TY - CONF A1 - Sturm, Heinz T1 - An AFM-ESEM hybrid instrument T2 - BAM Symposium "Polymere Verbundwerkstoffe zwischen Raumtemperatur und 4,2K" CY - Berlin, Germany DA - 2003-02-27 PY - 2003 AN - OPUS4-4095 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Scanning Force Microscopy based Lithography T2 - Anwendertreffen JPK Instruments CY - Berlin, Germany DA - 2003-09-18 PY - 2003 AN - OPUS4-2916 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Bonse, Jörn A1 - Munz, Martin A1 - Sturm, Heinz ED - Vajtai, R. T1 - Scanning force microscopic investigations of the femtosecond pulse laser ablation of indium phosphide in air N2 - Laser ablation of single-crystalline indium phosphide (InP) was performed in air by means of linearly polarized Ti:sapphire femtosecond-pulses (800 nm, 130 fs, 10 Hz). As a result of the first laser pulses, several morphological changes (crater formation, rim formation, ripple structures and cones) were observed. These effects were explored using force modulation microscopy (FMM), a technique based on scanning force microscopy (SFM), allowing the simultaneous imaging of both topography and local stiffness at a high lateral resolution. The first laser pulse induces the formation of a protruding rim (height <20 nm, width ~300 nm) bordering the ablated crater. A Fourier-analysis of the multi-pulse generated topographies reveals the formation of wavelength-sized periodic ripples (modulation depth <100 nm) with an orientation perpendicular to that of the electric field vector of the laser radiation. Besides these morphological alterations, also material modifications were observed in the irradiated regions by means of the FFM technique. Within the ablated craters, local stiffness variations were found revealing an inhomogeneous material composition/structure as a consequence of the femtosecond pulse laser treatment. T2 - Nanotechnology Conference 2003 CY - Maspalomas, Gran Canaria, Spain DA - 2003-05-19 KW - Femtosecond laser irradiation KW - Microstructure KW - Indium phosphide KW - Scanning/atomic force microscopy (SFM/AFM) KW - Stiffness KW - Laser induced periodic surface structures (LIPSS) PY - 2003 UR - http://cat.inist.fr/?aModele=afficheN&cpsidt=15329222 SN - 0-8194-4978-4 N1 - Serientitel: SPIE proceedings series – Series title: SPIE proceedings series IS - 5118 SP - 221 EP - 234 PB - SPIE, the International Society for Optical Engineering CY - Bellingham, Wash. AN - OPUS4-2865 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Bonse, Jörn A1 - Munz, Martin A1 - Sturm, Heinz T1 - Scanning force microscopic investigations of the femtosecond laser pulse irradiation of indium phosphide in air N2 - Laser ablation of single-crystalline indium phosphide (InP) was performed in air by means of linearly polarized Ti : sapphire femtosecond pulses (800 nm, 130 fs, 10 Hz). As a result of the irradiation with a variable number of laser pulses per spot (N /spl les/ 5), several morphological changes (crater formation, rim formation, ripple structures, and cones) were observed. These effects were explored using force modulation microscopy (FMM), a technique based on scanning force microscopy, allowing the simultaneous imaging of both topography and local stiffness at a high lateral resolution. The first laser pulse induces the formation of a protruding rim (height < 20 nm, width /spl ap/ 300 nm) bordering the ablated crater. A Fourier analysis of the multipulse generated topographies reveals the formation of wavelength-sized periodic ripples (modulation depth < 100 nm) with an orientation perpendicular to that of the electric field vector of the laser radiation. Besides these morphological alterations, material modifications were also observed in the irradiated regions by means of the FMM technique. Within the ablated craters, local stiffness variations were found revealing an inhomogeneous material composition/structure as a consequence of the femtosecond pulse laser treatment. KW - Laser materials-processing applications KW - Laser radiation effects KW - Microscopy KW - Semiconductor materials KW - Ultrafast optics PY - 2004 DO - https://doi.org/10.1109/TNANO.2004.828574 SN - 1536-125X SN - 1941-0085 VL - 3 IS - 3 SP - 358 EP - 367 PB - Institute of Electrical and Electronics Engineers CY - New York, NY AN - OPUS4-4067 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Solomun, Tihomir A1 - Schimanski, A. A1 - Sturm, Heinz A1 - Mix, Renate A1 - Illenberger, E. T1 - Surface Modification of Polyamides by Direct Fluorination N2 - Bulk samples and thin films of polyamides (PA6 and PA12) were exposed to fluorine (1 - 10 vol.-% F2 in N2) and analysed with photoelectron (XPS) and infrared spectroscopy. Fluorination affects both, the amide and the hydrocarbon parts of the polymers. However, only the carbon atom next to the carbonyl is readily fluorinated. Chemical modification of the amide group is apparent in a large binding energy shift (+5 eV) of the N1s level and the appearance of a CO band at 1734 cm-1. It is concluded that the amide C-N bond is cleaved in the fluorination process and that COOH and NF2 end groups are formed. This conclusion is corroborated by the appearance of ester oxygen in the XPS and by the 19F NMR spectra of the volatile products that show fluorine signals chemically shifted about 200 ppm towards lower field as compared with the CHF environment. KW - Gasfluorierung KW - IR KW - XPS KW - AFM KW - NF2-Gruppe PY - 2004 UR - http://www.e-polymers.org SN - 1618-7229 IS - 8 SP - 1 EP - 16 PB - De Gruyter CY - [S.l.] AN - OPUS4-3425 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - Atomic force microscopy with simultaneous AC conductivity contrast for the analysis of carbon fibre surfaces KW - Carbon fibre KW - Surface analysis KW - Conductivity microscopy KW - Scanning force microscopy KW - Scanning tunneling microscopy KW - Fiber surfaces PY - 1996 SN - 1359-835X VL - 27 IS - 9 SP - 677 EP - 684 PB - Elsevier CY - Oxford AN - OPUS4-6849 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - Local AC current contrast on carbon fiber surfaces imaged by scanning force microscopy N2 - After a delamination process in a C-fiber reinforced polymer composite, the identification of the polymer residue of poly-(phenylene sulphide) on carbon fiber surfaces gives important information on the composite failure mechanism. Using scanning force microscopy (SFM) in its lateral force imaging mode or with the stiffness imaging mode, it is almost impossible to distinguish the two composite components owing to a very low material-based contrast of the local friction and compliance. The new technique using contrast based on a local AC current measurement allows a clear identification of the conducting carbon fiber and the non-conducting polymer coverage. KW - Matrix adhesion KW - Films KW - Photoconduction KW - Composites PY - 1995 DO - https://doi.org/10.1002/actp.1995.010460505 SN - 0323-7648 SN - 1521-4044 VL - 46 IS - 5 SP - 379 EP - 384 PB - Wiley-VCH Verl. CY - Weinheim, Germany AN - OPUS4-6848 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Bovtun, V. A1 - Sturm, Heinz A1 - Pashkov, V.M. ED - Baptista, J. T1 - Investigation of local electrical properties and topography of homo- and heterogeneous TiO2-containing ceramics by scanning force microscopy (SFM) T2 - 5th International Conference on Electronic Ceramics & Applications CY - Aveiro, Portugal DA - 1996-09-02 KW - Ceramics KW - Scanning force microscopy KW - SFM KW - Electrical properties KW - Heterogeneity PY - 1996 SN - 972-828317-2 VL - 2 SP - 117 EP - 120 PB - Fundação João Jacinto de Magalhães CY - Aveiro AN - OPUS4-6850 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Munz, Martin A1 - Schulz, Eckhard T1 - SFM of Polymers with Harmonically Modulated Friction Force T2 - 24th Intern. TopoMetrix-Workshop: Aktuelle Entwicklungen in der Nanotechnologie und der Rastersondenmikroskopie, Humboldt-Universität CY - Berlin, Germany DA - 1998-03-12 PY - 1998 AN - OPUS4-6459 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Heyde, M. A1 - Rademann, K. T1 - Nichtlinearität und Hysterese von AFM-Piezos T2 - 24th Intern. TopoMetrix-Workshop: Aktuelle Entwicklungen in der Nanotechnologie und Rastersondenmikroskopie, Humboldt-Universität CY - Berlin, Germany DA - 1998-03-12 PY - 1998 AN - OPUS4-6462 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Heyde, M. A1 - Rademann, K. T1 - Analysis of Scanning Probe Microscopy (SPM) Piezos T2 - Digital-Instruments User-Workshop an der TU Dresden CY - Dresden, Germany DA - 1999-04-07 PY - 1999 AN - OPUS4-6498 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Munz, Martin T1 - Harmonically Modulated Friction Force Microscopy of Polymers and Composites T2 - Workshop "Scanning Probe Microscopy In the New Millennium" CY - Faure, South Africa DA - 2001-02-26 PY - 2001 AN - OPUS4-6512 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Polymere in der AFM-basierten Mikrosystemtechnik - Chancen und Problem anhand zweier Anwendungsbeispiele T2 - Workshop: Microscopy 2000, TU Chemnitz CY - Chemnitz, Germany DA - 2000-03-14 PY - 2000 AN - OPUS4-6503 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Nanomechanics in Scanning Force Microscopy (SFM) T2 - 1st Latin American Symposium on Scanning Probe Microscopy (LA SPM1) CY - São Carlos, Brazil DA - 2001-03-29 PY - 2001 AN - OPUS4-6515 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Harmonisch modulierte Reibmikroskopie an Modellproben von Bremsbelägen T2 - Kolloquium im Sfb 605 - Elementarreibereignisse an der TU Berlin CY - Berlin, Germany DA - 2000-05-18 PY - 2000 AN - OPUS4-6504 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Untersuchung heterogener Werkstoffe mittels dynamisch-mechanischer Zusatz-Kontraste im AFM T2 - 17. SPM Workshop: Fhl. Keramische Technologien und Sinterwerkstoffe CY - Dresden, Germany DA - 1997-03-13 PY - 1997 AN - OPUS4-6413 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Schulz, Eckhard A1 - Munz, Martin T1 - Der dynamische Reibkontrast als eine Methode zur Charakterisierung von Polymeroberflächen in der Rasterkraftmikroskopie T2 - Frühjahrstagung der DPG, FA: Polymerphysik CY - Münster, Germany DA - 1997-03-17 PY - 1997 AN - OPUS4-6415 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Messungen elektrischer Eigenschaften in der Rasterkraftmikroskopie T2 - Forschungsseminar zur Oberflächenphysik der Lehrstühle: Oberflächenphysik und Atomstoßprozesse und Elektronische Eigenschaften und Supraleitung CY - Berlin, Germany DA - 1997-11-17 PY - 1997 AN - OPUS4-6428 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Rasterkraftmikroskopische Verfahren zur Charakterisierung von Polymeroberflächen T2 - DECHEMA-Workshop: Mechanische Eigenschaften von Schichtsystemen CY - Frankfurt am Main, Germany DA - 1997-09-29 PY - 1997 AN - OPUS4-6418 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Studies of polymers by SPM T2 - Workshop em Microscopia de Forca Atomica e tecnicas correlatas CY - Rio de Janeiro, Brazil DA - 1997-10-14 PY - 1997 AN - OPUS4-6422 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Munz, Martin A1 - Schulz, Eckhard T1 - Nanomechanics at the Carbon Fibre/PPS interface: A combined SFM study of Topography, AC Conductivity and Surface Stiffness T2 - 24th Intern. TopoMetrix-Workshop: Aktuelle Entwicklungen in der Nanotechnologie und der Rastersondenmikroskopie, Humboldt-Universität CY - Berlin, Germany DA - 1998-03-12 PY - 1998 AN - OPUS4-6458 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Studies of polymers by SPM T2 - First Workshop on Scanning Probe Microscopy CY - São Carlos, Brazil DA - 1997-10-10 PY - 1997 AN - OPUS4-6420 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - From microstructures to nanodots: AFM experiments with a piezoelectric polymer T2 - iThemba LABS CY - Somerset West, South Africa DA - 2002-02-03 PY - 2002 AN - OPUS4-6527 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - How to write functional areas on polymers using DPL - a way to produce nanoarrays for life science applications T2 - iThemba LABS CY - Somerset West, South Africa DA - 2002-02-03 PY - 2002 AN - OPUS4-6528 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Stark, Wolfgang A1 - Schulz, Eckhard T1 - Messung elektrischer Eigenschaften in der Rasterkraftmikroskopie: der Aufladungskontrast auf nichtleitenden Oberflächen T2 - Tagung "Raster-Sonden-Mikroskopien und organische Materialien IV" CY - Munich, Germany DA - 1995-10-11 PY - 1995 AN - OPUS4-6389 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Stark, Wolfgang A1 - Schulz, Eckhard T1 - Messung elektrischer Eigenschaften in der Rasterkraftmikroskopie: Leitfähigkeitskontrast und Ladungskontrast T2 - 1. Jenaer Anwendersymposium Rastersondenmikroskopie CY - Jena, Germany DA - 1995-11-22 PY - 1995 AN - OPUS4-6390 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - Untersuchungen zur Materialzusammensetzung der Oberfläche eines Polymerblends: Eine vergleichende Studie zur Aussagefähigkeit mechanischer und elektrischer Zusatzkontraste im SFM T2 - Diskussionstagung: Raster-Sonden-Mikroskopien und Organische Materialien V CY - Münster, Germany DA - 1996-10-09 PY - 1996 AN - OPUS4-6391 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - Atomic force microscopy with simultaneous AC conductivity contrast for the analysis of carbon fibre surfaces T2 - IPCM (Interfacial Phenomena in Composite Materials) CY - Eindhoven, Netherlands DA - 1995-09-10 PY - 1995 AN - OPUS4-6385 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - AFM an Polymer- und Faseroberflächen T2 - Institut für Textil- und Faserchemie, Universität Stuttgart CY - Stuttgart, Germany DA - 1996-11-12 PY - 1996 AN - OPUS4-6397 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Messung elektrischer Eigenschaften in der Rastersondenmikroskopie T2 - Universität Ulm CY - Ulm, Germany DA - 1996-08-02 PY - 1996 AN - OPUS4-6398 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Methoden zur Messung elekrischer Eigenschaften in der Rasterkraftmikroskopie T2 - 3. Mikrosymposium: Elektronenmikroskopie in der Materialforschung - Rasterkraftmikroskopie an Polymeren an der Martin-Luther-Universität Halle-Wittenberg CY - Merseburg, Germany DA - 1996-05-31 PY - 1996 AN - OPUS4-6399 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - Rasterkraftmikroskopie auf Oberflächen polymerer Werkstoffe T2 - Berliner Polymeren-Tage CY - Potsdam, Germany DA - 1994-10-05 PY - 1994 AN - OPUS4-6371 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - Rasterkraftmikroskopie mit Leitfähigkeitskontrast T2 - Tagung "Raster-Sonden-Methoden und Organische Materialien" am Europäischen Lab. für Molekularbiologie CY - Heidelberg, Germany DA - 1994-10-11 PY - 1994 AN - OPUS4-6372 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - Polymere Faserwerkstoffe und die STM/AFM T2 - Diskussions-Tagung "Raster-Nahfeld-Mikroskopien und organische Materialien" CY - Planegg, Germany DA - 1992-07-08 PY - 1992 AN - OPUS4-6377 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Anwendungen der Rasterkraftmikroskopie auf polymere Werkstoffe T2 - Berliner Verband für Polymerforschung CY - Berlin, Germany DA - 1993-05-05 PY - 1993 AN - OPUS4-6381 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Rasterkraftmikroskopie in der Faserverbundwerkstoffforschung T2 - Berliner Polymerentage CY - Berlin, Germany DA - 1993-05-06 PY - 1993 AN - OPUS4-6382 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Rastersondenmikroskopische Verfahren zur Messung lokaler elektrischer Eigenschaften von Festkörpern T2 - TU Berlin CY - Berlin, Germany DA - 1996-04-19 PY - 1996 AN - OPUS4-6400 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Munz, Martin A1 - Schulz, Eckhard T1 - SFM-Nanomechanics - Constant Dynamic Indentation- and Harmonically Modulated Friction Force- Microscopy T2 - Workshop: Rastersondenmikroskopie in Forschung und Industrie an der GH Wuppertal CY - Wuppertal, Germany DA - 1999-03-11 PY - 1999 AN - OPUS4-6495 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Schulz, Eckhard A1 - Munz, Martin A1 - Hinrichsen, G. T1 - Characterisierung des Faser/Polymer-Interface mittels messungen lokaler mikromechanischer Eigenschaften in der Rasterkraftmikroskopie T2 - Frühjahrstagung der DPG, FA: Polymerphysik CY - Münster, Germany DA - 1997-03-17 PY - 1997 AN - OPUS4-6414 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Heyde, M. A1 - Munz, Martin A1 - Rademann, K. T1 - Physical properties of nanometer sized particles characterised by Scanning Probe Microscopy Techniques T2 - 2nd German Brazilian Workshop on Applied Surface Science CY - Templin, Germany DA - 1998-09-21 PY - 1998 AN - OPUS4-6454 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Heyde, M. A1 - Sturm, Heinz A1 - Rademann, K. T1 - A new application of scanning probe microscopy piezos T2 - Raster-Sonden-Mikroskopien und organische Materialien VII CY - Berlin, Germany DA - 1998-10-07 PY - 1998 AN - OPUS4-6466 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Sturm, Heinz A1 - Stark, Wolfgang A1 - Bovtun, V. A1 - Schulz, Eckhard ED - Xia, Z. T1 - Methods for simultaneous measurements of topography and local electrical properties using scanning force microscopy N2 - Two different approaches to investigate the local complex conductivity and the surface charge with Scanning Force Microscopy (SFM) techniques are presented. It is shown that the measurement of local electrical properties with SFM leads to interesting information about the composition of electrically heterogeneous surfaces T2 - 9th International Symposium on Electrets (ISE 9) CY - Shanghai, China DA - 1996-09-25 PY - 1996 SN - 0-7803-2695-4 DO - https://doi.org/10.1109/ISE.1996.578073 SP - 223 EP - 228 PB - IEEE Service Center CY - Piscataway, NJ AN - OPUS4-6851 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Sturm, Heinz A1 - Schulz, Eckhard A1 - Stark, Wolfgang A1 - Bovtun, V. A1 - Friedrich, Jörg Florian ED - Olefjord, I. ED - Nyborg, L. ED - Briggs, D. T1 - Techniques for surface composition analysis with scanning force microscopy (SFM) using electrical surface properties T2 - 7th European Conference on Applications of Surface and Interface Analysis CY - Göteborg, Sweden DA - 1997-06-16 PY - 1997 SN - 0-471-97827-2 SP - 579 EP - 582 PB - Wiley CY - Chichester AN - OPUS4-6854 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Schmittgens, Ralph T1 - SFM inside ESEM: A study of the electric properties of Polyaniline T2 - Polydays 2002 CY - Berlin, Germany DA - 2002-09-30 PY - 2002 AN - OPUS4-6538 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Bovtun, V. A1 - Sturm, Heinz A1 - Leshchenko, M. A. A1 - Yakimenko, Y. T1 - Dynamics of nanodomains (clusters) and dielectric relaxation in disordered ferroelectrics KW - Lead magnoniobate KW - Phase-transition KW - Dispersion PY - 1997 SN - 0015-0193 SN - 1563-5112 VL - 190 IS - 1-4 SP - 161 EP - 166 PB - Taylor & Francis CY - New York, NY AN - OPUS4-6853 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - Rasterkraftmikroskopie mit lokalem Leitfähigkeitskontrast zur Oberflächenanalyse von Kohlefaseroberflächen und plasmapolymerisierten dünnen Schichten PY - 1995 SN - 0340-3815 VL - 28 SP - 51 EP - 58 PB - Remy CY - Münster, Westf. AN - OPUS4-6847 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Sturm, Heinz T1 - Scanning force microscopy experiments probing micromechanical properties on polymer surfaces using harmonically modulated friction techniques - I. Principles of operation N2 - Applying a high-frequency lateral vibration between the sample surface and the tip of a scanning force microscope (SFM), a harmonically modulated lateral (friction) force image can be obtained using lock-in techniques. The principles of operation are explained, in particular the dramatic decrease of image artefacts generally caused by topography cross-talk and laser beam interference. Flat interfaces between the two immiscible polymers, poly(methyl methacrylate) (PMMA) and polystyrene (PS), are prepared on a sodium chloride single crystal from the melt. These samples are used to evaluate the appropriate model for the tip-sample interaction geometry. The relationship between frictional and normal force does not follow Amonton's law. This shows that a single-asperity interaction between the tip and sample surface can be considered. Using the new technique, local measurements of shear strength and Young's modulus can be performed. KW - Atomic-scale friction KW - Nanotribology KW - Tip PY - 1999 DO - https://doi.org/10.1002/masy.19991470124 SN - 1022-1360 SN - 0258-0322 SN - 1521-3900 VL - 147 SP - 249 EP - 258 PB - Wiley-VCH Verl. CY - Weinheim, Germany AN - OPUS4-6855 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Solomun, Tihomir A1 - Sturm, Heinz T1 - Bringing electrons and microarray technology together N2 - Low-energy secondary electrons are the most abundant radiolysis species which are thought to be able to attach to and damage DNA via formation and decay of localized molecular resonances involving DNA components. In this study, we analyze the consequences of low-energy electron impact on the ability of DNA to hybridize (i.e., to form the duplex). Specifically, single-stranded thymine DNA oligomers tethered to a gold surface are irradiated with very low-energy electrons (E = 3 eV, which is below the 7.5 eV ionization threshold of DNA) and subsequently exposed to a dye-marked complementary strand to quantify by a fluorescence method the electron induced damage. The damage to (dT)25 oligomers is detected at quite low electron doses with only about 300 electrons per oligomer being sufficient to completely preclude its hybridization. In the microarray format, the method can be used for a rapid screening of the sequence dependence of the DNA-electron interaction. We also show for the first time that the DNA reactions at surfaces can be imaged by secondary electron (SE) emission with both high analytical and spatial sensitivity. The SE micrographs indicate that strand breaks induced by the electrons play a significant role in the reaction mechanism. KW - Low energy electrons KW - DNA hybridization KW - Low voltage SEM KW - Fluorescence PY - 2007 DO - https://doi.org/10.1021/jp075338v SN - 1520-6106 SN - 1089-5647 VL - 111 IS - 36 SP - 10636 EP - 10638 PB - Soc. CY - Washington, DC AN - OPUS4-15840 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Chung, Jae Un A1 - Munz, Martin A1 - Sturm, Heinz T1 - Stiffness variation in the interphase of amine-cured epoxy adjacent to copper microstructures N2 - In an effort to expand the understanding of the mechanical properties of the polymeric interphase on a metal surface, a composite consisting of epoxy and copper was prepared and analyzed. Scanning force microscopy-based force modulation microscopy (SFM-FMM) was employed along with dynamic mechanical analysis (DMA) and energy dispersive X-ray analysis (EDX). Diglycidyl ether of bisphenol A (DGEBA)-based epoxy resins were applied with amine curing agents. The samples were made taking advantage of electron beam lithography (EBL) in order to produce sharp edges of copper structures and a flat surface suitable for the SFM-FMM analysis, which was able to depict the stiffness within the interphase. It is considered significant information because the mechanical characteristic within the narrow interphase was revealed. Comparing with DMA and EDX, the stiffness information of SFM-FMM demonstrated a matching correlation and agreement in terms of preferential adsorption of the curing agent in the vicinity of the interface. The stiffness profiles of the two epoxy systems turned out to be different, and it shows the material dependence of the interphase characteristics. KW - Polymer-metal KW - Interphase KW - Stiffness KW - SFM/AFM KW - DMA KW - EDX KW - Epoxy KW - Copper PY - 2007 SN - 0142-2421 SN - 1096-9918 VL - 39 IS - 7 SP - 624 EP - 633 PB - Wiley CY - Chichester AN - OPUS4-14973 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Maibohm, C. A1 - Brewer, J.R. A1 - Sturm, Heinz A1 - Balzer, F. A1 - Rubahn, H.-G. T1 - Bleaching and coating of organic nanofibers N2 - Based on an analysis of the diffusive heat flow equation, we determine limits on the localization of heating of soft materials and biological tissues by electromagnetically excited nanoparticles. For heating by rf magnetic fields or heating by typical continuous wave lasers, the local temperature rise adjacent to magnetic or metallic nanoparticles is negligible. However, heat dissipation for a large number of nanoparticles dispersed in a macroscopic region of a material or tissue produces a global temperature rise that is orders of magnitude larger than the temperature rise adjacent to a single nanoparticle. One approach for producing a significant local temperature rise on nanometer length scales is heating by high-power pulsed or modulated lasers with low duty cycle. KW - Nanofibers KW - Degradation KW - Bleaching KW - Luminescence KW - Silicon monoxide KW - Diffusion barrier KW - Security labels PY - 2006 DO - https://doi.org/10.1063/1.2335783 SN - 0021-8979 SN - 1089-7550 VL - 100 SP - 054304-1 - 054304-6 PB - American Institute of Physics CY - Melville, NY AN - OPUS4-12761 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -