TY - JOUR A1 - Bjeoumikhov, A. A1 - Arkadiev, V. A1 - Eggert, F. A1 - Hodoroaba, Vasile-Dan A1 - Langhoff, N. A1 - Procop, Mathias A1 - Rabe, J. A1 - Wedell, R. T1 - A new microfocus x-ray source, iMOXS, for highly sensitive XRF analysis in scanning electron microscopes N2 - Scanning electron microscopes are usually equipped with energy-dispersive X-ray detectors for electron probe microanalysis. This widespread analytical method allows investigators to determine the elemental composition of specimens with a spatial resolution of about 1 µm. However, owing to the electron-specimen interaction, the emitted spectra reveal, in addition to characteristic lines, also a high level of continuous bremsstrahlung background. As a result, elements with low concentrations cannot be identified. The minimum detection limit can be diminished by two orders of magnitude if the characteristic lines are excited as fluorescence by an additional x-ray source. In this case, the emergence of bremsstrahlung is considerably reduced. Combining a high-brilliance microfocus x-ray tube with efficient polycapillary optics enables one to realize an experimental arrangement for performing local fluorescence analysis at the same point where the electron beam hits the sample. The polycapillary optics under consideration focuses the emitted x-radiation onto focal spots between 30 and 100 µm in diameter. Count rates of several thousands cps have been achieved. Elemental maps have been obtained by means of the motorized specimen stage of the microscope. Copyright © 2005 John Wiley & Sons, Ltd. KW - Micro-XRF KW - Microfocus x-ray source KW - EPMA KW - SEM PY - 2005 U6 - https://doi.org/10.1002/xrs.872 SN - 0049-8246 VL - 34 IS - 6 SP - 493 EP - 497 PB - Wiley CY - Chichester AN - OPUS4-11228 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Bjeoumikhov, A. A1 - Bjeoumikhova, Zemfira A1 - Riesemeier, Heinrich A1 - Radtke, Martin A1 - Wedell, R. T1 - Propagation of synchrotron radiation through nanocapillary structures N2 - The propagation of synchrotron radiation through nanocapillary structures with channel sizes of 200 nm and periods in the micrometer size has been studied experimentally. It was shown that the propagation through individual capillary channels has a mode formation character. Furthermore it was shown that during the propagation through capillary channels the coherence of synchrotron radiation is partially conserved. Interference of beams propagating through different capillary channels is observed which leads to a periodically modulated distribution of the radiation intensity in a plane far from the exit of the structure. These investigations are of high relevance for the understanding of X-ray transmission through nanocapillaries and the appearance of wave properties at this size scale. KW - Polycapillary structure KW - Nanocapillary KW - X-ray optics KW - Wave properties KW - Synchrotron radiation KW - X-ray diffraction PY - 2007 U6 - https://doi.org/10.1016/j.physleta.2007.01.092 SN - 0031-9163 SN - 0375-9601 VL - 366 IS - 4-5 SP - 283 EP - 288 PB - North-Holland Publ. Co. CY - Amsterdam AN - OPUS4-20580 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Bjeoumikhov, A. A1 - Erko, M. A1 - Bjeoumikhova, Zemfira A1 - Erko, A. A1 - Snigireva, I. A1 - Snigirev, A. A1 - Wolff, Timo A1 - Mantouvalou, I. A1 - Malzer, W. A1 - Kanngießer, B. T1 - Capillary µFocus X-ray lenses with parabolic and elliptic profile KW - Synchrotron radiation KW - Capillary optics KW - Beamline optics PY - 2008 U6 - https://doi.org/10.1016/j.nima.2008.01.087 SN - 0168-9002 SN - 0167-5087 VL - 587 IS - 2-3 SP - 458 EP - 463 PB - North-Holland CY - Amsterdam AN - OPUS4-18922 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Nowak, S. H. A1 - Petric, M. A1 - Buchriegler, J. A1 - Bjeoumikhov, A. A1 - Bjeoumikhova, Z. A1 - von Borany, J. A1 - Munnik, F. A1 - Radtke, Martin A1 - Renno, A. D. A1 - Reinholz, Uwe A1 - Scharf, O. A1 - Tilgner, J. A1 - Wedell, R. T1 - Road to micron resolution with a color X-ray camera – polycapillary optics characterization N2 - In a color X-ray camera spatial resolution is achieved by means of a polycapillary optic conducting X-ray photons from small regions on a sample to distinct energy dispersive pixels on a CCD matrix. At present, the resolution limit of color X-ray camera systems can go down to several microns and is mainly restricted by Pixel dimensions. The recent development of an efficient subpixel resolution algorithm allows a release from pixel size, limiting the resolution only to the quality of theoptics. In this work polycapillary properties that influence the spatial resolution are systematized and assessed both theoretically and experimentally. It is demonstrated that with the current technological Level reaching one micron resolution is challenging, but possible. KW - Color X-ray camera KW - Polycapillary optics PY - 2017 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-404404 UR - https://arxiv.org/abs/1705.08939 SN - 2331-8422 SP - 1 EP - 11 PB - Cornell University CY - Ithaca, NY AN - OPUS4-40440 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Nowak, S.H. A1 - Bjeoumikhov, A. A1 - Von Borany, J. A1 - Buchriegler, J. A1 - Munnik, F. A1 - Petric, M. A1 - Radtke, Martin A1 - Renno, A.D. A1 - Reinholz, Uwe A1 - Scharf, O. A1 - Wedell, R. T1 - Sub-pixel resolution with a color X-ray camera N2 - The color X-ray camera SLcam® is a full-field, single photon detector providing scanning-free, energy and spatially resolved X-ray imaging. Spatial resolution is achieved with the use of polycapillary optics guiding X-ray photons from small regions on a sample to distinct energy dispersive pixels on a charged-coupled device detector. Applying sub-pixel resolution, signals from individual capillary channels can be distinguished. Therefore, the SLcam® spatial resolution, which is normally limited to the pixel size of the charge-coupled device, can be improved to the size of individual polycapillary channels. In this work a new approach to a sub-pixel resolution algorithm comprising photon events also from the pixel centers is proposed. The details of the employed numerical method and several sub-pixel resolution examples are presented and discussed. KW - Color X-ray camera KW - Sub pixel analysis PY - 2015 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-334948 SN - 0267-9477 SN - 1364-5544 SP - 1890 EP - 1897 PB - Royal Society of Chemistry CY - London AN - OPUS4-33494 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Nowak, S.H. A1 - Bjeoumikhov, A. A1 - Von Borany, J. A1 - Buchriegler, J. A1 - Munnik, F. A1 - Petric, M. A1 - Renno, A.D. A1 - Radtke, Martin A1 - Reinholz, Uwe A1 - Scharf, O. A1 - Strüder, L. A1 - Wedell, R. A1 - Ziegenrücker, R. T1 - Examples of XRF and PIXE imaging with few microns resolution using SLcam® a color X-ray camera N2 - We present results of recent development of the color X-ray camera, type SLcam®, allowing detection of X-ray images with few microns resolution. Such spectral resolution is achieved with the use of high-quality polycapillary optics combined with sub-pixel resolution. Imaging of Siemens star resolution test chart reveals that the resolution limit of SLcam® can go down to nearly 5µm. Several real sample examples of measurements carried out at the laboratory, synchrotron, and particle-induced X-ray emission beamlines are shown. This is the first time SLcam® is used as particle-induced X-ray emission detector. KW - X-ray KW - Color X-ray camera KW - CXC KW - Synchrotron radiation KW - BESSY KW - BAMline PY - 2015 U6 - https://doi.org/10.1002/xrs.2590 SN - 0049-8246 VL - 44 IS - 3 SP - 135 EP - 140 PB - Wiley & Sons, Ltd. CY - Chichester AN - OPUS4-33170 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Ordavo, I. A1 - Ihle, S. A1 - Arkadiev, V. A1 - Scharf, Oliver A1 - Soltau, H. A1 - Bjeoumikhov, A. A1 - Bjeoumikhova, S. A1 - Buzanich, Günter A1 - Gubzhokov, R. A1 - Günther, A. A1 - Hartmann, R. A1 - Holl, P. A1 - Kimmel, N. A1 - Kühbacher, M. A1 - Lang, M. A1 - Langhoff, N. A1 - Liebel, A. A1 - Radtke, Martin A1 - Reinholz, Uwe A1 - Riesemeier, Heinrich A1 - Schaller, G. A1 - Schopper, F. A1 - Strüder, L. A1 - Thamm, C. A1 - Wedell, R. T1 - A new pnCCD-based color X-ray camera for fast spatial and energy-resolved measurements N2 - We present a new high resolution X-ray imager based on a pnCCD detector and a polycapillary optics. The properties of the pnCCD like high quantum efficiency, high energy resolution and radiation hardness are maintained, while color corrected polycapillary lenses are used to direct the fluorescence photons from every spot on a sample to a corresponding pixel on the detector. The camera is sensitive to photons from 3 to 40 keV with still 30% quantum efficiency at 20 keV. The pnCCD is operated in split frame mode allowing a high frame rate of 400 Hz with an energy resolution of 152 eV for Mn Kα (5.9 keV) at 450 kcps. In single-photon counting mode (SPC), the time, energy and position of every fluorescence photon is recorded for every frame. A dedicated software enables the visualization of the elements distribution in real time without the need of post-processing the data. A description of the key components including detector, X-ray optics and camera is given. First experiments show the capability of the camera to perform fast full-field X-Ray Fluorescence (FF-XRF) for element analysis. The imaging performance with a magnifying optics (3×) has also been successfully tested. KW - X-ray CCD camera KW - pnCCD KW - Fast X-ray imaging KW - XRF KW - Full-field X-ray fluorescence KW - Elemental analysis KW - High quantum efficiency KW - High energy resolution KW - Polycapillary optics PY - 2011 U6 - https://doi.org/10.1016/j.nima.2011.05.080 SN - 0168-9002 SN - 0167-5087 VL - 654 SP - 250 EP - 257 PB - North-Holland CY - Amsterdam AN - OPUS4-24370 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Ostermann, Markus A1 - Kühn, Andreas A1 - Bjeoumikhov, A. A1 - Wedell, R. T1 - Einsatz der Röntgenfluoreszenzanalyse in der Prozessanalytik N2 - Elementanalyse mit Röntgenfluoreszenzspektrometrie direkt am Materialstrom in Produktionsprozessen gewinnt zunehmend an Bedeutung. Die Röntgenfluoreszenzspektrometrie kann aufgrund der technischen Entwicklung mittlerweile ohne aufwändige Probenvorbereitung als aussagekräftige Informationsquelle für Stoffparameter im industriellen Prozess eingesetzt werden. Der Einsatz von online Röntgenfluoreszenzanalyse zahlt sich sowohl finanziell als auch zeitlich schnell aus, da sie sowohl für den ökonomischen Einsatz von Rohmaterialien, als auch z. B. im Materialrecycling zu gebrauchen ist. In diesem Beitrag werden vier unterschiedliche Einsatzmöglichkeiten beschrieben. N2 - Elemental analysis directly at the material stream of production processes using X-ray fluorescence spectrometry is gathering importance. Thanks to technical developments, X-ray fluorescence analysis can be used as information source in the elemental analysis of material in industrial processes without tedious sample preparation steps. The employment of online X-ray fluorescence analysis pays off both in financial as well in time aspects, since it can be used for the economic application of raw materials or e. g. for recycling. This paper describes four different applications of X-ray fluorescence spectroscopy. KW - Röntgenfluoreszenzspektrometrie KW - Stoffparameter KW - Materialanalyse KW - X-ray fluorescence spectrometry KW - Elemental analysis KW - Material analysis PY - 2011 U6 - https://doi.org/10.1524/teme.2011.0162 SN - 0340-837X SN - 0178-2312 SN - 0171-8096 VL - 78 IS - 12 SP - 559 EP - 568 PB - Oldenbourg CY - München AN - OPUS4-24973 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Procop, Mathias A1 - Hodoroaba, Vasile-Dan A1 - Bjeoumikhov, A. T1 - Calculation of X-ray spectra for a side window tube T2 - Microscopy and Microanalysis CY - Chicago, IL, United States of America DA - 2006-07-30 KW - X-ray spectroscopy KW - X-ray tube KW - Microanalysis KW - XRF PY - 2006 U6 - https://doi.org/10.1017/S143192760606123X SN - 1431-9276 SN - 1435-8115 VL - 12 IS - Supplement 2 PB - Cambridge University Press CY - New York, NY AN - OPUS4-12667 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Procop, Mathias A1 - Hodoroaba, Vasile-Dan A1 - Bjeoumikhov, A. A1 - Eggert, F. A1 - Wedell, R. T1 - Combination of electron probe microanalysis and X-ray fluorescence analysis in a scanning electron microscope T2 - 45th Annual Port Elizabeth Conference CY - Port Elizabeth, South Africa DA - 2006-11-29 KW - myXRF at SEM KW - EPMA KW - Detection limits PY - 2006 SN - 0-620-37294-X VL - 36 SP - 26 CY - Onderstepoort AN - OPUS4-14567 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -