TY - CONF A1 - Radnik, Jörg A1 - Hesse, R. A1 - Denecke, R. T1 - Improved estimation of the transmission function with UNIFIT 2022 N2 - The recent development of x-ray photoelectron spectroscopy using excitation sources different from the usual lab-source Mg Kα and Al Kα and spectrometers with more sophisticated lens systems requires flexible approaches for determining the transmission function. Therefore, the approach using quantified peak areas (QPA) was refined.1 A new algorithm allows a more precise estimation of the transmission function which could be shown by comparing the results obtained with the new version with former calculations. Furthermore, next to the established reference materials Cu, Ag and Au, ionic liquids can be used for estimating the transmission function at beamlines with variable excitation energies. Comparison between the measured and stoichiometric composition shows that a transmission function was determined which allows a reasonable quantification. T2 - ECASIA 2022 CY - Limerick, Ireland DA - 29.05.2022 KW - X-ray photoelectron spectroscopy KW - Transmission function KW - Synchrotron radiation KW - Iionic liquid PY - 2022 AN - OPUS4-54962 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Radnik, Jörg A1 - Hodoroaba, Vasile-Dan A1 - Reed, B.P. A1 - Pollard, A. A1 - Clifford, C. A1 - Chemello, Giovanni T1 - XPS of GR2M N2 - The activities of ISO-G-Scope are presented. The influence of the sample preparation and the results of XPS/HAXPES measurements are discussed. T2 - Graphene Workshop @ ISO TC 229 Meeting CY - Teddington, UK DA - 16.11.2022 KW - Graphene related materials KW - X-ray photoelectron spectroscopy KW - Sample preparation KW - Hard X-ray photoelectron spectroscopy PY - 2022 AN - OPUS4-56434 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Müller, Anja A1 - Krahl, T. A1 - Radnik, Jörg A1 - Wagner, Andreas A1 - Werner, W. S. M. A1 - Ritter, B. A1 - Kemnitz, E. A1 - Unger, Wolfgang T1 - Chemical in-depth analysis of (Ca/Sr)F2 core–shell like nanoparticles by X-ray photoelectron spectroscopy with tunable excitation energy N2 - The fluorolytic sol–gel synthesis is applied with the intention to obtain two different types of core–shell nanoparticles, namely, SrF2–CaF2 and CaF2–SrF2. In two separate fluorination steps for core and shell formation, the corresponding metal lactates are reacted with anhydrous HF in ethylene glycol. Scanning transmission electron microscopy (STEM) and dynamic light scattering (DLS) confirm the formation of particles with mean dimensions between 6.4 and 11.5 nm. The overall chemical composition of the particles during the different reaction steps is monitored by quantitative Al Kα excitation X-ray photoelectron spectroscopy (XPS). Here, the formation of stoichiometric metal fluorides (MF2) is confirmed, both for the core and the final core–shell particles. Furthermore, an in-depth analysis by synchrotron radiation XPS (SR-XPS) with tunable excitation energy is performed to confirm the core–Shell character of the nanoparticles. Additionally, Ca2p/Sr3d XPS intensity ratio in-Depth profiles are simulated using the software Simulation of Electron Spectra for Surface Analysis (SESSA). In principle, core–shell like particle morphologies are formed but without a sharp interface between calcium and strontium containing phases. Surprisingly, the in-depth chemical distribution of the two types of nanoparticles is equal within the error of the experiment. Both comprise a SrF2-rich core domain and CaF2-rich shell domain with an intermixing zone between them. Consequently, the internal morphology of the final nanoparticles seems to be independent from the synthesis chronology. KW - Metal fluorides KW - Sol-gel synthesis KW - Synchrotron radiation KW - X-ray photoelectron spectroscopy PY - 2021 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-522284 SN - 0142-2421 VL - 53 IS - 5 SP - 494 EP - 508 PB - Wiley VCH AN - OPUS4-52228 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Radnik, Jörg A1 - Kersting, R. A1 - Hagenhoff, B. A1 - Bennet, Francesca A1 - Ciornii, Dmitri A1 - Nymark, P. A1 - Grafström, R. A1 - Hodoroaba, Vasile-Dan T1 - Reliable Surface Analysis Data of Nanomaterials in Support of Risk Assessment Based on Minimum Information Requirements N2 - The minimum information requirements needed to guarantee high-quality surface Analysis data of nanomaterials are described with the aim to provide reliable and traceable Information about size, shape, elemental composition and surface chemistry for risk assessment approaches. The widespread surface analysis methods electron microscopy (SEM), energy dispersive X-ray spectroscopy (EDS), X-ray photoelectron spectroscopy (XPS) and secondary ion mass spectrometry (SIMS) were considered. The complete analysis sequence from sample preparation, over measurements, to data analysis and data format for reporting and archiving is outlined. All selected methods are used in surface analysis since many years so that many aspects of the analysis (including (meta)data formats) are already standardized. As a practical analysis use case, two coated TiO2 reference nanoparticulate samples, which are available on the Joint Research Centre (JRC) repository, were selected. The added value of the complementary analysis is highlighted based on the minimum information requirements, which are well-defined for the analysis methods selected. The present paper is supposed to serve primarily as a source of understanding of the high standardization level already available for the high-quality data in surface analysis of nanomaterials as reliable input for the nanosafety community. KW - Electron microscopy KW - X-ray photoelectron spectroscopy KW - Secondary ion mass spectrometry KW - Energy dispersive X-ray spectroscopy KW - Standardization PY - 2021 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-522683 VL - 11 IS - 3 SP - 639 PB - MDPI AN - OPUS4-52268 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Radnik, Jörg T1 - Elucidating core shell nanostructures with surface analytics N2 - XPS is a versatile tool for elucidating core shell structures. XPS can obtain information for organic compounds (polymer particle, organic coating ) which are hardly or not detectable with other Methods. XPS is an important tool for the risk assessement of nanoparticles T2 - Kratos German User Meeting CY - Online meeting DA - 26.05.2021 KW - Core-shell nanoparticles KW - X-ray photoelectron spectroscopy KW - Complementary methods PY - 2021 AN - OPUS4-52717 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Radnik, Jörg A1 - Reed, B. A1 - Shard, A. T1 - Elemental composition of an ionic liquid surface N2 - (1) First results show the suitability of IL as reference for quantification of XPS (at least for organic materials). (2) Different quantification methods lead to similar results (with a slight advantage for “background method”). (3)Promising reference material for a better understanding and traceable protocols for the quantification of organic materials with XPS. T2 - BIPM / SAWG Spring Meeting CY - Online meeting DA - 12.05.2021 KW - Ionic liquid KW - X-ray photoelectron spectroscopy KW - Quantification PY - 2021 AN - OPUS4-52688 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Radnik, Jörg A1 - Gawek, M. A1 - Madkour, S. A1 - Szymoniak, Paulina A1 - Omar, Hassan A1 - Schönhals, Andreas T1 - Energy-resolved x-ray photoelectron spectroscopy measurements on the concentration profile of thin blended poly(vinyl methyl ether)/polystyrene films N2 - The composition of thin films of polymer blends in vertical direction is still under discussion. For explaining the thickness dependence of some properties like the thermal glass transition temperature, a three-layer model has been introduced consisting of an adsorbed layer with a reduced segmental mobility at the substrate, a bulk-like layer in the middle of the film and an outermost surface layer with a higher molecular mobility. X-ray photoelectron spectroscopy (ER-XPS) measurements with a varying excitation energy from 400 eV to 1486.6 eV and, herewith, an information depth from 1.5 nm to 10 nm were performed at PVME/PS films with compositions of 25/75 wt% and 50/50 wt% and thicknesses between 15 nm and 190 nm. As expected, it was found that the PVME concentration decreases with increasing information depth. Secondly, a complex correlation between the PVME concentration at the surface and the film thickness was found. The PVME concentration increases with decreasing film thickness until a maximum at 30 nm. For thinner films, the PVME concentration decreases. These data agree with previous investigations obtained with specific heat spectroscopy. We thank BESSY II (HZB) for the allocation of beamtime at the HE-SGM beamline and for technical support. DFG (Project number 124846229) is acknowledged for financial support. T2 - German Conference for Research with Synchrotron Radiation, Neutrons and Ion Beams at Large Facilities (SNI2022) CY - Berlin, Germany DA - 05.09.2022 KW - X-ray photoelectron spectroscopy KW - Miscible polymer films KW - Depth profiling PY - 2022 AN - OPUS4-55654 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Seeburg, Dominik A1 - Liu, Dongjing A1 - Radnik, Jörg A1 - Atia, Hanan A1 - Pohl, Marga-Martina A1 - Schneider, Matthias A1 - Martin, Andreas A1 - Wohlrab, Sebastian T1 - Structural changes of highly active Pd/MeOx (Me = Fe, Co, Ni) during catalytic methane combustion N2 - Fe2O3, Co3O4 and NiO nanoparticles were prepared via a citrate method and further functionalized with Pd by impregnation. The pure oxides as well as Pd/Fe2O3, Pd/Co3O4, and Pd/NiO (1, 5 and 10 wt % Pd) were employed for catalytic methane combustion under methane lean (1 vol %)/oxygen rich (18 vol %, balanced with nitrogen) conditions. Already, the pure metal oxides showed a high catalytic activity leading to complete conversion temperature of T100 ≤ 500 °C. H2-TPR (Temperature-programmed reduction) experiments revealed that Pd-functionalized metal oxides exhibited enhanced redox activity compared to the pure oxides leading to improved catalytic combustion activity at lower temperatures. At a loading of 1 wt % Pd, 1Pd/Co3O4 (T100 = 360 °C) outperforms 1Pd/Fe2O3 (T100 = 410 °C) as well as 1Pd/NiO (T100 = 380 °C). At a loading of 10 wt % Pd, T100 could only be slightly reduced in all cases. 1Pd/Co3O4 and 1Pd/NiO show reasonable stability over 70 h on stream at T100. XPS (X-ray photoelectron spectroscopy) and STEM (Scanning transmission electron microscopy) investigations revealed strong interactions between Pd and NiO as well as Co3O4, respectively, leading to dynamic transformations and reoxidation of Pd due to solid state reactions, which leads to the high long-term stability. KW - Methane total oxidation KW - Methane removal KW - Carbon dioxide KW - X-ray photoelectron spectroscopy PY - 2018 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-439412 SN - 2073-4344 VL - 8 IS - 2 SP - Article 42, 1 EP - 13 PB - MDPI AN - OPUS4-43941 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CHAP A1 - Radnik, Jörg ED - Wandelt, K. T1 - X-ray photoelectron spectroscopy for investigation of heterogeneous catalytic process N2 - Heterogeneous catalysis is a key technology in modern industrial societies. The main steps of a catalytic process take place at the surfaces of complex materials. For the investigations of these surfaces X-ray photoelectron spectroscopy is widely used and fits ideally. At some suitable examples, it will be explained how XPS can help to understand such catalysts better. The focus is on selective oxidation catalysts, one of the main challenges of present research. Here it will illustrate, how changes in the near surface region influence the catalyst performance and, herewith the different stages (activation, maximum performance and deactivation) in the life of catalysts. Additionally, it will be stressed out how important information at different depth regions (surface, near-surface region, bulk) can be useful for comprehensive understanding of the material. Another important subject is nanostructured catalysts with molecular sieves as supports or defined complexes as precursors. Finally, the combination of XPS with other methods used in the analysis of catalysts, e.g. electron microscopy, X-ray absorption spectroscopy and low energy ion scattering will be discussed. KW - X-ray photoelectron spectroscopy KW - Depth information KW - Heterogeneous catalysis KW - Structure-properties relationships PY - 2018 SN - 978-0-12-809739-7 VL - 1 SP - 607 EP - 614 PB - Elsevier AN - OPUS4-44876 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Radnik, Jörg A1 - Kjaervik, Marit A1 - Unger, Wolfgang T1 - Surface chemical analysis surface chemical analysis of cells and biofilms N2 - The status of the planned technical report "Surface characterization of biomaterials" will be presented. T2 - ISO TC201 Meeting CY - Online meeting DA - 05.09.2020 KW - X-ray photoelectron spectroscopy KW - X-ray spectroscopy KW - Biomaterials KW - Standardization PY - 2020 AN - OPUS4-51197 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Reed, B. P. A1 - Cant, D.J.H. A1 - Spencer, J. A1 - Carmona-Carmona, A. J. A1 - Bushell, A. A1 - Herrara-Gómez, A. A1 - Kurokawa, A. A1 - Thissen, A. A1 - Thomas, A.G. A1 - Britton, A.J. A1 - Bernasik, A. A1 - Fuchs, A. A1 - Baddorf, A. P. A1 - Bock, B. A1 - Thellacker, B. A1 - Cheng, B. A1 - Castner, D.G. A1 - Morgan, D.J. A1 - Valley, D. A1 - Willneff, E.A. A1 - Smith, E.F. A1 - Nolot, E. A1 - Xie, F. A1 - Zorn, G. A1 - Smith, G.C. A1 - Yasukufu, H. A1 - Fenton, J. L. A1 - Chen, J. A1 - Counsell, J..D.P. A1 - Radnik, Jörg A1 - Gaskell, K.J. A1 - Artyushkova, K. A1 - Yang, L. A1 - Zhang, L. A1 - Eguchi, M. A1 - Walker, M. A1 - Hajdyla, M. A1 - Marzec, M.M. A1 - Linford, M.R. A1 - Kubota, N. A1 - Cartazar-Martínez, O. A1 - Dietrich, P. A1 - Satoh, R. A1 - Schroeder, S.L.M. A1 - Avval, T.G. A1 - Nagatomi, T. A1 - Fernandez, V. A1 - Lake, W. A1 - Azuma, Y. A1 - Yoshikawa, Y. A1 - Shard, A.G. T1 - Versailles Project on Advanced Materials and Standards interlaboratory study on intensity calibration for x-ray photoelectron spectroscopy instruments using low-density polyethylene N2 - We report the results of a Versailles Project on Advanced Materials and Standards interlaboratory study on the intensity scale calibration of x-ray photoelectron spectrometers using low-density polyethylene (LDPE) as an alternative material to gold, silver, and copper. An improved set of LDPE reference spectra, corrected for different instrument geometries using a quartz-monochromated Al Kα x-ray source, was developed using data provided by participants in this study. Using these new reference spectra, a transmission function was calculated for each dataset that participants provided. When compared to a similar calibration procedure using the NPL reference spectra for gold, the LDPE intensity calibration method achieves an absolute offset of ∼3.0% and a systematic deviation of ±6.5% on average across all participants. For spectra recorded at high pass energies (≥90 eV), values of absolute offset and systematic deviation are ∼5.8% and ±5.7%, respectively, whereas for spectra collected at lower pass energies (<90 eV), values of absolute offset and systematic deviation are ∼4.9% and ±8.8%, respectively; low pass energy spectra perform worse than the global average, in terms of systematic deviations, due to diminished count rates and signal-to-noise ratio. Differences in absolute offset are attributed to the surface roughness of the LDPE induced by sample preparation. We further assess the usability of LDPE as a secondary reference material and comment on its performance in the presence of issues such as variable dark noise, x-ray warm up times, inaccuracy at low count rates, and underlying spectrometer problems. In response to participant feedback and the results of the study, we provide an updated LDPE intensity calibration protocol to address the issues highlighted in the interlaboratory study. We also comment on the lack of implementation of a consistent and traceable intensity calibration method across the community of x-ray photoelectron spectroscopy (XPS) users and, therefore, propose a route to achieving this with the assistance of instrument manufacturers, metrology laboratories, and experts leading to an international standard for XPS intensity scale calibration. KW - X-ray photoelectron spectroscopy KW - Transmission function KW - Intensity scale calibration KW - Reference spectra KW - Low-density polyethylene (LDPE) PY - 2020 U6 - https://doi.org/10.1116/6.0000577 VL - 38 IS - 6 SP - 063208 AN - OPUS4-51655 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hünger, K.-J. A1 - Kositz, M. A1 - Danneberg, M. A1 - Radnik, Jörg T1 - Enrichment of aluminium in the near‐surface region of natural quartzite rock after aluminium exposure N2 - Alkali–silica reaction (ASR) is an ongoing problem that causes damage to concrete constructions and reduces their durability. Therefore, minimizing this undesired reaction is of great interest for both safety and economic reasons. Additives containing high aluminium content are very effective in reducing the release of silica and enhancing the durability of concrete; however, the mechanism for this effect is still under discussion. In this study, an enrichment of aluminium in the near‐surface region was observed for natural quartzite rock after storage in Al (OH)3 and metakaolin as aluminium sources, from which we conclude that the formation of aluminosilicate sheets of a few nanometres inhibits the silica release; this hypothesis is supported by high‐resolution spectra of Al 2p, Si 2p and O 1s. KW - Alkali-silica reaction KW - Quartzite rock KW - X-ray photoelectron spectroscopy PY - 2020 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-519394 SN - 0142-2421 SP - 1 EP - 7 PB - Wiley VCH AN - OPUS4-51939 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Füllenbach, L.C. A1 - Perez, J. P. H. A1 - Freeman, H.M. A1 - Thomas, A.N. A1 - Mayanna, S. A1 - Parker, J. E. A1 - Göttlicher, J. A1 - Steininger, R. A1 - Radnik, Jörg A1 - Benning, L.G. A1 - Oelkers, E.H. T1 - Nanoanalytical Identification of Siderite Dissolution-Coupled Pb Removal Mechanisms from Oxic and Anoxic Aqueous Solutions N2 - Lead(II) is a toxic pollutant often found in metalcontaminated soils and wastewaters. In acidic aqueous environments, Pb(II) is highly mobile. Chemical treatment strategies of such systems therefore often include neutralization agents and metal sorbents. Since metal solubility and the retention potential of sorbents depend on the redox state of the aqueous system, we tested the efficiency of the naturally occurring redox-sensitive ferrous iron carbonate mineral siderite to remove Pb(II) from acidic aqueous solutions in batch experiments under oxic and anoxic conditions over a total of 1008 h. Siderite dissolution led to an increase in reactive solution pH from 3 to 5.3 and 6.9, while 90 and 100% of the initial aqueous Pb(II) (0.48 × 10−3 mol kg−1) were removed from the oxic and anoxic systems, respectively. Scanning and transmission electron microscopy, combined with X-ray absorption and photoelectron spectroscopy, indicated that under oxic conditions, Pb(II) was consumed by cerussite precipitation and inner-sphere surface complexation to secondary goethite. Under anoxic conditions, Pb(II) was removed by the rapid precipitation of cerussite. This efficient siderite dissolution-coupled sequestration of Pb(II) into more stable solid phases demonstrates this potential method for contaminated water Treatment regardless of the redox environment. KW - Siderite KW - X-ray absorption spectroscopy KW - X-ray photoelectron spectroscopy KW - Wastewater treatment PY - 2020 U6 - https://doi.org/10.1021/acsearthspacechem.0c00180 VL - 4 IS - 11 SP - 1966 EP - 1977 PB - ACS Publication AN - OPUS4-51961 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Bennet, Francesca A1 - Müller, Anja A1 - Radnik, Jörg A1 - Hachenberger, Y. A1 - Jungnickel, H. A1 - Laue, P. A1 - Luch, A. A1 - Tentschert, J. T1 - Preparation of Nanoparticles for ToF-SIMS and XPS Analysis N2 - Nanoparticles have gained increasing attention in recent years due to their potential and application in different fields including medicine, cosmetics, chemistry, and their potential to enable advanced materials. To effectively understand and regulate the physico-chemical properties and potential adverse effects of nanoparticles, validated measurement procedures for the various properties of nanoparticles need to be developed. While procedures for measuring nanoparticle size and size Distribution are already established, standardized methods for analysis of their surface chemistry are not yet in place, although the influence of the surface chemistry on nanoparticle properties is undisputed. In particular, storage and preparation of nanoparticles for surface analysis strongly influences the analytical results from various methods, and in order to obtain consistent results, sample preparation must be both optimized and standardized. In this contribution, we present, in detail, some standard procedures for preparing nanoparticles for surface analytics. In principle, nanoparticles can be deposited on a suitable substrate from suspension or as a powder. Silicon (Si) Wafers are commonly used as substrate, however, their cleaning is critical to the process. For sample preparation from suspension, we will discuss drop-casting and spin-coating, where not only the cleanliness of the substrate and purity of the suspension but also its concentration play important roles for the success of the preparation methodology. For nanoparticles with sensitive ligand shells or coatings, deposition as powders is more suitable, although this method requires particular care in fixing the sample. KW - Titania nanoparticles KW - X-ray photoelectron spectroscopy KW - Secondary ion mass spectrometry KW - Surface chemisttry PY - 2020 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-520103 UR - https://www.jove.com/video/61758 VL - 163 SP - e61758 AN - OPUS4-52010 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Reed, B. P. A1 - Cant, D.J.H. A1 - Spencer, S.J. A1 - Carmona-Carmona, A. J. A1 - Bushell, A. A1 - Herrara-Gómez, A. A1 - Kurokawa, A. A1 - Thissen, A. A1 - Thomas, A.G. A1 - Britton, A.J. A1 - Bernasik, A. A1 - Fuchs, A. A1 - Baddorf, A.P. A1 - Bock, B. A1 - Thellacker, B. A1 - Cheng, B. A1 - Castner, D.G. A1 - Morgan, D.J. A1 - Valley, D. A1 - Willneff, E.A. A1 - Smith, E.P. A1 - Nolot, E. A1 - Xie, F. A1 - Zorn, G. A1 - Smith, G.C. A1 - Yasukufu, H. A1 - Fenton, J.L. A1 - Chen, J. A1 - Counsell, J.D.P. A1 - Radnik, Jörg A1 - Gaskell, K.J. A1 - Artyushkova, K. A1 - Yang, L. A1 - Zhang, L. A1 - Eguchi, M. A1 - Walker, M. A1 - Hajdyla, M. A1 - Marzec, M.M. A1 - Linford, M.R. A1 - Kubota, N. A1 - Cortazar-Martinez, O. A1 - Dietrich, P. A1 - Satoh, R. A1 - Schroeder, S.L.M. A1 - Avval, T.G. A1 - Nagatomi, T. A1 - Fernandez, V. A1 - Lake, W. A1 - Azuma, Y. A1 - Yoshikawa, Y. A1 - Compean-Gonzalez, C.L. A1 - Ceccone, G. A1 - Shard, A.G. T1 - ERRATUM: “Versailles project on advanced materials and standards interlaboratory study on intensity calibration for x-ray photoelectron spectroscopy instruments using low-density polyethylene” [J. Vac. Sci. Technol. A 38, 063208 (2020)] N2 - The lead authors failed to name two collaborators as co-authors. The authors listed should include: Miss Claudia L. Compean-Gonzalez (ORCID: 0000-0002-2367-8450) and Dr. Giacomo Ceccone (ORCID: 0000-0003-4637-0771). These co-authors participated in VAMAS project A27, provided data that were analyzed and presented in this publication (and supporting information), and reviewed the manuscript before submission. KW - X-ray photoelectron spectroscopy KW - Transmission function KW - Low-density polyethylene PY - 2021 U6 - https://doi.org/10.1116/6.0000907 VL - 39 IS - 2 SP - 027001 PB - American Vacuum Society AN - OPUS4-52380 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Lee, Jun-Seob A1 - Radnik, Jörg A1 - Bäßler, Ralph T1 - Passivity of alloy 31 in green-death solution N2 - The passivation behavior of alloy 31 was investigated as a function of passivation potential in a green-death solution at 40 °C. The alloy 31 surface is in a stable passive state during cyclic potentiodynamic polarization. In potentiostatic polarization of alloy 31, passive current density increases with an increase in the passivation potential. Electrochemical impedance spectroscopy (EIS) and Mott–Schottky (M–S) analysis showed that a more defective n-type semiconductive passive film forms as the potential increases. X-ray photoelectron spectroscopy (XPS) revealed that passive film consists of mainly chromium and minor iron and nickel oxides. The increase of the applied potential is considered to be a reason for the change in passive film stability. KW - Passive film KW - Steel KW - Alloy 31 KW - X-ray photoelectron spectroscopy PY - 2018 U6 - https://doi.org/10.1002/maco.201709996 SN - 0947-5117 SN - 1521-4176 VL - 69 IS - 9 SP - 1218 EP - 1226 PB - Wiley-VCH CY - Weinheim AN - OPUS4-45938 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Radnik, Jörg A1 - Chemello, Giovanni A1 - Hodoroaba, Vasile-Dan A1 - Reed, B.P. A1 - Pollard, A.J. A1 - Clifford, C.A. T1 - An interlaboratory comparison on measuring the chemical composition of functionalized graphene nanoplatelets N2 - The results of the international interlaboratory comparison ""Chemical Composition of functionalized graphene with X-ray photoelectron spectroscopy (XPS) under the auspice of VAMAS TWA 2 (Surface Chemical Analysis) will be presented. T2 - Kratos German User Meeting 2023 CY - Berlin, Germany DA - 25.10.2023 KW - Graphene KW - Interlaboratory Comparison KW - X-ray photoelectron spectroscopy PY - 2023 AN - OPUS4-58683 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Chemello, Giovanni A1 - Knigge, Xenia A1 - Ciornii, Dmitri A1 - Reed, B.P. A1 - Pollard, A.J. A1 - Clifford, C.A. A1 - Howe, T. A1 - Vyas, N. A1 - Hodoroaba, Vasile-Dan A1 - Radnik, Jörg T1 - Influence of the Morphology on the Functionalization of Graphene Nanoplatelets Analyzed by Comparative Photoelectron Spectroscopy with Soft and Hard X-Rays N2 - Since its isolation, graphene has received growing attention from academia and industry due to its unique properties. However, the “what is my material” barrier hinders further commercialization. X-ray photoelectron spectroscopy (XPS) is considered as a method of choice for the determination of the elemental and chemical composition. In this work the influence of the morphology of graphene particles on the XPS results is studied and investigated as a function of X-ray energy, using conventional XPS with Al K𝜶 radiation and hard X-ray photoemission spectroscopy (HAXPES) using Cr K𝜶 radiation. Thereby, the information depth is varied between 10 and 30 nm. For this purpose, two commercial powders containing graphene nanoplatelets with lateral dimensions of either ≈100 nm or in the micrometer range are compared. These larger ones exist as stack of graphene layers which is inspected with scanning electron microscopy. Both kinds of particles are then functionalized with either oxygen or fluorine. The size of the graphene particles is found to influence the degree of functionalization. Only the combination of XPS and HAXPES allows to detect the functionalization at the outermost surface of the particles or even of the stacks and to provide new insights into the functionalization process. KW - Functionalized graphene KW - Hard-energy X-ray photoelectron spectroscopy KW - X-ray photoelectron spectroscopy PY - 2023 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-578860 SN - 2196-7350 SP - 1 EP - 8 PB - Wiley VCH AN - OPUS4-57886 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Radnik, Jörg A1 - Chemello, Giovanni A1 - Hodoroaba, Vasile-Dan A1 - Howe, T. A1 - Vyas, N. A1 - Reed, B.P. A1 - Pollard, A.J. A1 - Clifford, C.A. T1 - Reliable chemical characterization of industrial graphene related materials N2 - International standards describing reliable protocols will facilitate the commercialization of graphene and related 2D materials. One physico-chemical key property next to flake size and thickness is the chemical composition of the material. Therefore, an ISO standard is under development with X-ray photoelectron spectroscopy having a prominent role. With its information depth of around 10 nm which is the similar length scale as the thickness as of particles of 2D materials consisting of a few monolayer XPS seems to be highly suitable for this purpose. Different sample preparation methods like pressing the powders onto adhesive tapes, into recesses, or into solid pellets result in inconsistencies in the quantification. For the validation of the quantification with XPS an interlaboratory comparison was initiated under the auspice of the “Versailles Project on Advanced Materials and Standards” (VAMAS). First results confirm that the sample preparation method (pellet vs. powder) influences the quantification results clearly. Considering this effect, a good agreement of the results from the different participants were observed. Similar results were observed for raw, N- and F-functionalized graphene. T2 - Graphene CY - Manchester, England, UK DA - 27.06.2023 KW - X-ray photoelectron spectroscopy KW - Functionalized graphene KW - Interlaboratory comparison KW - VAMAS PY - 2023 AN - OPUS4-57895 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Radnik, Jörg T1 - How to measure the chemical composition of industrial graphene - New insights from an interlaboratory comparison N2 - International standards describing reliable protocols will facilitate the commercialization of graphene and related 2D materials. One physico-chemical key property next to flake size and thickness is the chemical composition of the material. Therefore, an ISO standard is under development with X-ray photoelectron spectroscopy having a prominent role. With its information depth of around 10 nm which is the similar length scale as the thickness as of particles of 2D materials consisting of a few monolayer XPS seems to be highly suitable for this purpose. Different sample preparation methods like pressing the powders onto adhesive tapes, into recesses, or into solid pellets result in inconsistencies in the quantification. For the validation of the quantification with XPS an interlaboratory comparison was initiated under the auspice of the “Versailles Project on Advanced Materials and Standards” (VAMAS). First results confirm that the sample preparation method (pellet vs. powder) influences the quantification results clearly. T2 - Characterization of Nanomaterials Colloquium CY - Berlin, Germany DA - 04.07.2023 KW - X-ray photoelectron spectroscopy KW - Functionalized graphene KW - Interlaboratory comparison PY - 2023 AN - OPUS4-57897 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Radnik, Jörg A1 - Chemello, Giovanni A1 - Knigge, Xenia A1 - Al-Sabbgh, Dominik A1 - Hodoroaba, Vasile-Dan T1 - XPS, HAXPES, XRD and SEM datasets of functionalized graphene nanoplateletes N2 - The datasets from (Hard Energy) X-ray photoelectron spectroscopy, X-ray diffraction and Scanning Electron Microsopy are related to the publication G. Chemello, X. Knigge, D. Ciornii, B.P. Reed, A.J. Pollard, C.A. Clifford, T. Howe, N. Vyas, V.-D. Hodoroaba, J. Radnik "Influence of the morphology on the functionalization of graphene nanoplatelets analyzed by comparative photoelectron spectroscopy with soft and hard X-rays" Advanced Materials Interfaces (2023), DOI: 10.1002/admi.202300116. KW - Graphene related 2D materials KW - X-ray photoelectron spectroscopy KW - Hard-energy X-ray photoelectron spectroscopy KW - Scanning electron microscopy KW - Powder X-ray diffraction PY - 2023 U6 - https://doi.org/10.5281/zenodo.7956497 PB - Zenodo CY - Geneva AN - OPUS4-57898 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Reed, B.P. A1 - Marchesini, S. A1 - Chemello, Giovanni A1 - Morgan, D.J. A1 - Vyas, N. A1 - Howe, T. A1 - Radnik, Jörg A1 - Clifford, C,A. A1 - Pollard, A.J. T1 - The influence of sample preparation on XPS quantification of oxygen-functionalised graphene nanoplatelets N2 - X-ray photoelectron spectroscopy (XPS) is widely used for characterising the chemistry of graphene-related two-dimensional materials (GR2M), however the careful preparation of the sample for analysis is important in obtaining representative quantifications. We report an investigation by three laboratories showing that the preparation method for oxygen-functionalised graphene nanoplatelet (GNP) powders has a significant effect on the homogeneous-equivalent elemental composition measured in XPS. We show that pressing GNP powders onto adhesive tapes, into recesses, or into solid pellets results in inconsistencies in the XPS quantification. The measured oxygen-to-carbon atomic ratio from GNP pellets depends upon the die pressure used to form them and the morphology of the GNPs themselves. We recommend that powder samples of GR2Ms are pelletised prior to XPS analysis to improve repeatability and reproducibility of measurements. KW - X-ray photoelectron spectroscopy KW - Graphene related two-dimensional materials (GR2M) KW - Pelletization KW - Powder PY - 2023 U6 - https://doi.org/10.1016/j.carbon.2023.118054 SN - 0008-6223 VL - 211 SP - 1 EP - 6 PB - Elsevier Ltd. AN - OPUS4-57694 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Radnik, Jörg A1 - Chemello, Giovanni A1 - Knigge, Xenia A1 - Hodoroaba, Vasile-Dan T1 - Characterization of functionalized graphene particles with comparative XPS/HAXPES investigations N2 - The different chmemistry of graphitic nanoplatelets between the outermost surface and the bulk of the samples was investigated with comparative XPS/HAXPES measurements. T2 - PHI User Meeting CY - Grenoble, France DA - 18.04.2023 KW - X-ray photoelectron spectroscopy KW - Hard-energy X-ray photoelectron spectroscopy KW - graphene related 2D materials PY - 2023 AN - OPUS4-57649 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Radnik, Jörg A1 - Chemello, Giovanni A1 - Hodoroaba, Vasile-Dan A1 - Reed, B. P. A1 - Pollard, A. A1 - Clifford, C. T1 - VAMAS Project A33: Chemical composition of functionalized graphene with X ray photoelectron spectroscopy (XPS) N2 - The results of the interlaboratory comparison about the chemical composition of functionalized graphene are presented. T2 - DIN Meeting NA 062-08-16 AA CY - Berlin, Germany DA - 25.05.2023 KW - X-ray photoelectron spectroscopy KW - Functionalized graphene KW - Interlaboratory comparison KW - VAMAS PY - 2023 AN - OPUS4-57650 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Radnik, Jörg A1 - Chemello, Giovanni A1 - Hodoroaba, Vasile-Dan A1 - Howe, T. A1 - Vyas, N. A1 - Reed, B. P. A1 - Pollard, A. J. A1 - Clifford, C. A. T1 - Reliable Chemical Characterization Protocols for Industrial Graphene-Related Materials N2 - Since its isolation, graphene has received growing attention from academia and industry due to its unique properties. Promising opportunities for applications are discussed in different field like electronics and optoelectronics, detection, and sensing devices, biosystems or chemical and environmental corrosion inhibition. Here, functionalization with elements like oxygen, nitrogen or fluorine can broaden the application, for example in composite materials. However, lack of generally accepted operation procedures hinders the commercialization, the so-called “what is my material” barrier. Therefore, first efforts were done to develop common, reliable, and reproducible ways to characterize the morphological and chemical properties of the industrially produced material. In this contribution, our efforts in the development of reliable chemical characterizations protocols for functionalized graphene are presented. An ISO standard for the chemical characterization of graphene-related (GRM) is under development with X-ray photoelectron spectroscopy (XPS) having a prominent role. With its information depth of around 10 nm, which is the similar length scale as the thickness of particles of 2D materials consisting of a few monolayers, XPS seems to be highly suitable for the quantitative analysis of (functionalized) GRM. Thereby, different sample preparation methods like pressing the powders onto adhesive tapes, into recesses, or into solid pellets result in inconsistencies in the quantification. Furthermore, different morphologies like stacks of graphene layers (left figure) or irregular particles (right figure) lead to different analysis results for the chemical composition. For the validation of the quantification with XPS and the further development of standards an international interlaboratory comparison was initiated under the head of the “Versailles Project on Advanced Materials and Standards” (VAMAS). First results are reported showing the suitability of the protocols. Finally, the XPS results are compared with the elemental composition results obtained after quantification with energy-dispersive X-ray spectroscopy (EDS) as a fast analytical method which is usually combined with electron microscopy. T2 - nanoSAFE 2023 CY - Grenoble, France DA - 05.06.2023 KW - X-ray photoelectron spectroscopy KW - Functionalized graphene KW - Interlaboratory comparison KW - VAMAS PY - 2023 AN - OPUS4-57652 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Radnik, Jörg T1 - Xps/Haxpes at (core shell) nanoparticles N2 - The principles of (Hard) X-ray photoelectron spectroscopy and some application in the field of (core-shell) nanoparticles will be presented. The presentation should answer hoe to get reliable results. Furthermore, examples of the correlation between physical-chemical measurments and toxicological results are given which are crucial for the risk assessment of nanoparticles. T2 - Training Course Metrological Determination of Micro and Nano Contaminants in Food CY - Berne, Switzerland DA - 05.09.2023 KW - X-ray photoelectron spectroscopy KW - Core-shell nanoparticles KW - Reliabiilty KW - Risk assessment PY - 2023 AN - OPUS4-59496 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Radnik, Jörg A1 - Stockmann, Jörg Manfred A1 - Knigge, Xenia A1 - Chemello, Giovanni A1 - Hodoroaba, Vasile-Dan A1 - Resch-Genger, Ute A1 - Madkour, S. A1 - Schönhals, Andreas A1 - Reed, B. A1 - Clifford, C. A1 - Shard, A. T1 - (hard) x ray photoelectron spectroscopy as tool in nano-analytics N2 - Selected samples are used to show, that photoelectron spectroscopy is an important tool for measuring nano-objects, especially for determing the chemical composition and structure on the nanosacle. XPS with different energies offers new possibilities in depth-profiling. T2 - SFB 1073 Colloquium CY - Göttingen, Germany DA - 22.02.2024 KW - X-ray photoelectron spectroscopy KW - Core-shell nanoparticle KW - Graphene related 2D materials PY - 2024 AN - OPUS4-59589 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Radnik, Jörg T1 - How to perform reliable xps-measurements? N2 - Reliable measurements are a great challenge in X-ray photoelectron spectroscopy. It will be shown, how to check the performance and calibration of the instrument, the charge compensation, quantification, fitting, and depth profiling. T2 - Course for PhD students at SFB 1073 CY - Göttingen, Germany DA - 23.02.2024 KW - X-ray photoelectron spectroscopy KW - Reproducibility crisis KW - Reliability PY - 2024 AN - OPUS4-59590 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -