TY - CONF A1 - Ritter, Martin A1 - Kranzmann, Axel T1 - Analysis of multimodal 3D microscopy measurements T2 - EMC T2 - EMC CY - Aachen, Germany DA - 2008-09-01 PY - 2008 AN - OPUS4-18437 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Ritter, Martin A1 - Dziomba, T. A1 - Xu, M. A1 - Dai, G. A1 - Koenders, L. T1 - Systematic analytics of non-linear deviations by established standards and a new generation of 3D standards T2 - Nanoscale 2008 T2 - Nanoscale 2008 CY - Turin, Italy DA - 2008-09-22 PY - 2008 AN - OPUS4-18447 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Ritter, Martin A1 - Dziomba, T. A1 - Kranzmann, Axel A1 - Koenders, L. T1 - A landmark based 3D calibration strategy for SPM T2 - Nanoscale 2006, METAS T2 - Nanoscale 2006, METAS CY - Wabern, Switzerland DA - 2006-04-24 PY - 2006 AN - OPUS4-12174 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -