TY - CONF A1 - Sturm, Heinz T1 - Prinzipien der Rastersondenmikroskopie T2 - Vortrag am Institut für Nichtmetallische Werkstoffe der TU Berlin CY - Berlin, Germany DA - 2005-11-03 PY - 2005 AN - OPUS4-11315 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Tavares, L. A1 - Kjelstrup-Hansen, J. A1 - Rubahn, H.-G. A1 - Sturm, Heinz T1 - Reduced bleaching in organic nanofibers by bilayer polymer/oxide coating N2 - Para-hexaphenylene (p-6P) molecules exhibit a characteristic photoinduced reaction (bleaching) resulting in a decrease in luminescence intensity upon UV light exposure, which could render the technological use of the nanofibers problematic. In order to investigate the photoinduced reaction in nanofibers, optical bleaching experiments have been performed by irradiating both pristine and coated nanofibers with UV light. Oxide coating materials (SiOx and Al2O3) were applied onto p-6P nanofibers. These treatments caused a reduction in the bleaching reaction but in addition, the nanofiber luminescence spectrum was significantly altered. It was observed that some polymer coatings [a statistical copolymer of tetrafluoroethylene and 2,2-bis-trifluoromethyl-4,5-difluoro-1,3-dioxole, P(TFE-PDD), and poly(methyl methacrylate), PMMA] do not interfere with the luminescence spectrum from the p-6P but are not effective in stopping the bleaching. Bilayer coatings with first a polymer material, which should work as a protection layer to avoid modifications of the p-6P luminescence spectrum, and second an oxide layer used as oxygen blocker were tested and it was found that a particular bilayer polymer/oxide combination results in a significant reduction in bleaching without affecting significantly the emission spectrum from the nanofibers. KW - Nanofibers KW - Photobleaching KW - Polymer coating KW - Oxide coating PY - 2010 DO - https://doi.org/10.1063/1.3427561 SN - 0021-8979 SN - 1089-7550 VL - 107 SP - 103521-1 - 103521-6 PB - American Institute of Physics CY - Melville, NY AN - OPUS4-21574 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Friedrich, Jörg Florian A1 - Mix, Renate A1 - Wettmarshausen, Sascha A1 - Sturm, Heinz ED - Tachibana, K. ED - Takai, O. T1 - A new concept of adhesion promotion in metal-polymer composites by introduction of covalently bonded hydrophobic spacers at interface T2 - Proceedings of the 18th International Symposium on Plasma Chemistry (ISPC-18) CY - Kyoto, Japan DA - 2007-08-26 PY - 2007 SN - 978-4-9903773-4-2 SP - 27A EP - p5, 1 PB - International Union of Pure and Applied Chemistry CY - Kyoto AN - OPUS4-20668 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Solomun, Tihomir A1 - Seitz, H. A1 - Sturm, Heinz T1 - DNA damage by low-energy electron impact: dependence on guanine content KW - DNA oligonucleotide KW - Low energy electrons KW - Secondary electrons KW - Damage KW - Guanine content PY - 2009 DO - https://doi.org/10.1021/jp905263x SN - 1520-6106 SN - 1089-5647 VL - 113 IS - 34 SP - 11557 EP - 11559 PB - Soc. CY - Washington, DC AN - OPUS4-20704 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Modulated Lateral Force Microscopy: An AFM tool for Analysis and Modification of Polymer T2 - German-Russian Workshop "Contact Mechanics and Friction" CY - Berlin, Germany DA - 2009-10-05 PY - 2009 AN - OPUS4-20751 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Methoden der Rasterelektronen- und Rasterkraftmikroskopie zur Analyse von Faserverbundwerkstoffen T2 - 15. Nationales Symposium SAMPE Deutschland e.V. CY - Berlin, Germany DA - 2009-02-18 PY - 2009 AN - OPUS4-20750 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz T1 - Using a SFM/ESEM hybrid for the analysis of vibrating surfaces T2 - MC 2009 Microscopy Conference CY - Graz, Austria DA - 2009-08-30 PY - 2009 AN - OPUS4-20706 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Henrichsen, H. A1 - Sturm, Heinz A1 - Boggild, P. A1 - Hansen, O. T1 - Submicron organic nanofiber devices with different anode-cathode materials: A simple approach N2 - The authors present a simple general method for simultaneously producing tens of submicron electrode gaps with different cathode and anode materials on top of nanofibers, nanowires, and nanotubes, with an optional gap size variation. Using this method, an ensemble of para-hexaphenylene (p6P) nanofiber devices of different length was fabricated with Sm and Au electrodes. The measured I-V characteristics are in agreement with a nonlinear hopping transport model, where domain barriers dominate the transport with an estimated domain size of 23±5 nm. KW - Nanofibers KW - Sub-micron electrode KW - Para-hexaphenylene KW - Samarium KW - Gold KW - I/V-characteristics KW - Nanolasers KW - Domain barriers PY - 2010 DO - https://doi.org/10.1116/1.3431088 SN - 1071-1023 SN - 0734-211X VL - 28 IS - 3 SP - 617 EP - 622 PB - American Institute of Physics CY - New York, NY AN - OPUS4-21573 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Bonse, Jörn A1 - Wiggins, S. M. A1 - Solis, J. A1 - Lippert, Th. T1 - Dynamics of phase transitions in polymer thin films upon single femtosecond laser pulse irradiation T2 - Second International Conference on Photo-Induced Phase Transitions Cooperative, non-linear and functional properties CY - Rennes, France DA - 2005-05-24 PY - 2005 AN - OPUS4-7430 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sturm, Heinz A1 - Cappella, Brunero T1 - Dynamic Plowing Lithography of Polymer Surfaces T2 - Workshop "Scanning Probe Microscopy in the New Millennium" CY - Faure, South Africa DA - 2001-02-26 PY - 2001 AN - OPUS4-7512 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -