TY - CONF A1 - Frübing, P. A1 - Wang, F. A1 - Günter, C. A1 - Gerhard, R. A1 - Wegener, M. A1 - Jaunich, Matthias A1 - Stark, Wolfgang T1 - Relation between dielectric and mechanical losses in ferroelectric poly(vinylidene fluoride - hexafluoropropylene) films N2 - The temperature dependences of dielectric permittivity and elastic modulus of poly(vinylidene fluoride - hexafluoropropylene) (P(VDF-HFP)) are compared and explained by use of structural data obtained by differential scanning calorimetry and X-ray analysis. Special emphasis is put on the effect of uniaxial stretching which renders the polymer ferroelectric. It is shown that dielectric and mechanical relaxations at the glass transition (aa relaxation) are closely related and not significantly affected by stretching. It is further confirmed that stretching destroys the non-polar spherulitic crystalline structure and produces relatively small-sized polar crystallites. This manifests in the disappearence of the so-called ac relaxation which is associated to molecular motions within the spherulitic crystalline lamellae. However, there are discrepancies between dielectric and mechanical losses above the glass transition which point towards a still not described structural transition. T2 - 10th IEEE International conference on solid dielectrics (ICSD) CY - Potsdam, Germany DA - 2010-07-04 KW - Poly(vinylidene(fluoride - hexafluoropropylene) KW - P(VDF-HFP) KW - Ferroelectric polymer KW - Dielectric relaxation KW - Dynamic mechanical analysis KW - Uniaxial stretching PY - 2010 SN - 978-1-4244-7945-0 U6 - https://doi.org/10.1109/ICSD.2010.5567936 SP - 1 EP - 4(?) AN - OPUS4-23421 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Stinville, J.C. A1 - Charpagne, M.A. A1 - Maaß, Robert A1 - Proudhon, H. A1 - Ludwig, W. A1 - Callahan, P.G. A1 - Wang, F. A1 - Beyerlein, I.J. A1 - Echlin, M.P. A1 - Pollock, T.M. T1 - Insights into Plastic Localization by Crystallographic Slip from Emerging Experimental and Numerical Approaches N2 - Advanced experimental and numerical approaches are being developed to capture the localization of plasticity at the nanometer scale as a function of the multiscale and heterogeneous microstructure present in metallic materials. These innovative approaches promise new avenues to understand microstructural effects on mechanical properties, accelerate alloy design, and enable more accurate mechanical property prediction. This article provides an overview of emerging approaches with a focus on the localization of plasticity by crystallographic slip. New insights into the mechanisms and mechanics of strain localization are addressed. The consequences of the localization of plasticity by deformation slip for mechanical properties of metallic materials are also detailed. KW - Slip localization KW - Metallic materials KW - Experimental and numerical techniques KW - Mechanical properties KW - Plasticity PY - 2023 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-578398 SN - 1531-7331 VL - 53 SP - 275 EP - 317 AN - OPUS4-57839 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Bennet, Francesca A1 - Opitz, R. A1 - Ghoreishi, N. A1 - Plate, K. A1 - Barnes, J.-P. A1 - Bellew, A. A1 - Bellu, A. A1 - Ceccone, G. A1 - de Vito, E. A1 - Delcorte, A. A1 - Franquet, A. A1 - Fumageli, F. A1 - Gilliland, D. A1 - Jungnickel, H. A1 - Lee, T.G. A1 - Poleunis, C. A1 - Rading, D. A1 - Shon, H.K. A1 - Spampinato, V. A1 - Son, J.G. A1 - Wang, F. A1 - Wang, Y.-C. A. A1 - Zhao, Y. A1 - Roloff, A. A1 - Tentschert, J. A1 - Radnik, Jörg T1 - VAMAS TWA2 interlaboratory comparison: Surface analysis of TiO2 nanoparticles using ToF-SIMS N2 - Due to the extremely high specific surface area of nanoparticles and corresponding potential for adsorption, the results of surface analysis can be highly dependent on the history of the particles, particularly regarding sample preparation and storage. The sample preparation method has, therefore, the potential to have a significant influence on the results. This report describes an interlaboratory comparison (ILC) with the aim of assessing which sample preparation methods for ToF-SIMS analysis of nanoparticles provided the most intra- and interlaboratory consistency and the least amount of sample contamination. The BAM reference material BAM-P110 (TiO2 nanoparticles with a mean Feret diameter of 19 nm) was used as a sample representing typical nanoparticles. A total of 11 participants returned ToF-SIMS data,in positive and (optionally) negative polarity, using sample preparation methods of “stick-and-go” as well as optionally “drop-dry” and “spin-coat.” The results showed that the largest sources of variation within the entire data set were caused by adventitious hydrocarbon contamination or insufficient sample coverage, with the spin-coating protocol applied in this ILC showing a tendency toward insufficient sample coverage; the sample preparation method or the participant had a lesser influence on results. KW - Secondary Ion Mass Spectrometry KW - VMAAS KW - Titania KW - Interlaboratory comparison KW - Reproducibility PY - 2023 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-582290 SN - 0734-2101 VL - 41 IS - 5 SP - 053210-1 EP - 053210-13 PB - AIP (American Institute of Physics) AN - OPUS4-58229 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -