TY - JOUR A1 - Cappella, Brunero A1 - Sturm, Heinz T1 - Comparison between dynamic plowing lithography and nanoindentation methods N2 - Two different methods of nanolithography, namely dynamic plowing lithography (DPL) and indentation by means of force-displacement curves (FDI), have been compared by performing them on two different polymers, poly (methylmethacrylate) and polystyrene. No fundamental differences can be found out in the efficiency of the two methods, i.e., in the depth of the lithographed structure as a function of the scanning parameters. The main drawback of FDI is that it is much more time consuming than DPL. On the other hand, when the sample is lithographed with DPL, the border walls that surround the lithographed structure are very much bigger than the border walls created through FDI. The physicochemical properties of the border walls created through DPL have been investigated. Several experimental data reveal that such border walls are very much softer and looser than unmodified polymers and suggest that during DPL the fast oscillating tip is able to break polymer chains. This does not happen with FDI, where border walls are simply made up of the material carved out by the tip. A method to eliminate these undesirable border walls is suggested. PY - 2002 DO - https://doi.org/10.1063/1.1421632 SN - 0021-8979 SN - 1089-7550 VL - 91 IS - 1 SP - 506 EP - 512 PB - American Institute of Physics CY - Melville, NY AN - OPUS4-1632 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Cappella, Brunero A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - Stiffness and adhesion characterization of nanolithographed poly(methyl methacrylate) by means of force-displacement curves N2 - Poly(methyl methacrylate) (PMMA) surfaces have been modified by dynamic plowing lithography. The resulting modified structures, presenting regions of different densities and stiffnesses, have been studied by force–displacement curves. The elasto-plastic response, the stiffness, and the adhesion of the modified samples have been characterized. Force–displacement curves are able to distinguish between unmodified PMMA and two different structures resulting from the lithography, i.e. compressed PMMA and low density PMMA. In particular, the low density regions are made up of cluster-like globular particles, whose elasto-plastic response and adhesion are measured and whose contribution to the total elasto-plastic response and to the adhesion has been studied in detail. KW - AFM KW - Lithography KW - Force-displacement curves KW - Stiffness KW - Adhesion KW - Elasto-plastic response PY - 2002 DO - https://doi.org/10.1163/156856102760136472 SN - 0169-4243 SN - 1568-5616 VL - 16 IS - 7 SP - 921 EP - 933 PB - VNU Science Press CY - Utrecht AN - OPUS4-1609 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Cappella, Brunero A1 - Sturm, Heinz A1 - Weidner, Steffen T1 - Breaking polymer chains by dynamic plowing lithography N2 - The adhesion of poly(methyl methacrylate) (PMMA) and polystyrene (PS) films, whose surface has been previously structured by dynamic plowing lithography (DPL), has been measured by means of force–displacement curves. The different adhesion of modified and unmodified PS leads to the assumption that polymer chains are broken during DPL. After measuring the energy dissipated by the tip during DPL, in order to check that the transferred energy is sufficient to break covalent bonds, the polymer chain scission caused by the lithographic process has been definitely confirmed by size exclusion chromatography measurements of the lithographed films. KW - AFM KW - Nanolithography KW - Chain scission PY - 2002 DO - https://doi.org/10.1016/S0032-3861(02)00285-9 SN - 0032-3861 SN - 1873-2291 VL - 43 IS - 16 SP - 4461 EP - 4466 PB - Springer CY - Berlin AN - OPUS4-1608 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Munz, Martin A1 - Schulz, Eckhard A1 - Sturm, Heinz T1 - Reliability of polymer materials - the nanoscopic view on interphases T2 - Kick-off Meeting zu einem gemeinsamen DAAD-Projekt mit der Universidad Pais Vasco (UVP), Dept. of Chemical and Environmental Engineering, Industrial Engineering School (EITI), Materials and Technologies Group CY - San Sebastián, Spain DA - 2002-08-08 PY - 2002 SP - 1(?) EP - 12(?) AN - OPUS4-1832 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Munz, Martin A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - Reliability of polymer based composites - interfaces and interphases from the nanomechanical point of view T2 - 15th International Congress on Electron Microscopy (ICEM) CY - Durban, South Africa DA - 2002-09-01 PY - 2002 SN - 0-620-29294-6 SP - 619 EP - 620 PB - Microscopy Society of Southern Africa CY - Onderstepoort AN - OPUS4-1833 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Munz, Martin A1 - Chung, Jae Un A1 - Eltanany, Gehan A1 - Sturm, Heinz A1 - Schulz, Eckhard ED - Degischer, H.-P. T1 - Interphasial stiffness gradients in polymer materials T2 - Symposium Verbundwerkstoffe und Werkstoffverbunde CY - Wien, Österreich DA - 2003-07-02 PY - 2003 SN - 3-527-30762-1 PB - Wiley-VCH CY - Weinheim AN - OPUS4-2525 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Nanoföhren und -drähte: Lithographie, Manipulation und Analyse in ESEM (Enviromental Scanning Electron Microscopy) und AFM (Atomic Force Microscopy) T2 - Gründungsveranstaltung des DFG-Schwerpunktes Nanodrähte und Nanoröhren CY - Halle (Saale), Germany DA - 2003-01-16 PY - 2003 AN - OPUS4-4098 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Munz, Martin A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - Zuverlässigkeit von Polymer-Werkstoffen - Interphasen nanoskopisch betrachtet T2 - 3. Workshop "Rasterkraftmikroskopie in der Werkstoffwissenschaft" CY - Berlin, BAM, Deutschland DA - 2002-02-28 PY - 2002 SP - 14 AN - OPUS4-1831 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Nanoröhren und -drähte: Lithographie, Manipulation und Analyse in ESEM und AFM T2 - Vorbereitungstreffen zum DFG Schwerpunkt "Nanodrähte und Nanoröhren" CY - Halle (Saale), Germany DA - 2003-01-17 PY - 2003 AN - OPUS4-2914 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Nanoröhren und -drähte - Lithographie, Manipulation und Analyse in ESEM und AFM T2 - Vorbereitungstreffen zum DFG Schwerpunkt "Nanodrähte und Nanoröhren" CY - Halle (Saale), Deutschland DA - 2003-01-17 PY - 2003 CY - Halle AN - OPUS4-2130 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - An AFM-ESEM hybrid instrument T2 - BAM Symposium "Polymere Verbundwerkstoffe zwischen Raumtemperatur und 4,2K" CY - Berlin, Germany DA - 2003-02-27 PY - 2003 AN - OPUS4-4095 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Scanning Force Microscopy based Lithography T2 - Anwendertreffen JPK Instruments CY - Berlin, Germany DA - 2003-09-18 PY - 2003 AN - OPUS4-2916 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Bonse, Jörn A1 - Munz, Martin A1 - Sturm, Heinz ED - Vajtai, R. T1 - Scanning force microscopic investigations of the femtosecond pulse laser ablation of indium phosphide in air N2 - Laser ablation of single-crystalline indium phosphide (InP) was performed in air by means of linearly polarized Ti:sapphire femtosecond-pulses (800 nm, 130 fs, 10 Hz). As a result of the first laser pulses, several morphological changes (crater formation, rim formation, ripple structures and cones) were observed. These effects were explored using force modulation microscopy (FMM), a technique based on scanning force microscopy (SFM), allowing the simultaneous imaging of both topography and local stiffness at a high lateral resolution. The first laser pulse induces the formation of a protruding rim (height <20 nm, width ~300 nm) bordering the ablated crater. A Fourier-analysis of the multi-pulse generated topographies reveals the formation of wavelength-sized periodic ripples (modulation depth <100 nm) with an orientation perpendicular to that of the electric field vector of the laser radiation. Besides these morphological alterations, also material modifications were observed in the irradiated regions by means of the FFM technique. Within the ablated craters, local stiffness variations were found revealing an inhomogeneous material composition/structure as a consequence of the femtosecond pulse laser treatment. T2 - Nanotechnology Conference 2003 CY - Maspalomas, Gran Canaria, Spain DA - 2003-05-19 KW - Femtosecond laser irradiation KW - Microstructure KW - Indium phosphide KW - Scanning/atomic force microscopy (SFM/AFM) KW - Stiffness KW - Laser induced periodic surface structures (LIPSS) PY - 2003 UR - http://cat.inist.fr/?aModele=afficheN&cpsidt=15329222 SN - 0-8194-4978-4 N1 - Serientitel: SPIE proceedings series – Series title: SPIE proceedings series IS - 5118 SP - 221 EP - 234 PB - SPIE, the International Society for Optical Engineering CY - Bellingham, Wash. AN - OPUS4-2865 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Bonse, Jörn A1 - Munz, Martin A1 - Sturm, Heinz T1 - Scanning force microscopic investigations of the femtosecond laser pulse irradiation of indium phosphide in air N2 - Laser ablation of single-crystalline indium phosphide (InP) was performed in air by means of linearly polarized Ti : sapphire femtosecond pulses (800 nm, 130 fs, 10 Hz). As a result of the irradiation with a variable number of laser pulses per spot (N /spl les/ 5), several morphological changes (crater formation, rim formation, ripple structures, and cones) were observed. These effects were explored using force modulation microscopy (FMM), a technique based on scanning force microscopy, allowing the simultaneous imaging of both topography and local stiffness at a high lateral resolution. The first laser pulse induces the formation of a protruding rim (height < 20 nm, width /spl ap/ 300 nm) bordering the ablated crater. A Fourier analysis of the multipulse generated topographies reveals the formation of wavelength-sized periodic ripples (modulation depth < 100 nm) with an orientation perpendicular to that of the electric field vector of the laser radiation. Besides these morphological alterations, material modifications were also observed in the irradiated regions by means of the FMM technique. Within the ablated craters, local stiffness variations were found revealing an inhomogeneous material composition/structure as a consequence of the femtosecond pulse laser treatment. KW - Laser materials-processing applications KW - Laser radiation effects KW - Microscopy KW - Semiconductor materials KW - Ultrafast optics PY - 2004 DO - https://doi.org/10.1109/TNANO.2004.828574 SN - 1536-125X SN - 1941-0085 VL - 3 IS - 3 SP - 358 EP - 367 PB - Institute of Electrical and Electronics Engineers CY - New York, NY AN - OPUS4-4067 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Solomun, Tihomir A1 - Schimanski, A. A1 - Sturm, Heinz A1 - Mix, Renate A1 - Illenberger, E. T1 - Surface Modification of Polyamides by Direct Fluorination N2 - Bulk samples and thin films of polyamides (PA6 and PA12) were exposed to fluorine (1 - 10 vol.-% F2 in N2) and analysed with photoelectron (XPS) and infrared spectroscopy. Fluorination affects both, the amide and the hydrocarbon parts of the polymers. However, only the carbon atom next to the carbonyl is readily fluorinated. Chemical modification of the amide group is apparent in a large binding energy shift (+5 eV) of the N1s level and the appearance of a CO band at 1734 cm-1. It is concluded that the amide C-N bond is cleaved in the fluorination process and that COOH and NF2 end groups are formed. This conclusion is corroborated by the appearance of ester oxygen in the XPS and by the 19F NMR spectra of the volatile products that show fluorine signals chemically shifted about 200 ppm towards lower field as compared with the CHF environment. KW - Gasfluorierung KW - IR KW - XPS KW - AFM KW - NF2-Gruppe PY - 2004 UR - http://www.e-polymers.org SN - 1618-7229 IS - 8 SP - 1 EP - 16 PB - De Gruyter CY - [S.l.] AN - OPUS4-3425 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - Atomic force microscopy with simultaneous AC conductivity contrast for the analysis of carbon fibre surfaces KW - Carbon fibre KW - Surface analysis KW - Conductivity microscopy KW - Scanning force microscopy KW - Scanning tunneling microscopy KW - Fiber surfaces PY - 1996 SN - 1359-835X VL - 27 IS - 9 SP - 677 EP - 684 PB - Elsevier CY - Oxford AN - OPUS4-6849 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - Local AC current contrast on carbon fiber surfaces imaged by scanning force microscopy N2 - After a delamination process in a C-fiber reinforced polymer composite, the identification of the polymer residue of poly-(phenylene sulphide) on carbon fiber surfaces gives important information on the composite failure mechanism. Using scanning force microscopy (SFM) in its lateral force imaging mode or with the stiffness imaging mode, it is almost impossible to distinguish the two composite components owing to a very low material-based contrast of the local friction and compliance. The new technique using contrast based on a local AC current measurement allows a clear identification of the conducting carbon fiber and the non-conducting polymer coverage. KW - Matrix adhesion KW - Films KW - Photoconduction KW - Composites PY - 1995 DO - https://doi.org/10.1002/actp.1995.010460505 SN - 0323-7648 SN - 1521-4044 VL - 46 IS - 5 SP - 379 EP - 384 PB - Wiley-VCH Verl. CY - Weinheim, Germany AN - OPUS4-6848 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Bovtun, V. A1 - Sturm, Heinz A1 - Pashkov, V.M. ED - Baptista, J. T1 - Investigation of local electrical properties and topography of homo- and heterogeneous TiO2-containing ceramics by scanning force microscopy (SFM) T2 - 5th International Conference on Electronic Ceramics & Applications CY - Aveiro, Portugal DA - 1996-09-02 KW - Ceramics KW - Scanning force microscopy KW - SFM KW - Electrical properties KW - Heterogeneity PY - 1996 SN - 972-828317-2 VL - 2 SP - 117 EP - 120 PB - Fundação João Jacinto de Magalhães CY - Aveiro AN - OPUS4-6850 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Munz, Martin A1 - Schulz, Eckhard T1 - SFM of Polymers with Harmonically Modulated Friction Force T2 - 24th Intern. TopoMetrix-Workshop: Aktuelle Entwicklungen in der Nanotechnologie und der Rastersondenmikroskopie, Humboldt-Universität CY - Berlin, Germany DA - 1998-03-12 PY - 1998 AN - OPUS4-6459 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Heyde, M. A1 - Rademann, K. T1 - Nichtlinearität und Hysterese von AFM-Piezos T2 - 24th Intern. TopoMetrix-Workshop: Aktuelle Entwicklungen in der Nanotechnologie und Rastersondenmikroskopie, Humboldt-Universität CY - Berlin, Germany DA - 1998-03-12 PY - 1998 AN - OPUS4-6462 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Heyde, M. A1 - Rademann, K. T1 - Analysis of Scanning Probe Microscopy (SPM) Piezos T2 - Digital-Instruments User-Workshop an der TU Dresden CY - Dresden, Germany DA - 1999-04-07 PY - 1999 AN - OPUS4-6498 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Munz, Martin T1 - Harmonically Modulated Friction Force Microscopy of Polymers and Composites T2 - Workshop "Scanning Probe Microscopy In the New Millennium" CY - Faure, South Africa DA - 2001-02-26 PY - 2001 AN - OPUS4-6512 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Polymere in der AFM-basierten Mikrosystemtechnik - Chancen und Problem anhand zweier Anwendungsbeispiele T2 - Workshop: Microscopy 2000, TU Chemnitz CY - Chemnitz, Germany DA - 2000-03-14 PY - 2000 AN - OPUS4-6503 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Nanomechanics in Scanning Force Microscopy (SFM) T2 - 1st Latin American Symposium on Scanning Probe Microscopy (LA SPM1) CY - São Carlos, Brazil DA - 2001-03-29 PY - 2001 AN - OPUS4-6515 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Harmonisch modulierte Reibmikroskopie an Modellproben von Bremsbelägen T2 - Kolloquium im Sfb 605 - Elementarreibereignisse an der TU Berlin CY - Berlin, Germany DA - 2000-05-18 PY - 2000 AN - OPUS4-6504 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Untersuchung heterogener Werkstoffe mittels dynamisch-mechanischer Zusatz-Kontraste im AFM T2 - 17. SPM Workshop: Fhl. Keramische Technologien und Sinterwerkstoffe CY - Dresden, Germany DA - 1997-03-13 PY - 1997 AN - OPUS4-6413 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Schulz, Eckhard A1 - Munz, Martin T1 - Der dynamische Reibkontrast als eine Methode zur Charakterisierung von Polymeroberflächen in der Rasterkraftmikroskopie T2 - Frühjahrstagung der DPG, FA: Polymerphysik CY - Münster, Germany DA - 1997-03-17 PY - 1997 AN - OPUS4-6415 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Messungen elektrischer Eigenschaften in der Rasterkraftmikroskopie T2 - Forschungsseminar zur Oberflächenphysik der Lehrstühle: Oberflächenphysik und Atomstoßprozesse und Elektronische Eigenschaften und Supraleitung CY - Berlin, Germany DA - 1997-11-17 PY - 1997 AN - OPUS4-6428 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Rasterkraftmikroskopische Verfahren zur Charakterisierung von Polymeroberflächen T2 - DECHEMA-Workshop: Mechanische Eigenschaften von Schichtsystemen CY - Frankfurt am Main, Germany DA - 1997-09-29 PY - 1997 AN - OPUS4-6418 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Studies of polymers by SPM T2 - Workshop em Microscopia de Forca Atomica e tecnicas correlatas CY - Rio de Janeiro, Brazil DA - 1997-10-14 PY - 1997 AN - OPUS4-6422 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Munz, Martin A1 - Schulz, Eckhard T1 - Nanomechanics at the Carbon Fibre/PPS interface: A combined SFM study of Topography, AC Conductivity and Surface Stiffness T2 - 24th Intern. TopoMetrix-Workshop: Aktuelle Entwicklungen in der Nanotechnologie und der Rastersondenmikroskopie, Humboldt-Universität CY - Berlin, Germany DA - 1998-03-12 PY - 1998 AN - OPUS4-6458 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Studies of polymers by SPM T2 - First Workshop on Scanning Probe Microscopy CY - São Carlos, Brazil DA - 1997-10-10 PY - 1997 AN - OPUS4-6420 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - From microstructures to nanodots: AFM experiments with a piezoelectric polymer T2 - iThemba LABS CY - Somerset West, South Africa DA - 2002-02-03 PY - 2002 AN - OPUS4-6527 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - How to write functional areas on polymers using DPL - a way to produce nanoarrays for life science applications T2 - iThemba LABS CY - Somerset West, South Africa DA - 2002-02-03 PY - 2002 AN - OPUS4-6528 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Stark, Wolfgang A1 - Schulz, Eckhard T1 - Messung elektrischer Eigenschaften in der Rasterkraftmikroskopie: der Aufladungskontrast auf nichtleitenden Oberflächen T2 - Tagung "Raster-Sonden-Mikroskopien und organische Materialien IV" CY - Munich, Germany DA - 1995-10-11 PY - 1995 AN - OPUS4-6389 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Stark, Wolfgang A1 - Schulz, Eckhard T1 - Messung elektrischer Eigenschaften in der Rasterkraftmikroskopie: Leitfähigkeitskontrast und Ladungskontrast T2 - 1. Jenaer Anwendersymposium Rastersondenmikroskopie CY - Jena, Germany DA - 1995-11-22 PY - 1995 AN - OPUS4-6390 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - Untersuchungen zur Materialzusammensetzung der Oberfläche eines Polymerblends: Eine vergleichende Studie zur Aussagefähigkeit mechanischer und elektrischer Zusatzkontraste im SFM T2 - Diskussionstagung: Raster-Sonden-Mikroskopien und Organische Materialien V CY - Münster, Germany DA - 1996-10-09 PY - 1996 AN - OPUS4-6391 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - Atomic force microscopy with simultaneous AC conductivity contrast for the analysis of carbon fibre surfaces T2 - IPCM (Interfacial Phenomena in Composite Materials) CY - Eindhoven, Netherlands DA - 1995-09-10 PY - 1995 AN - OPUS4-6385 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - AFM an Polymer- und Faseroberflächen T2 - Institut für Textil- und Faserchemie, Universität Stuttgart CY - Stuttgart, Germany DA - 1996-11-12 PY - 1996 AN - OPUS4-6397 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Messung elektrischer Eigenschaften in der Rastersondenmikroskopie T2 - Universität Ulm CY - Ulm, Germany DA - 1996-08-02 PY - 1996 AN - OPUS4-6398 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Methoden zur Messung elekrischer Eigenschaften in der Rasterkraftmikroskopie T2 - 3. Mikrosymposium: Elektronenmikroskopie in der Materialforschung - Rasterkraftmikroskopie an Polymeren an der Martin-Luther-Universität Halle-Wittenberg CY - Merseburg, Germany DA - 1996-05-31 PY - 1996 AN - OPUS4-6399 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - Rasterkraftmikroskopie auf Oberflächen polymerer Werkstoffe T2 - Berliner Polymeren-Tage CY - Potsdam, Germany DA - 1994-10-05 PY - 1994 AN - OPUS4-6371 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - Rasterkraftmikroskopie mit Leitfähigkeitskontrast T2 - Tagung "Raster-Sonden-Methoden und Organische Materialien" am Europäischen Lab. für Molekularbiologie CY - Heidelberg, Germany DA - 1994-10-11 PY - 1994 AN - OPUS4-6372 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - Polymere Faserwerkstoffe und die STM/AFM T2 - Diskussions-Tagung "Raster-Nahfeld-Mikroskopien und organische Materialien" CY - Planegg, Germany DA - 1992-07-08 PY - 1992 AN - OPUS4-6377 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Anwendungen der Rasterkraftmikroskopie auf polymere Werkstoffe T2 - Berliner Verband für Polymerforschung CY - Berlin, Germany DA - 1993-05-05 PY - 1993 AN - OPUS4-6381 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Rasterkraftmikroskopie in der Faserverbundwerkstoffforschung T2 - Berliner Polymerentage CY - Berlin, Germany DA - 1993-05-06 PY - 1993 AN - OPUS4-6382 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Rastersondenmikroskopische Verfahren zur Messung lokaler elektrischer Eigenschaften von Festkörpern T2 - TU Berlin CY - Berlin, Germany DA - 1996-04-19 PY - 1996 AN - OPUS4-6400 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Munz, Martin A1 - Schulz, Eckhard T1 - SFM-Nanomechanics - Constant Dynamic Indentation- and Harmonically Modulated Friction Force- Microscopy T2 - Workshop: Rastersondenmikroskopie in Forschung und Industrie an der GH Wuppertal CY - Wuppertal, Germany DA - 1999-03-11 PY - 1999 AN - OPUS4-6495 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Schulz, Eckhard A1 - Munz, Martin A1 - Hinrichsen, G. T1 - Characterisierung des Faser/Polymer-Interface mittels messungen lokaler mikromechanischer Eigenschaften in der Rasterkraftmikroskopie T2 - Frühjahrstagung der DPG, FA: Polymerphysik CY - Münster, Germany DA - 1997-03-17 PY - 1997 AN - OPUS4-6414 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Heyde, M. A1 - Munz, Martin A1 - Rademann, K. T1 - Physical properties of nanometer sized particles characterised by Scanning Probe Microscopy Techniques T2 - 2nd German Brazilian Workshop on Applied Surface Science CY - Templin, Germany DA - 1998-09-21 PY - 1998 AN - OPUS4-6454 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -