TY - GEN A1 - Salge, T. A1 - Wäsche, Rolf A1 - Hodoroaba, Vasile-Dan T1 - Advanced light element and low energy X-ray analysis of a TiB2 – TiC – SiC ceramic material using EDS spectrum imaging N2 - The accurate EDS microanalysis of light elements such as boron and carbon by spectrum imaging will be demonstrated using a sintered hard ceramic material composed of the three major phases titanium boride (TiB2), titanium carbide (TiC), silicon carbide (SiC) and minor phases, sub-μm in size. The combination of these three materials leads to improved mechanical and tribological properties. Silicon carbide is a material used for mechanical seals. It has the disadvantage of reduced failsafe running functions, causing increased wear when running dry. The added titanium components (TiC and TiB2) improve the failsafe running functions. This technology has already been transferred to industrial applications. KW - EDS KW - Spectrum imaging KW - Ceramic KW - Phase analysis KW - Light elements PY - 2018 UR - https://www.bruker.com/fileadmin/user_upload/8-PDF-Docs/X-rayDiffraction_ElementalAnalysis/Microanalysis_EBSD/LabReports/App_eds_10_LE_keramik_Rev1_1_lores.pdf SP - 1 EP - 5 CY - Berlin AN - OPUS4-44622 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -