TY - CONF A1 - Salge, T. A1 - Tunckan, O. A1 - Scheller, S. A1 - Hodoroaba, Vasile-Dan A1 - Turan, S. T1 - Advanced light element and low energy X-ray analysis of ceramics and ceramic-metal joints using SEM/EDX with SDD T2 - The 22nd Australian Conference on Microscopy and Microanalysis (ACMM 22) CY - Perth, Australia DA - 2012-02-05 PY - 2012 AN - OPUS4-25530 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Salge, T. A1 - Tunckan, O. A1 - Terborg, R. A1 - Hodoroaba, Vasile-Dan A1 - Turan, S. T1 - Advanced light element and low energy X-ray analysis of ceramics and ceramic-metal joints using SEM/EDX with Silicon Drift Detector (SDD) T2 - 76. Jahrestagung der DPG und DPG-Frühjahrstagung CY - Berlin, Germany DA - 2012-03-25 PY - 2012 AN - OPUS4-25523 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Salge, T. A1 - Terborg, R. A1 - Rackwitz, Vanessa T1 - Advanced elemental analysis with ED-EPMA, WD-EPMA and mu-XRF at a SEM N2 - It is a latent wish of any SEM/EDS (scanning electron microscope with an energy dispersive spectrometer) analyst to “see more” of the analyzed specimen, i.e. to improve the existing analytical figures of merit. One key issue are the relatively poor limits of detection (not below 0.1 mass-%) provided by energy dispersive X-ray spectrometry (EDX) with the conventional electron excitation (ED-EPMA). This is a consequence of relatively low peak-to-background ratios and reduced energy resolution when compared to wavelength dispersive spectrometry (WD-EPMA). Recent technological developments make possible to equip the SEM with a wavelength dispersive spectrometer (WDS), so that significantly better energy resolution can be attained. Also a relative new product that can be easily attached to a SEM/EDS system is a micro-focus X-ray source. Hence, it is possible to perform (micro-focus) X-ray fluorescence spectrometry (μ-XRF) and take advantage of the enhanced peak-to-background ratios (well suited for trace analysis). However, there are also some disadvantages: an increased measurement time and excitation with a high current in the 10s of nA range are usually required for WDS. μ-XRF provides more bulk information and poor limits of detection for light elements. By combining the advantages of these analytical techniques “seeing more” becomes possible. KW - ED-EPMA KW - WD-EPMA KW - (mu-)XRF KW - EDX PY - 2011 U6 - https://doi.org/10.1017/S1431927611003874 SN - 1431-9276 SN - 1435-8115 VL - 17 IS - Suppl. 2 SP - 600 EP - 601 PB - Cambridge University Press CY - New York, NY AN - OPUS4-26751 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Rades, Steffi A1 - Salge, T. A1 - Schmidt, R. A1 - Hodoroaba, Vasile-Dan T1 - Need for large-area EDS detectors for imaging nanoparticles in a SEM operating in transmission mode KW - EDS KW - EDX KW - Nanoparticles KW - High-resolution KW - SEM KW - T-SEM KW - Large-area EDS PY - 2014 U6 - https://doi.org/10.1017/S1431927614005030 SN - 1431-9276 SN - 1435-8115 VL - 20 IS - Suppl. S 3 SP - 662 EP - 663 PB - Cambridge University Press CY - New York, NY AN - OPUS4-31389 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Salge, T. A1 - Terborg, R. A1 - Ball, A. D. A1 - Broad, G.R. A1 - Kearsley, A.T. A1 - Jones, C.G. A1 - Smith, C. A1 - Rades, Steffi A1 - Hodoroaba, Vasile-Dan ED - Hozak, P. T1 - Advanced SEM/EDS analysis using an annular silicon drift detector (SDD): Applications in nano, life, earth and planetary sciences below micrometer scale T2 - IMC 2014 - 18th International microscopy congress CY - Prague, Czech Republic DA - 2014-09-07 PY - 2014 SN - 978-80-260-6720-7 SP - IT-5-P-1842, 1-2 AN - OPUS4-31944 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Salge, T. A1 - Terborg, R. A1 - Ball, A. D. A1 - Broad, G. R. A1 - Kearsley, A. T. A1 - Jones, C. G. A1 - Smith, C. A1 - Rades, Steffi A1 - Hodoroaba, Vasile-Dan T1 - Advanced SEM/EDS analysis using an Annular Silicon Drift Detector (SDD): Applications in Nano, Life, Earth and Planetary Sciences below Micrometer Scale T2 - 18th International Microscopy Congress CY - Prague, Czech Republic DA - 2014-09-07 PY - 2014 AN - OPUS4-31915 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Rades, Steffi A1 - Hodoroaba, Vasile-Dan A1 - Salge, T. A1 - Wirth, Thomas A1 - Lobera, M.P. A1 - Labrador, R.H. A1 - Natte, Kishore A1 - Behnke, Thomas A1 - Gross, Thomas A1 - Unger, Wolfgang T1 - High-resolution imaging with SEM/T-SEM, EDX and SAM as a combined methodical approach for morphological and elemental analyses of single engineered nanoparticles N2 - The combination of complementary characterization techniques such as SEM (Scanning Electron Microscopy), T-SEM (Scanning Electron Microscopy in Transmission Mode), EDX (Energy Dispersive X-ray Spectroscopy) and SAM (Scanning Auger Microscopy) has been proven to be a powerful and relatively quick characterization strategy for comprehensive morphological and chemical characterization of individual silica and titania nanoparticles. The selected “real life” test materials, silica and titania, are listed in the OECD guidance manual as representative examples because they are often used as commercial nanomaterials. Imaging by high resolution SEM and in the transmission mode by T-SEM allows almost simultaneous surface and in-depth inspection of the same particle using the same instrument. EDX and SAM enable the chemical characterization of bulk and surface of individual nanoparticles. The core–shell properties of silica based materials are addressed as well. Titania nominally coated by silane purchased from an industrial source has been found to be inhomogeneous in terms of chemical composition. KW - surface and in-depth inspection KW - silica nanoparticles KW - titania nanoparticles PY - 2014 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-316296 SN - 2046-2069 VL - 4 IS - 91 SP - 49577 EP - 49587 PB - RSC Publishing CY - London AN - OPUS4-31629 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Salge, T. A1 - Hodoroaba, Vasile-Dan A1 - Tunckan, O. A1 - Terborg, R. A1 - Turan, S. T1 - Advanced light element and low energy X-ray analysis of ceramics and ceramic-metal joints using SEM/EDX with Silicon Drift Detectors (SDD) T2 - 20th National Electron Microscopy Congress CY - Kemer, Turkey DA - 2011-10-25 PY - 2011 AN - OPUS4-24135 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Salge, T. A1 - Nolze, Gert T1 - Innovations in EDS and EBSD Microanalysis: Hyperspectral Imaging for Planetological Applications Using Silicon Drift Detectors (SDD) and EBSD N2 - Within the last decade, silicon drift detectors (SDD) systems have become more and more popular in the field of energy-dispersive spectroscopy (EDS). The main characteristic of the SDDs is their extremely high pulse load capacity of up to 750,000 counts per second at good or reasonable energy resolution (<123eV Mn-Kα, <46eV C-Kα at 100.000 cps). These properties in conjunction with electron backscatter diffraction (EBSD) techniques and modern data processing make a range of innovative analysis options possible, not only high speed mapping but also hyperspectral imaging techniques. T2 - 72nd Annual Meeting of the Meteoritical Society CY - Nancy, France DA - 13.07.2009 KW - Electron backscatter diffraction KW - Energy dispersive x-ray spectroscopy KW - Method combination PY - 2009 VL - Suppl. SP - 5270 AN - OPUS4-38002 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Salge, T. A1 - Ball, A. D. A1 - Bonato, E. A1 - Broad, G.R. A1 - Jones, C.G. A1 - Ma, X. A1 - Smith, C.L. A1 - Wozniakiewicz, P. J. A1 - Kearsley, A.T. A1 - Rades, Steffi A1 - Bell, L. S. A1 - Musat, M. A1 - Stryhanyuk, H. A1 - Falke, M. A1 - Hansen, B. A1 - Terborg, R. A1 - Hodoroaba, Vasile-Dan T1 - Advanced SEM/EDX Analysis below Micrometre Scale using an Annular SDD: Applications in Nano, Life, Forensic, Cultural Heritage, Earth and Planetary Sciences T2 - Microscience Microscopy Congress (mmc 2015) incorporating EMAG 2015 (Institute of Physics's Electron Microscopy and Microanalysis Group) CY - Manchester, United Kingdom DA - 2015-06-29 PY - 2015 AN - OPUS4-33885 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -