TY - JOUR A1 - Pavlenko, E. S. A1 - Sander, M. A1 - Mitzscherling, Steffen A1 - Pudell, J. A1 - Zamponi, F. A1 - Rössle, M. A1 - Bojahr, A. A1 - Bargheer, M. T1 - Azobenzene – functionalized polyelectrolyte nanolayers as ultrafast optoacoustic transducers JF - Nanoscale N2 - We introduce azobenzene-functionalized polyelectrolyte multilayers as efficient, inexpensive optoacoustic transducers for hyper-sound strain waves in the GHz range. By picosecond transient reflectivity measurements we study the creation of nanoscale strain waves, their reflection from interfaces, damping by scattering from nanoparticles and propagation in soft and hard adjacent materials like polymer layers, quartz and mica. The amplitude of the generated strain ε∼5×10−4 is calibrated by ultrafast X-ray diffraction. KW - Picosecond acoustic KW - Ultrafast optoacoustic KW - Nanolayer KW - Polyelectrolyte PY - 2016 DO - https://doi.org/10.1039/c6nr01448h SN - 2040-3364 SN - 2040-3372 VL - 8 IS - 27 SP - 13297 EP - 13302 AN - OPUS4-37079 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Schick, D. A1 - Herzog, M. A1 - Bojahr, A. A1 - Leitenberger, W. A1 - Hertwig, Andreas A1 - Shayduk, R. A1 - Bargheer, M. T1 - Ultrafast lattice response of photoexcited thin films studied by X-ray diffraction JF - Structural dynamics N2 - Using ultrafast X-ray diffraction, we study the coherent picosecond lattice dynamics of photoexcited thin films in the two limiting cases, where the photoinduced stress profile decays on a length scale larger and smaller than the film thickness. We solve a unifying analytical model of the strain propagation for acoustic impedance-matched opaque films on a semi-infinite transparent substrate, showing that the lattice dynamics essentially depend on two parameters: One for the spatial profile and one for the amplitude of the strain. We illustrate the results by comparison with high-quality ultrafast X-ray diffraction data of SrRuO3 films on SrTiO3 substrates. KW - Festkörperphysik KW - Dünnschichttechnik KW - Ellipsometrie KW - Röntgenbeugung KW - Optische Konstanten PY - 2014 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-322471 DO - https://doi.org/10.1063/1.4901228 SN - 2329-7778 VL - 1 IS - 6 SP - 064501-1 - 064501-13 PB - AIP Publishing LLC CY - Melville, NY AN - OPUS4-32247 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -