TY - JOUR A1 - Ziegler, Mathias A1 - Myrach, Philipp T1 - Neues aus der Normung - INS-Projekt 'Zerstörungsfreie Risserkennung - Erarbeitung einer Richtlinie zur zerstörungsfreien Risserkennung mit lokal angeregter Thermografie' N2 - Im Projekt wurden systematische Untersuchungen zur thermografischen Erkennung von Oberflächenrissen mit Rissbreiten von ca. 0,1 bis 200 µm anhand von standardisierten bzw. selbst erstellten metallischen Referenzprobekörpern durchgeführt. Zur lokalen Anregung wurde ein Hochleistungs-Diodenlasersystem verwendet. Alle für die erfolgreiche Prüfung wesentlichen Parameter des Prüfsystems wurden systematisch untersucht und bewertet. Hieraus wurden Vorschläge, Empfehlungen und Faustformeln für die Wahl der Prüfparameter, Referenzprüfkörper, geeignete Gerätekomponenten und Auswertungsalgorithmen sowie Hinweise zur Prüfungsdurchführung abgeleitet. Zur Absicherung der Aussagen und zum Anschluss des neuen Prüfverfahrens an den Stand der Technik wurden Referenzprüfungen und -messungen mit etablierten Verfahren durchgeführt. Zudem wurde die Grenze der Nachweisempfindlichkeit des Verfahrens demonstriert. PY - 2013 SN - 1616-069X SN - 0948-5112 VL - 134 IS - April SP - 12 EP - 14 PB - Deutsche Gesellschaft für Zerstörungsfreie Prüfung CY - Berlin AN - OPUS4-28298 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Maierhofer, Christiane A1 - Röllig, Mathias A1 - Steinfurth, Henrik A1 - Ziegler, Mathias A1 - Kreutzbruck, Marc A1 - Scheuerlein, C. A1 - Heck, S. T1 - Non-destructive testing of Cu solder connections using active thermography N2 - Impulse and lock-in thermography have been applied to detect delaminations of prototype solder joints, similar to those to be produced between Cu shunts and Cu busbar stabilisers at the Large Hadron Collider (LHC) at CERN. Two infrared cameras with different detector materials and with different spectral ranges and two excitation techniques have been tested and compared for their ability to detect delaminations behind 2 and 3 mm thick Cu shunts. We have analyzed the signal to noise ratio (SNR) for each detected defect and are able to detect defects down to a nominal edge length of 4 mm behind 2 mm thick Cu shunts by using fast impulse thermography and a camera with a microbolometer array. For the 3 mm thick Cu shunt, on the other hand, the nominal 4 mm defect is only visible in the lock-in thermography phase images and the highest SNR has been achieved with a cooled InSb-based camera. In addition, numerical simulations show the influence of the minimum detectable defect size on the shunt thickness and that the developed on-site testing technique is sufficient to find all defects that are detectable theoretically. KW - Active thermography KW - Solder joint KW - Copper KW - FFT KW - Signal-to-noise-ratio PY - 2012 U6 - https://doi.org/10.1016/j.ndteint.2012.07.010 SN - 0963-8695 VL - 52 SP - 103 EP - 111 PB - Butterworth-Heinemann CY - Oxford AN - OPUS4-27575 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hempel, M. A1 - Ziegler, Mathias A1 - Tomm, J.W. A1 - Elsaesser, T. A1 - Michel, N. A1 - Krakowski, M. T1 - Time-resolved analysis of catastrophic optical damage in 975 nm emitting diode lasers N2 - Catastrophic optical damage (COD) is analyzed during single current pulse excitation of 975 nm emitting diode lasers. Power transients and thermal images are monitored during each pulse. The COD process is unambiguously related to the occurrence of a “thermal flash” of Planck’s radiation. We observe COD to ignite multiple times in subsequent pulses. Thermography allows for tracing a spatial motion of the COD site on the front facet of the devices. The time constant of power decay after the onset of COD has values from 400 to 2000 ns, i.e., an order of magnitude longer than observed for shorter-wavelength devices. KW - Semiconductor laser KW - Thermography KW - Catastrophic optical damage KW - High-power diode lasers PY - 2010 U6 - https://doi.org/10.1063/1.3456388 SN - 0003-6951 SN - 1077-3118 VL - 96 IS - 251105 SP - 1 EP - 3 PB - American Institute of Physics CY - Melville, NY AN - OPUS4-21672 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hempel, M. A1 - Tomm, J.W. A1 - Ziegler, Mathias A1 - Elsaesser, T. A1 - Michel, N. A1 - Krakowski, M. T1 - Catastrophic optical damage at front and rear facets of diode lasers N2 - Single-pulse tests of the catastrophic optical damage (COD) are performed for three batches of diode lasers with different gain-regions. The tests involve in situ inspection of front, rear, and side of the devices by a thermocamera. Devices with an Al-containing gain-region show COD at the front facet, as expected for strong facet heating via surface recombination and reabsorption of laser light. In contrast, Al-free devices with low surface recombination rates tend to fail at the rear facet, pointing to a different heating scenario. The high carrier density at the rear facet favors heating and COD via Auger recombination processes. KW - Thermography KW - Catastrophic optical damage KW - High power diode lasers KW - Destructive testing KW - Non-destructive testing KW - Auger effect KW - Carrier density KW - Heating KW - Laser beam effects KW - Optical testing KW - Semiconductor lasers KW - Surface recombination PY - 2010 U6 - https://doi.org/10.1063/1.3524235 SN - 0003-6951 SN - 1077-3118 VL - 97 IS - 23 SP - 231101-1 - 231101-3 PB - American Institute of Physics CY - Melville, NY AN - OPUS4-22763 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hempel, M. A1 - Ziegler, Mathias A1 - Schwirzke-Schaaf, S. A1 - Tomm, J.W. A1 - Jankowski, D. A1 - Schröder, D. T1 - Spectroscopic analysis of packaging concepts for high-power diode laser bars N2 - Double-side cooled high-power diode laser bars packaged by different techniques on different types of passive heat sinks are analyzed in terms of packaging-induced strain. Reference data from standard devices being single-side cooled only and packaged by conventional soft and hard soldering are also presented. Thermal profiling across the devices complements the results. The most suitable packaging architecture and technique for double-side cooled bars is identified. Measurements of the laser emission near field and electroluminescence pattern provide direct reference to the functionality of the devices. Furthermore, a type of cross calibration of the methods used for strain analysis is made, since all techniques are applied to the same set of bars. This involves micro photoluminescence, micro Raman, and degree-of-polarization electroluminescence spectroscopy. KW - Spectroscopy KW - Semiconductor laser KW - Thermography KW - High-power diode lasers KW - Non-destructive testing PY - 2012 U6 - https://doi.org/10.1007/s00339-012-6799-4 SN - 0947-8396 VL - 107 IS - 2 SP - 371 EP - 377 PB - Springer CY - Berlin AN - OPUS4-25789 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Ahmadi, Samim A1 - Kästner, L. A1 - Hauffen, Jan Christian A1 - Jung, P. A1 - Ziegler, Mathias T1 - Photothermal-SR-Net: A Customized Deep Unfolding Neural Network for Photothermal Super Resolution Imaging N2 - This article presents deep unfolding neural networks to handle inverse problems in photothermal radiometry enabling super-resolution (SR) imaging. The photothermal SR approach is a well-known technique to overcome the spatial resolution limitation in photothermal imaging by extracting high-frequency spatial components based on the deconvolution with the thermal point spread function (PSF). However, stable deconvolution can only be achieved by using the sparse structure of defect patterns, which often requires tedious, handcrafted tuning of hyperparameters and results in computationally intensive algorithms. On this account, this article proposes Photothermal-SR-Net, which performs deconvolution by deep unfolding considering the underlying physics. Since defects appear sparsely in materials, our approach includes trained block-sparsity thresholding in each convolutional layer. This enables to super-resolve 2-D thermal images for nondestructive testing (NDT) with a substantially improved convergence rate compared to classic approaches. The performance of the proposed approach is evaluated on various deep unfolding and thresholding approaches. Furthermore, we explored how to increase the reconstruction quality and the computational performance. Thereby, it was found that the computing time for creating high-resolution images could be significantly reduced without decreasing the reconstruction quality by using pixel binning as a preprocessing step. KW - Deep unfolding KW - Defect reconstruction KW - Elastic net KW - Inverse problems KW - Iterative shrinkage thresholding KW - Neural network KW - Nondestructive testing (NDT) KW - Photothermal imaging KW - Super resolution (SR) KW - Thermography PY - 2022 U6 - https://doi.org/10.1109/tim.2022.3154803 SN - 1557-9662 VL - 71 SP - 1 EP - 9 PB - IEEE AN - OPUS4-54678 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Pech May, Nelson Wilbur A1 - Ziegler, Mathias T1 - Detection of surface breaking cracks using flying line laser thermography: A Canny-based algorithm N2 - In this work, we introduce a new algorithm for effectual crack detection using flying line laser thermography, based on the well-known Canny approach. The algorithm transforms the input thermographic sequence into an edge map. Experimental measurements are performed on a metallic component that contains surface breaking cracks due to industrial use. The specimen is tested using flying line thermography at different scanning speeds and laser input powers. Results obtained with the proposed algorithm are additionally compared with a previously established algorithm for flying spot thermography. The proposed Canny-based algorithm can be used in automated systems for thermographic non-destructive testing. T2 - Advanced Infrared Technology and Applications 2021 CY - Online meeting DA - 26.10.2021 KW - Canny approach KW - Flying line thermography KW - Crack detection PY - 2021 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-539628 SN - 2673-4591 VL - 8 IS - 1 SP - 1 EP - 4 PB - MDPI CY - Basel AN - OPUS4-53962 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Ahmadi, Samim A1 - Thummerer, G. A1 - Breitwieser, S. A1 - Mayr, G. A1 - Lecompagnon, Julien A1 - Burgholzer, P. A1 - Jung, P. A1 - Caire, G. A1 - Ziegler, Mathias T1 - Multi-dimensional reconstruction of internal defects in additively manufactured steel using photothermal super resolution combined with virtual wave based image processing N2 - We combine three different approaches to greatly enhance the defect reconstruction ability of active thermographic testing. As experimental approach, laser-based structured illumination is performed in a step-wise manner. As an intermediate signal processing step, the virtual wave concept is used in order to effectively convert the notoriously difficult to solve diffusion-based inverse problem into a somewhat milder wavebased inverse problem. As a final step, a compressed-sensing based optimization procedure is applied which efficiently solves the inverse problem by making advantage of the joint sparsity of multiple blind measurements. To evaluate our proposed processing technique, we investigate an additively manufactured stainless steel sample with eight internal defects. The concerted super resolution approach is compared to conventional thermographic reconstruction techniques and shows an at least four times better spatial resolution. KW - Active thermography KW - Additive manufacturing KW - Stainless steel KW - ADMM KW - Block regularization KW - Internal defects KW - Joint sparsity KW - Laser excitation KW - Multi-dimensional reconstruction KW - Photothermal super resolution KW - Virtual waves PY - 2021 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-525330 SN - 1551-3203 SN - 1941-0050 VL - 17 IS - 11 SP - 7368 EP - 7378 PB - IEEE CY - New York, NY AN - OPUS4-52533 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hauffen, J. C. A1 - Kästner, L. A1 - Ahmadi, Samim A1 - Jung, P. A1 - Caire, G. A1 - Ziegler, Mathias T1 - Learned block iterative shrinkage thresholding algorithm for photothermal super resolution imaging N2 - Block-sparse regularization is already well known in active thermal imaging and is used for multiple-measurement-based inverse problems. The main bottleneck of this method is the choice of regularization parameters which differs for each experiment. We show the benefits of using a learned block iterative shrinkage thresholding algorithm (LBISTA) that is able to learn the choice of regularization parameters, without the need to manually select them. In addition, LBISTA enables the determination of a suitable weight matrix to solve the underlying inverse problem. Therefore, in this paper we present LBISTA and compare it with state-of-the-art block iterative shrinkage thresholding using synthetically generated and experimental test data from active thermography for defect reconstruction. Our results show that the use of the learned block-sparse optimization approach provides smaller normalized mean square errors for a small fixed number of iterations. Thus, this allows us to improve the convergence speed and only needs a few iterations to generate accurate defect reconstruction in photothermal super-resolution imaging. KW - Thermography KW - Laser KW - Machine learning KW - Optimization KW - Non-destructive testing KW - NDT KW - Neural network KW - Defect reconstruction KW - Block-sparsity KW - Active thermal imaging KW - Regularization KW - Laser thermography PY - 2022 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-554598 SN - 1424-8220 VL - 22 IS - 15 SP - 1 EP - 15 PB - MDPI CY - Basel AN - OPUS4-55459 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Thiel, Erik A1 - Kreutzbruck, M. A1 - Ziegler, Mathias T1 - Laser-projected photothermal thermography using thermal wave field interference for subsurface defect characterization N2 - The coherent superposition of two anti-phased thermal wave fields creates a zone of destructive interference which is extremely sensitive to the presence of defects without any reference measurements. Combining a high power laser with a spatial light modulator allows modulating phase and amplitude of an illuminated surface that induces spatially and temporally controlled thermal wave fields. The position and depth of defects are reconstructed from analysis of the Amplitude and Phase of the resulting photothermal signal. The proposed concept is experimentally validated and supported by numerical modeling. KW - Thermal waves KW - Active thermography KW - DMD KW - Spatial light modulator KW - Subsurface defects PY - 2016 UR - http://scitation.aip.org/search?value1=laser+projected+photothermal&option1=all&option912=resultCategory&value912=ResearchPublicationContent&operator8=AND&option8=pub_serialIdent&value8=aip%2Fjournal%2Fapl&qs=true U6 - https://doi.org/10.1063/1.4963139 SN - 0003-6951 VL - 109 IS - 12 SP - 123504-1 EP - 123504-4 PB - AIP Publishing CY - Melville, New York AN - OPUS4-37590 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -