TY - JOUR A1 - Epishin, A. I. A1 - Link, T. A1 - Nolze, Gert A1 - Svetlov, I. L. A1 - Bokshtein, B. S. A1 - Rodin, A. O. A1 - Saliwan Neumann, Romeo A1 - Oder, Gabriele T1 - Diffusion processes in multicomponent nickel-base superalloy-nickel system JF - The Physics of Metals and Metallography N2 - Optical and scanning electron microscopy, as well as electron microprobe analysis and electron backscatter diffraction, have been used to study diffusion processes that occur in a diffusion pair that consistsof a single-crystal CMSX-10 nickel-base superalloy and polycrystalline nickel, at temperatures of 1050–1250°C. It has been found that, in this system, the distributions of γ-stabilizing elements (Cr, Co, W, and Re) are described by the Boltzmann solution for diffusion between two semiinfinite plates of a binary alloy. The processing of these distributions has shown that the diffusion coefficients of Cr, Co, W, and Re in the multicomponent system are close to those in binary alloys of these elements with Ni. The diffusion redistribution of the elements leads to the dissolution of the γ′ phase in the nickel-base superalloy, growth of nickel grains toward the superalloy constituent of the diffusion pair, and the formation of porosity on both sides of the migrating interface, which is determined from a crystal misorientation of the alloy single crystal and nickel grains. KW - Ni-base superalloy KW - Interface KW - Diffusion KW - Phase transformation KW - Porosity PY - 2014 SN - 0031-918X VL - 115 IS - 1 SP - 21 EP - 29 AN - OPUS4-37980 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Rabe, Torsten A1 - Glitzky, Carsten A1 - Naghib Zadeh, Hamid A1 - Oder, Gabriele A1 - Eberstein, M. A1 - Töpfer, J. T1 - Silver in LTCC - Interfacial reactions, transport processes and influence on properties of ceramics T2 - CICMT 2009 - 5th International Conference and Exhibition on Ceramic Interconnect and Ceramic Microsystems Technologies (Proceedings) T2 - 2009 IMAPS/ACerS - 5th International Conference and Exhibition on Ceramic Interconnect and Ceramic Microsystems Technologies (CICMT) CY - Denver, Colorado, USA DA - 2009-04-21 KW - LTCC KW - Silver conductors KW - Interface KW - Sintering KW - Ferrite KW - Capacitor PY - 2009 SN - 0-930815-87-4 SP - 000085 EP - 000093 AN - OPUS4-19428 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -