TY - JOUR A1 - Mann, Guido A1 - Pentzien, Simone A1 - Krüger, Jörg T1 - Beam diameter dependence of surface damage threshold of fused silica fibers and preforms for nanosecond laser treatment at 1064 nm wavelength N2 - Optical fibers made of fused silica are a common method of transmitting high laser pulse energies. Failure of those fibers is a significant risk. The determination of laser-induced damage thresholds (LIDT) on fiber end facets according to ISO 21254 standard is needed. In the past, single pulse nanosecond laser experiments showed an improvement of LIDT with increasing fiber core diameter for 1064 nm wavelength and a constant beam diameter of 50 µm. This paper pays particular attention to the influence of the laser beam diameter on damage resistance. All-silica fiber types (LEONI) with different core diameters (100–600 µm) were investigated using beam diameters in a range from 30 µm to 100 µm. For comparison experiments on fused silica preform material (Heraeus F300) were performed. On one hand, surface LIDT of fused silica preform material decreases significantly with increasing beam size. A model considering a random distribution of point defects explains the experimental data qualitatively. On the other hand, LIDT of fiber end facets stays constant. White light microscopy results suggest that the point defect density on fiber end facets is lower compared to the preform surface due to an excellent surface polish quality. KW - Laser-induced damage threshold KW - Nanosecond laser KW - Optical fiber KW - Fused silica KW - Spot size KW - Defect model PY - 2013 DO - https://doi.org/10.1016/j.apsusc.2013.03.088 SN - 0169-4332 SN - 1873-5584 VL - 276 SP - 312 EP - 316 PB - Elsevier B.V. CY - Amsterdam AN - OPUS4-28310 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Pentzien, Simone A1 - Rabin, Ira A1 - Hahn, Oliver A1 - Krüger, Jörg A1 - Kleber, F. A1 - Hollaus, F. A1 - Diem, M. A1 - Sablatnig, R. T1 - Can modern technologies defeat nazi censorship? KW - Laser cleaning KW - Multispectral imaging KW - Image enhancement KW - Ancient manuscripts KW - Image restoration PY - 2010 SN - 1556-4673 VL - 2 IS - 3, Article 1 SP - 1 EP - 16 PB - Association for Computing Machinery CY - New York, NY, USA AN - OPUS4-25651 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kotsifaki, D.G. A1 - Zekou, L. A1 - Pentzien, Simone A1 - Krüger, Jörg A1 - Serafetinides, A.A. ED - Saunders, D. ED - Strlic, M. ED - Korenberg, C. ED - Luxford, N. ED - Birkhölzer, K. T1 - Cleaning of artificially soiled papers by infrared and mid-infrared lasers N2 - One of the most important materials presenting and witnessing human culture is paper. The cleaning of paper is often necessary because contamination must be removed so that the fragile organic substrate can be preserved. The conventional cleaning methods are mechanical or involve the application of chemicals. These methods can damage drawings or print layers to some extent or make the original paper substrate brittle. More specifically, the use of a scalpel blade can cause damage to fibers. Chemical cleaning is difficult to perform locally, can dissolve foreign matter that then migrates into the paper substrate, or involves volatile organic compounds that can be harmful to the conservator. There is, therefore, a need for new conservation technologies aimed at the safe cleaning of paper. Lasers have proved to be an appropriate tool for cleaning as the energy dose and penetration depth at the specific point of contamination can be controlled. Additionally, if used properly, laser cleaning is not destructive to the paper. T2 - LACONA IX - Lasers in the conservation of artworks CY - London, UK DA - 07.09.2011 KW - Laser cleaning KW - Paper KW - Artificial soiling KW - Nanosecond laser KW - Microsecond laser PY - 2013 SN - 978-1-904982-87-6 SP - 219 EP - 221 PB - Archetype publications Ltd. AN - OPUS4-27956 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Eberstein, M. A1 - Geier, M. A1 - Grießmann, H. A1 - Partsch, U. A1 - Voelkel, L. A1 - Böhme, R. A1 - Pentzien, Simone A1 - Koter, Robert A1 - Mann, Guido A1 - Bonse, Jörn A1 - Krüger, Jörg T1 - Towards an industrial laser doping process for the selective emitter using phosphoric acid as dopant N2 - Different laser supported approaches have already been realized, proving the great potential of laserdoped selective emitters (LDSE). However, it is challenging to establish a low-cost process by using pulsed laser tools. So far a single-step process only leads to satisfying results utilizing cw-lasers. In this paper we have examined a two-step process to produce laser-doped selective emitters on multicrystalline textured standard silicon photovoltaic wafers (90-Ω/sq-Emitter, SiN-antireflection coating (ARC)). The precise ARC removal by near-infrared fs-laser pulses (30 fs, 800 nm), and the doping of uncoated silicon wafers by ns-laser pulses (8 ns, 532 nm) were systematically investigated. In the fs-experiment, optimum conditions for ARC removal were identified. In the nsexperiments under suitable conditions (melting regime), the phosphorous concentration underneath the wafer surface was significantly increased and the sheet resistance was reduced by nearly a factor of two. Moreover, electrical measurements on fired metallization fingers deposited on the laser processed wafers showed low contact resistances. Hence, wafer conditioning with combined fs-laser- and ns-laser-processes are expected to be a promising technology for producing selective emitters. T2 - 26th European photovoltaic solar energy conference and exhibition CY - Hamburg, Germany DA - 05.09.2011 KW - Laser processing KW - Doping KW - Selective emitter KW - Multicrystalline silicon PY - 2011 SN - 3-936338-27-2 DO - https://doi.org/10.4229/26thEUPVSEC2011-2BV.1.2 SP - 1220 EP - 1223 AN - OPUS4-24996 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kautek, Wolfgang A1 - Pentzien, Simone A1 - Rudolph, Pascale A1 - Krüger, Jörg A1 - König, E. T1 - Laser interaction with coated collagen und cellulose fibre composites: fundamentals of laser cleaning of ancient parchment manuscripts and paper N2 - Laser cleaning of delicate biological composite materials such as ancient parchment manuscripts from the 15th and 16th century and printed paper from the 19th century is demonstrated with an ultraviolet excimer pulsed laser at 308 nm. Laser fluence levels must stay below the ablation and destruction threshold of the parchment or paper substrate, and have to surpass the threshold of the contaminant matter. Foreign layers to be removed must exhibit a higher optical density than the artifact substrates. Synthetic carbonaceous dirt modelled by water-soluble black crayons showed a characteristically weak featureless laser-induced plasma spectroscopy spectrum near the noise limit. It turned out that laser-induced plasma spectroscopy is of limited use in monitoring halting points (or etch-stops) because it relies on the destruction not only of the laterally inhomogenously distributed contaminant but also of pigment phases on a microscopically rough parchment substrate. Laser-induced fluorescence spectroscopy, however, promises to be a valuable non-destructive testing technique for etch-stop monitoring. KW - Laser KW - Parchment KW - Papery KW - Spectroscopy KW - Laser cleaning PY - 1998 SN - 0169-4332 SN - 1873-5584 VL - 127-129 SP - 746 EP - 754 PB - North-Holland CY - Amsterdam AN - OPUS4-11516 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Pentzien, Simone A1 - Conradi, Andrea A1 - Krüger, Jörg A1 - Wurster, R. ED - M. Castillejo, ED - P. Moreno, ED - M. Oujja, ED - R. Radvan, ED - J. Ruiz, T1 - Monitoring of the laser cleaning process of artificially soiled paper N2 - Laser cleaning of soiled paper is a challenging task due to the fact that a contamination has to be removed and a fragile organic material has to be preserved. The ejection of particles forms a significant channel for the removal of unwanted surface contaminations and can be exploited for an in-situ monitoring of the cleaning procedure. 532-nm-nanosecond single and multi pulse laser cleaning of artificially soiled Whatman© paper was performed. Particles were registered with a dust monitor. These in-situ experiments were combined with ex-situ investigations of cleaning and substrate damage thresholds by means of light and scanning electron microscopic techniques. The cleaning efficiency measured by a multi-spectral imaging system was compared to the in-situ particle monitoring. Additionally, possible color changes of the paper substrate were evaluated. T2 - LACONA VII International Conference, "Lasers in the Conservation of Artworks" CY - Madrid, Spain DA - 2007-09-17 PY - 2008 SN - 978-0-415-47596-9 SP - 345 EP - 351 PB - Taylor & Francis AN - OPUS4-17974 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Kautek, Wolfgang A1 - Pentzien, Simone A1 - Rudolph, Pascale A1 - Krüger, Jörg A1 - Maywald-Pitellos, C. A1 - Bansa, H. A1 - Grösswang, H. A1 - König, W. ED - Fotakis, C. T1 - Near-Ultraviolet Pulsed Laser Interaction with Contaminants and Pigments on Parchment: Spectroscopic Diagnostics for Laser Cleaning Safety T2 - 5th International Conference on Optics within Life Sciences CY - H¯erakleion, Greece DA - 1998-01-01 PY - 2000 SN - 3-540-66648-6 N1 - Serientitel: Optics within life sciences – Series title: Optics within life sciences IS - 5 SP - 100 EP - 107 PB - Springer CY - Berlin AN - OPUS4-6189 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Wurster, R. A1 - Pentzien, Simone A1 - Conradi, Andrea A1 - Krüger, Jörg T1 - Characterization of laser-generated microparticles by means of a dust monitor and SEM imaging N2 - Nanosecond laser (1064 nm wavelength) cleaning of artificially soiled paper as a model sample simulating a real-world artwork was performed. During the cleaning process, the ejection of particles was monitored in situ by means of a dust monitor (8 size classes, ranging from 0.3 µm to >2 µm) and ex situ using a mini-cascade impactor (MKI, 5 stages). The cleaning result was analyzed by scanning electron microscopy (SEM) considering possible laser-induced damages to the substrate. Size distributions of emitted particles were measured depending on the processing parameters: laser fluence, F, and pulse number per spot, N. High numbers of large (>2 µm) particles were collected by the mini-cascade impactor indicating a gas dynamical liftoff process. Obviously, these particles were not affected by the laser-matter interaction. The different methods (SEM, MKI, and dust monitor) are compared with respect to their usefulness for a proper interpretation of the cleaning results. PY - 2006 DO - https://doi.org/10.1155/2006/31862 SN - 0278-6273 SN - 1476-3516 VL - 2006 IS - Article ID 31862 SP - 1 EP - 5(?) PB - Harwood Academic Publ. CY - London AN - OPUS4-14467 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Mäder, M. A1 - Holle, H. A1 - Schreiner, M. A1 - Pentzien, Simone A1 - Krüger, Jörg A1 - Kautek, Wolfgang ED - Johann Nimmrichter, ED - Kautek, Wolfgang ED - Manfred Schreiner, T1 - Traditional and laser cleaning methods of historic picture post cards T2 - LACONA VI CY - Vienna, Austria DA - 2005-09-21 KW - Laser KW - Cleaning KW - Picture Post Card PY - 2007 SN - 978-3-540-72129-1 SN - 0930-8989 N1 - Serientitel: Springer proceedings in physics – Series title: Springer proceedings in physics IS - 116 SP - 281 EP - 286 PB - Springer CY - Berlin AN - OPUS4-16378 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Lerber, K. von A1 - Strlic, M. A1 - Kolar, J. A1 - Krüger, Jörg A1 - Pentzien, Simone A1 - Kennedy, C. A1 - Wess, T. A1 - Sokhan, M. A1 - Kautek, W. ED - Johann Nimmrichter, ED - Kautek, Wolfgang ED - Manfred Schreiner, T1 - Laser cleaning of undyed silk: Indications of chemical change T2 - LACONA VI CY - Vienna, Austria DA - 2005-09-21 KW - Laser KW - Cleaning KW - Silk KW - Textiles KW - Viscometry KW - X-ray diffraction KW - SIMS PY - 2007 SN - 978-3-540-72129-1 SN - 0930-8989 N1 - Serientitel: Springer proceedings in physics – Series title: Springer proceedings in physics IS - 116 SP - 313 EP - 319 PB - Springer CY - Berlin AN - OPUS4-16379 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -