TY - CONF A1 - Beckmann, Jörg A1 - Spranger, Holger A1 - Ewert, Uwe T1 - THz Applications for Non-Destructive Testing N2 - Up to now THz-TDS-systems aren’t considered to be nondestructive testing facilities for large scale industrial applications, despite it was proven that they provide a comprehensive set of quality parameters. A practical approach to bring THz-TDS in addition to already existing testing systems into the industrial mainstream is systematic development of future test procedures and test facilities for dielectrics. For this purpose polyeth-ylene test specimen with introduced artefacts were designed, to evaluate the detection sensitivity of Time of Flight measurements based on dielectrics. SAFT reconstructed tomograms are presented which visualize the sizes and location of artificially introduced flaws. T2 - 2017 Far East NDT New Technology & Application Forum (FENDT) CY - XI'an, China DA - 22.06.2017 KW - THz radiation KW - Dielectric materials KW - Image reconstruction KW - Terahertz synthetic aperture PY - 2018 U6 - https://doi.org/10.1109/FENDT.2017.8584511 VL - 12 SP - 272 EP - 276 PB - IEEE Conference Publication CY - USA AN - OPUS4-47220 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Spranger, Holger A1 - Beckmann, Jörg T1 - THz – ToF optical layer analysis (OLA) to determine optical properties of dielectric materials N2 - Electromagnetic waves with frequencies between 0.1 and 10 THz are described as THz-radiation (T-ray). The ability to penetrate dielectric materials makes T-rays attractive to reveal discontinuities in polymer and ceramic materials. THz-Time Domain Spectroscopy Systems (THz-TDS) are available on the market today which operates with THz-pulses transmitted and received by optically pumped semiconductor antennas. In THz-TDS the travelling time (ToF) and shape of the pulse is changed if it interacts with the dielectric material and its inherent discontinuities. A tomogram of the object under the test can be reconstructed from time of flight diffraction (ToFD) scans if a synthetic focusing aperture (SAFT) algorithm is applied. The knowledge of the base materials shape and optical properties is essential for a proper reconstruction result. To obtain these properties a model is assumed which describes the device under the test as multilayer structure composed of thin layers with different dielectric characteristics. The Optical Layer Analysis (OLA) is able to fulfill these requirements. A short description why the optical properties are crucial for meaningful SAFT reconstruction results will be given first. Afterwards the OLA will be derived and applied on representative samples to discuss and evaluate ist benefits and limits. T2 - QNDE 2016 CY - Atlanta, GA, USA DA - 17.07.2016 KW - Optical layer analysis KW - THz-TDS KW - Optical properties of dielectric materials KW - THz-ToF PY - 2017 SN - 978-0-7354-1474-7 U6 - https://doi.org/10.1063/1.4974707 SN - 0094-243X VL - 1806 IS - 1 SP - UNSP 120002, 1 EP - 7 PB - AIP Publishing AN - OPUS4-39393 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Spranger, Holger A1 - Beckmann, Jörg T1 - THz-SAFT Rekonstruktion von HDPE-Bauteilen N2 - Obwohl THz-TDS-Systeme vielfältige Qualitätsparameter von Dielektrika ermitteln können, ist deren industrielle Nutzung im Bereich der zerstörungsfreien Bauteilprüfung noch nicht anerkannter Stand der Technik. Ein pragmatischer Weg, TDS-Systeme neben traditionellen Prüfverfahren zu etablieren, sind systematische Untersuchungen an Modellbauteilen, mit dem Ziel einer Methodenentwicklung zur zuverlässigen berührungslosen Prüfung von Dielektrika. Anhand von THz-TDS-Messungen an Polyethylen-Testkörpern mit künstlich eingebauten Fehlstellen werden anfänglich die Möglichkeiten der Laufzeitmessung zur Ermittlung von Tiefenlagen von Ungänzen in Testkörpern präsentiert. Im weitern Teil wird gezeigt, wie durch eine veränderte Versuchsdurchführung und Verwendung eines modifizierten SAFT-Rekonstruktions-Algorithmus Tomogramme berechnet werden können, in denen die künstlich eingebrachten Fehlstellen hinsichtlich ihrer Größe und Lage geometrisch richtig dargestellt werden. T2 - 3. Fachseminar des FA MTHz Mikrowellen- und Terahertz-Prüftechnik in der Praxis CY - Würzburg, Germany DA - 05.04.2017 KW - THz KW - THz-SAFT KW - THz-TDS KW - SAFT KW - HDPE PY - 2017 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-396883 SN - 978-3-940283-84-9 VL - 161 SP - 1 EP - 9 PB - Deutsche Gesellschaft für Zerstörungsfreie Prüfung (DGZfP) CY - Berlin AN - OPUS4-39688 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Spranger, Holger A1 - Beckmann, Jörg T1 - THZ-SAFT Rekonstruktion von HDPE-Bauteilen N2 - Obwohl THz-TDS-Systeme vielfältige Qualitätsparameter von Dielektrika ermitteln können, ist deren industrielle Nutzung im Bereich der zerstörungsfreien Bauteilprüfung noch nicht anerkannter Stand der Technik. Ein pragmatischer Weg, TDS-Systeme neben traditionellen Prüfverfahren zu etablieren, sind systematische Untersuchungen an Modellbauteilen, mit dem Ziel einer Methodenentwicklung zur zuverlässigen berührungslosen Prüfung von Dielektrika. Anhand von THz-TDS-Messungen an Polyethylen-Testkörpern mit künstlich eingebauten Fehlstellen werden anfänglich die Möglichkeiten der Laufzeitmessung zur Ermittlung von Tiefenlagen von Ungänzen in Testkörpern präsentiert. Im weitern Teil wird gezeigt, wie durch eine veränderte Versuchsdurchführung und Verwendung eines modifizierten SAFT-Rekonstruktions-Algorithmus Tomogramme berechnet werden können, in denen die künstlich eingebrachten Fehlstellen hinsichtlich ihrer Größe und Lage geometrisch richtig dargestellt werden. T2 - 3. Fachseminar Mikrowellen- und Terahertz-Prüftechnik in der Praxis CY - Würzburg, Germany DA - 05.04.2017 KW - THz KW - THz-SAFT KW - HDPE PY - 2017 AN - OPUS4-39689 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Beckmann, Jörg A1 - Spranger, Holger T1 - THz-TDS-SAFT for the detection of inherent discontinuities in dielectric materials N2 - Today X-ray tomography and Ultrasound Synthetic Aperture Focusing Techniques are representative examples for defect imaging in the field of nondestructive testing. THz time domain spectroscopy (TDS) operates with short electromagnetic pulses. The sensitivity of the pulses to optical material property changes makes THz-TDS attractive for the detection of flaws in dielectric materials. Unfortunately, the X-ray computed tomography (CT) model holds only for THz-TDS reconstruction if minor refraction index differences between the inhomogeneities and the surrounding material matrix exist. A Time Domain SAFT algorithm has been developed to overcome the restrictions. THz time domain measurement on representative sample sets with inherent artefacts were performed to use them for the Image reconstructions. The results will be presented and compared with optical surface images of the used test objects to evaluate the SAFT algorithm in relation to the econstruction quality. T2 - 42nd International Conference on Infrared, Millimeter and Terahertz Waves CY - Cancun, Mexico DA - 27.08.2017 KW - THz-TDS-Saft KW - Tomography KW - Dielectric materials KW - Image reconstruction KW - Terahertz spectroscopy KW - Terahertz wave imaging KW - Time-domain analysis KW - X-ray tomography KW - Ultrasound synthetic aperture focusing techniques KW - Terahertz time domain spectroscopy KW - Time domain SAFT algorithm KW - Image reconstructions KW - Optical surface images KW - Computed tomography KW - Dielectrics KW - Time measurement KW - Reflection PY - 2017 UR - http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8067159&isnumber=8066832 SN - 978-1-5090-6048-1 U6 - https://doi.org/10.1109/IRMMW-THz.2017.8067159 SP - TD.19-1 EP - TD.19-2 PB - IEEE CY - Danvers, USA AN - OPUS4-42030 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Spranger, Holger A1 - Beckmann, Jörg A1 - Boehm, Rainer T1 - THz-TOF saft & ola for the detection of inherent discontinuities in dielectric materials N2 - T-rays are electromagnetic waves with frequencies between 0.3 and 10 THz. The ability to penetrate dielectric materials makes them attractive to reveal discontinuities in polymer and ceramic materials. THz-Time Domain Spectroscopy Systems (THz-TDS) are available which operates with THz-pulses. In THz-TDS the travelling time (ToF) and shape of the pulse changes if it interacts with the basic material and its discontinuities. Several reconstruction techniques have been already demonstrated in the context of THz-ToF. Nevertheless, tomographic reconstruction procedures, developed for x-ray computed tomography (CT) ap-plications, have been preferably applied. As a result, reliable tomograms could be presented in case of existing minor refraction property differences between the defect and its surrounding material. Nevertheless geometric artefacts could be observed. The strong restriction of the CT application for the inspection of dielectric plastics that engaged us to develop a recon-struction technique that takes refraction into account. A time domain SAFT based algorithm will be presented, which is able to visualize discontinuities properly in dimension and location, if the base materials shape and its refractive index are considered. The algorithm became more challenging in case of multilayer composites. For that reason an Optical Layer algorithm was developed. Measurements on representative samples with a variety of artificially produced small and large size defects will be shown. The calculated tomograms will be demonstrated to discuss and evaluate the benefits and limits of the two different reconstruction approaches. T2 - QNDE 2016 CY - Atlanta, G.A, USA DA - 17.07.2016 KW - THz KW - Synthetic Aperture Focusing KW - Layer Reconstruction KW - FMM PY - 2016 AN - OPUS4-37246 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Spranger, Holger A1 - Beckmann, Jörg T1 - THz-ToF techniques for the detection of inherent discontinuities in dielectric materials based on SAFT N2 - The ability to penetrate dielectric materials makes T-rays attractive to reveal discontinuities in polymer and ceramic materials. Changes of travelling time (ToF) and pulse shape due to the interactions of THz pulses with the dielectric material and its inherent discontinuities can be observed. A tomogram of the object under the test can be reconstructed from time of flight diffraction (ToFD) scans if a synthetic focusing aperture (SAFT) algorithm is applied. T2 - 7th International Workshop on Terahertz Technology and Applications CY - Kaiserslautern, Germany DA - 15.03.2016 KW - Terahertz synthetic aperture dielectric materials PY - 2016 AN - OPUS4-36221 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Spranger, Holger A1 - Beckmann, Jörg A1 - Boehm, Rainer T1 - THz-ToF techniques for the detection of inherent discontinuities in dielectric materials based on a SAFT – and an optical layer reconstruction algorithm N2 - Electromagnetic waves with frequencies between 0.1 and 10 THz are described as THz-radiation (T-ray). The ability to penetrate dielectric materials makes T-rays attractive to reveal discontinuities in polymer and ceramic materials. THz-Time Domain Spectroscopy Systems (THz-TDS) are available on the market today which operates with THz-pulses transmitted and received by optically pumped semiconductor antennas. In THz-TDS the travelling time (ToF) and shape of the pulse is changed if it interacts with the dielectric material and its inherent discontinuities. A tomogram of the object under the test can be reconstructed from time of flight diffraction (ToFD) scans if a synthetic focusing aperture (SAFT) algorithm is applied. Otherwise, planar discontinuities like cracks in plastics or delaminated layers in composites can be abstracted as layers located at any angle in relation to the outer sample surface direction. A tomogram from the scanned sample can then be reconstructed in case the interactions of electromagnetic pulses with the existing inherent interfaces are detectable and a model is assumed which describes the device under the test as multilayer structure composed of thin layers with different dielectric properties. A short description of both the SAFT – and Optical Layer algorithm for the reconstruction of the inherent structure is initially given. Measurements on representative samples with a variety of artificially produced small and large scale. Reconstructed tomograms are presented to discuss and evaluate the benefits and limits of the two different reconstruction approaches. T2 - 19th World Conference on Non-Destructive Testing 2016 CY - Munich, Germany DA - 13.06.2016 KW - THz SAFT Optical layer reconstruction PY - 2016 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-365866 SN - 978-3-940283-78-8 VL - 158 SP - 1 EP - 10 AN - OPUS4-36586 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Spranger, Holger A1 - Boehm, Rainer A1 - Beckmann, Jörg T1 - THz-ToF techniques for the detection of inherent discontinuities in dielectric materials based on a SAFT – and an Optical Layer reconstruction algorithm N2 - Electromagnetic waves with frequencies between 0.1 and 10 THz are described as THz-radiation (T-ray). The ability to penetrate dielectric materials makes T-rays attractive to reveal discontinuities in polymer and ceramic materials. THz-Time Domain Spectroscopy Systems (THz-TDS) are available on the market today which operates with THz-pulses transmitted and received by optically pumped semiconductor antennas. In THz-TDS the travelling time (ToF) and shape of the pulse is changed if it interacts with the dielectric material and its inherent disconti-nuities. A tomogram of the object under the test can be reconstructed from time of flight diffraction (ToFD) scans if a synthetic focusing aperture (SAFT) algorithm is applied. Otherwise, planar discontinuities like cracks in plastics or delaminated lay-ers in composites can be abstracted as layers located at any angle in relation to the outer sample surface direction. A tomogram from the scanned sample can then be reconstructed in case the interactions of electromagnetic pulses with the existing in-herent interfaces are detectable and a model is assumed which describes the device under the test as multilayer structure composed of thin layers with different dielec-tric properties. A short description of both the SAFT – and Optical Layer algorithm for the recon-struction of the inherent structure is initially given. Measurements on representative samples with a variety of artificially produced small and large scale. Reconstructed tomograms are presented to discuss and evaluate the benefits and limits of the two different reconstruction approaches. T2 - 19th World Conference on Non-Destructive Testing 2016 CY - Munich, Germany DA - 13.06.2016 KW - SAFT KW - ToF KW - Optical layer reconstruction KW - Dielectric materials KW - THz PY - 2016 AN - OPUS4-36591 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Spranger, Holger T1 - THz-ToFD Tomography with Synthetic-Aperture-Aperture N2 - Terahertz-radiation (T-ray) are electromagnetic waves within a frequency range between 0,3 to 6 THz. T-rays are nonionising! They penetrate plastic, paper, ceramic and fabric. It is promising to use T-Rays for CT-applications to reveal uncertainties in dielectric materials. T2 - 8. THz-PhD-meeting CY - Marburg, Germany DA - 06.08.2013 KW - Terahertz Tomography synthetic aperture PY - 2013 AN - OPUS4-36223 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -