TY - CONF A1 - Salge, T. A1 - Tunckan, O. A1 - Scheller, S. A1 - Hodoroaba, Vasile-Dan A1 - Turan, S. T1 - Advanced light element and low energy X-ray analysis of ceramics and ceramic-metal joints using SEM/EDX with SDD T2 - The 22nd Australian Conference on Microscopy and Microanalysis (ACMM 22) CY - Perth, Australia DA - 2012-02-05 PY - 2012 AN - OPUS4-25530 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Salge, T. A1 - Tunckan, O. A1 - Terborg, R. A1 - Hodoroaba, Vasile-Dan A1 - Turan, S. T1 - Advanced light element and low energy X-ray analysis of ceramics and ceramic-metal joints using SEM/EDX with Silicon Drift Detector (SDD) T2 - 76. Jahrestagung der DPG und DPG-Frühjahrstagung CY - Berlin, Germany DA - 2012-03-25 PY - 2012 AN - OPUS4-25523 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Salge, T. A1 - Hodoroaba, Vasile-Dan A1 - Tunckan, O. A1 - Terborg, R. A1 - Turan, S. T1 - Advanced light element and low energy X-ray analysis of ceramics and ceramic-metal joints using SEM/EDX with Silicon Drift Detectors (SDD) T2 - 20th National Electron Microscopy Congress CY - Kemer, Turkey DA - 2011-10-25 PY - 2011 AN - OPUS4-24135 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Salge, T. A1 - Ball, A. D. A1 - Bonato, E. A1 - Broad, G.R. A1 - Jones, C.G. A1 - Ma, X. A1 - Smith, C.L. A1 - Wozniakiewicz, P. J. A1 - Kearsley, A.T. A1 - Rades, Steffi A1 - Bell, L. S. A1 - Musat, M. A1 - Stryhanyuk, H. A1 - Falke, M. A1 - Hansen, B. A1 - Terborg, R. A1 - Hodoroaba, Vasile-Dan T1 - Advanced SEM/EDX Analysis below Micrometre Scale using an Annular SDD: Applications in Nano, Life, Forensic, Cultural Heritage, Earth and Planetary Sciences T2 - Microscience Microscopy Congress (mmc 2015) incorporating EMAG 2015 (Institute of Physics's Electron Microscopy and Microanalysis Group) CY - Manchester, United Kingdom DA - 2015-06-29 PY - 2015 AN - OPUS4-33885 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -