TY - GEN A1 - Sturm, Heinz A1 - Schulz, Eckhard A1 - Stark, Wolfgang A1 - Bovtun, V. A1 - Friedrich, Jörg Florian ED - Olefjord, I. ED - Nyborg, L. ED - Briggs, D. T1 - Techniques for surface composition analysis with scanning force microscopy (SFM) using electrical surface properties T2 - ECASIA 97 T2 - 7th European Conference on Applications of Surface and Interface Analysis CY - Göteborg, Sweden DA - 1997-06-16 PY - 1997 SN - 0-471-97827-2 SP - 579 EP - 582 PB - Wiley CY - Chichester AN - OPUS4-6854 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -