TY - JOUR A1 - Dörfel, Ilona A1 - Österle, Werner A1 - Urban, Ingrid A1 - Bouzy, E. T1 - Microstructural characterization of binary and ternary hard coating systems for wear protection - Part I: PVD coatings JF - Surface and coatings technology N2 - Different wear-resistant coatings produced by physical vapour deposition (PVD) were characterized with the aid of cross-sectional transmission electron microscopy (XTEM). All coating systems were optimized by the producers and exhibited good properties with respect to their special applications. The microstructure, texture and chemical composition of binary and ternary systems produced by the arc process [TiN, CrN, Cr2N (Ti, Cr)N on steel substrates] and magnetron sputtering process [TiN, CrN on steel substrates, (Ti, Al)N on Si-substrate] were investigated. All coatings had a more or less columnar microstructure, which was interrupted by interlayers in some cases. Whereas arc coatings always did show some kind of substrate modification, the latter was not observed after magnetron sputtering. Electron diffraction normally revealed a mono-phase fcc structure, except at sites very near to the interface. Only for the systems Cr–N and (Ti, Cr)–N were different additional phases observed at low nitrogen partial pressures. KW - Arc bond sputtering KW - Arc deposition KW - Magnetron sputtering KW - TEM KW - XTEM PY - 1999 UR - http://www.sciencedirect.com/science?_ob=ArticleURL&_udi=B6TVV-3VTRSCY-G&_user=963821&_coverDate=01%2F29%2F1999&_rdoc=14&_fmt=summary&_orig=browse&_srch=doc-info(%23toc%235544%231999%23998889997%2360972%23FLA%23display%23Volume)&_cdi=5544&_sort=d&_docanch DO - https://doi.org/10.1016/S0257-8972(98)00735-X SN - 0257-8972 VL - 111 IS - 2-3 SP - 199 EP - 209 PB - Elsevier Science CY - Lausanne AN - OPUS4-2364 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Dörfel, Ilona A1 - Österle, Werner A1 - Urban, Ingrid A1 - Bouzy, E. A1 - Morlok, O. T1 - Microstructural characterization of binary and ternary hard coating sytems for wear protection - Part II: Ti(CN) PACVD coatings JF - Surface and coatings technology KW - Microstructure KW - PACVD KW - Solid lubrication KW - Texture KW - TiC KW - TiN KW - Ti(CN) PY - 1999 SN - 0257-8972 VL - 116-119 SP - 898 EP - 905 PB - Elsevier Science CY - Lausanne AN - OPUS4-2365 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Dück, Alexander A1 - Gamer, Nadja A1 - Gesatzke, Wolfgang A1 - Griepentrog, Michael A1 - Österle, Werner A1 - Sahre, Mario A1 - Urban, Ingrid T1 - Ti/TiN multilayer coatings: deposition technique, characterization and mechanical properties JF - Surface and coatings technology N2 - Ti/TiN multilayer coatings with multilayer periods in the range 5–50 nm and a final thickness of 2 µm were deposited on steel substrates by cyclic modulation of nitrogen gas flow into the chamber of a PVD sputtering device. Coating characterization was performed by cross-sectional transmission electron microscopy, glancing-angle X-ray diffraction and instrumental indentation testing. Individual a-titanium and titanium nitride layers were always observed, although for the finer microstructures, the TiN layers were thicker than the Ti layers by a factor three. The plastic hardness of the films increased steadily with decreasing layer spacing, following a Hall–Petch relationship. Finally, a hardness value of 42 GPa was reached, which is similar to that of a thick TiN monolayer, prepared under the same coating conditions. KW - Ti/TiN KW - Multilayer KW - Magnetron sputtering KW - Mechanical properties KW - Cross-sectional transmission electron microscopy (XTEM) PY - 2001 DO - https://doi.org/10.1016/S0257-8972(01)01171-9 SN - 0257-8972 VL - 142-144 SP - 579 EP - 584 PB - Elsevier Science CY - Lausanne AN - OPUS4-7646 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Engelhardt, Monika A1 - Gesatzke, Wolfgang A1 - Österle, Werner A1 - Müller, Urs A1 - Rooch, Heidemarie A1 - Saliwan Neumann, Romeo A1 - Urban, Ingrid T1 - Makro- und Mikrogefüge von Bremsbelägen T2 - Fortschritte in der Metallographie - Vortragstexte der 39. Metallographie-Tagung KW - Bremsbelag KW - Polymermatrix-Verbundstoff KW - Röntgenfluoreszenzanalyse KW - REM KW - FIB KW - TEM PY - 2005 SN - 3-88355-343-3 SN - 0343-3579 N1 - Serientitel: Sonderbände der praktischen Metallographie – Series title: Sonderbände der praktischen Metallographie IS - 37 SP - 105 EP - 110 PB - Werkstoff-Informationsges. CY - Frankfurt AN - OPUS4-10996 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Gesatzke, Wolfgang A1 - Österle, Werner A1 - Rooch, Heidemarie A1 - Urban, Ingrid ED - Portella, Pedro Dolabella T1 - Präparation von Mikro-Querschnitten mit dem fokussierten Ionenstrahl (FIB) T2 - Fortschritte in der Metallographie - Vortragstexte der 37. Metallographie-Tagung T2 - 37. Metallographie-Tagung CY - Berlin, Deutschland DA - 2003-09-17 PY - 2004 SN - 3-88355-322-0 SN - 0343-3579 N1 - Serientitel: Sonderbände der praktischen Metallographie – Series title: Sonderbände der praktischen Metallographie IS - 35 SP - 145 EP - 149 PB - Werkstoff-Informationsges. CY - Frankfurt AN - OPUS4-7641 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Klein, A. A1 - Urban, Ingrid A1 - Ressel, P. A1 - Nebauer, E. A1 - Merkel, U. A1 - Österle, Werner T1 - Preparation, transmission electron microscopy, and microanalytical investigations of metal-III-V semiconductor interfaces JF - Materials characterization PY - 1996 SN - 1044-5803 SN - 1873-4189 VL - 37 SP - 143 EP - 151 PB - Elsevier CY - New York, NY AN - OPUS4-2528 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kranzmann, Axel A1 - Hünert, Daniela A1 - Rooch, Heidemarie A1 - Urban, Ingrid A1 - Schulz, Wencke A1 - Österle, Werner T1 - Reactions at the interface between steel and oxide scale in wet CO2 containing atmospheres T2 - NACE International corrosion conference 2009 (Proceedings) N2 - The resistance of structural steels against corrosion in CO2-H2O and CO2-H2O-O2 atmospheres at temperatures above 550°C was observed with high magnification methods. The test atmosphere is the basic composition of an oxyfuel coal combustion atmosphere. The analytical information base was applied to develop reaction schemes for the oxidation of steels. It was demonstrated that the formation of phases and the kinetics of oxidation reactions in this atmospheres is affected by the formation of intermediate iron hydroxide and a high carbon activity. In the temperature regime above 550°C the thermal equilibrium between H2O, CO2 and Fe reacted and formed CO. CO triggers the formation of FeO and carbides and increases the reaction kinetics. Porosity at the interface is established by gaseous phases such as Fe(OH)2 or H2O. H2 formation is not limited to the steel - oxide interface but can occur in the whole oxide scale. Examples of the experimental results were compared with a thermodynamic approach. The objective of the work was to derive qualitative rules of the basic corrosion reactions. T2 - NACE International corrosion conference 2009 CY - Atlanta, Georgia, USA DA - 2009-03-22 KW - High temperature corrosion KW - Corrosion gases KW - Mild steels KW - 9-12% Cr-steels KW - Hydrogen transport KW - Oxyfuel combustion PY - 2009 SP - 1 EP - 10 (Paper 09265) AN - OPUS4-22334 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kuhmann, J. F. A1 - Chiang, C. H. A1 - Harde, P. A1 - Reier, F. A1 - Österle, Werner A1 - Urban, Ingrid A1 - Klein, A. T1 - Pt thin-film metallization for FC-bonding using SnPb60/40 solder bump metallurgy JF - Materials Science and Engineering N2 - Platinum does not form any adherent oxides and can be easily wetted by tin-based solders. Platinum is also an available metallization in semiconductor laboratories. Therefore we investigated the diffusion of platinum thin-film metallizations into eutectic tin–lead solder by using a high-resolution secondary ion mass spectroscopy (SIMS) profiling from the back side. It is shown that an intermetallic phase (PtSn4) is formed during soldering, which controls the consumption of platinum during soldering and in operation. The consumption of platinum follows the well-known parabolic diffusion law. The activation energy of this process is 0.63 eV. Even at extended heating cycles of 2 min at 250°C, 190 nm from the original 300 nm of the platinum film remain undissolved. This high stability makes platinum a very attractive thin-film metallization for flip-chip (FC) bonding of new microsystems. KW - Pt thin film metallization KW - FC solder bonding KW - Diffusion KW - SIMS PY - 1998 SN - 0921-5093 VL - A242 SP - 22 EP - 25 PB - Elsevier AN - OPUS4-38540 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Ressel, P. A1 - Österle, Werner A1 - Urban, Ingrid A1 - Dörfel, Ilona A1 - Klein, A. A1 - Vogel, K. A1 - Kräutle, H. T1 - Transmission electron microscopy study of rapid thermally annealed Pd/Ge contacts on IN0.53Ga0.47As JF - Journal of applied physics PY - 1996 SN - 0021-8979 SN - 1089-7550 VL - 88 SP - 3910 EP - 3914 PB - American Institute of Physics CY - Melville, NY AN - OPUS4-2514 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Ressel, P. A1 - Österle, Werner A1 - Urban, Ingrid A1 - Klein, A. A1 - Vogel, K. A1 - Kräutle, H. T1 - Transmission electron microscopy study of rapid thermally annealed Pd/Ge contacts on In0.53Ga0.47As JF - Journal of Applied Physics N2 - Phase formation in rapid thermally annealed Pd/Ge contacts on In0.53Ga0.47As has been investigated by means of cross-sectional transmission electron microscopy, convergent-beam electron diffraction, and energy-dispersive x-ray analysis. Solid-phase regrowth is observed to occur similarly as in Pd/Ge contacts on GaAs or InP. The reaction starts at low temperatures with the formation of an amorphous Pd–In–Ga–As layer, which crystallizes at elevated temperatures yielding hexagonal Pd4In0.53Ga0.47As being first described in this work. At temperatures .250 °C, this phase decomposes due to epitaxial solid-phase regrowth of In0.53Ga0.47As and formation of Pd–Ge phases. The stable composition is reached at temperatures .350 °C with excess Ge diffused through top Pd–Ge to the contact interface and growing epitaxially on the semiconductor. KW - Semiconductor KW - Thin film contact layer KW - Electron microscopy KW - Intermetallic phases PY - 1996 DO - https://doi.org/10.1063/1.363348 SN - 0021-8979 VL - 80 IS - 7 SP - 3910 EP - 3914 AN - OPUS4-38537 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -