TY - CONF A1 - Schmidt, Wolfram A1 - Radebe, N. ED - Schmidt, Wolfram T1 - Biased by analytical equipment N2 - Today, in scientific events often a certain separation between researchers from laboratories with highly sophisticated equipment and those from less privileged laboratories can be observed. It is not an uncommon situation that results presented at conferences are rubbished or ridiculed because the investigator only used low-end analytical methods. The assessment of the study is then biased based on the equipment, regardless of the actual quality of the study. T2 - ISEE Africa - Innovation, Science, Engineering, Education CY - Nairobi, Kenya DA - 30.01.2019 KW - Analytics KW - Africa KW - Bias KW - Science KW - Research PY - 2019 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-484877 UR - http://isee-africa.com/wp-content/uploads/2019/07/Innovation-Science-Engineering-Education_High-Quality.pdf SN - 978-3-9818564-2-2 SP - 203 EP - 204 PB - Bundesanstalt für Materialforschung und -prüfung (BAM) CY - Berlin AN - OPUS4-48487 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -