TY - JOUR A1 - Grunewald, Christian A1 - Radtke, Martin A1 - Reinholz, Uwe A1 - Buzanich, Günter A1 - Riesemeier, Heinrich T1 - SRXRF-measurements at non-planar objects: automatic determination of the angle of incidence of the exciting X-ray JF - Journal of analytical atomic spectrometry N2 - For quantitative SRXRF measurements the angle of incidence of the incoming X-ray beam is an important factor. When the sample is focused by a long-range-microscope, the determination of the angle can be automatized using a simple algorithm. This was developed to improve the orientation of especially round or ornate samples. As a side effect the three dimensional surface can be reconstructed, too. KW - X-ray fluorescence KW - Synchrotron radiation KW - Long-range microscope PY - 2011 DO - https://doi.org/10.1039/c0ja00237b SN - 0267-9477 SN - 1364-5544 VL - 26 IS - 5 SP - 1088 EP - 1089 PB - Royal Society of Chemistry CY - London AN - OPUS4-23193 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -