TY - CONF A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Weidner, Steffen A1 - Geng, Sh. A1 - Wigant, L. A1 - Wöll, Ch. A1 - Erdmann, J. A1 - Gorsler, H.-V. T1 - Characterization of plasma-modified organic surfaces by electron spectroscopy, SEIRA, and MALDI-TOF-MS T2 - 6th European Conference on Applications of Surface and Interface Analysis CY - Montreux, Switzerland DA - 1995-10-09 PY - 1995 SP - TC 11 PB - Wiley CY - Chichester AN - OPUS4-7001 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Lippitz, Andreas A1 - Koprinarov, Ivaylo A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang A1 - Weiss, K. A1 - Wöll, Ch. T1 - Surface analysis of metaillized poly(bisphenol A cabonate) films by x-ray absorption spectroscopy (NEXAFS) KW - NEXAFS KW - Röntgenadsorptionsspektroskopie KW - Oberflächenanalyse KW - Film, metallisiert KW - Polymeroberfläche PY - 1996 SN - 0032-3861 SN - 1873-2291 VL - 37 IS - 14 SP - 3157 EP - 3160 PB - Springer CY - Berlin AN - OPUS4-649 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Lippitz, Andreas A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang A1 - Schertel, A. A1 - Wöll, Ch. T1 - Surface analysis of partially crystalline and amorphous poly(ethylene terephthalate) samples by x-ray absorption spectroscopy (NEXAFS) KW - NEXAFS KW - Röntgenadsorptionsspektroskopie KW - Oberflächenanalyse KW - Polymeroberfläche PY - 1996 SN - 0032-3861 SN - 1873-2291 VL - 37 IS - 14 SP - 3151 EP - 3155 PB - Springer CY - Berlin AN - OPUS4-650 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Lippitz, Andreas A1 - Koprinarov, Ivaylo A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang A1 - Schertel, A. A1 - Wöll, Ch. T1 - NEXAFS analysis of a plasma treated, partially crystalline poly(ehtylene terephtalate) surface KW - NEXAFS KW - Röntgenstrukturanalyse KW - Oberflächen behandeln KW - Plasma PY - 1996 SN - 0179-4159 SP - 279 EP - 281 PB - Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung CY - Berlin AN - OPUS4-681 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Koprinarov, Ivaylo A1 - Lippitz, Andreas A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang A1 - Wöll, Ch. T1 - Surface analysis of DC oxygen plasma treated or chromium evaporated poly(ethylene terephthalate) foils by soft X-ray absorption spectroscopy (NEXAFS) KW - Biaxially streched poly(ehtylene terephthalate) KW - Oxygen DC plasma treatment KW - Metallization with chromium PY - 1997 SN - 0032-3861 SN - 1873-2291 VL - 38 IS - 8 SP - 2005 EP - 2010 PB - Springer CY - Berlin AN - OPUS4-6998 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Friedrich, Jörg Florian A1 - Koprinarov, Ivaylo A1 - Weiss, K. A1 - Wöll, Ch. ED - Mittal, K. T1 - The Application of Near Edge X-ray Absorption Fine Structures (NEXAFS) Spectroscopy and X-ray Photoelectron Spectroscopy (XPS) in Surface Analysis of Chromium-evaporated Polymers and Organic Films PY - 1998 SN - 90-6764-290-8 SP - 147 EP - 168 PB - VSP CY - Utrecht AN - OPUS4-6986 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Koprinarov, Ivaylo A1 - Lippitz, Andreas A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang A1 - Wöll, Ch. T1 - Oxygen plama induced degradation of the surface of poly(styrene), poly(bisphenol-A-carbonate) and poly(ethylene terephthalate) as observed by soft X-ray absorption spectroscopy (NEXAFS) KW - Oxygen DC plasma treatment KW - Plasma degradation KW - X-ray absorption spectroscopy (NEXAFS) PY - 1998 SN - 0032-3861 SN - 1873-2291 VL - 39 IS - 14 SP - 3001 EP - 3009 PB - Springer CY - Berlin AN - OPUS4-6990 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Gross, Thomas A1 - Friedrich, Jörg Florian A1 - Wöll, Ch. A1 - Nick, L. T1 - The Use of Octadecyltrichlorosilane Self-Assembled Layers as a Model for the Assessment of Plasma Treatment and Metallization Effects on Polyolefins N2 - Self-assembled octadecyltrichlorosilane (CH3(CH2)17SiCl3, OTS) films were deposited on an oxidized silicon wafer. They were carefully exposed to a low-pressure oxygen direct current (dc) plasma and/or Cr vapor. Subsequently, they were characterized by X-ray photoelectron spectroscopy, near-edge X-ray absorption fine structure spectroscopy, and atomic force microscopy. Detailed information on the oxygen functionalization and the molecular conformation of the OTS films was obtained. The main result was that functionalization conditions can be found where the order of the film remains almost unaffected. Similarly, Cr evaporation of pure OTS films revealed only slight effects on the order in the film. Cr evaporation of an ordered but functionalized OTS film immediately changes its state toward a fully isotropic one. In the course of interaction, oxygen sites at the surface of the functionalized OTS film are reduced whereas Cr becomes oxidized. A redox reaction scheme is proposed for this interfacial reaction. Finally, it is concluded that the given study should be of importance for advanced plasma processing of polyolefins. KW - NEXAFS KW - OTS Self-Assembled Layers PY - 1999 U6 - https://doi.org/10.1021/la981174l SN - 0743-7463 SN - 1520-5827 VL - 15 IS - 4 SP - 1161 EP - 1166 PB - American Chemical Society CY - Washington, DC AN - OPUS4-808 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Giebler, Rainer A1 - Unger, Wolfgang A1 - Schulz, B. A1 - Reiche, J. A1 - Brehmer, L. A1 - Wühn, M. A1 - Wöll, Ch. A1 - Smith, A.P. A1 - Urquhart, S.G. T1 - Near-Edge X-ray Absorption Fine Structure Spectroscopy on Ordered Films of an Amphiphilic Derivate of 2,5-Diphenyl-1,3,4-Oxadiazole KW - NEXAFS KW - OMBD KW - X-ray Absorption Spectroscopy PY - 1999 SN - 0743-7463 SN - 1520-5827 VL - 15 IS - 4 SP - 1291 EP - 1298 PB - American Chemical Society CY - Washington, DC AN - OPUS4-828 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Koprinarov, Ivaylo A1 - Friedrich, Jörg Florian A1 - Wöll, Ch. T1 - K-Edge Soft X-ray Absorption (NEXAFS) Spectroscopy In Surface Chemical Analysis of Polymers T2 - International Discussion Meeting Advanced Methods of Polymer Characterization: New Developments and Applications in Industry CY - Mainz, Germany DA - 1999-03-15 PY - 1999 SP - P3.53 CY - Mainz AN - OPUS4-6925 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -