TY - GEN A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Friedrich, Jörg Florian A1 - Koprinarov, Ivaylo A1 - Weiss, K. A1 - Wöll, Ch. ED - Mittal, K. T1 - The Application of Near Edge X-ray Absorption Fine Structures (NEXAFS) Spectroscopy and X-ray Photoelectron Spectroscopy (XPS) in Surface Analysis of Chromium-evaporated Polymers and Organic Films PY - 1998 SN - 90-6764-290-8 SP - 147 EP - 168 PB - VSP CY - Utrecht AN - OPUS4-6986 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -