TY - JOUR A1 - Bonse, Jörn A1 - Bachelier, G. A1 - Wiggins, S. M. A1 - Siegel, J. A1 - Solis, J. A1 - Krüger, Jörg A1 - Sturm, Heinz T1 - Femtosecond laser ablation of indium phosphide in air: dynamical, structural and morphological evolution N2 - The irradiation of single-crystalline indium phosphide (c-InP) by Ti:sapphire femtosecond laser pulses (130 fs, 800 nm) in air is studied by means of in-situ time resolved reflectivity measurements [fs-time-resolved microscopy (100 fs-10 ns) and point probing analysis (ns - µs)] and by complementary ex-situ surface analytical methods (Micro Raman Spectroscopy, Scanning Force, and Optical Microscopy). The dynamics of melting, ablation, and optical breakdown as well as structural changes resulting from rapid solidification are investigated in detail. Different laser-induced surface morphologies are characterized and discussed on the basis of recent ablation and optical breakdown models. KW - Femtosecond laser ablation KW - Optical breakdown KW - Time-resolved measurements KW - Semiconductor KW - Indium phosphide PY - 2010 SN - 1454-4164 VL - 12 IS - 3 SP - 421 EP - 426 PB - INOE & INFM CY - Bucharest AN - OPUS4-21082 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Munz, Martin A1 - Sturm, Heinz A1 - Stark, Wolfgang T1 - Mechanical gradient interphase by interdiffusion and antiplasticisation effect - study of an epoxy/thermoplastic system N2 - A stoichiometric amine–epoxy formulation was cured in the presence of a thermoplastic, namely poly(vinylpyrrolidone) (PVP). The epoxy system consisted of the resin diglycidyl ether of bisphenol A (DGEBA) and the aromatic curing agent 4,4'-diaminodiphenylsulfone (DDS). As shown for this system in a former study by Oyama et al. [Oyama HT, Lesko JJ, Wightman JP. J Polym Sci B 1997;35:331–46. [36]], preferential absorption of amine molecules by PVP can occur. In the present study, the focus is on the variations of local elastic properties within the epoxy interphase adjacent to the PVP layer. The curing was performed close to the glass transition temperature, Tα, of the PVP film, namely at 170 °C. Variations of the local amine concentration were tracked using energy-dispersive analysis of X-rays (EDX), by taking benefit of the sulfur contained in DDS. Using temperature-dependent dynamic mechanical analysis (DMA), a series of epoxy reference samples of different amine–epoxy concentration ratios, r, was investigated in order to work out the relationship between r and the epoxy storage modulus at room temperature. In the excess-epoxy regime, r<1, the modulus is observed to increase with departure from the stoichiometric ratio, r=1. Considering the respective suppression of the ß-transition, the observed characteristic can be explained by an antiplasticisation effect. Depth-sensing indentation (DSI) experiments across the epoxy/PVP interphase provided evidence for strong modulus variations. In consistency with the EDX and the DMA data, in the vicinity of the PVP layer the local epoxy modulus is increased. The total change of the epoxy Young's modulus is ~1.1 GPa. However, the total width of the modulus decay of ~175 µm is ~2.5 times larger than the one of the DDS concentration gradient. This finding is discussed in terms of additional spatial variations of the DGEBA concentration as well as long-range diffusion currents of DDS induced by the interdiffusion processes and their effect on the final network of crosslinks. KW - Interdiffusion KW - Interphase/interface KW - Polymer PY - 2005 DO - https://doi.org/10.1016/j.polymer.2005.06.098 SN - 0032-3861 SN - 1873-2291 VL - 46 IS - 21 SP - 9097 EP - 9112 PB - Springer CY - Berlin AN - OPUS4-10893 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Sturm, Heinz A1 - Schröter, Maria-Astrid A1 - Weimann, Christiane T1 - Imaging method for vibrating scanning force microscopy cantilevers for the analysis of mode shapes and nonlinear harmonic motion N2 - A specially designed scanning force microscope (SFM, atomic force microscope – AFM) was incorporated into the chamber of a commercial scanning electron microscope (SEM) to investigate vibrating SFM cantilevers at their resonance. Inherently, the spatial resolution of electron microscopy is higher than that of optical methods. In this paper we present vibration modes (eigenmodes) of two different SFM cantilevers. Their nonlinear behavior is also explored in order to depict their 2nd harmonics (twice the fundamental frequency). Imaging of the local vibration is performed by measuring the frequency- and phase-selective responses of the SE signal at different X and Y positions of the scanned electron beam. KW - Electron microscopy KW - Scanning force microscopy KW - Motion detection KW - Cantilever KW - Eigenmode KW - Harmonic KW - Nonlinearity KW - Harmonix cantilever PY - 2012 DO - https://doi.org/10.1016/j.mee.2012.07.088 SN - 0167-9317 SN - 1873-5568 VL - 98 SP - 492 EP - 496 PB - Elsevier Science CY - Amsterdam, Netherlands AN - OPUS4-26431 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Waegner, M. A1 - Schröder, M. A1 - Suchaneck, G. A1 - Sturm, Heinz A1 - Weimann, Christiane A1 - Eng, L.M. A1 - Gerlach, G. T1 - Domain formation in nano-patterned PZT thin films N2 - In this work, reactive magnetron-sputtered Pb(Zr,Ti)O3 thin films were used to fabricate well-ordered nanodot arrays by means of nanosphere lithography (NSL). NSL is based on a two-step etch process by means of, firstly adjusting the diameter of polystyrene spheres in the self-assembled polymeric nanosphere mask using reactive ion etching, and secondly transferring the mask to the substrate by ion milling with adjusted heights. Hence, structures with different aspect ratios can be fabricated. Piezoresponse force microscopy was used as the inspection tool on both non-patterned and patterned films. Both the topography and polarization out of plane and in plane was deduced in this mode. Grains of nanodots with low aspect ratio form domain structures comparable to domains in non-patterned films. In contrast to that, nanodots with a higher aspect ratio form particular structures. The in-plane amplitude images show mostly a bisectioned domain assembly, while the out-of-plane amplitude images show in some cases more complex structures like 'c'-shaped domains or multi-domains around a center domain. The patterning of the ferroelectric material was shown to affect the formation of ferroelectric domains. The initial polycrystalline, randomly-ordered films are re-oriented and show domain structures depending on nanodisc diameter and aspect ratio. This may enable tailoring of ferroelectric materials in their piezoelectric and pyroelectric properties by patterning. T2 - MRS Spring meeting 2012 CY - San Francisco, CA, USA DA - 2012-04-09 KW - Nanostructure KW - Piezoresponse KW - Ferroelectric KW - Piezo response force microscopy KW - Nanodots PY - 2012 DO - https://doi.org/10.1557/opl.2012.1230 SN - 1946-4274 SN - 0272-9172 VL - 1454 SP - 1 EP - 6(?) PB - Mater. Res. Soc CY - Warrendale, Pa. AN - OPUS4-26521 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Solomun, Tihomir A1 - Sturm, Heinz A1 - Wellhausen, Robert A1 - Seitz, H. T1 - Interaction of a single-stranded DNA-binding protein g5p with DNA oligonucleotides immobilised on a gold surface N2 - We report surface plasmon resonance (spr) and confocal fluorescence results concerning the interaction of a gene-5-protein (g5p) with single-stranded DNA oligonucleotides (dT25) tethered to a gold surface. The spr data show that a highly stable g5p–ssDNA complex is readily formed on a gold surface with koff = 1.7 × 10-3 s-1. The extent of the complexion indicated involvement of the cooperative protein–protein interactions within the binding to DNA. In the experiments where dT25 coexist with g5p in the solution, the fluorescence data show that g5p also mediates the binding between the non-complementary oligonucleotides in the solution and those immobilised on the surface. KW - Single stranded DNA KW - g5p protein PY - 2012 DO - https://doi.org/10.1016/j.cplett.2012.03.017 SN - 0009-2614 SN - 1873-4448 VL - 533 SP - 92 EP - 94 PB - North-Holland Publ. Co. CY - Amsterdam AN - OPUS4-26525 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Anik, Yavuz A1 - Geburtig, Anja A1 - Sturm, Heinz A1 - Meyer-Plath, Asmus ED - Reichert, T. T1 - CarboLifeCycle -weathering-induced degradation of nanoparticle-functionalised composites N2 - A new research project 'CarboLifeCycle', funded by the German Federal Ministry of Education and Research (BMBF), investigates various nanoparticle release scenarios for carbon nanotube-containing polymer composites. The studied weathering concepts and conditions will be described. T2 - 5th European weathering symposium - Natural and artificial ageing of polymers CY - Lisbon, Portugal DA - 21.09.2011 KW - CNT KW - Nanoparticle KW - Weathering KW - Degradation PY - 2011 SN - 978-3-9813136-2-8 N1 - Serientitel: CEEES Publication – Series title: CEEES Publication IS - 15 SP - 125 EP - 135 PB - GUS (Gesellschaft für Umweltsimulation) CY - Pfinztal AN - OPUS4-24503 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Tavares, Luciana A1 - Kjelstrup-Hansen, J. A1 - Rubhahn, H.-G. T1 - Bilayer polymer/oxide coating for electroluminescent organic semiconductors T2 - E-MRS 2011 Spring Meeting; IUMRS ICAM 20011 & E-MRS / MRS Bilateral Conference on Energy CY - Nice, France DA - 2011-05-09 PY - 2011 AN - OPUS4-23667 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Schröter, Maria-Astrid A1 - Weimann, Christiane T1 - Nanotribology and vibrating contacts T2 - Chinese-German Symposium Nanomanufacturing and Nanotribology CY - Berlin, Germany DA - 2011-05-30 PY - 2011 AN - OPUS4-23582 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kovalev, Alexander A1 - Sturm, Heinz T1 - Observation of nanoscale hot-spot generation on a 2, 4, 6-trinitrophenol (TNP) single crystal N2 - An energetic material (EM) creates a local thermal point when it accepts energy and the EM will explode due to thermal decomposition when the hot-spot temperature reaches the explosive temperature. The initial stage of the hot-spot formation on 2, 4, 6-trinitrophenol (TNP) single crystal has been observed at the nanometer scale using atomic force microscopy (AFM). The hot-spot generation has been directly initiated by means of an AFM tip. The phenomenon is accompanied by producing agglomerated spherical-like nanoparticles due to a low-temperature decomposition of TNP. It has been observed that the agglomerated particles are produced outside of the stimulated region. The observed decomposition process at the nanoscale doesn't lead to a self-sustaining shock as detonation or explosion. The results are of interest in relation to explore the origin of deformation-induced chemical decomposition or detonation of EM. KW - Energetic material KW - Hot-spot KW - Atomic force microscopy KW - Scratching KW - Dynamic ploughing lithography KW - Nanomanipulation KW - 2, 4, 6-trinitrophenol PY - 2011 DO - https://doi.org/10.1016/j.susc.2011.06.012 SN - 0039-6028 VL - 605 IS - 17-18 SP - 1747 EP - 1753 PB - Elsevier CY - Amsterdam AN - OPUS4-24367 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Schröter, Maria-Astrid A1 - Weimann, Christiane A1 - Holzschneider, M. T1 - Imaging and simulation of mode shapes and harmonics of AFM cantilevers using Scanning Electron Microscopy T2 - 4th Multifrequency AFM Conference CY - Madrid, Spain DA - 2012-10-15 PY - 2012 AN - OPUS4-27342 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Heyde, M. T1 - Nanotechnologie auf Kunststoff-Oberflächen T2 - Hannover-Messe CY - Hanover, Germany DA - 1999-04-19 PY - 1999 AN - OPUS4-6499 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Schröter, Maria-Astrid A1 - Sturm, Heinz A1 - Holschneider, M. T1 - Phase and amplitude patterns in DySEM mappings of vibrating microstructures N2 - We use a dynamic scanning electron microscope (DySEM) to analyze the movement of oscillating micromechanical structures. A dynamic secondary electron (SE) signal is recorded and correlated to the oscillatory excitation of scanning force microscope (SFM) cantilever by means of lock-in amplifiers. We show, how the relative phase of the oscillations modulate the resulting real part and phase pictures of the DySEM mapping. This can be used to obtain information about the underlying oscillatory dynamics. We apply the theory to the case of a cantilever in oscillation, driven at different flexural and torsional resonance modes. This is an extension of a recent work (Schr¨oter et al 2012 Nanotechnology 23 435501), where we reported on a general methodology to distinguish nonlinear features caused by the Imaging process from those caused by cantilever motion. KW - DySEM KW - mechanical nonlinearity KW - vibration KW - DySEM KW - mechanische Nichtlinearitäten KW - Vibration PY - 2013 DO - https://doi.org/doi:10.1088/0957-4484/24/21/215701 VL - 24 IS - 21 SP - 215701-1 EP - 215701-10 PB - IOP PUBLISHING LTD CY - Bristol, UK AN - OPUS4-35396 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Munz, Martin A1 - Cappella, Brunero A1 - Sturm, Heinz A1 - Geuss, Markus A1 - Schulz, Eckhard T1 - Materials contrasts and nanolithography techniques in scanning force microscopy (SFM) and their application to polymers and polymer composites N2 - Beyond measuring the topography of surfaces, scanning force microscopy (SFM) has proved to be valuable both for mapping of various materials properties and for modifying surfaces via lithography techniques. Thus, SFM has gained relevance as a surface analysis technique as well as a tool for nanoscale engineering purposes. Different kinds of tip-sample interactions are exploitable, e.g. mechanical, thermal and electrical ones. Owing to its versatility, SFM has found plenty of applications in polymer science. Among others, the examples reported on in this review article encompass issues related to commodity polymers, various polymer-based composites, polymer blends, or ferroelectric polymers. For instance, stiffness imaging is elucidated as a technique for detecting interphases occurring in composites with inorganic fillers. The described applications are mainly related to mechanical and electrical tip-sample interactions. The respective fundamentals are outlined as well as some aspects of the measurement of materials contrasts. The presented techniques of nano-scale modification are a dynamical sort of plowing lithography and electrical poling, both performed by means of SFM-probes. KW - Local electrical-properties KW - Probing micromechanical properties KW - Spreading resistance microscopy KW - Modulated friction techniques KW - Nanometer-scale modification KW - Ferroelectric domain-walls KW - Interfacial shear-strength KW - Self-assembled monolayers KW - Maxwell-stress microscopy KW - Solid-liquid interfaces KW - Contact mechanics KW - Electrical properties KW - Interface/interphase KW - Nanolithography KW - Polymer-matrix composites (PMC) scanning/atomic force KW - Microscopy (SFM/AFM) thermal diffusivity PY - 2003 SN - 3-540-00530-7 DO - https://doi.org/10.1007/b11055 SN - 0065-3195 SN - 1436-5030 N1 - Serientitel: Advances in polymer science – Series title: Advances in polymer science IS - 164 SP - 87 EP - 210 PB - Springer CY - Berlin AN - OPUS4-2892 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - Messung elektrischer Eigenschaften in der Rasterkraftmikroskopie: Leitfähigkeitskontrast auf Kohlefaseroberflächen T2 - Tagung "Raster-Sonden-Mikorskopien und organische Materialien IV" CY - Munich, Germany DA - 1995-10-11 PY - 1995 AN - OPUS4-6388 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - Messung lokaler elektrischer Eigenschaften mit dem AFM: Der Leitfähigkeitskontrast T2 - Festvortragsreihe "Fortschritte in der Rastersondenmikroskopie" anläßlich der Eremittierung von Prof. Dr. Lacmann CY - Braunschweig, Germany DA - 1995-03-16 PY - 1995 AN - OPUS4-6383 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - Reibungsmikroskopie auf laserabladierten C-Faser-Verbunden und plasmapolymerisierten dünnen Schichten T2 - Tagung "Raster-Sonden-Mikroskopien und organische Materialien II" CY - Mainz, Germany DA - 1993-10-11 PY - 1993 AN - OPUS4-6380 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Stark, Wolfgang A1 - Bovtun, V. A1 - Schulz, Eckhard T1 - Methods for simultaneous measurements of topography and local electrical properties using scanning force microscopy T2 - 9th International Symposium on Electrets (ISE9) CY - Shanghai, China DA - 1996-09-15 PY - 1996 AN - OPUS4-6396 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Stark, Wolfgang A1 - Schulz, Eckhard T1 - Messungen der lokalen Leitfähigkeit und Oberflächenaufladung im Rasterkraftmikroskop T2 - Frühjahrstagung des Fachausschusses Polymerphysik der Deutschen Physikalischen Gesellschaft (DPG) CY - Marburg, Germany DA - 1996-03-18 PY - 1996 AN - OPUS4-6395 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Lithography on Polymers using a Scanning Force Microscope (SFM) and a Environmental Scanning Electron Microscope (ESEM) T2 - Seminar International PhD Program CY - Berlin, Germany DA - 2004-04-30 PY - 2004 AN - OPUS4-3504 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Rastersondenverfahren T2 - BAM, DGM Fachausschuss "Gefüge und Eigenschaften von Polymerwerkstoffen" CY - Berlin, Germany DA - 2003-12-05 PY - 2003 AN - OPUS4-4099 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Scanning Force Microscopy (SFM) of Polymer surfaces: Materials contrasts and nanolithography T2 - Fachbereich Chemie der Universität Siegen CY - Siegen, Germany DA - 2003-07-01 PY - 2003 AN - OPUS4-4100 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - An AFM-ESEM Hybride T2 - 2. BAM-IVW-Symposium im DFG-Proekt:Gleitverschleiss polymer Verbundwerkstoffen zwischen Raumtemperatur und 4,2 K CY - Berlin, Germany DA - 2003-02-27 PY - 2003 AN - OPUS4-2913 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Lithographie, Manipulation und Analyse in ESEM und AFM T2 - Evaluierungsmeeting eines zukünftigen DFG-Forscherverbundes zum Thema "Nanoröhren und -drähte" CY - Halle (Saale), Germany DA - 2003-01-17 PY - 2003 AN - OPUS4-2915 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Modulated Lateral Force Microscopy (M-LFM): principles, experiments and unsolved problems T2 - Institut für Physik der Universität Basel CY - Basel, Switzerland DA - 2003-02-20 PY - 2003 AN - OPUS4-4097 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Rastersondenverfahren: Materialkontraste und Nanolithographie T2 - DGM Fachausschuss "Gefüge und Eigenschaften von Polymerwerkstoffen" CY - Berlin, Germany DA - 2003-12-05 PY - 2003 AN - OPUS4-2917 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Modulator Lateral Force Microscopy: principles, experiments and unsolved problems T2 - Institutsvortrag Universität Basel DA - 2003-02-20 PY - 2003 AN - OPUS4-2912 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Erweiterung konventioneller Rasterkraftmikroskopie: Informationen aus Zusatzkontrasten lokaler elektrischer Eigenschaften T2 - Institut für Physik an der Universität Basel CY - Basel, Switzerland DA - 1994-11-14 PY - 1994 AN - OPUS4-6373 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - Rasternahfeldmikroskopie an Oberflächen organischer Werkstoffe T2 - Vortrag für die AFM/STM User Group Berlin-Brandenburg CY - Berlin, Germany DA - 1993-11-30 PY - 1993 AN - OPUS4-6379 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Scanning force mocroscopy based lothography T2 - JPK-Wirkshop "Scanning probe microscopy in life science" CY - Berlin, Germany DA - 2003-09-18 PY - 2003 AN - OPUS4-4653 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Rastersondenmikroskopie zur Oberflächenanalyse polymerer Werkstoffe T2 - BAM CY - Berlin, Germany DA - 1994-11-02 PY - 1994 AN - OPUS4-6375 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Solomun, Tihomir A1 - Schimanski, A. A1 - Sturm, Heinz A1 - Illenberger, E. T1 - Reactions of amide group with fluorine as revealed with surface analytics N2 - Thin polyamide-6 films were exposed to fluorine gas and analysed with photoelectron and infrared spectroscopies. Fluorine cleaves the amide C–N bond resulting in the formation of the –COOH and –NF2 terminal groups. This is evident from large shifts in the N1s binding energy (+5 eV) and C=O stretching frequency (~80 cm-1), appearance of ester oxygen in the XPS spectra, as well as by the 19F nmr spectra of volatile products consistent with a terminal NF2 group. KW - Gasfluorierung KW - Polyamid-6 KW - XPS KW - IR KW - -COOH und NF2-Gruppen PY - 2004 UR - http://www.sciencedirect.com/science?_ob=PublicationURL&_tockey=%23TOC%235231%232004%23996109995%23499295%23FLA%23&_cdi=5231&_pubType=J&_auth=y&_acct=C000049503&_version=1&_urlVersion=0&_userid=963821&md5=baea8e0df63660c666921ef377c00e40 SN - 0009-2614 SN - 1873-4448 VL - 378 SP - 312 EP - 316 PB - North-Holland Publ. Co. CY - Amsterdam AN - OPUS4-3439 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Schulz, Eckhard A1 - Stark, Wolfgang A1 - Bovtun, V. A1 - Friedrich, Jörg F. T1 - Techniques for surface composition analysis with Scanning Force Microscopy (SFM) T2 - ECASIA '97 CY - Gothenburg, Sweden DA - 1997-06-16 PY - 1997 AN - OPUS4-6416 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Dynamic Plowing Lithography T2 - International Workshop on Scanning Probe Microscopy in Nanotechnology CY - Wroclaw, Poland DA - 2001-07-09 PY - 2001 AN - OPUS4-6514 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Bericht und Neuanträge des Teilprojektes A1/B5 T2 - Sfb605 "Elementarreibereignisse" CY - Berlin, Germany DA - 2001-05-07 PY - 2001 AN - OPUS4-6513 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Munz, Martin A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - The Normal Force Modulation as a method for Studying the Interphase of Fibre Reinforced Polymer T2 - 24th Intern. TopoMetrix-Workshop: Aktuelle Entwicklungen in der Nanotechnologie und Rastersondenmikroskopie, Humboldt-Universität CY - Berlin, Germany DA - 1998-03-12 PY - 1998 AN - OPUS4-6457 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Munz, Martin A1 - Schulz, Eckhard A1 - Hampe, Andreas T1 - Scanning Probe Microscopy Techniques for the Examination of Interface Nanomechanics - A Study of Topography, AC Conductivity and Surface Stiffness T2 - Workshop: Rastersondenmikroskopie in Forschung und Industrie an der GH Wuppertal CY - Wuppertal, Germany DA - 1999-03-11 PY - 1999 AN - OPUS4-6497 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Geuss, Markus T1 - Scanning Force Microscopy Investigation on Electroactive Polymers and their Metal Electrodes Probing Local Electro-Mechanical Properties T2 - 10th International Symposium on Electrets (ISE 10) CY - Delphi, Greece DA - 1999-09-22 PY - 1999 AN - OPUS4-6502 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Fertigung und Charakterisierung von Kalibrierproben T2 - 1. Treffen im Verbundprojekt Entwicklung und Optimierung von Prüfmethoden zur quantitativen Bestimmung elastischer Eigenschaften in nanoskaligen Dimensionen mit Rastersondenmikroskopie, IZPF CY - Saarbrücken, Germany DA - 2002-09-04 PY - 2002 AN - OPUS4-6526 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Studies of wear on materials by SPM T2 - First Workshop on Scanning Probe Microscopy CY - São Carlos, Brazil DA - 1997-10-10 PY - 1997 AN - OPUS4-6421 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Der dynamische Reibungskontrast im SFM T2 - Kolloquium der Abt. VI CY - Berlin, Germany DA - 1997-10-23 PY - 1997 AN - OPUS4-6426 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Heyde, M. A1 - Sturm, Heinz A1 - Rademann, K. T1 - SPM Techniques to characterise Electrical Properties of Nanometer sized Particles T2 - Raster-Sonden-Mikroskopien und organische Materialien VII CY - Berlin, Germany DA - 1998-10-07 PY - 1998 AN - OPUS4-6455 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Scanning Probe Microscopy Techniques for the Examination of Nanomechanics - a study of Topography, AC Conductivity and Surface Stiffness T2 - Raster-Sonden-Mikroskopien und organische Materialien VII CY - Berlin, Germany DA - 1998-10-08 PY - 1998 AN - OPUS4-6448 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Munz, Martin A1 - Schulz, Eckhard A1 - Hampe, Andreas T1 - Scanning Probe Microscopy Techniques for the Examination of Interface Nanomechanics T2 - ECOF 7, European Conference Thin Organised Films CY - Potsdam, Germany DA - 1998-09-14 PY - 1998 AN - OPUS4-6460 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Geuss, Markus T1 - Measurements of Topography and local electrical properties: Conductivity, Capacity, Surface Charge and Inverse Piezoelectricity T2 - 2nd German Brazilian Workshop on Applied Surface Science CY - Templin, Germany DA - 1998-09-21 PY - 1998 AN - OPUS4-6461 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Heyde, M. A1 - Rademann, K. T1 - Scanning Probe Microscopy Techniques to characterise electric and dielectric properties of nanometer sized particles T2 - ECOF 7, European Conference Thin Organised Films CY - Potsdam, Germany DA - 1998-09-18 PY - 1998 AN - OPUS4-6464 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Harmonically modulated friction force microscopy: An AFM tool for analysis and modification of polymer surfaces T2 - International Symposium on Polymer Surface Characterization (MST conference) CY - Newark, NJ, USA DA - 2000-10-10 PY - 2000 AN - OPUS4-6505 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Kraft-Modulationstechniken am AFM zum Schreiben und Analysieren kleiner Strukturen T2 - BAM-Kolloquium CY - Berlin, Germany DA - 2000-11-09 PY - 2000 AN - OPUS4-6506 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - AFM-basierte Nanoanalytik für die Mikrosystemtechnik T2 - Gründungskolloquium des BAM-AK Life Science CY - Berlin, Germany DA - 2003-04-02 PY - 2003 AN - OPUS4-4094 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CHAP A1 - Arlt, C. A1 - Exner, W. A1 - Riedel, U. A1 - Sturm, Heinz A1 - Sinapius, M. ED - Wiedemann, M. ED - Sinapius, M. T1 - Nanoscaled boehmites' modes of action in a polymer and its carbon fiber reinforced plastic N2 - Laminates of carbon fiber reinforced plastic (CFRP), which are manufactured by injection technology, are reinforced with boehmite particles. This doping strengthens the laminates, whose original properties are weaker than those of prepregs. Besides the shear strength, compression strength and the damage tolerance, the mode of action of the nanoparticles in resin and in CFRP is also analyzed. It thereby reveals that the hydroxyl groups and even more a taurine modification of the boehmites' surface alter the elementary polymer morphology. Consequently a new flow and reaction comportment, lower glass transition temperatures and shrinkage, as well as a changed mechanical behavior occur. Due to a structural upgrading of the matrix (higher shear stiffness, reduced residual stress), a better fiber-matrix adhesion, and differing crack paths, the boehmite nanoparticles move the degradation barrier of the material to higher loadings, thus resulting in considerably upgraded new CFRP. KW - Nano particles KW - Epoxy KW - Aerospace PY - 2012 SN - 978-3-642-29189-0 IS - Chapter 4 SP - 49 EP - 58 PB - Springer CY - Berlin, Heidelberg AN - OPUS4-26496 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kovalev, Alexander A1 - Sturm, Heinz T1 - In situ direct observation of adsorption and desorption on a single crystal of 2,4,6-trinitrophenol (TNP) N2 - For the first time, we report the direct observation of the nanoscale adsorption and desorption of 2,4,6-trinitrophenol (TNP) molecules on the crystal surface during atomic force microscopy scanning. Our results reveal the position instability of TNP molecules at the border of molecular layers under normal ambient conditions. The observed phenomena are of great interest for exploring the origin of hot-spot generation on the surface of energetic materials. On the basis of the explored properties of TNP crystal, a plausible mechanism of hot-spot formation upon weak initiation at the nanoscale is proposed. KW - Nanoscale adsorption and desorption KW - 2,4,6-trinitrophenol (TNP) KW - Instability of TNP KW - Mechanism of hot-spot formation PY - 2012 DO - https://doi.org/10.1021/cg300366m SN - 1528-7483 VL - 12 IS - 7 SP - 3557 EP - 3564 PB - American Chemical Society CY - Washington, DC, USA AN - OPUS4-26734 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -