TY - JOUR A1 - Favet, J. A1 - Lapanje, A. A1 - Giongo, A. A1 - Kennedy, S. A1 - Aung, Y.-Y. A1 - Cattaneo, A. A1 - Davis-Richardson, A.G. A1 - Brown, C.T. A1 - Kort, R. A1 - Brumsack, H.-J. A1 - Schnetger, B. A1 - Chappell, A. A1 - Kroijenga, J. A1 - Beck, A. A1 - Schwibbert, Karin A1 - Mohamed, A.H. A1 - Kirchner, T. A1 - Dorr de Quadros, P. A1 - Triplett, E.W. A1 - Broughton, William J. A1 - Gorbushina, Anna T1 - Microbial hitchhikers on intercontinental dust: catching a lift in Chad N2 - Ancient mariners knew that dust whipped up from deserts by strong winds travelled long distances, including over oceans. Satellite remote sensing revealed major dust sources across the Sahara. Indeed, the Bodélé Depression in the Republic of Chad has been called the dustiest place on earth. We analysed desert sand from various locations in Chad and dust that had blown to the Cape Verde Islands. High throughput sequencing techniques combined with classical microbiological methods showed that the samples contained a large variety of microbes well adapted to the harsh desert conditions. The most abundant bacterial groupings in four different phyla included: (a) Firmicutes—Bacillaceae, (b) Actinobacteria—Geodermatophilaceae, Nocardiodaceae and Solirubrobacteraceae, (c) Proteobacteria—Oxalobacteraceae, Rhizobiales and Sphingomonadaceae, and (d) Bacteroidetes—Cytophagaceae. Ascomycota was the overwhelmingly dominant fungal group followed by Basidiomycota and traces of Chytridiomycota, Microsporidia and Glomeromycota. Two freshwater algae (Trebouxiophyceae) were isolated. Most predominant taxa are widely distributed land inhabitants that are common in soil and on the surfaces of plants. Examples include Bradyrhizobium spp. that nodulate and fix nitrogen in Acacia species, the predominant trees of the Sahara as well as Herbaspirillum (Oxalobacteraceae), a group of chemoorganotrophic free-living soil inhabitants that fix nitrogen in association with Gramineae roots. Few pathogenic strains were found, suggesting that African dust is not a large threat to public health. KW - Aeolian KW - High throughput sequencing KW - Bodélé Depression KW - Republic of Chad KW - Wind erosion PY - 2013 DO - https://doi.org/10.1038/ismej.2012.152 SN - 1751-7362 SN - 1751-7370 VL - 7 SP - 850 EP - 867 PB - Nature Publishing Group CY - Basingstoke AN - OPUS4-28083 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Giongo, A. A1 - Favet, J. A1 - Lapanje, A. A1 - Gano, K.A. A1 - Kennedy, S. A1 - Davis-Richardson, A.G. A1 - Brown, C. A1 - Beck, A. A1 - Farmerie, W.G. A1 - Cattaneo, A. A1 - Crabb, D.B. A1 - Aung, Y.-Y. A1 - Kort, R. A1 - Brumsack, H.-J. A1 - Schnetger, B. A1 - Broughton, William J. A1 - Gorbushina, Anna A1 - Triplett, E.W. T1 - Microbial hitchhikers on intercontinental dust: high-throughput sequencing to catalogue microbes in small sand samples N2 - Microbiological studies on the intercontinental transport of dust are confounded by the difficulty of obtaining sufficient material for analysis. Axenic samples of dust collected at high altitudes or historic specimens in museums are often so small and precious that the material can only be sacrificed when positive results are assured. With this in mind, we evaluated current methods and developed new ones in an attempt to catalogue all microbes present in small dust or sand samples. The methods used included classical microbiological approaches in which sand extracts were plated out on a variety of different media, polymerase chain reaction (PCR)-based amplification of 16S/18S rRNA sequences followed by construction of clone libraries, PCR amplification of 16S rRNA sequences followed by high-throughput sequencing (HtS) of the products and direct HtS of DNA extracted from the sand. A representative sand sample collected at Bahaï Wadi in the desert of the Republic of Chad was used. HtS with or without amplification showed the most promise and can be performed on ≤100 ng DNA. Since living microbes are often required, current best practices would involve geochemical and microscopic characterisation of the sample, followed by DNA isolation and direct HtS. Once the microbial content of the sample has been deciphered, growth conditions (including media) can be tailored to isolate the micro-organisms of interest. KW - Chad KW - Deserts KW - Eukaryota KW - 16S amplicons KW - Metagenomics PY - 2013 DO - https://doi.org/10.1007/s10453-012-9264-0 SN - 0393-5965 SN - 1573-3025 VL - 29 IS - 1 SP - 71 EP - 84 PB - Springer Science + Business Media B.V. CY - Dordrecht [u.a.] AN - OPUS4-27687 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Favet, J. A1 - Lapanje, A. A1 - Giongo, A. A1 - Kennedy, S. A1 - Aung, Y.-Y. A1 - Cataneo, A. A1 - Kort, R. A1 - Brumsack, H.-J. A1 - Schnetger, B. A1 - Triplett, E.W. A1 - Beck, A. A1 - Broughton, William J. A1 - Gorbushina, Anna T1 - Microbial hitchhikers on intercontinental dust - Chadian origins T2 - VAAM-Jahrestagung 2011 CY - Karlsruhe, Germany DA - 03.04.2011 KW - Intercontinental dust KW - Desert soil PY - 2011 SN - 0947-0867 IS - EMP114 SP - 118 PB - Spektrum, Akad. Verl. AN - OPUS4-23629 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Beck, M. A1 - Becker, S. A1 - Beckmann, Jörg A1 - Cojocari, O. A1 - Feige, V. A1 - Fischer, B. A1 - Friederich, F. A1 - Globisch, B. A1 - Haupt, H. A1 - Hechtfischer, G. A1 - Hens, K. A1 - Hübers, H.-W. A1 - Jelonnek, J. A1 - Jonuscheit, J. A1 - Keil, A. A1 - Kleine-Ostmann, T. A1 - Nickel, H.-U. A1 - Peichl, M. A1 - Peters, O. A1 - Sprenger, T. A1 - Steiger, A. A1 - van Frank, S. A1 - Vieweg, N. A1 - Werner, M. A1 - Wilk, R. T1 - Terahertzsysteme - Anwendungsfelder und Systeme N2 - Die nicht ionisierende elektromagnetische Strahlung im Bereich von Terahertz-Frequenzen ermöglicht berührungslose und zerstörungsfreie Mess- und Prüftechnik in zahlreichen Bereichen. Nach ersten Anwendungen in der Astronomie und der Atmosphärenforschung wurden in letzter Zeit Anwendungsfelder in der Sicherheitstechnik, der Medizintechnik, der Nachrichtentechnik und der zerstörungsfreien Prozess- und Qualitätskontrolle erschlossen. Dielektrische Materialien wie Kunststoffe und Keramiken können von Terahertz-Wellen durchdrungen werden. Das ermöglicht Untersuchungen des Objektinneren ohne spezielle Schutzmaßnahmen, wie sie z.B. beim Röntgen notwendig sind. Die Richtlinie erleichtert die Verständigung zwischen Nutzern, Herstellern und dem Vertrieb von Terahertz-Systemen. In der Richtlinie werden bekannte Einsatzgebiete sowie die eingesetzten Verfahren und Funktionsprinzipien aufgeführt, um den Leser bei der Auswahlentscheidung zu unterstützen. Nach einer kurzen Einführung in die physikalischen Grundlagen und Hinweisen zur elektromagnetischen Verträglichkeit, zum Strahlenschutz und zur regulierten Frequenzvergabe werden die verschiedenen Geräteklassen von Terahertz-Systemen ausführlich vorgestellt. Die Richtlinie gibt Hinweise zur messtechnischen Charakterisierung von Terahertz-Wellen. Einsatzgebiete von Terahertz-Systemen, wie die zerstörungsfreie Prüfung, die Dicken- und Abstandsmessung, die Tomografie und die chemische Analytik, werden mit ihren spezifischen Eigenschaften im Detail beschrieben. Umfangreiche Literaturverweise vereinfachen eine vertiefte Beschäftigung mit den Themen der Richtlinie. Eine tabellarische Übersicht mit einer Zusammenfassung, welche Terahertz-Systeme für welche Anwendungsfelder eingesetzt werden können, vervollständigt die Richtlinie. KW - Terahertzsysteme KW - THz-Wellen PY - 2018 UR - https://www.vdi.de/5590 VL - VDI/VDE 5590 Blatt 2 SP - 1 EP - 27 PB - VDI-Verlag CY - Düsseldorf ET - Entwurf - November 2018 AN - OPUS4-46727 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - van der Kolk, G. J. A1 - Hurkmans, A. A1 - Trinh, T. A1 - Fleischer, W. A1 - Beck, Uwe A1 - Griepentrog, Michael T1 - Coating evaluation of decorative PVD finishes T2 - 41st Annual Technical Conference CY - Boston, MA, USA DA - 1998-04-18 PY - 1998 UR - http://www.knovel.com/web/portal/browse/display?_EXT_KNOVEL_DISPLAY_bookid=272 SN - 1-591-24158-8 SP - 44 EP - 45 PB - Society of Vacuum Coaters CY - Albuquerque AN - OPUS4-607 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hasche, K. A1 - Ulm, G. A1 - Herrmann, K. A1 - Krumrey, M. A1 - Ade, G. A1 - Sümpel, J. A1 - Busch, I. A1 - Thomsen-Schmidt, P. A1 - Schädlich, S. A1 - Schindler, A. A1 - Frank, W. A1 - Procop, Mathias A1 - Beck, Uwe T1 - About the calibration of thickness standards on the nanometer scale T2 - 3rd International EUSPEN conference ; 3rd International conference. European Society for Precision Engineering and Nanotechnology ; 4th General meeting. European Society for Precision Engineering and Nanotechnology CY - Eindhoven, The Netherlands DA - 2002-05-26 PY - 2002 SN - 90-386-2883-8 SP - 1 EP - 5 CY - Eindhoven AN - OPUS4-2283 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hasche, K. A1 - Herrmann, K. A1 - Thomsen-Schmidt, P. A1 - Krumrey, M. A1 - Ulm, G. A1 - Ade, G. A1 - Pohlenz, F. A1 - Stümpel, J. A1 - Busch, I. A1 - Schädlich, S. A1 - Frank, W. A1 - Hirsch, D. A1 - Schindler, A. A1 - Procop, Mathias A1 - Beck, Uwe T1 - Ein Beitrag zu kalibrierten Nanometerschichten für unterschiedliche Anwendungsbereiche N2 - Nanotechnologien werden gegenwärtig als leistungsfähige Oberflächentechniken in erheblichem Umfange industriell genutzt. Dabei spielen dünne Schichten und deren Kenndaten eine wesentliche Rolle, z.B. als Röntgenspiegel oder optische und magnetooptische Datenträger. Die Schichtdicke zählt hierbei zu den technologisch wichtigen Parametern. Abgeleitet von Anwenderinteressen, werden für die Röntgenreflektometrie (XRR bzw. GIXR), Elektronenstrahl-Mikroanalyse (EPMA) und Röntgenfluoreszenzanalyse (XRF) einerseits und die Ellipsometrie andererseits zugeschnittene Schichtdickenmaßverkörperungen (SDM) entwickelt, gefertigt und untersucht. Das Ziel ist die Bereitstellung praxistauglicher, kalibrierter SDM, im weiteren Schichtdickennormale (SDN) genannt. SDN sind Maßverkörperungen, für die der Schichtdickenwert mit einer definierten Messunsicherheit bekannt und auf ein metrologisch anerkanntes Längennormal zurückgeführt ist. Berichtet wird über die Herstellung und messtechnische Charakterisierung der beiden spezifischen Varianten von Maßverkörperungen. T2 - 47. Internationales Wissenschaftliches Kolloquium. Technische Universität Ilmenau ; Herbstkonferenz der Gesellschaft für Arbeitswissenschaft ; 6. Workshop Multimedia für Bildung und Wirtschaft CY - Ilmenau, Deutschland DA - 2002-09-23 PY - 2002 UR - http://publica.fraunhofer.de/documents/N-14872.html VL - 47 SP - 568 EP - 569 PB - Techn. Univ. CY - Ilmenau AN - OPUS4-2284 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Koenders, L. A1 - Hasche, K. A1 - Ulm, G. A1 - Krumrey, M. A1 - Ade, G. A1 - Stümpel, J. A1 - Busch, I. A1 - Thomsen-Schmidt, P. A1 - Schädlich, S. A1 - Schindler, A. A1 - Frank, W. A1 - Beck, Uwe A1 - Procop, Mathias T1 - Über die metrologische Charakterisierung von Schichtdicken Standards im Nanometerbereich T2 - 12th Applied Surface Analysis Workshop ; AOFA 12 CY - --- DA - 2002-09-15 PY - 2002 AN - OPUS4-2285 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - RPRT A1 - Jacobs, R. A1 - Meneve, J. A1 - Dyson, G. A1 - Jennett, N. M. A1 - von Stebut, J. A1 - Feuchter, P. A1 - Cavalleri, A. A1 - Ronkainen, H. A1 - Beck, Uwe A1 - Reiners, Georg A1 - Ingelbrecht, C. D. T1 - SMT4-CT98-2238 - A certified reference material for the scratch test - REMAST - Final technical report PY - 2002 SP - 1 EP - 110 PB - Vito CY - Mol, Belgium AN - OPUS4-25601 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - RPRT A1 - Jacobs, R. A1 - Meneve, J. A1 - Dyson, G. A1 - Jennett, N. A1 - von Stebut, J. A1 - Feuchter, P. A1 - Cavaleiro, A. A1 - Ronkainen, H. A1 - Beck, Uwe A1 - Reiners, Georg A1 - Ingelbrecht, C. T1 - SMT4-CT98-2238 - A certified reference material for the scratch test - REMAST - Synthesis report PY - 2002 SP - 1 EP - 9 PB - Vito CY - Mol, Belgium AN - OPUS4-25625 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Maser, K. A1 - Mohr, U. A1 - Leihkauf, R. A1 - Ecker, Klaus A1 - Beck, Uwe A1 - Grambole, D. A1 - Grötzschel, R. A1 - Herrmann, F. A1 - Krauser, J. A1 - Weidinger, A. T1 - Hydrogen migration in wet-thermally grown silicon dioxide layers due to high dose 15N ion beam irradiation N2 - Three effects have been observed in wet-thermally grown structures under bombardement with energetic 15N ions: (1) Out-diffusion of H from the SiO2/Si system through the surface, (2) Accumulation of H at the SiO2/Si interface, (3) Changes in the optical fingerprint spectra of Ψ and Δ in dependence on λ (wavelength) obtained by ellipsometric measurements. PY - 1999 DO - https://doi.org/10.1016/S0167-9317(99)00356-1 SN - 0167-9317 SN - 1873-5568 VL - 48 IS - 1-4 SP - 139 EP - 142 PB - Elsevier CY - Amsterdam AN - OPUS4-25572 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hähner, P. A1 - Rinaldi, C. A1 - Bicego, V. A1 - Affeldt, E. E. A1 - Brendel, T. A1 - Andersson, H. A1 - Beck, T. A1 - Klingelhöffer, Hellmuth A1 - Kühn, Hans-Joachim A1 - Köster, A. A1 - Loveday, M. A1 - Marchionni, M. A1 - Rae, C. T1 - Research and development into a European code-of-practice for strain-controlled thermo-mechanical fatigue testing N2 - Thermo-mechanical fatigue (TMF) testing plays an increasingly important role in the design, the reliability assessment and the lifecycle management of safety critical components used, for instance, for power generation, in the process industry and in aeronautical and automotive applications, with a view to increasing the fuel efficiency, safety and service intervals, while reducing production (and material) costs. In a European Commission funded research project (acronym: TMF-Standard) of the 5th Framework Programme, 20 European laboratories have undertaken a joint research effort to establish a validated code-of-practice (CoP) for strain-controlled TMF testing. Starting from a survey of the testing protocols and procedures previously used by the partners, a comprehensive pre-normative research activity into various issues has been completed, addressing the dynamic temperature control, the effects of deviations in nominal temperatures and phase angles, the influences of temperature gradients, as well as the practicalities of test interruption and restart procedures. Meaningful allowable tolerances for the various test parameters were identified and practical recommendations as to the test techniques were formulated. From this a preliminary CoP was compiled and used to guide an extensive round robin exercise among the project partners. From the statistical analysis of that exercise, a validated CoP was derived dealing with strain-controlled constant amplitude TMF of nominally homogeneous metallic materials subjected to spatially uniform temperature fields and uniaxial mechanical loading. It is intended to give advice and guidance on the appropriate test setup, testing procedures and the analysis of results, in particular for newcomers in the field of strain-controlled TMF. This paper highlights some of the results of the TMF-Standard project. Moreover, commonalities and differences of the present CoP with respect to the standard documents for strain-controlled TMF, which have been developed at ISO and ASTM levels, are presented in this paper. KW - Thermo-mechanical fatigue KW - Ni-base superalloy KW - Standardisation KW - Test methods PY - 2008 DO - https://doi.org/10.1016/j.ijfatigue.2007.01.052 SN - 0142-1123 VL - 30 IS - 2 SP - 372 EP - 381 PB - Elsevier CY - Oxford AN - OPUS4-17536 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Thomsen-Schmidt, P. A1 - Hasche, K. A1 - Ulm, G. A1 - Herrmann, K. A1 - Krumrey, M. A1 - Ade, G. A1 - Stümpel, J. A1 - Busch, I. A1 - Schädlich, S. A1 - Schindler, A. A1 - Frank, W. A1 - Hirsch, D. A1 - Procop, Mathias A1 - Beck, Uwe T1 - Realisation and metrological characterisation of thickness standards below 100 nm N2 - High-accuracy film thickness measurements in the range below 100 nm can be made by various complex methods like spectral ellipsometry (SE), scanning force microscopy (SFM), grazing incidence X-ray reflectometry (GIXR), or X-ray fluorescence analysis (XRF). The measurement results achieved with these methods are based on different interactions between the film and the probe. A key question in nanotechnology is how to achieve consistent results on a level of uncertainty below one nanometre with different techniques. Two different types of thickness standards are realised. Metal film standards for X-ray techniques in the thickness range 10 to 50 nm are calibrated by GIXR with monochromatised synchrotron radiation of 8048 eV. The results obtained at four different facilities show excellent agreement. SiO2 on Si standards for SE and SFM in the thickness range 6 to 1000 nm are calibrated by GIXR with monochromatised synchrotron radiation of 1841 eV and with a metrological SFM. Consistent results within the combined uncertainties are obtained with the two methods. Surfaces and interfaces of both types of standards are additionally investigated by transmission electron microscopy (TEM). PY - 2004 DO - https://doi.org/10.1007/s00339-003-2273-7 SN - 0947-8396 VL - 78 IS - 5 SP - 645 EP - 649 PB - Springer CY - Berlin AN - OPUS4-17195 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Jacobs, R. A1 - Meneve, J. A1 - Dyson, G. A1 - Teer, D. G. A1 - Jennett, N. M. A1 - Harris, P. A1 - von Stebut, J. A1 - Comte, C. A1 - Feuchter, P. A1 - Cavaleiro, A. A1 - Ronkainen, H. A1 - Holmberg, K. A1 - Beck, Uwe A1 - Reiners, Georg A1 - Ingelbrecht, C. D. T1 - A certified reference material for the scratch test N2 - Adhesion and other mechanical behaviour of coatings is at present routinely tested in industry and research organisations using the scratch test. The test has been the subject of a European Standard prEN 1071-3:2000 established by the European Standards Committee CEN TC184 WG5. A previous European project on the development and validation of test methods for thin hard coatings—FASTE—revealed that uncertainties in the Rockwell C stylus tip shape represent a major source of error for the scratch-test method. Therefore a follow-up project—REMAST—was started to develop and certify a reference material as a quality control tool for the testing and qualification of scratch-test instruments. In addition, a considerable effort was devoted to improve the scratch stylus manufacturing process. This paper presents the results of the REMAST project. During a feasibility study, two candidate materials—titanium nitride (TiN) and diamond-like carbon (DLC) coatings both on high speed steel substrates—were evaluated. Because of the lower sensitivity to styli tip shape variations and higher data scatter observed for the TiN coating, DLC was chosen as the reference material to be certified. One thousand samples were produced, as well as qualified styli to carry out the certification campaign, including homogeneity and stability testing. Nine independent laboratories were involved in the certification exercise, and the data were statistically analysed to obtain the certified critical load values and their uncertainty ranges. A certified reference material BCR-692 is available for verification purposes. This presents three repeatable failure events at certified critical load intervals and can provide a good indication of overall scratch-test instrument performance, including stylus condition and calibration. It is also useful as a diagnostic tool, providing a means of sensitive monitoring of machine and stylus performance over extended periods. Considerable improvement of the quality of scratch styli was achieved by the strict control of all manufacturing steps. KW - Adhesion KW - Scratch test KW - Certified reference material PY - 2003 DO - https://doi.org/10.1016/S0257-8972(03)00470-5 SN - 0257-8972 VL - 174-175 SP - 1008 EP - 1013 PB - Elsevier Science CY - Lausanne AN - OPUS4-25435 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - van Wasen, S. A1 - You, Yi A1 - Beck, S. A1 - Riedel, Jens A1 - Volmer, D. A. T1 - Laser Ablation Secondary Electrospray Ionization for In Situ Mass Spectrometric Interrogation of Acoustically-Levitated Droplets N2 - The composition of acoustically levitated droplets was probed by a novel combination of mid-IR laser evaporation and subsequent postionization via secondary electrospray ionization. The combination of microliter samples and subnanoliter sampling provided time-resolved interrogation of droplets and allowed for a kinetic investigation of the laser-induced release of the analyte, which was found to strongly depend on the analytes. The observed substancespecific delayed release of the analytes permitted baseline-separated discrimination of the analytes, ideal for the study of complex samples. The additionally applied postionization scheme was found to enable efficient detection of small volatile compounds as well as peptides. The detection of small molecules and peptides occurred under very different sampling geometries, pointing to two distinct underlying ionization mechanisms. Overall, our results suggest that the experimental setup presented in this study can serve as a widely applicable platform to study chemical reactions in acoustically levitated droplets as model reactors. KW - Acoustic levitation KW - Mass spectrometry KW - Electrospray KW - Laser ablation PY - 2022 DO - https://doi.org/10.1021/acs.analchem.2c03800 SN - 0003-2700 VL - 2022 SP - 1 EP - 5 PB - ACS Publications CY - Washington AN - OPUS4-56531 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Beck, Uwe A1 - Lange, Thorid A1 - Hielscher, Stefan A1 - Rietz, Uwe A1 - Lerche, D. A1 - Pfuch, A. T1 - Multiple-sample approach for bonding and testing: validation of bonding strength of adhesive-bonded joints and adhesive tapes N2 - The multiple-sample approach by means of centrifugal adhesion testing (CAT-technology) allows the determination of bonding strength of adhesive-bonded joints on a statistical basis of up to eight samples. Therefore, it is obvious to ensure the continuous handling and identical processing of an octet of samples within the entire process chain of wet-chemical cleaning, plasma-chemical pre-treatment, bonding of samples, and testing of bonding strength. Within the multiple-sample bonding set-up (MPKV-technology) a defined bonding pressure can be adjusted regardless the actual number of samples. A comparison of single- and multiple-sample approach is made for bonding strength of selected adhesives, double-sided adhesive tapes and different material combinations [stainless steel (V2A) vs. stainless steel, polyamide (PA), or polypropylene (PP)]. It is shown that both technologies improve reliability of results T2 - EURADH 2016 Adhesion ´16 CY - Glasgow, UK DA - 21.09.2016 KW - Multiple-sample bonding KW - Multiple-sample testing KW - Bonding strength KW - Adhesives and adhesive tapes PY - 2016 SP - 162 EP - 166 AN - OPUS4-37588 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Beck, Uwe A1 - Hielscher, Stefan A1 - Lange, Thorid A1 - Weise, Matthias A1 - Kittler-Packmor, Kai A1 - Rietz, U. A1 - Lerche, D. A1 - Pfuch, A. T1 - Mehr-Proben-Konzept zum Kleben und Prüfen: Validierung von Klebverbunden im OKTETT T2 - 10. ThGOT Thementage Grenz- und Oberflächentechnik mit 4. Optik-Kolloquium CY - Leipzig, Germany DA - 2014-09-02 KW - Zentrifugentechnologie KW - Klebfestigkeit KW - Haftfestigkeit KW - Mehr-Proben-Prüfen/Kleben PY - 2014 SP - BA04, 1 EP - 2 AN - OPUS4-31313 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Pfuch, A. A1 - Beck, Uwe A1 - Lange, Thorid A1 - Rietz, U. A1 - Küzün, B. A1 - Twardygrosz, R. T1 - Wie Klebungen einfacher validiert werden können N2 - Die Bestimmung der Haftfestigkeit von Lackierungen, Beschichtungen oder Klebungen ist wichtig für die Beurteilung von entsprechenden Fertigungsabläufen. Unter Verwendung einer neuen Zentrifugentechnik wurde jetzt ein neues Mehr-Proben-Konzept zur schnellen Validierung von Klebverbindungen entwickelt. KW - Klebfestigkeit KW - Haftfestigkeit KW - Mehr-Proben-Vorbehandeln/Kleben/Prüfen PY - 2015 SN - 0001-8198 VL - 9 SP - 44 EP - 52 PB - Vieweg CY - Wiesbaden AN - OPUS4-34282 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Beck, Uwe A1 - Pfuch, A. A1 - Rietz, U. T1 - Zentrifugentechnologie erleichtert Prüfverfahren N2 - Die Bestimmung der Haftfestigkeit von Lackierungen, Beschichtungen oder Klebeverbunden ist ein wichtiges Analyseinstrument bei der Beurteilung von entsprechenden Fertigungsabläufen. Unter Verwendung einer neuen Zentrifugentechnologie wurde in einem AiF Forschungsprojekt OKTETT die gesamte Prozesskette Vorbehandlung - Verklebung - Prüfung validiert. KW - Klebfestigkeit KW - Haftfestigkeit KW - Mehr-Proben-Vorbehandeln/Kleben/Prüfen PY - 2015 SN - 2195-5891 SN - 2195-5905 IS - 3 SP - 1 PB - WOTech CY - Waldshut-Tiengen AN - OPUS4-32834 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - RPRT A1 - Beck, Uwe A1 - Krüger, A. T1 - Abschlussbericht für das Kooperationsprojekt zwischen Unternehmen und Forschungseinrichtungen (KF) - Nanoskalige Haftvermittler zur Erhöhung der Haft- bzw. Klebfestigkeit kritischer Verbundsysteme unter Verwendung von ALD-Hybridprozessen N2 - Aufzählung der wichtigsten wissenschaftlich-technischen und anderer wesentlicher Ergebnisse • ALD Abscheidungen auf Polymeren (PE, PP, PTFE) unter Atmosphärendruck und im Vakuum mit Ozon als Oxidationsmittel wurden durchgeführt: - Mit Variation der Schichtdicke - Mit Variation der Zykluszeit - Mit und ohne Ozon Vorbehandlung der Oberfläche • ALD Abscheidungen auf (PE, PP, PTFE) in Vakuum mit O2- und H2-Plasma Vorbehandlung wurden durchgeführt. - Mit Variation der Schichtdicke - Mit Variation der Zykluszeit - Mit und ohne Plasma Vorbehandlung der Oberfläche • Die ALD Prozesse wurden mit in situ Laserellipsometrie untersucht. • Die ALD Schichten wurden für die Haftfestigkeit bei der BAM ausgewerte KW - ALD-Abscheidungen KW - Plasma Vorbehandlung KW - Laserellipsometrie KW - Haftfestigkeit PY - 2017 N1 - Das Dokument unterliegt der Vertraulichkeit und kann nicht zugänglich gemacht werden - The document is subject to confidentiality restrictions and cannot be made accessible - Projektlaufzeit: 01.07.2015-30.06.2017 - Project runtime: 01.07.2015-30.06.2017 SP - 1 EP - 17 AN - OPUS4-50386 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Florian, Camilo A1 - Fischer, Daniel A1 - Freiberg, K. A1 - Duwe, M. A1 - Sahre, Mario A1 - Schneider, S. A1 - Hertwig, Andreas A1 - Krüger, Jörg A1 - Rettenmayr, M. A1 - Beck, Uwe A1 - Undisz, A. A1 - Bonse, Jörn T1 - Single Femtosecond Laser-Pulse-Induced Superficial Amorphization and Re-Crystallization of Silicon N2 - Superficial amorphization and re-crystallization of silicon in <111> and <100> orientation after irradiation by femtosecond laser pulses (790 nm, 30 fs) are studied using optical imaging and transmission electron microscopy. Spectroscopic imaging ellipsometry (SIE) allows fast data acquisition at multiple wavelengths and provides experimental data for calculating nanometric amorphous layer thickness profiles with micrometric lateral resolution based on a thin-film layer model. For a radially Gaussian laser beam and at moderate peak fluences above the melting and below the ablation thresholds, laterally parabolic amorphous layer profiles with maximum thicknesses of several tens of nanometers were quantitatively attained. The accuracy of the calculations is verified experimentally by high-resolution transmission electron microscopy (HRTEM) and energy dispersive X-ray spectroscopy (STEM-EDX). Along with topographic information obtained by atomic force microscopy (AFM), a comprehensive picture of the superficial re-solidification of silicon after local melting by femtosecond laser pulses is drawn. KW - Femtosecond laser KW - Silicon KW - Amorphization KW - Crystallization KW - Spectroscopic imaging ellipsometry PY - 2021 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-523687 UR - https://www.mdpi.com/1996-1944/14/7/1651 DO - https://doi.org/10.3390/ma14071651 SN - 1996-1944 VL - 14 IS - 7 SP - 1651-1 EP - 1651-21 PB - MDPI AG CY - Basel, Switzerland AN - OPUS4-52368 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Ickert, Stefanie A1 - Schwaar, Timm A1 - Springer, A. A1 - Grabarics, M. A1 - Riedel, Jens A1 - Beck, S. A1 - Pagel, K. A1 - Linscheid, M. W. T1 - Comparison of the fragmentation behavior of DNA and LNA single strands and duplexes N2 - DNA and locked nucleic acid (LNA) were characterized as single strands, as well as double stranded DNA-DNA duplexes and DNA-LNA hybrids using tandem mass spectrometry with collision-induced dissociation. Additionally, ion mobility spectrometry was carried out on selected species. Oligonucleotide duplexes of different sequences – bearing mismatch positions and abasic sites of complementary DNA 15-mers – were investigated to unravel general trends in their stability in the gas phase. Single stranded LNA oligonucleotides were also investigated with respect to their gas phase behavior and fragmentation upon collision-induced dissociation. In contrast to the collision-induced dissociation of DNA, almost no base loss was observed for LNAs. Here, backbone cleavages were the dominant dissociation pathways. This finding was further underlined by the need for higher activation energies. Base losses from the LNA strand were also absent in fragmentation experiments of the investigated DNA-LNA hybrid duplexes. While DNA-DNA duplexes dissociated easily into single stranded fragments, the high stability of DNA-LNA hybrids resulted in predominant fragmentation of the DNA part rather than the LNA, while base losses were only observed from the DNA single strand of the hybrid. KW - Oligonucleotide fragmentation KW - Locked nucleic acids KW - Collision induced dissociation (CID) KW - Double strands KW - Ion mobility spectrometry PY - 2019 DO - https://doi.org/10.1002/jms.4344 VL - 54 IS - 5 SP - 402 EP - 411 PB - Wiley AN - OPUS4-47485 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - van Wasen, S. A1 - You, Yi A1 - Beck, S. A1 - Riedel, Jens A1 - Volmer, D. A. T1 - Miniaturized Protein Digestion Using Acoustic Levitation with Online High Resolution Mass Spectrometry N2 - The combination of acoustically levitated droplets, mid-IR laser evaporation, and subsequent post-ionization by secondary electrospray ionization was applied for monitoring the enzymatic digestion of various proteins. Acoustically levitated droplets are an ideal, wall-free model reactor, readily allowing compartmentalized microfluidic trypsin digestions. Time-resolved interrogation of the droplets yielded real-time information on the progress of the reaction and thus provided insights into reaction kinetics. After 30 min of digestion in the acoustic levitator, the obtained protein sequence coverages were identical to the reference overnight digestions. Importantly, our results clearly demonstrate that the applied experimental setup can be used for the real-time investigation of chemical reactions. Furthermore, the described methodology only uses a fraction of the typically applied amounts of solvent, analyte, and trypsin. Thus, the results exemplify the use of acoustic levitation as a green analytical chemistry alternative to the currently used batch reactions. KW - Acoustic levitation KW - Protein analysis KW - Mass spectrometry PY - 2023 DO - https://doi.org/10.1021/acs.analchem.2c05334 VL - 95 SP - 4190 EP - 4195 PB - ACS Publications AN - OPUS4-57053 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Reiners, Georg A1 - Beck, Uwe A1 - Jehn, H.A. T1 - Decorative optical coatings KW - Nitrides KW - Optical properties KW - Physical vapour desposition KW - Structural properties PY - 1994 SN - 0040-6090 VL - 253 SP - 33 EP - 40 PB - Elsevier CY - Amsterdam AN - OPUS4-6956 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Beck, Uwe A1 - Reiners, Georg A1 - Urban, Ingrid A1 - Jehn, H.A. A1 - Kopacz, U. A1 - Schack, H. T1 - Decorative hard coatings: new layer systems without allergy risk PY - 1993 SN - 0257-8972 VL - 61 SP - 215 EP - 222 PB - Elsevier Science CY - Lausanne AN - OPUS4-6957 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Beck, Uwe A1 - Reiners, Georg A1 - Kopacz, U. A1 - Jehn, H.A. T1 - Decorative hard coatings: interdependence of optical, stoichiometric and structural properties PY - 1993 SN - 0257-8972 VL - 60 SP - 389 EP - 395 PB - Elsevier Science CY - Lausanne AN - OPUS4-6959 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Schott, M. A1 - Szczerba, Wojciech A1 - Posset, U. A1 - Vuk, A.S. A1 - Beck, M. A1 - Riesemeier, Heinrich A1 - Thünemann, Andreas A1 - Kurth, D. G. T1 - In operando XAFS experiments on flexible electrochromic devices based on Fe(II)-metallo-supramolecular polyelectrolytes and vanadium oxides N2 - Flexible electrochromic devices (ECDs) based on Fe(II)-metallo-supramolecular polyelectrolytes (Fe-MEPE) and vanadium oxide are studied in operando by means of x-ray absorption fine structure (XAFS) spectroscopy. The ECDs are blue-purple in the colored state at 0.0 V and become light yellow when a voltage of 1.6 V is applied. The XAFS studies at the K-edge of Fe(II) reveals that the absorption edge is shifted toward higher energies by 1.8 eV in the transparent state. Comparison of two different ECDs and different charge cycles demonstrates the reversibility and repeatability of the process. We attribute the shift to a charge transfer and a change of oxidation state of the ions from Fe2+ to Fe3+. The transition is not accompanied by a noticeable structural change of the octahedral coordination geometry as confirmed by analysis of the extended x-ray absorption fine structure (EXAFS) data. (C) 2015 Elsevier B.V. All rights reserved. KW - Metallo-supramolecular polyelectrolytes KW - Vanadium oxide KW - Electrochromism KW - Electrochromic device KW - Cyclic voltammetry KW - XAFS PY - 2016 DO - https://doi.org/10.1016/j.solmat.2015.10.015 SN - 0927-0248 VL - 147 SP - 61 EP - 67 PB - Elsevier B.V. CY - Amsterdam [u.a.] AN - OPUS4-35251 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -