TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Rackwitz, Vanessa T1 - Prediction of detection limits of micro X-ray fluorescence (muXRF) JF - Microscopy and microanalysis KW - X-ray scattering KW - Limits of detection KW - Peak-to-background KW - Peak-to-noise KW - XRF KW - Modelling PY - 2012 DO - https://doi.org/10.1017/S1431927612006563 SN - 1431-9276 SN - 1435-8115 VL - 18 IS - Suppl. 2 SP - 942 EP - 943 PB - Cambridge University Press CY - New York, NY AN - OPUS4-26754 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -