TY - JOUR A1 - Rades, Steffi A1 - Salge, T. A1 - Schmidt, R. A1 - Hodoroaba, Vasile-Dan T1 - Need for large-area EDS detectors for imaging nanoparticles in a SEM operating in transmission mode N2 - Accurate characterization of nanoparticles (NPs) with a high-resolution SEM with respect to morphology, shape and size distribution is carried out meanwhile routinely in more and more laboratories [1,2]. The valuable result of the metrological measurement of the NP size distribution -including traceability to the SI length unit - was also recently demonstrated by exploiting the transmission mode in a SEM, i.e. TSEM [1,3]. Especially for NPs prepared on thin foil supports like the typical TEM grids the transmission mode at low voltages (up to 30 kV) supplies a high imaging contrast so that sharp boarders of the NPs enable accurate lateral dimensional measurements of NPs size. There are just a few analytical methods which are able to characterize physico-chemical properties of individual NPs. In most cases a SEM has attached an EDS detector so that Information on the elemental composition of the sample to be analyzed becomes possible. The addressed sample volume typically in the micrometer ränge for bulk specimens is considerably reduced if thin, electron transparent Support films are used. Hence, one improves the spatial resolution however, at the cost of lower signal-to-noise ratios of the X-ray spectra, due to the tiny amount of substance excited [2,4,5]. One decisive technological development in the manufacturing of EDS detectors, namely the large-area SDD EDS, meanwhile available commercially in various designs, compensates this analytical drawback. If collection solid angles of 1-2 msr have been typically available for almost four decades, recent technological improvements in SDD EDS size and design have resulted in solid angles in the sr ränge. KW - EDS KW - EDX KW - Nanoparticles KW - High-resolution KW - SEM KW - T-SEM KW - Large-area EDS PY - 2014 DO - https://doi.org/10.1017/S1431927614005030 SN - 1431-9276 SN - 1435-8115 VL - 20 IS - Suppl. S 3 SP - 662 EP - 663 PB - Cambridge University Press CY - New York, NY AN - OPUS4-31389 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Salge, T. A1 - Wäsche, Rolf A1 - Hodoroaba, Vasile-Dan T1 - Advanced light element and low energy X-ray analysis of a TiB2 – TiC – SiC ceramic material using EDS spectrum imaging N2 - The accurate EDS microanalysis of light elements such as boron and carbon by spectrum imaging will be demonstrated using a sintered hard ceramic material composed of the three major phases titanium boride (TiB2), titanium carbide (TiC), silicon carbide (SiC) and minor phases, sub-μm in size. The combination of these three materials leads to improved mechanical and tribological properties. Silicon carbide is a material used for mechanical seals. It has the disadvantage of reduced failsafe running functions, causing increased wear when running dry. The added titanium components (TiC and TiB2) improve the failsafe running functions. This technology has already been transferred to industrial applications. KW - EDS KW - Spectrum imaging KW - Ceramic KW - Phase analysis KW - Light elements PY - 2018 UR - https://www.bruker.com/fileadmin/user_upload/8-PDF-Docs/X-rayDiffraction_ElementalAnalysis/Microanalysis_EBSD/LabReports/App_eds_10_LE_keramik_Rev1_1_lores.pdf SP - 1 EP - 5 CY - Berlin AN - OPUS4-44622 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -