TY - CONF A1 - Procop, Mathias T1 - Quantitative Analysis in EDS T2 - Short Course "Energy Dispersive X-ray Microanalysis" der DPG Konstanz CY - Konstanz, Germany DA - 1999-05-03 PY - 1999 AN - OPUS4-6034 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Procop, Mathias T1 - RDXTOOLS - Computer Programmes for the Determination of Critical EDX System Parameters T2 - EMAS´99, 6th Workshop of the European Microanalysis Society CY - Konstanz, Germany DA - 1999-05-03 PY - 1999 AN - OPUS4-6077 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Procop, Mathias T1 - Qualitätssicherung in einem REM/EDX-Labor T2 - Workshop "Raster-Elektronen-Mikroskopie in der Mikroverbindungstechnik" des FhG-IZM CY - Berlin, Germany DA - 1999-10-27 PY - 1999 AN - OPUS4-6054 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Procop, Mathias A1 - Scholze, F. T1 - Calibration of the detection efficiency of energy dispersive X-ray spectrometers for absolute intensity measurements and to establish a basis for a more rigorous quantitation procedure T2 - Microscopy and Microanalysis 2008 CY - Albuquerque, NM, USA DA - 2008-08-03 PY - 2008 AN - OPUS4-16589 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Procop, Mathias A1 - Hodoroaba, Vasile-Dan A1 - Bjeoumikhov, A. A1 - Wedell, R. A1 - Warrikhoff, A. T1 - Improvements of the low-energy performance of a micro-focus X-ray source for XRF analysis with the SEM T2 - European X-ray Spectroscopy Conference CY - Cavtat, Croatia DA - 2008-06-16 PY - 2008 AN - OPUS4-17604 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Procop, Mathias A1 - Scholze, F. T1 - Modelling the response function of an EDS with a silicon detector T2 - European X-ray Spectroscopy Conference CY - Cavtat, Croatia DA - 2008-06-16 PY - 2008 AN - OPUS4-17602 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Procop, Mathias A1 - Hodoroaba, Vasile-Dan A1 - Bjeoumikhov, A. A1 - Eggert, F. A1 - Wedell, R. T1 - Combination of electron probe microanalysis and X-ray fluorescence analysis in a scanning electron microscope T2 - 45th Annual Conference of the Microscopy Society of Southern Africa (MSSA 2006) CY - Port Elizabeth, South Africa DA - 2006-11-28 PY - 2006 AN - OPUS4-14228 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Procop, Mathias A1 - Hodoroaba, Vasile-Dan A1 - Bjeoumikhov, A. A1 - Eggert, F. A1 - Wedell, R. T1 - Combination of electron probe microanalysis and X-ray fluorescence analysis in a scanning electron microscope T2 - 45th Annual Port Elizabeth Conference CY - Port Elizabeth, South Africa DA - 2006-11-29 KW - myXRF at SEM KW - EPMA KW - Detection limits PY - 2006 SN - 0-620-37294-X VL - 36 SP - 26 CY - Onderstepoort AN - OPUS4-14567 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Procop, Mathias A1 - Hodoroaba, Vasile-Dan T1 - X-ray fluorescence as an additional method for a scanning electron microscope T2 - 10th European Workshop on Modern Developments and Applications in Microbeam Analysis - EMAS 2007 CY - Antwerp, Belgium DA - 2007-05-06 PY - 2007 AN - OPUS4-14550 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Procop, Mathias T1 - Laborpraxis mit dem IMOXS T2 - 1. EDAX Partikelanalyse und iMOXS Anwendertreffen CY - Wiesbaden, Germany DA - 2007-11-29 PY - 2007 AN - OPUS4-16169 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -