpoint drawing KW - Silberstiftzeichnung PY - 2006 DO - https://doi.org/10.1007/s00339-006-3505-4 SN - 0947-8396 VL - 83 IS - 2 SP - 169 EP - 173 PB - Springer CY - Berlin AN - OPUS4-12532 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Ecker, Klaus A1 - Wätjen, U. A1 - Berger, Achim A1 - Persson, L. A1 - Pritzkow, Wolfgang A1 - Radtke, Martin A1 - Riesemeier, Heinrich T1 - RBS, SY-XRF, INAA and ICP-IDMS of antimony implanted in silicon - A multi-method approach to characterize and certify a reference material N2 - A layer of Sb atoms, implanted with an energy of 400 keV and a nominal dose of 5×1016 atoms/cm2 into a high purity silicon wafer, was certified for its areal density (atoms/cm2) using Rutherford backscattering spectrometry (RBS), instrumental neutron activation analysis (INAA) and inductively coupled plasma isotope dilution mass spectrometry (ICP-IDMS) and for its isotope ratio using INAA and ICP-IDMS. Excellent agreement between the results of the different independent methods was found. In the present work, the measurements of the homogeneity of the areal density of Sb, previously determined with RBS in spots having 1 mm diameter, are improved with synchrotron X-ray fluorescence analysis: Higher precision in even smaller sample spots allows to estimate a reduced inhomogeneity of the whole batch of samples of the order of only 0.4%. Thus the uncertainty of the certified value can further be reduced. Down to fractions of a chip with 0.3×0.4 mm2 area, the areal density is now certified as (4.81±0.06)×1016 Sb atoms/cm2, where the expanded uncertainty 0.06 (coverage factor k=2) corresponds to only 1.2%. The relative merits of the different analytical methods are discussed. KW - Certified reference material KW - RBS KW - INAA KW - ICP-IDMS KW - XRF KW - SY-XRF PY - 2002 DO - https://doi.org/10.1016/S0168-583X(01)01038-2 SN - 0168-583X SN - 1872-9584 VL - 188 IS - 1-4 SP - 120 EP - 125 PB - Elsevier CY - Amsterdam AN - OPUS4-13870 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Berger, Achim A1 - Merchel, Silke T1 - Nitrogen determination in boron carbide by IPAA and gas fusion analyses T2 - GDCh-Wissenschaftsforum Chemie 2007 CY - Ulm, Germany DA - 2007-09-16 PY - 2007 AN - OPUS4-16301 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Berger, Achim A1 - Görner, Wolf A1 - Haase, Oskar A1 - Kipphardt, Heinrich A1 - Ostermann, Markus A1 - Segebade, Christian T1 - Schritte auf dem Weg zu einer "idealen" Kernstrahlungsspektrometrie T2 - 21. Seminar Aktivierungsanalyse und Gammaspektroskopie (SAAGAS 21) CY - Mainz, Germany DA - 2007-03-21 PY - 2007 AN - OPUS4-16640 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Berger, Achim A1 - Alber, D. A1 - Bukalis, G. T1 - Determination of cobalt in nickel in the sub-ppm level with cold neutrons KW - Neutronenaktivierungsanalyse KW - Neutronenstrahl KW - Referenzmaterialien PY - 2007 SN - 0236-5731 SN - 1588-2780 SN - 1417-2097 VL - 271 IS - 1 SP - 251 EP - 253 PB - Elsevier Sequoia CY - Lausanne AN - OPUS4-14568 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Berger, Achim A1 - Merchel, Silke T1 - Nitrogen determination in boron carbide by INAA and gas fusion analysis T2 - 21. Seminar Aktivierungsanalyse und Gammaspektroskopie (SAAGAS 21) CY - Mainz, Germany DA - 2007-03-21 PY - 2007 AN - OPUS4-14637 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Merchel, Silke A1 - Berger, Achim T1 - Determination of nitrogen in boron carbide by instrumental photon activation analysis N2 - Boron carbide is widely used as industrial material, because of its extreme hardness, and as a neutron absorber. As part of a round-robin exercise leading to certification of a new reference material (ERM-ED102) which was demanded by the industry we analysed nitrogen in boron carbide by inert gas fusion analysis (GFA) and instrumental photon activation analysis (IPAA) using the 14N(γ,n)13N nuclear reaction. The latter approach is the only non-destructive method among all the methods applied. By using photons with energy below the threshold of the 12C(γ,n)11C reaction, we hindered activation of matrix and other impurities. A recently installed beam with a very low lateral activating flux gradient enabled us to homogeneously activate sample masses of approximately 1 g. Taking extra precautions, i.e. self-absorption correction and deconvolution of the complex decay curves, we calculated a nitrogen concentration of 2260 ± 100 µg g-1, which is in good agreement with our GFA value of 2303 ± 64 µg g-1. The values are the second and third highest of a rather atypical (non-S-shape) distribution of data of 14 round-robin participants. It is of utmost importance for the certification process that our IPAA value is the only one not produced by inert gas fusion analysis and, therefore, the only one which is not affected by a possible incomplete release of nitrogen from high-melting boron carbide. KW - Nitrogen KW - Reference materials KW - Gas fusion analysis KW - Photon activation analysis PY - 2007 DO - https://doi.org/10.1007/s00216-007-1217-z SN - 1618-2642 SN - 1618-2650 VL - 388 IS - 2 SP - 385 EP - 389 PB - Springer CY - Berlin AN - OPUS4-16149 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Görner, Wolf A1 - Alber, D. A1 - Berger, Achim A1 - Haase, Oskar A1 - Monse, G. A1 - Segebade, Christian T1 - BEAMGAA - A chance for high precision analysis of big samples N2 - In activation analysis of traces in small samples, the non-equivalence of the activating radiation doses of sample and calibration material gives rise to sometimes tolerable systematic errors. Conversely, analysis of major components usually demands high trueness and precision. To meet this, beam geometry activation analysis (BEAMGAA) procedures have been developed for instrumental photon (IPAA) and neutron activation analysis (INAA) in which the activating neutron/photon beam exhibits broad, flat-topped characteristics. This results in a very low lateral activating flux gradient compared to known radiation facilities, however, at significantly lower flux density. The axial flux gradient can be accounted for by a monitor-sample-monitor assembly. As a first approach, major components were determined in high purity substances as well as selenium in a cattle fodder additive. T2 - 6th International Conference "Methods and Applications of Radioanalytical Chemistry" CY - Kailua-Kona, HI, United States of America DA - 2003-04-07 KW - Beam geometry activation analysis KW - Flux gradients KW - Measurement regime KW - Representativity KW - Big samples PY - 2005 DO - https://doi.org/10.1007/s10967-005-0660-6 SN - 0236-5731 SN - 1588-2780 SN - 1417-2097 VL - 263 IS - 3 SP - 791 EP - 796 PB - Elsevier Sequoia CY - Lausanne AN - OPUS4-6907 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Segebade, Christian A1 - Berger, Achim ED - Robert A. Meyers, T1 - Photon activation analysis N2 - In photon activation analysis (PAA), nuclides of the analyte elements in the material sample under study are converted to radioactive nuclides through exposure to high-energy photons. Characteristic radiation upon disintegration of these radionuclides (preferably ? quanta) is then measured with appropriate spectrometers. PAA is not an “absolute” method; hence, the samples under investigation have to be irradiated together with a comparative material sample (calibration material) with well-known chemical composition. After spectroscopic measurement of both samples, the quantitative evaluation is performed by comparison of the two resulting element spectra, basically following the same procedure as in most instrumental methods, e.g. ICP, AAS, etc. The particular advantages of this method are freedom from blank values; reduced danger of contamination; and, since frequent investigations can be carried out “nondestructively”, easy handling of materials that are difficult to treat chemically, e.g. certain refractory metals, dusts, ashes, etc. Another advantage is the option to study very small samples (a few milligrams) as well as very large ones (up to kilogram amounts). Basically, there are no limitations concerning the nature of material studied but matrices like lead or other heavy elements raise the limit of detection considerably, and separation techniques have to be used. KW - Activation analysis KW - Electron accelerator KW - Radiation spectrometry KW - Instrumental analysis KW - Multi-element analysis KW - Radiochemical separation PY - 2008 SN - 978-0-471-97670-7 DO - https://doi.org/10.1002/9780470027318.a6211.pub2 SP - 1 EP - 23 PB - John Wiley & Sons, Ltd. AN - OPUS4-19215 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Ostermann, Markus A1 - Berger, Achim A1 - Mans, C. A1 - Simons, C. A1 - Hanning, S. A1 - Janßen, A. A1 - Kreyenschmidt, M. T1 - Results and effects of homogeneity and stability studies carried out by X-ray fluorescence on the new reference material BAM-H010 N2 - The Federal Institute for materials research and testing (BAM)in cooperation with the Fachhochschule Münster has developed a new certified polymeric reference material, BAM-H010. The reference material consists of acrylonitrile–butadiene–styrene terpolymer (ABS) and has been doped with different contents of the elements Br, Cd, Cr, Hg and Pb. The monitoring of these elements is demanded in the EU directive 2002/95/EG, commonly referred to as RoHS. We have shown that the uncertainty contribution of the thermal long-term stability (ustability) is negligible compared to the contribution to the uncertainty caused by the method used for the characterization of the elemental content and the batch inhomogeneity (uhomogeneity). The stability of theABS material during exposure of the samples with hard X-radiation leads to a degradation of the ABS matrix with either long- or short-chain products. KW - Reference material KW - Plastic KW - RoHS KW - WEEE KW - X-ray fluorescence PY - 2011 DO - https://doi.org/10.1007/s00769-011-0806-x SN - 0949-1775 SN - 1432-0517 VL - 16 IS - 10 SP - 515 EP - 522 PB - Springer CY - Berlin AN - OPUS4-24249 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Ma, L. A1 - Feng, L. A1 - Hioki, A. A1 - Cho, K.H. A1 - Vogl, Jochen A1 - Berger, Achim A1 - Turk, G. A1 - Macleod, S. A1 - Labarraque, G. A1 - Tong, W.F. A1 - Schiel, D. A1 - Yafa, C. A1 - Valiente, L. A1 - Konopelko, L.A. A1 - Quetel, C. A1 - Vermaercke, P. A1 - Manzano, J.V.L. A1 - Linsky, M. A1 - Cortés, E. A1 - Tangpitayakul, S. A1 - Plangsangmas, L. A1 - Bergamaschi, L. A1 - Hearn, R. T1 - International comparison of the determination of the mass fraction of cadmium, chromium, mercury and lead in polypropylene: the Comité Consultatif pour la quantité de matière pilot study CCQM-P106 KW - Cadmium KW - Chromium KW - Mercury KW - Lead KW - Polypropylene KW - CCQM PY - 2010 DO - https://doi.org/10.1007/s00769-009-0574-z SN - 0949-1775 SN - 1432-0517 VL - 15 IS - 1 SP - 39 EP - 44 PB - Springer CY - Berlin AN - OPUS4-20787 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Berger, Achim A1 - Ecker, Klaus A1 - Pritzkow, Wolfgang A1 - Riesemeier, Heinrich A1 - Vogl, Jochen T1 - Bestimmung von ionen-implantiertem Molybdän in Halbleitersilizium T2 - 20. Seminar Aktivierungsanalyse, TU München/Garching CY - Munich, Germany DA - 2005-02-24 PY - 2005 AN - OPUS4-11623 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Berger, Achim A1 - Ecker, Klaus A1 - Pritzkow, Wolfgang A1 - Radtke, Martin A1 - Vogl, Jochen A1 - Riesemeier, Heinrich T1 - Bestimmung von ionen-implantiertem Molybdän in Halbleitersilizium T2 - Tag der Chemie, Freie Universität Berlin CY - Berlin, Germany DA - 2005-06-08 PY - 2005 AN - OPUS4-7460 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Pritzkow, Wolfgang A1 - Vogl, Jochen A1 - Berger, Achim A1 - Ecker, Klaus A1 - Grötzschel, R. A1 - Klingbeil, Patrick A1 - Persson, L. A1 - Riebe, Gundel A1 - Wätjen, U. T1 - Contribution of ICP-IDMS to the certification of antimony implanted in a silicon wafer - comparison with RBS and INAA results N2 - A thin-layer reference material for surface and near-surface analytical methods was produced and certified. The surface density of the implanted Sb layer was determined by Rutherford backscattering spectrometry (RBS), instrumental neutron activation analysis (INAA), and inductively coupled plasma isotope dilution mass spectrometry (ICP-IDMS) equipped with a multi-collector. The isotopic abundances of Sb (121Sb and 123Sb) were determined by multi-collector ICP-MS and INAA. ICP-IDMS measurements are discussed in detail in this paper. All methods produced values traceable to the SI and are accompanied by a complete uncertainty budget. The homogeneity of the material was measured with RBS. From these measurements the standard uncertainty due to possible inhomogeneities was estimated to be less than 0.78% for fractions of the area increments down to 0.75 mm2 in size. Excellent agreement between the results of the three different methods was found. For the surface density of implanted Sb atoms the unweighted mean value of the means of four data sets is 4.8121016 cm-2 with an expanded uncertainty (coverage factor k=2) of 0.0921016 cm-2. For the isotope amount ratio R (121Sb/123Sb) the unweighted mean value of the means of two data sets is 1.435 with an expanded uncertainty (coverage factor k=2) of 0.006. KW - ICP-MS KW - IDMS KW - Reference material KW - Surface analysis PY - 2001 DO - https://doi.org/10.1007/s002160100987 SN - 0937-0633 VL - 371 SP - 867 EP - 873 PB - Springer CY - Berlin AN - OPUS4-7220 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Balski, Matthias A1 - Kipphardt, Heinrich A1 - Berger, Achim A1 - Meyer, S. A1 - Panne, Ulrich T1 - Determination of impurities in solar grade silicon by inductively coupled plasma sector field mass spectrometry (ICP-SFMS) subsequent to matrix evaporation N2 - A method for the determination of 22 trace impurities in solar grade silicon after dissolution in a mixture of HF and HNO3 and subsequent matrix evaporation is reported. The presented method involves a simple, inexpensive, one-vessel sample preparation apparatus design. The recoveries of B, Na, Mg, Al, P, K, Ca, Ti, Cr, Mn, Fe, Co, Ni, Cu, Zn, Ga, Ge, As, Mo, Sb, W, and Tl at 250 µg kg-1 level are in the range of 93 to 108%. After careful selection of monitored isotopes and their respective resolutions, a sector field mass spectrometer has been used to carry out the measurements. Limits of determination down to 120 ng kg-1 have been obtained using a calibration by three-point standard addition. The method was tested on diluted NIST SRM 57b silicon powder as well as on synthetic test samples and also applied successfully on raw solar grade silicon samples in an interlaboratory comparison including NAA. KW - Solar grade silicon KW - Matrix separation KW - Sector field mass spectrometry PY - 2014 DO - https://doi.org/10.1039/C3AY41213J SN - 1759-9660 SN - 1759-9679 VL - 6 IS - 1 SP - 77 EP - 85 PB - RSC Publ. CY - Cambridge AN - OPUS4-29893 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -