TY - CONF A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - Rasternahfeldmikroskopie an Oberflächen organischer Werkstoffe T2 - Vortrag für die AFM/STM User Group Berlin-Brandenburg CY - Berlin, Germany DA - 1993-11-30 PY - 1993 AN - OPUS4-6379 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - Rasterkraftmikroskopie auf Oberflächen polymerer Werkstoffe T2 - Berliner Polymeren-Tage CY - Potsdam, Germany DA - 1994-10-05 PY - 1994 AN - OPUS4-6371 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Scanning force mocroscopy based lothography T2 - JPK-Wirkshop "Scanning probe microscopy in life science" CY - Berlin, Germany DA - 2003-09-18 PY - 2003 AN - OPUS4-4653 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Rasterkraftmikroskopie in der Faserverbundwerkstoffforschung T2 - Berliner Polymerentage CY - Berlin, Germany DA - 1993-05-06 PY - 1993 AN - OPUS4-6382 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Rastersondenmikroskopie zur Oberflächenanalyse polymerer Werkstoffe T2 - BAM CY - Berlin, Germany DA - 1994-11-02 PY - 1994 AN - OPUS4-6375 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Solomun, Tihomir A1 - Schimanski, A. A1 - Sturm, Heinz A1 - Illenberger, E. T1 - Reactions of amide group with fluorine as revealed with surface analytics N2 - Thin polyamide-6 films were exposed to fluorine gas and analysed with photoelectron and infrared spectroscopies. Fluorine cleaves the amide C–N bond resulting in the formation of the –COOH and –NF2 terminal groups. This is evident from large shifts in the N1s binding energy (+5 eV) and C=O stretching frequency (~80 cm-1), appearance of ester oxygen in the XPS spectra, as well as by the 19F nmr spectra of volatile products consistent with a terminal NF2 group. KW - Gasfluorierung KW - Polyamid-6 KW - XPS KW - IR KW - -COOH und NF2-Gruppen PY - 2004 UR - http://www.sciencedirect.com/science?_ob=PublicationURL&_tockey=%23TOC%235231%232004%23996109995%23499295%23FLA%23&_cdi=5231&_pubType=J&_auth=y&_acct=C000049503&_version=1&_urlVersion=0&_userid=963821&md5=baea8e0df63660c666921ef377c00e40 SN - 0009-2614 SN - 1873-4448 VL - 378 SP - 312 EP - 316 PB - North-Holland Publ. Co. CY - Amsterdam AN - OPUS4-3439 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Solomun, Tihomir A1 - Schimanski, A. A1 - Sturm, Heinz A1 - Mix, Renate A1 - Illenberger, E. T1 - Surface Modification of Polyamides by Direct Fluorination N2 - Bulk samples and thin films of polyamides (PA6 and PA12) were exposed to fluorine (1 - 10 vol.-% F2 in N2) and analysed with photoelectron (XPS) and infrared spectroscopy. Fluorination affects both, the amide and the hydrocarbon parts of the polymers. However, only the carbon atom next to the carbonyl is readily fluorinated. Chemical modification of the amide group is apparent in a large binding energy shift (+5 eV) of the N1s level and the appearance of a CO band at 1734 cm-1. It is concluded that the amide C-N bond is cleaved in the fluorination process and that COOH and NF2 end groups are formed. This conclusion is corroborated by the appearance of ester oxygen in the XPS and by the 19F NMR spectra of the volatile products that show fluorine signals chemically shifted about 200 ppm towards lower field as compared with the CHF environment. KW - Gasfluorierung KW - IR KW - XPS KW - AFM KW - NF2-Gruppe PY - 2004 UR - http://www.e-polymers.org SN - 1618-7229 IS - 8 SP - 1 EP - 16 PB - De Gruyter CY - [S.l.] AN - OPUS4-3425 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Schulz, Eckhard A1 - Munz, Martin T1 - Der dynamische Reibkontrast als eine Methode zur Charakterisierung von Polymeroberflächen in der Rasterkraftmikroskopie T2 - Frühjahrstagung der DPG, FA: Polymerphysik CY - Münster, Germany DA - 1997-03-17 PY - 1997 AN - OPUS4-6415 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Schulz, Eckhard A1 - Stark, Wolfgang A1 - Bovtun, V. A1 - Friedrich, Jörg F. T1 - Techniques for surface composition analysis with Scanning Force Microscopy (SFM) T2 - ECASIA '97 CY - Gothenburg, Sweden DA - 1997-06-16 PY - 1997 AN - OPUS4-6416 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - Local AC current contrast on carbon fiber surfaces imaged by scanning force microscopy N2 - After a delamination process in a C-fiber reinforced polymer composite, the identification of the polymer residue of poly-(phenylene sulphide) on carbon fiber surfaces gives important information on the composite failure mechanism. Using scanning force microscopy (SFM) in its lateral force imaging mode or with the stiffness imaging mode, it is almost impossible to distinguish the two composite components owing to a very low material-based contrast of the local friction and compliance. The new technique using contrast based on a local AC current measurement allows a clear identification of the conducting carbon fiber and the non-conducting polymer coverage. KW - Matrix adhesion KW - Films KW - Photoconduction KW - Composites PY - 1995 DO - https://doi.org/10.1002/actp.1995.010460505 SN - 0323-7648 SN - 1521-4044 VL - 46 IS - 5 SP - 379 EP - 384 PB - Wiley-VCH Verl. CY - Weinheim, Germany AN - OPUS4-6848 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Messungen elektrischer Eigenschaften in der Rasterkraftmikroskopie T2 - Forschungsseminar zur Oberflächenphysik der Lehrstühle: Oberflächenphysik und Atomstoßprozesse und Elektronische Eigenschaften und Supraleitung CY - Berlin, Germany DA - 1997-11-17 PY - 1997 AN - OPUS4-6428 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Munz, Martin T1 - Harmonically Modulated Friction Force Microscopy of Polymers and Composites T2 - Workshop "Scanning Probe Microscopy In the New Millennium" CY - Faure, South Africa DA - 2001-02-26 PY - 2001 AN - OPUS4-6512 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Nanomechanics in Scanning Force Microscopy (SFM) T2 - 1st Latin American Symposium on Scanning Probe Microscopy (LA SPM1) CY - São Carlos, Brazil DA - 2001-03-29 PY - 2001 AN - OPUS4-6515 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Dynamic Plowing Lithography T2 - International Workshop on Scanning Probe Microscopy in Nanotechnology CY - Wroclaw, Poland DA - 2001-07-09 PY - 2001 AN - OPUS4-6514 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Bericht und Neuanträge des Teilprojektes A1/B5 T2 - Sfb605 "Elementarreibereignisse" CY - Berlin, Germany DA - 2001-05-07 PY - 2001 AN - OPUS4-6513 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - How to write functional areas on polymers using DPL - a way to produce nanoarrays for life science applications T2 - iThemba LABS CY - Somerset West, South Africa DA - 2002-02-03 PY - 2002 AN - OPUS4-6528 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - From microstructures to nanodots: AFM experiments with a piezoelectric polymer T2 - iThemba LABS CY - Somerset West, South Africa DA - 2002-02-03 PY - 2002 AN - OPUS4-6527 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Munz, Martin A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - The Normal Force Modulation as a method for Studying the Interphase of Fibre Reinforced Polymer T2 - 24th Intern. TopoMetrix-Workshop: Aktuelle Entwicklungen in der Nanotechnologie und Rastersondenmikroskopie, Humboldt-Universität CY - Berlin, Germany DA - 1998-03-12 PY - 1998 AN - OPUS4-6457 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Munz, Martin A1 - Schulz, Eckhard A1 - Hampe, Andreas T1 - Scanning Probe Microscopy Techniques for the Examination of Interface Nanomechanics - A Study of Topography, AC Conductivity and Surface Stiffness T2 - Workshop: Rastersondenmikroskopie in Forschung und Industrie an der GH Wuppertal CY - Wuppertal, Germany DA - 1999-03-11 PY - 1999 AN - OPUS4-6497 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Geuss, Markus T1 - Scanning Force Microscopy Investigation on Electroactive Polymers and their Metal Electrodes Probing Local Electro-Mechanical Properties T2 - 10th International Symposium on Electrets (ISE 10) CY - Delphi, Greece DA - 1999-09-22 PY - 1999 AN - OPUS4-6502 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -