TY - CONF A1 - Rackwitz, Vanessa T1 - Zertifizierung von Röntgenröhrenspektren an einem kalibrierten Messstand T2 - PRORA 2009 CY - Berlin, Germany DA - 2009-11-26 PY - 2009 AN - OPUS4-20086 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Rackwitz, Vanessa T1 - Mikro-Röntgenfluorenszenz-Analyse (µ-RFA) am Rasterelektronen-Mikroskop (REM) T2 - 15. Tagung Festkörperanalytik CY - Chemnitz, Germany DA - 2009-07-12 PY - 2009 AN - OPUS4-19529 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Rackwitz, Vanessa A1 - Reuter, Dirk T1 - X-ray scattering and its benefits for X-ray spectrometry at the SEM PY - 2009 DO - https://doi.org/10.1017/S1431927609094392 SN - 1431-9276 SN - 1435-8115 VL - 15 IS - Suppl. 2 SP - 1122 EP - 1123 PB - Cambridge University Press CY - New York, NY AN - OPUS4-19792 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Rackwitz, Vanessa A1 - Warrikhoff, A. A1 - Panne, Ulrich A1 - Hodoroaba, Vasile-Dan T1 - Determination of the efficiency of an energy dispersive X-ray spectrometer up to 50 keV with a SEM N2 - Both electron and polychromatic photon excitations (micro-focus X-ray source) at a scanning electron microscope (SEM) are used to determine the efficiency of an energy dispersive X-ray spectrometer up to 50 keV by means of a calibrated X-ray spectrometer and reference materials (RM) specially selected for this purpose. KW - Detector efficiency KW - Calibration KW - XRF KW - EDS KW - SEM KW - EDS-TM001 KW - Scattering PY - 2009 DO - https://doi.org/10.1039/b907815k SN - 0267-9477 SN - 1364-5544 VL - 24 SP - 1034 EP - 1036 PB - Royal Society of Chemistry CY - London AN - OPUS4-19714 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Rackwitz, Vanessa T1 - Characterisation of Polycapillary Lenses with a Scanning Electron Microscope (SEM) T2 - ICXOM20, 20th International Congress on X-ray Optics and Microanalysis CY - Karlsruhe, Germany DA - 2009-09-14 PY - 2009 AN - OPUS4-19533 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Rackwitz, Vanessa T1 - Quantitative referenzfreie Röntgenfluoreszenzanalyse (RFA) - Unsicherheiten bei der Bestimmung der spektralen Röntgenröhrenverteilungen T2 - ANAKON 2009 CY - Berlin, Germany DA - 2009-03-17 PY - 2009 AN - OPUS4-18136 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Rackwitz, Vanessa T1 - The Determination of the Efficiency of an Energy Dispersive X-Ray Spectrometer up to 50keV with a SEM using a calibrated Reference Spectrometer T2 - EMAS 2009 CY - Gdansk, Poland DA - 2009-05-10 PY - 2009 AN - OPUS4-18462 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Rackwitz, Vanessa T1 - Experimental Determination of the X-Ray Tube Spectral Distribution with a Scanning Electron Microscope (SEM) T2 - ICXOM20, 20th International Congress on X-ray Optics and Microanalysis CY - Karlsruhe, Germany DA - 2009-09-14 PY - 2009 AN - OPUS4-19537 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -