TY - CONF A1 - Pelkner, Matthias A1 - Stegemann, Robert A1 - Sonntag, Nadja A1 - Pohl, Rainer A1 - Kreutzbruck, Marc T1 - Benefits of GMR sensors for high spatial resolution NDT applications T2 - AIP Conference Proceedings N2 - Magneto resistance sensors like GMR (giant magneto resistance) or TMR (tunnel magneto resistance) are widely used in industrial applications, examples are position measurement and read heads of hard disk drives. However, in case of non-destructive testing (NDT) applications these sensors, although their properties are outstanding like high spatial resolution, high field sensitivity, low cost and low energy consumption, never reached a technical transfer to an application beyond sci-entific scope. This paper deals with benefits of GMR/TMR sensors in terms of high spatial resolution testing for different NDT applica-tions. The first example demonstrates the preeminent advantages of MR-elements compared with conventional coils used in eddy current testing (ET). The probe comprises one-wire excitation with an array of MR elements. This led to a better spatial resolution in terms of neighboring defects. The second section concentrates on MFL-testing (magnetic flux leakage) with active field excitation during and before test-ing. The latter illustrated the capability of highly resolved crack detection of a crossed notch. This example is best suited to show the ability of tiny magnetic field sensors for magnetic material characterization of a sample surface. Another example is based on characterization of samples after tensile test. Here, no external field is applied. The magnetization is only changed due to external load and magnetostriction leading to a field signature which GMR sensors can resolve. This gives access to internal changes of the magnetization state of the sample under test. T2 - QNDE 2017 CY - Provo, Utah, USA DA - 16.07.2017 KW - GMR KW - Non-destructive testing KW - Sensor arrays KW - Spatial resolution PY - 2018 SN - 978-0-7354-1644-4 DO - https://doi.org/10.1063/1.5031535 SN - 0094-243X VL - 1949 SP - UNSP 040001, 1 EP - 10 AN - OPUS4-45050 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -