TY - GEN A1 - Munz, Martin A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - Reliability of polymer based composites - interfaces and interphases from the nanomechanical point of view T2 - 15th International Congress on Electron Microscopy (ICEM) CY - Durban, South Africa DA - 2002-09-01 PY - 2002 SN - 0-620-29294-6 SP - 619 EP - 620 PB - Microscopy Society of Southern Africa CY - Onderstepoort AN - OPUS4-1833 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Munz, Martin A1 - Cappella, Brunero A1 - Sturm, Heinz A1 - Geuss, Markus A1 - Schulz, Eckhard T1 - Materials contrasts and nanolithography techniques in scanning force microscopy (SFM) and their application to polymers and polymer composites N2 - Beyond measuring the topography of surfaces, scanning force microscopy (SFM) has proved to be valuable both for mapping of various materials properties and for modifying surfaces via lithography techniques. Thus, SFM has gained relevance as a surface analysis technique as well as a tool for nanoscale engineering purposes. Different kinds of tip-sample interactions are exploitable, e.g. mechanical, thermal and electrical ones. Owing to its versatility, SFM has found plenty of applications in polymer science. Among others, the examples reported on in this review article encompass issues related to commodity polymers, various polymer-based composites, polymer blends, or ferroelectric polymers. For instance, stiffness imaging is elucidated as a technique for detecting interphases occurring in composites with inorganic fillers. The described applications are mainly related to mechanical and electrical tip-sample interactions. The respective fundamentals are outlined as well as some aspects of the measurement of materials contrasts. The presented techniques of nano-scale modification are a dynamical sort of plowing lithography and electrical poling, both performed by means of SFM-probes. KW - Local electrical-properties KW - Probing micromechanical properties KW - Spreading resistance microscopy KW - Modulated friction techniques KW - Nanometer-scale modification KW - Ferroelectric domain-walls KW - Interfacial shear-strength KW - Self-assembled monolayers KW - Maxwell-stress microscopy KW - Solid-liquid interfaces KW - Contact mechanics KW - Electrical properties KW - Interface/interphase KW - Nanolithography KW - Polymer-matrix composites (PMC) scanning/atomic force KW - Microscopy (SFM/AFM) thermal diffusivity PY - 2003 SN - 3-540-00530-7 U6 - https://doi.org/10.1007/b11055 SN - 0065-3195 SN - 1436-5030 N1 - Serientitel: Advances in polymer science – Series title: Advances in polymer science IS - 164 SP - 87 EP - 210 PB - Springer CY - Berlin AN - OPUS4-2892 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Munz, Martin A1 - Chung, Jae Un A1 - Eltanany, Gehan A1 - Sturm, Heinz A1 - Schulz, Eckhard ED - Degischer, H.-P. T1 - Interphasial stiffness gradients in polymer materials T2 - Symposium Verbundwerkstoffe und Werkstoffverbunde CY - Wien, Österreich DA - 2003-07-02 PY - 2003 SN - 3-527-30762-1 PB - Wiley-VCH CY - Weinheim AN - OPUS4-2525 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Sturm, Heinz A1 - Stark, Wolfgang A1 - Bovtun, V. A1 - Schulz, Eckhard ED - Xia, Z. T1 - Methods for simultaneous measurements of topography and local electrical properties using scanning force microscopy N2 - Two different approaches to investigate the local complex conductivity and the surface charge with Scanning Force Microscopy (SFM) techniques are presented. It is shown that the measurement of local electrical properties with SFM leads to interesting information about the composition of electrically heterogeneous surfaces T2 - 9th International Symposium on Electrets (ISE 9) CY - Shanghai, China DA - 1996-09-25 PY - 1996 SN - 0-7803-2695-4 U6 - https://doi.org/10.1109/ISE.1996.578073 SP - 223 EP - 228 PB - IEEE Service Center CY - Piscataway, NJ AN - OPUS4-6851 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Schulz, Eckhard A1 - Sturm, Heinz A1 - Stark, Wolfgang A1 - Bovtun, V. ED - Xia, Z. T1 - Determination of electric properties of heterogeneous systems using the contact and noncontact scanning force microscopy (SFM) N2 - With an extended contact and non-contact mode scanning force microscope samples with different heterogeneous electrical properties can be characterized. The contact mode method allows the determination of local electric conductivities of heterogeneous systems at the sample surfaces. An interpretation of this behaviour can be obtained in combination with other SFM modes such as topography, friction and compliance used simultaneously. The non-contact mode SFM allows to get more information about the local surface charge of heterogeneous samples. In this paper two new SFM approaches will be discussed on examples of carbon-fibre reinforced, organic and ceramic materials T2 - 9th International Symposium on Electrets (ISE 9) CY - Shanghai, China DA - 1996-09-25 PY - 1996 SN - 0-7803-2695-4 U6 - https://doi.org/10.1109/ISE.1996.578094 SP - 334 EP - 339 PB - IEEE Service Center CY - Piscataway, NJ AN - OPUS4-6852 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Sturm, Heinz A1 - Schulz, Eckhard A1 - Stark, Wolfgang A1 - Bovtun, V. A1 - Friedrich, Jörg Florian ED - Olefjord, I. ED - Nyborg, L. ED - Briggs, D. T1 - Techniques for surface composition analysis with scanning force microscopy (SFM) using electrical surface properties T2 - 7th European Conference on Applications of Surface and Interface Analysis CY - Göteborg, Sweden DA - 1997-06-16 PY - 1997 SN - 0-471-97827-2 SP - 579 EP - 582 PB - Wiley CY - Chichester AN - OPUS4-6854 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Sturm, Heinz A1 - Geuss, Markus A1 - Schulz, Eckhard ED - Konsta, A. T1 - Scanning force microscopy investigations on electroactive polymer films N2 - The authors present investigations on a PVDF (polyvinylidenefluoride) film supplied with top and bottom Au electrodes, which is analysed using a SFM and a contactless optical sensor to measure the sample strain with respect to applied fields. T2 - 10th IEEE International Symposium on Electrets (ISE) CY - Delphi, Greece DA - 1999-09-22 PY - 1999 SN - 0-7803-5025-1 U6 - https://doi.org/10.1109/ISE.1999.832086 SP - 465 EP - 468 PB - IEEE Operations Center CY - Piscataway, NJ AN - OPUS4-6862 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -