TY - GEN A1 - Hentschel, Manfred P. A1 - Lange, Axel A1 - Schors, Jörg A1 - Wald, Oliver ED - Geer, R. T1 - X-Ray Diffraction Topography images materials by molecular probe T2 - Testing, reliability, and application of micro- and nano-material systems III T2 - Testing, Reliability, and Application of Micro- and Nano-Material Systems II CY - San Diego, CA, USA DA - 2005-03-08 KW - X-ray diffraction KW - X-ray topography KW - X-ray microscopy KW - Texture KW - Polymers KW - Composites KW - Ceramics KW - Compounds KW - Molecular probe KW - Non-metallics PY - 2005 SN - 0-8194-5747-7 N1 - Serientitel: SPIE proceedings series – Series title: SPIE proceedings series IS - 5766 SP - 9 EP - 14 PB - SPIE CY - Bellingham AN - OPUS4-11700 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -