TY - CONF A1 - Sturm, Heinz T1 - Prinzipien der Rastersondenmikroskopie T2 - Vortrag am Institut für Nichtmetallische Werkstoffe der TU Berlin CY - Berlin, Germany DA - 2005-11-03 PY - 2005 AN - OPUS4-11315 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Tavares, L. A1 - Kjelstrup-Hansen, J. A1 - Rubahn, H.-G. A1 - Sturm, Heinz T1 - Reduced bleaching in organic nanofibers by bilayer polymer/oxide coating N2 - Para-hexaphenylene (p-6P) molecules exhibit a characteristic photoinduced reaction (bleaching) resulting in a decrease in luminescence intensity upon UV light exposure, which could render the technological use of the nanofibers problematic. In order to investigate the photoinduced reaction in nanofibers, optical bleaching experiments have been performed by irradiating both pristine and coated nanofibers with UV light. Oxide coating materials (SiOx and Al2O3) were applied onto p-6P nanofibers. These treatments caused a reduction in the bleaching reaction but in addition, the nanofiber luminescence spectrum was significantly altered. It was observed that some polymer coatings [a statistical copolymer of tetrafluoroethylene and 2,2-bis-trifluoromethyl-4,5-difluoro-1,3-dioxole, P(TFE-PDD), and poly(methyl methacrylate), PMMA] do not interfere with the luminescence spectrum from the p-6P but are not effective in stopping the bleaching. Bilayer coatings with first a polymer material, which should work as a protection layer to avoid modifications of the p-6P luminescence spectrum, and second an oxide layer used as oxygen blocker were tested and it was found that a particular bilayer polymer/oxide combination results in a significant reduction in bleaching without affecting significantly the emission spectrum from the nanofibers. KW - Nanofibers KW - Photobleaching KW - Polymer coating KW - Oxide coating PY - 2010 DO - https://doi.org/10.1063/1.3427561 SN - 0021-8979 SN - 1089-7550 VL - 107 SP - 103521-1 - 103521-6 PB - American Institute of Physics CY - Melville, NY AN - OPUS4-21574 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Friedrich, Jörg Florian A1 - Mix, Renate A1 - Wettmarshausen, Sascha A1 - Sturm, Heinz ED - Tachibana, K. ED - Takai, O. T1 - A new concept of adhesion promotion in metal-polymer composites by introduction of covalently bonded hydrophobic spacers at interface T2 - Proceedings of the 18th International Symposium on Plasma Chemistry (ISPC-18) CY - Kyoto, Japan DA - 2007-08-26 PY - 2007 SN - 978-4-9903773-4-2 SP - 27A EP - p5, 1 PB - International Union of Pure and Applied Chemistry CY - Kyoto AN - OPUS4-20668 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Solomun, Tihomir A1 - Seitz, H. A1 - Sturm, Heinz T1 - DNA damage by low-energy electron impact: dependence on guanine content KW - DNA oligonucleotide KW - Low energy electrons KW - Secondary electrons KW - Damage KW - Guanine content PY - 2009 DO - https://doi.org/10.1021/jp905263x SN - 1520-6106 SN - 1089-5647 VL - 113 IS - 34 SP - 11557 EP - 11559 PB - Soc. CY - Washington, DC AN - OPUS4-20704 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Modulated Lateral Force Microscopy: An AFM tool for Analysis and Modification of Polymer T2 - German-Russian Workshop "Contact Mechanics and Friction" CY - Berlin, Germany DA - 2009-10-05 PY - 2009 AN - OPUS4-20751 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Methoden der Rasterelektronen- und Rasterkraftmikroskopie zur Analyse von Faserverbundwerkstoffen T2 - 15. Nationales Symposium SAMPE Deutschland e.V. CY - Berlin, Germany DA - 2009-02-18 PY - 2009 AN - OPUS4-20750 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Using a SFM/ESEM hybrid for the analysis of vibrating surfaces T2 - MC 2009 Microscopy Conference CY - Graz, Austria DA - 2009-08-30 PY - 2009 AN - OPUS4-20706 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Henrichsen, H. A1 - Sturm, Heinz A1 - Boggild, P. A1 - Hansen, O. T1 - Submicron organic nanofiber devices with different anode-cathode materials: A simple approach N2 - The authors present a simple general method for simultaneously producing tens of submicron electrode gaps with different cathode and anode materials on top of nanofibers, nanowires, and nanotubes, with an optional gap size variation. Using this method, an ensemble of para-hexaphenylene (p6P) nanofiber devices of different length was fabricated with Sm and Au electrodes. The measured I-V characteristics are in agreement with a nonlinear hopping transport model, where domain barriers dominate the transport with an estimated domain size of 23±5 nm. KW - Nanofibers KW - Sub-micron electrode KW - Para-hexaphenylene KW - Samarium KW - Gold KW - I/V-characteristics KW - Nanolasers KW - Domain barriers PY - 2010 DO - https://doi.org/10.1116/1.3431088 SN - 1071-1023 SN - 0734-211X VL - 28 IS - 3 SP - 617 EP - 622 PB - American Institute of Physics CY - New York, NY AN - OPUS4-21573 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Bonse, Jörn A1 - Wiggins, S. M. A1 - Solis, J. A1 - Lippert, Th. T1 - Dynamics of phase transitions in polymer thin films upon single femtosecond laser pulse irradiation T2 - Second International Conference on Photo-Induced Phase Transitions Cooperative, non-linear and functional properties CY - Rennes, France DA - 2005-05-24 PY - 2005 AN - OPUS4-7430 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Cappella, Brunero T1 - Dynamic Plowing Lithography of Polymer Surfaces T2 - Workshop "Scanning Probe Microscopy in the New Millennium" CY - Faure, South Africa DA - 2001-02-26 PY - 2001 AN - OPUS4-7512 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Sturm, Heinz A1 - Heyde, M. A1 - Rademann, K. T1 - Measuring SPM Piezo Displacement Responses PY - 1999 SN - 1551-9295 VL - 99 IS - 4 SP - 24 EP - 26 PB - Microscopy Society of America CY - Wappingers Falls, NY AN - OPUS4-6860 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Heyde, M. T1 - Nanotechnologie auf Kunststoff-Oberflächen T2 - Hannover-Messe CY - Hanover, Germany DA - 1999-04-19 PY - 1999 AN - OPUS4-6499 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Schröter, Maria-Astrid A1 - Sturm, Heinz A1 - Holschneider, M. T1 - Phase and amplitude patterns in DySEM mappings of vibrating microstructures N2 - We use a dynamic scanning electron microscope (DySEM) to analyze the movement of oscillating micromechanical structures. A dynamic secondary electron (SE) signal is recorded and correlated to the oscillatory excitation of scanning force microscope (SFM) cantilever by means of lock-in amplifiers. We show, how the relative phase of the oscillations modulate the resulting real part and phase pictures of the DySEM mapping. This can be used to obtain information about the underlying oscillatory dynamics. We apply the theory to the case of a cantilever in oscillation, driven at different flexural and torsional resonance modes. This is an extension of a recent work (Schr¨oter et al 2012 Nanotechnology 23 435501), where we reported on a general methodology to distinguish nonlinear features caused by the Imaging process from those caused by cantilever motion. KW - DySEM KW - mechanical nonlinearity KW - vibration KW - DySEM KW - mechanische Nichtlinearitäten KW - Vibration PY - 2013 DO - https://doi.org/doi:10.1088/0957-4484/24/21/215701 VL - 24 IS - 21 SP - 215701-1 EP - 215701-10 PB - IOP PUBLISHING LTD CY - Bristol, UK AN - OPUS4-35396 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Munz, Martin A1 - Cappella, Brunero A1 - Sturm, Heinz A1 - Geuss, Markus A1 - Schulz, Eckhard T1 - Materials contrasts and nanolithography techniques in scanning force microscopy (SFM) and their application to polymers and polymer composites N2 - Beyond measuring the topography of surfaces, scanning force microscopy (SFM) has proved to be valuable both for mapping of various materials properties and for modifying surfaces via lithography techniques. Thus, SFM has gained relevance as a surface analysis technique as well as a tool for nanoscale engineering purposes. Different kinds of tip-sample interactions are exploitable, e.g. mechanical, thermal and electrical ones. Owing to its versatility, SFM has found plenty of applications in polymer science. Among others, the examples reported on in this review article encompass issues related to commodity polymers, various polymer-based composites, polymer blends, or ferroelectric polymers. For instance, stiffness imaging is elucidated as a technique for detecting interphases occurring in composites with inorganic fillers. The described applications are mainly related to mechanical and electrical tip-sample interactions. The respective fundamentals are outlined as well as some aspects of the measurement of materials contrasts. The presented techniques of nano-scale modification are a dynamical sort of plowing lithography and electrical poling, both performed by means of SFM-probes. KW - Local electrical-properties KW - Probing micromechanical properties KW - Spreading resistance microscopy KW - Modulated friction techniques KW - Nanometer-scale modification KW - Ferroelectric domain-walls KW - Interfacial shear-strength KW - Self-assembled monolayers KW - Maxwell-stress microscopy KW - Solid-liquid interfaces KW - Contact mechanics KW - Electrical properties KW - Interface/interphase KW - Nanolithography KW - Polymer-matrix composites (PMC) scanning/atomic force KW - Microscopy (SFM/AFM) thermal diffusivity PY - 2003 SN - 3-540-00530-7 DO - https://doi.org/10.1007/b11055 SN - 0065-3195 SN - 1436-5030 N1 - Serientitel: Advances in polymer science – Series title: Advances in polymer science IS - 164 SP - 87 EP - 210 PB - Springer CY - Berlin AN - OPUS4-2892 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - Messung elektrischer Eigenschaften in der Rasterkraftmikroskopie: Leitfähigkeitskontrast auf Kohlefaseroberflächen T2 - Tagung "Raster-Sonden-Mikorskopien und organische Materialien IV" CY - Munich, Germany DA - 1995-10-11 PY - 1995 AN - OPUS4-6388 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - Messung lokaler elektrischer Eigenschaften mit dem AFM: Der Leitfähigkeitskontrast T2 - Festvortragsreihe "Fortschritte in der Rastersondenmikroskopie" anläßlich der Eremittierung von Prof. Dr. Lacmann CY - Braunschweig, Germany DA - 1995-03-16 PY - 1995 AN - OPUS4-6383 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - Reibungsmikroskopie auf laserabladierten C-Faser-Verbunden und plasmapolymerisierten dünnen Schichten T2 - Tagung "Raster-Sonden-Mikroskopien und organische Materialien II" CY - Mainz, Germany DA - 1993-10-11 PY - 1993 AN - OPUS4-6380 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Stark, Wolfgang A1 - Bovtun, V. A1 - Schulz, Eckhard T1 - Methods for simultaneous measurements of topography and local electrical properties using scanning force microscopy T2 - 9th International Symposium on Electrets (ISE9) CY - Shanghai, China DA - 1996-09-15 PY - 1996 AN - OPUS4-6396 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Stark, Wolfgang A1 - Schulz, Eckhard T1 - Messungen der lokalen Leitfähigkeit und Oberflächenaufladung im Rasterkraftmikroskop T2 - Frühjahrstagung des Fachausschusses Polymerphysik der Deutschen Physikalischen Gesellschaft (DPG) CY - Marburg, Germany DA - 1996-03-18 PY - 1996 AN - OPUS4-6395 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Lithography on Polymers using a Scanning Force Microscope (SFM) and a Environmental Scanning Electron Microscope (ESEM) T2 - Seminar International PhD Program CY - Berlin, Germany DA - 2004-04-30 PY - 2004 AN - OPUS4-3504 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Rastersondenverfahren T2 - BAM, DGM Fachausschuss "Gefüge und Eigenschaften von Polymerwerkstoffen" CY - Berlin, Germany DA - 2003-12-05 PY - 2003 AN - OPUS4-4099 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Scanning Force Microscopy (SFM) of Polymer surfaces: Materials contrasts and nanolithography T2 - Fachbereich Chemie der Universität Siegen CY - Siegen, Germany DA - 2003-07-01 PY - 2003 AN - OPUS4-4100 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - An AFM-ESEM Hybride T2 - 2. BAM-IVW-Symposium im DFG-Proekt:Gleitverschleiss polymer Verbundwerkstoffen zwischen Raumtemperatur und 4,2 K CY - Berlin, Germany DA - 2003-02-27 PY - 2003 AN - OPUS4-2913 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Lithographie, Manipulation und Analyse in ESEM und AFM T2 - Evaluierungsmeeting eines zukünftigen DFG-Forscherverbundes zum Thema "Nanoröhren und -drähte" CY - Halle (Saale), Germany DA - 2003-01-17 PY - 2003 AN - OPUS4-2915 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Modulated Lateral Force Microscopy (M-LFM): principles, experiments and unsolved problems T2 - Institut für Physik der Universität Basel CY - Basel, Switzerland DA - 2003-02-20 PY - 2003 AN - OPUS4-4097 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Rastersondenverfahren: Materialkontraste und Nanolithographie T2 - DGM Fachausschuss "Gefüge und Eigenschaften von Polymerwerkstoffen" CY - Berlin, Germany DA - 2003-12-05 PY - 2003 AN - OPUS4-2917 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Modulator Lateral Force Microscopy: principles, experiments and unsolved problems T2 - Institutsvortrag Universität Basel DA - 2003-02-20 PY - 2003 AN - OPUS4-2912 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Erweiterung konventioneller Rasterkraftmikroskopie: Informationen aus Zusatzkontrasten lokaler elektrischer Eigenschaften T2 - Institut für Physik an der Universität Basel CY - Basel, Switzerland DA - 1994-11-14 PY - 1994 AN - OPUS4-6373 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - Rasternahfeldmikroskopie an Oberflächen organischer Werkstoffe T2 - Vortrag für die AFM/STM User Group Berlin-Brandenburg CY - Berlin, Germany DA - 1993-11-30 PY - 1993 AN - OPUS4-6379 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Scanning force mocroscopy based lothography T2 - JPK-Wirkshop "Scanning probe microscopy in life science" CY - Berlin, Germany DA - 2003-09-18 PY - 2003 AN - OPUS4-4653 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Rastersondenmikroskopie zur Oberflächenanalyse polymerer Werkstoffe T2 - BAM CY - Berlin, Germany DA - 1994-11-02 PY - 1994 AN - OPUS4-6375 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Solomun, Tihomir A1 - Schimanski, A. A1 - Sturm, Heinz A1 - Illenberger, E. T1 - Reactions of amide group with fluorine as revealed with surface analytics N2 - Thin polyamide-6 films were exposed to fluorine gas and analysed with photoelectron and infrared spectroscopies. Fluorine cleaves the amide C–N bond resulting in the formation of the –COOH and –NF2 terminal groups. This is evident from large shifts in the N1s binding energy (+5 eV) and C=O stretching frequency (~80 cm-1), appearance of ester oxygen in the XPS spectra, as well as by the 19F nmr spectra of volatile products consistent with a terminal NF2 group. KW - Gasfluorierung KW - Polyamid-6 KW - XPS KW - IR KW - -COOH und NF2-Gruppen PY - 2004 UR - http://www.sciencedirect.com/science?_ob=PublicationURL&_tockey=%23TOC%235231%232004%23996109995%23499295%23FLA%23&_cdi=5231&_pubType=J&_auth=y&_acct=C000049503&_version=1&_urlVersion=0&_userid=963821&md5=baea8e0df63660c666921ef377c00e40 SN - 0009-2614 SN - 1873-4448 VL - 378 SP - 312 EP - 316 PB - North-Holland Publ. Co. CY - Amsterdam AN - OPUS4-3439 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Schulz, Eckhard A1 - Stark, Wolfgang A1 - Bovtun, V. A1 - Friedrich, Jörg F. T1 - Techniques for surface composition analysis with Scanning Force Microscopy (SFM) T2 - ECASIA '97 CY - Gothenburg, Sweden DA - 1997-06-16 PY - 1997 AN - OPUS4-6416 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Dynamic Plowing Lithography T2 - International Workshop on Scanning Probe Microscopy in Nanotechnology CY - Wroclaw, Poland DA - 2001-07-09 PY - 2001 AN - OPUS4-6514 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Bericht und Neuanträge des Teilprojektes A1/B5 T2 - Sfb605 "Elementarreibereignisse" CY - Berlin, Germany DA - 2001-05-07 PY - 2001 AN - OPUS4-6513 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Munz, Martin A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - The Normal Force Modulation as a method for Studying the Interphase of Fibre Reinforced Polymer T2 - 24th Intern. TopoMetrix-Workshop: Aktuelle Entwicklungen in der Nanotechnologie und Rastersondenmikroskopie, Humboldt-Universität CY - Berlin, Germany DA - 1998-03-12 PY - 1998 AN - OPUS4-6457 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Munz, Martin A1 - Schulz, Eckhard A1 - Hampe, Andreas T1 - Scanning Probe Microscopy Techniques for the Examination of Interface Nanomechanics - A Study of Topography, AC Conductivity and Surface Stiffness T2 - Workshop: Rastersondenmikroskopie in Forschung und Industrie an der GH Wuppertal CY - Wuppertal, Germany DA - 1999-03-11 PY - 1999 AN - OPUS4-6497 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Geuss, Markus T1 - Scanning Force Microscopy Investigation on Electroactive Polymers and their Metal Electrodes Probing Local Electro-Mechanical Properties T2 - 10th International Symposium on Electrets (ISE 10) CY - Delphi, Greece DA - 1999-09-22 PY - 1999 AN - OPUS4-6502 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Fertigung und Charakterisierung von Kalibrierproben T2 - 1. Treffen im Verbundprojekt Entwicklung und Optimierung von Prüfmethoden zur quantitativen Bestimmung elastischer Eigenschaften in nanoskaligen Dimensionen mit Rastersondenmikroskopie, IZPF CY - Saarbrücken, Germany DA - 2002-09-04 PY - 2002 AN - OPUS4-6526 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Studies of wear on materials by SPM T2 - First Workshop on Scanning Probe Microscopy CY - São Carlos, Brazil DA - 1997-10-10 PY - 1997 AN - OPUS4-6421 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Der dynamische Reibungskontrast im SFM T2 - Kolloquium der Abt. VI CY - Berlin, Germany DA - 1997-10-23 PY - 1997 AN - OPUS4-6426 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Heyde, M. A1 - Sturm, Heinz A1 - Rademann, K. T1 - SPM Techniques to characterise Electrical Properties of Nanometer sized Particles T2 - Raster-Sonden-Mikroskopien und organische Materialien VII CY - Berlin, Germany DA - 1998-10-07 PY - 1998 AN - OPUS4-6455 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Scanning Probe Microscopy Techniques for the Examination of Nanomechanics - a study of Topography, AC Conductivity and Surface Stiffness T2 - Raster-Sonden-Mikroskopien und organische Materialien VII CY - Berlin, Germany DA - 1998-10-08 PY - 1998 AN - OPUS4-6448 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Munz, Martin A1 - Schulz, Eckhard A1 - Hampe, Andreas T1 - Scanning Probe Microscopy Techniques for the Examination of Interface Nanomechanics T2 - ECOF 7, European Conference Thin Organised Films CY - Potsdam, Germany DA - 1998-09-14 PY - 1998 AN - OPUS4-6460 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Geuss, Markus T1 - Measurements of Topography and local electrical properties: Conductivity, Capacity, Surface Charge and Inverse Piezoelectricity T2 - 2nd German Brazilian Workshop on Applied Surface Science CY - Templin, Germany DA - 1998-09-21 PY - 1998 AN - OPUS4-6461 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Heyde, M. A1 - Rademann, K. T1 - Scanning Probe Microscopy Techniques to characterise electric and dielectric properties of nanometer sized particles T2 - ECOF 7, European Conference Thin Organised Films CY - Potsdam, Germany DA - 1998-09-18 PY - 1998 AN - OPUS4-6464 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Harmonically modulated friction force microscopy: An AFM tool for analysis and modification of polymer surfaces T2 - International Symposium on Polymer Surface Characterization (MST conference) CY - Newark, NJ, USA DA - 2000-10-10 PY - 2000 AN - OPUS4-6505 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Kraft-Modulationstechniken am AFM zum Schreiben und Analysieren kleiner Strukturen T2 - BAM-Kolloquium CY - Berlin, Germany DA - 2000-11-09 PY - 2000 AN - OPUS4-6506 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Rhiem, S. A1 - Barthel, Anne-Kathrin A1 - Meyer-Plath, A. A1 - Hennig, M. P. A1 - Wachtendorf, Volker A1 - Sturm, Heinz A1 - Schäffer, A. A1 - Maes, H. M. T1 - Release of 14C-labelled carbon nanotubes from polycarbonate composites N2 - Waste disposal of carbon nanotube (CNT) containing products is expected to be the most important pathway for release of CNTs into the environment. In the present work, the use of radiolabelled CNTs (14C-CNT) for polycarbonate polymer nanocomposites with 1 wt% 14C-CNT content allowed for the first time to quantify and differentiate the CNT release according to the type of impact along the materials' ageing history. After an initial exposure of the nanocomposite by solar-like irradiation, further environmental impacts were applied to composite material. They aimed at mimicking disposal site conditions that may induce further ageing effects and CNT release. This study included shaking in water, rapid temperature changes, soaking in humic acid solution as well as waste water effluent, and, finally, gentle mechanical abrasion. All ageing impacts were applied sequentially, both on pristine (control) and on solar-irradiated nanocomposites. All experiments were accompanied by absolute quantification of radioactive release as well as chemical and morphological analyses of the nanocomposite surfaces using infra-red (IR) spectroscopy, X-ray photoelectron spectroscopy (XPS) and scanning electron microscopy (SEM). The morphological analysis showed that spectral irradiation can uncover CNT networks on the outer nanocomposite surface layers by polymer degradation. After having subjected the solar-irradiated nanocomposite to all studied disposal site effect, the total radioactive release was quantified to amount to 64 mg CNT/m2, whereas only 0.8 mg CNT/m2 were found for the un-irradiated control sample. Solar degradation of polymers was thus found to significantly increase the propensity of the studied polymer nanocomposites to release CNTs during ageing effects at the product's end-of-life typical for disposal sites. KW - Weathering KW - Carbon nanotubes KW - Nanocomposites KW - Release KW - Quantification PY - 2016 UR - http://www.sciencedirect.com/science/article/pii/S0269749116303748 DO - https://doi.org/10.1016/j.envpol.2016.04.098 SN - 0269-7491 VL - 215 IS - August SP - 356 EP - 365 PB - Elsevier Ltd. CY - Paris AN - OPUS4-36899 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Topolniak, Ievgeniia A1 - Elert, Anna Maria A1 - Knigge, Xenia A1 - Ciftci, G. C. A1 - Radnik, Jörg A1 - Sturm, Heinz T1 - High precision micropatterning of polydopamine by Multiphoton Lithography N2 - Mussel-inspired polydopamine (PDA) initiated a multifunctional modification route that leads to the generation of novel advanced materials and their applications. However, existing PDA deposition techniques still exhibit poor spatial control, have a very limited capability of micropatterning and do not allow to locally tune PDA topography. Herein, we demonstrate PDA deposition based on Multiphoton Lithography (MPL) that enables full spatial and temporal control with nearly total freedom of patterning design. Using MPL, we achieve 2D microstructures of complex design with pattern precision of 0.8 μm without the need of a photomask or stamp. Moreover, this approach permits adjusting the morphology and thickness of the fabricated microstructure within one deposition step, resulting in a unique tunability of materials properties. The chemical composition of PDA is confirmed and its ability for protein enzyme immobilization is demonstrated. This work presents a new methodology for high precision and complete control of PDA deposition, enabling PDA incorporation in applications where fine and precise local surface functionalization is required. Possible applications include multicomponent functional elements and devices in microfluidics or lab-on-a-chip systems. KW - Multiphoton lithography KW - Polydopamine KW - Micropatterning PY - 2022 DO - https://doi.org/10.1002/adma.202109509 VL - 34 IS - 18 SP - e2109509 PB - Wiley online library AN - OPUS4-54535 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -