TY - CONF A1 - Salge, T. A1 - Terborg, R. A1 - Ball, A. D. A1 - Broad, G.R. A1 - Kearsley, A.T. A1 - Jones, C.G. A1 - Smith, C. A1 - Rades, Steffi A1 - Hodoroaba, Vasile-Dan ED - Hozak, P. T1 - Advanced SEM/EDS analysis using an annular silicon drift detector (SDD): Applications in nano, life, earth and planetary sciences below micrometer scale N2 - Analysis of fine-scale structures requires low accelerating voltages. Consequently, only low to intermediate energy X-ray lines with many peak overlaps can be evaluated which requires deconvolution. Examination of nano-scale structures also requires low probe currents which would give low X-ray count rates with traditional EDX detectors. The additional time required to acquire sufficient data for deconvolution risks altering the specimen as a result of beam-sample interaction or sample contamination. The BRUKER XFIash 5060F SDD has allowed us to overcome these limitations and offers additional benefits as we demonstrate here. T2 - IMC 2014 - 18th International microscopy congress CY - Prague, Czech Republic DA - 07.09.2014 PY - 2014 SN - 978-80-260-6720-7 SP - IT-5-P-1842, 1-2 AN - OPUS4-31944 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kowalewsky, Helmut A1 - Droste, Bernhard A1 - Neumeyer, Tino A1 - Burnay, S.G. A1 - Ball, M. H. A1 - Morton, D.A.V. A1 - Smith, P.N. A1 - Tuson, A.T. ED - Droste, B. ED - Kowalewsky, H. T1 - Safety assessment of leaktightness criteria for radioactive materials transport packages T2 - PATRAM 98 - 12th International conference on the packaging and transportation of radioactive materials CY - Paris, France DA - 1998-05-10 PY - 1998 VL - 2 SP - 543 EP - 550 PB - Nuclear Technology Publishing CY - Paris, France AN - OPUS4-21599 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -