TY - JOUR A1 - Hahn, Oliver A1 - Falkenberg, G. A1 - Pepponi, G. A1 - Streli, C. A1 - Wobrauscheck, P. T1 - Comparison of conventional and total reflection excitation geometry for fluorescence X-ray absorption spectroscopy on droplet samples JF - Spectrochimica acta B N2 - X-ray absorption fine structure (XAFS) experiments in fluorescence mode have been performed in total reflection excitation geometry and conventional 45°/45° excitation/detection geometry for comparison. The experimental results have shown that XAFS measurements are feasible under normal total reflection X-ray fluorescence (TXRF) conditions, i.e. on droplet samples, with excitation in grazing incidence and using a TXRF experimental chamber. The application of the total reflection excitation geometry for XAFS measurements increases the sensitivity compared to the conventional geometry leading to lower accessible concentration ranges. However, XAFS under total reflection excitation condition fails for highly concentrated samples because of the self-absorption effect. T2 - 9th Conference on Total Reflection X-Ray Fluorescence analysis and Related Methods CY - Funchal, Portugal DA - 2002-09-08 PY - 2003 DO - https://doi.org/10.1016/j.sab.2003.06.006 SN - 0584-8547 SN - 0038-6987 VL - 58 IS - 12 SP - 2239 EP - 2244 PB - Elsevier CY - Amsterdam AN - OPUS4-1499 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -