TY - GEN A1 - Peplinski, Burkhard A1 - Schultze, Dietrich A1 - Wenzel, Klaus-Jürgen ED - Delhez, R. T1 - Interlaboratory comparison (Round Robin) of the application of the Rietveld method to quantitative phase analysis by X-ray and neutron diffraction T2 - Proceedings of the seventh European powder diffraction conference T2 - 7th European Powder Diffraction Conference CY - Barcelona, Spain DA - 2000-05-20 KW - Interlaboratory comparison KW - Quality assurance KW - Quantitative phase analysis KW - Reference materials KW - Rietveld analysis KW - Round Robin KW - Silicon nitride KW - Statistical tests PY - 2001 SN - 0-87849-886-9 SN - 0255-5476 N1 - Serientitel: Materials science forum – Series title: Materials science forum IS - 378-381/1 SP - 124 EP - 129 PB - Trans Tech Publications CY - Uetikon-Zürich AN - OPUS4-1193 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -