TY - GEN A1 - Sturm, Heinz A1 - Stark, Wolfgang A1 - Bovtun, V. A1 - Schulz, Eckhard ED - Xia, Z. T1 - Methods for simultaneous measurements of topography and local electrical properties using scanning force microscopy N2 - Two different approaches to investigate the local complex conductivity and the surface charge with Scanning Force Microscopy (SFM) techniques are presented. It is shown that the measurement of local electrical properties with SFM leads to interesting information about the composition of electrically heterogeneous surfaces T2 - 9th International Symposium on Electrets (ISE 9) CY - Shanghai, China DA - 1996-09-25 PY - 1996 SN - 0-7803-2695-4 U6 - https://doi.org/10.1109/ISE.1996.578073 SP - 223 EP - 228 PB - IEEE Service Center CY - Piscataway, NJ AN - OPUS4-6851 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Schulz, Eckhard A1 - Sturm, Heinz A1 - Stark, Wolfgang A1 - Bovtun, V. ED - Xia, Z. T1 - Determination of electric properties of heterogeneous systems using the contact and noncontact scanning force microscopy (SFM) N2 - With an extended contact and non-contact mode scanning force microscope samples with different heterogeneous electrical properties can be characterized. The contact mode method allows the determination of local electric conductivities of heterogeneous systems at the sample surfaces. An interpretation of this behaviour can be obtained in combination with other SFM modes such as topography, friction and compliance used simultaneously. The non-contact mode SFM allows to get more information about the local surface charge of heterogeneous samples. In this paper two new SFM approaches will be discussed on examples of carbon-fibre reinforced, organic and ceramic materials T2 - 9th International Symposium on Electrets (ISE 9) CY - Shanghai, China DA - 1996-09-25 PY - 1996 SN - 0-7803-2695-4 U6 - https://doi.org/10.1109/ISE.1996.578094 SP - 334 EP - 339 PB - IEEE Service Center CY - Piscataway, NJ AN - OPUS4-6852 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -