TY - JOUR A1 - Seah, M.P. A1 - Spencer, S.J. A1 - Bensebaa, F. A1 - Vickridge, I. A1 - Danzebrink, H. A1 - Krumrey, M. A1 - Gross, Thomas A1 - Österle, Werner A1 - Wendler, E. A1 - Rheinländer, B. A1 - Azuma, Y. A1 - Kojima, I. A1 - Suzuki, N. A1 - Suzuki, M. A1 - Tanuma, S. A1 - Moon, D.W. A1 - Lee, H.J. A1 - Cho, H.M. A1 - Chen, H.Y. A1 - Wee, A. T. S. A1 - Osipowicz, T. A1 - Pan, J.S. A1 - Jordaan, W.A. A1 - Hauert, R. A1 - Klotz, U. A1 - van der Marel, C. A1 - Verheijen, M. A1 - Tamminga, Y. A1 - Jeynes, C. A1 - Bailey, P. A1 - Biswas, S. A1 - Falke, U. A1 - Nguyen, N.V. A1 - Chandler-Horowitz, D. A1 - Ehrstein, J.R. A1 - Muller, D. A1 - Dura, J.A. T1 - Critical review of the current status of thickness measurements for ultrathin SiO2 on Si - Part V: Results of a CCQM pilot study N2 - Results are reported from a pilot study under the Consultative Committee for Amount of Substance (CCQM) to compare measurements of and resolve any relevant measurement issues in, the amount of thermal SiO2 oxide on (100) and (111) orientation Si wafer substrates in the thickness range 1.5 - 8 nm. As a result of the invitation to participate in this activity, 45 sets of measurements have been made in different laboratories using 10 analytical methods: medium-energy ion scattering spectrometry (MEIS), nuclear reaction analysis (NRA), RBS, elastic backscattering spectrometry (EBS), XPS, SIMS, ellipsometry, grazing-incidence x-ray reflectrometry (GIXRR), neutron reflectometry and transmission electron microscopy (TEM). The measurements are made on separate sets of 10 carefully prepared samples, all of which have been characterised by a combination of ellipsometry and XPS using carefully established reference conditions and reference parameters. The results have been assessed against the National Physical Laboratory (NPL) data and all show excellent linearity. The remaining data sets correlate with the NPL data with average root-mean-square scatters of 0.15 nm, half being better than 0.1 nm and a few at or better than 0.05 nm. Each set of data allows a relative scaling constant and a zero thickness offset to be determined. Each method has an inherent zero thickness offset between 0 nm and 1 nm and it is these offsets, measured here for the first time, that have caused many problems in the past. There are three basic classes of offset: water and carbonadeous contamination equivalent to ~1 nm as seen by ellipsometry; adsorbed oxygen mainly from water at an equivalent thickness of 0.5 nm as seen by MEIS, NRA, RBS and possibly GIXRR; and no offset as seen by XPS using the Si 2p peaks. Each technique has a different uncertainty for the scaling constant and consistent results have been achieved. X-Ray photoelectron spectroscopy has large uncertainties for the scaling constant but a high precision and, critically, if used correctly, has zero offset. Thus, a combination of XPS and the other methods allows the XPS scaling constant to be determined with low uncertainty, traceable via the other methods. XPS laboratories returning results early were invited to test a new reference procedure. All showed very significant improvements. The reference attenuation lengths thus need scaling by 0.986 ± 0.009 (at an expansion factor of 2) deduced from the data for the other methods. Several other methods have small offsets and, to the extent that these can be shown to be constant or measurable, then these methods will also show low uncertainty. Recommendations are provided for parameters for XPS, MEIS, RBS and NRA to improve their accuracy. KW - Calibration KW - Ellipsometry KW - GIXRR KW - Interlaboratory study KW - MEIS KW - Neutron reflectometry KW - NRA KW - RBS KW - Silicon dioxide KW - SIMS KW - XPS PY - 2004 DO - https://doi.org/10.1002/sia.1909 SN - 0142-2421 SN - 1096-9918 VL - 36 IS - 9 SP - 1269 EP - 1303 PB - Wiley CY - Chichester AN - OPUS4-5549 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - RPRT A1 - Seah, M.P. A1 - Spencer, S.J. A1 - Bensebaa, F. A1 - Vickridge, I. A1 - Danzebrink, H. A1 - Krumrey, M. A1 - Gross, Thomas A1 - Österle, Werner A1 - Wendler, E. A1 - Rheinländer, B. A1 - Azuma, Y. A1 - Kojima, I. A1 - Suzuki, N. A1 - Suzuki, M. A1 - Tanuma, S. A1 - Moon, D.W. A1 - Lee, H.J. A1 - Cho, H.M. A1 - Chen, H.Y. A1 - Wee, A. T. S. A1 - Osipowicz, T. A1 - Pan, J.S. A1 - Jordaan, W.A. A1 - Hauert, R. A1 - Klotz, U. A1 - van der Marel, C. A1 - Verheijen, M. A1 - Tamminga, Y. A1 - Jeynes, C. A1 - Bailey, P. A1 - Biswas, S. A1 - Falke, U. A1 - Nguyen, N.V. A1 - Chandler-Horowitz, D. A1 - Ehrstein, J.R. A1 - Muller, D. A1 - Dura, J.A. T1 - Ultra-thin SiO2 on Si, Part V: Results of a CCQM Pilot Study of Thickness Measurements KW - SiO2 KW - Thin films KW - Thickness KW - XPS KW - Ellipsometry KW - TEM PY - 2003 SN - 1473-2734 SP - 57 pages AN - OPUS4-4118 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Schlaad, H. A1 - Müller, A. H. E. A1 - Kolshorn, H. A1 - Krüger, Ralph-Peter T1 - Mechanism of anionic polymerization of (meth)acrylates in the presence of aluminium alkyls PY - 1995 SN - 0170-0839 SN - 1436-2449 VL - 35 SP - 169 EP - 176 PB - Springer CY - Berlin AN - OPUS4-2144 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Spickermann, J. A1 - Martin, K. A1 - Räder, H.J. A1 - Müllen, K. A1 - Schlaad, H. A1 - Müller, A. H. E. A1 - Krüger, Ralph-Peter T1 - Quantitative analysis of broad molecular weight distributions obtained by MALDI-TOF mass spectrometry PY - 1996 SN - 1469-0667 SN - 1356-1049 SN - 1365-0718 IS - 2 SP - 161 EP - 165 PB - IM Publications CY - Chichester AN - OPUS4-2153 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kind, L. A1 - Plamper, F.A. A1 - Göbel, R. A1 - Mantion, Alexandre A1 - Müller, A. H. E. A1 - Pieles, U. A1 - Taubert, A. A1 - Meier, W. T1 - Silsesquioxane/polyamine nanoparticle-templated formation of star- or raspberry-like silica nanoparticles KW - Silica nanoparticles KW - 3D TEM KW - Star-shaped nanoparticles KW - Raspberry-shaped nanoparticles PY - 2009 DO - https://doi.org/10.1021/la900229n SN - 0743-7463 SN - 1520-5827 VL - 25 IS - 12 SP - 7109 EP - 7115 PB - American Chemical Society CY - Washington, DC AN - OPUS4-19580 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, B. A1 - Dahms, A. A1 - Knudsen, H.N. A1 - Afshari, A. A1 - Wargocki, P. A1 - Olesen, B. A1 - Berglund, B. A1 - Ramalho, O. A1 - Goschnick, J. A1 - Häringer, D. A1 - Jann, Oliver A1 - Horn, Wolfgang A1 - Nesa, D. A1 - Chanie, E. A1 - Ruponen, M. A1 - Müller, D. T1 - Measuring perceived air quality and intensity by a Sensor System, the European Project SysPAQ T2 - Indoor Air 2008, 11th International Conference on Indoor Air Quality and Climate CY - Copenhagen, Denmark DA - 2008-08-17 KW - Perceived air quality KW - Perceived odour intensity KW - Profiling KW - Sensor system PY - 2008 IS - Paper ID: 530 SP - 1 EP - 8 AN - OPUS4-18302 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, B. A1 - Bitter, F. A1 - Müller, D. A1 - Knudsen, H.N. A1 - Afshari, A. A1 - Wargocki, P. A1 - Olesen, B. A1 - Berglund, B. A1 - Ramalho, O. A1 - Goschnick, J. A1 - Jann, Oliver A1 - Horn, Wolfgang A1 - Nesa, D. A1 - Chanie, E. A1 - Ruponen, M. T1 - Messung der empfundenen Geruchsintensität mit Multigas-Sensorsystemen, das Forschungsvorhaben SysPAQ KW - Geruch KW - Sensorsystem KW - Perceived Air Quality KW - Produkttypischer Geruch KW - Bauprodukte KW - Emissionen PY - 2007 SN - 978-3-18-091995-9 SN - 0083-5560 IS - 1995 SP - 17 EP - 29 PB - VDI-Verl. CY - Düsseldorf AN - OPUS4-16370 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Falkenhagen, Jana A1 - Much, Helmut A1 - Stauf, W. A1 - Müller, A. H. E. T1 - Characterization of block copolymers by liquid adsorption chromatography at critical conditions. 1. Diblock copolymers N2 - Liquid adsorption chromatography at critical conditions (LACCC) in normal and in reversed-phase modes provides independent information on the molar mass distributions of both blocks of poly(methyl methacrylate)-block-poly(tert-butyl methacrylate), even if no information about the precursor is available. In addition, the amount of unreacted precursor can be determined, even if its molar mass is comparable to that of the total block copolymer. The reversal of elution order by changing of stationary and mobile phases makes it possible to independently characterize each block in the SEC mode of the LACCC system. Thus, complete structural information is obtained even without using two-dimensional chromatographic techniques. PY - 2000 DO - https://doi.org/10.1021/ma991903j SN - 0024-9297 SN - 1520-5835 VL - 33 IS - 10 SP - 3687 EP - 3693 PB - American Chemical Society CY - Washington, DC AN - OPUS4-2172 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Falkenhagen, Jana A1 - Much, Helmut A1 - Stauf, W. A1 - Müller, A. H. E. T1 - Characterization of di- and triblock copolymers using coupled chromatogreaphic methods PY - 1999 SN - 0032-3934 VL - 40 IS - 2 SP - 984 EP - 985 PB - American Chemical Society CY - Newark, NJ AN - OPUS4-2183 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Apel, E. A1 - Deubener, J. A1 - Bernard, A. A1 - Müller, Ralf A1 - Kappert, H. A1 - Rheinberger, V. A1 - Höland, W. T1 - Phenomena and mechanisms of crack propagation in glass-ceramics N2 - Lithium disilicate, leucite and apatite glass-ceramics have become state-of-the-art framework materials in the fabrication of all-ceramic dental restorative materials. The goal of this study was to examine the crack propagation behaviour of these three known glass-ceramic materials after they have been subjected to Vickers indentation and to characterize their crack opening profiles (δmeas vs. (a-r)). For this purpose, various methods of optical examination were employed. Optical microscopy investigations were performed to examine the crack phenomena at a macroscopic level, while high-resolution techniques, such as scanning electron microscopy (SEM) and atomic force microscopy (AFM), were employed to investigate the crack phenomena at a microscopic level. The crack patterns of the three glass-ceramics vary from fairly straightforward to more complex, depending on the amount of residual glass matrix present in the material. The high-strength lithium disilicate crystals feature a high degree of crosslinking, thereby preventing crack propagation. In this material, the crack propagates only through the residual glass phase, which constitutes 30%–40% by volume. Having a high glass content of more than 65% by volume, the leucite and apatite glass-ceramics show far more complex crack patterns. Cracks in the leucite glass-ceramic propagate through both the glass and crystal phase. The apatite glass-ceramic shows a similar crack behaviour as an inorganic–organic composite material containing nanoscale fillers, which are pulled out in the surroundings of the crack tip. The observed crack behaviour and the calculated View the MathML source values of the three types of glass-ceramics were compared to the Kkic values determined according to the SEVNB method. KW - Glass KW - Viscosity KW - Water content PY - 2008 DO - https://doi.org/10.1016/j.jmbbm.2007.11.005 SN - 1751-6161 VL - 1 IS - 4 SP - 313 EP - 325 PB - Elsevier CY - Amsterdam AN - OPUS4-18308 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -