TY - JOUR A1 - Rades, Steffi A1 - Oswald, F. A1 - Narbey, S. A1 - Radnik, Jörg A1 - Hodoroaba, Vasile-Dan T1 - Complementary methodical approach for the analysis of a perovskite solar cell layered system N2 - Loss in efficiency of perovskite solar cells may be caused by structural and/or chemical alterations of the complex layered system. SEM/EDX combined with XPS were chosen as appropriate methodical approach to characterise perovskite laboratory cells in depth and complementary on top, before and after light exposure. The layered perovskite system investigated here is based on glass covered with fluorine doped tin oxide (FTO), followed by three porous thin films of TiO2, ZrO2 and a thick monolithic carbon. This layered system serves as the matrix for the perovskite. After infiltration of perovskite solution and annealing, EDX spectral maps on cross-sections of the specimen have been measured. The distribution of relevant elements – Si, Sn, Ti, Zr and C – correlates conclusively with layers visible in the acquired SEM images. Lead and iodine are distributed throughout the porous layers C, ZrO2 and TiO2. By EDX it was found that several weeks of ambient daylight did not change significantly the qualitative elemental composition of lead and iodine throughout the solar cell system. It was confirmed with EDX that nanoparticles identified in high-resolution SEM micrographs contain mainly Pb and I, indicating these to be the perovskite crystals. However, a time-dependent compositional and chemical altering was observed with XPS for the near-surface region of the outermost ~10 nm after two months of illumination. KW - Pervskite solar cells KW - TiO2 KW - Porous layer KW - SEM/EDX KW - XPS PY - 2017 UR - https://www.cambridge.org/core/services/aop-cambridge-core/content/view/0E9E937542BC8B5535900B53B7F667E9/S1431927617010558a.pdf/complementary_methodical_approach_for_the_analysis_of_a_perovskite_solar_cell_layered_system.pdf U6 - https://doi.org/10.1017/S1431927617010558 VL - 23 IS - S1 (July) SP - 1978 EP - 1979 PB - Cambridge University Press CY - New York, NY, U.S.A. AN - OPUS4-41925 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Rades, Steffi A1 - Oswald, F. A1 - Narbey, S. A1 - Radnik, Jörg A1 - Hodoroaba, Vasile-Dan T1 - Analytical approach for characterization of morphology and chemistry of a CH3NH3PbI3/TiO2 solar cell layered system N2 - Manufacturing of new perovskite layered solar cells with constant high light conversion Efficiency over time may be hampered by the loss of efficiency caused by structural and/or chemical alterations of the complex layered system. SEM/EDX combined with XPS were chosen as an appropriate methodical approach to characterize perovskite laboratory cells in depth and at surface, before and after light exposure. The layered perovskite system investigated here is based on glass covered with fluorine doped tin oxide, followed by thin films of TiO2, ZrO2, and a thick monolithic carbon. TiO2 film is subdivided into a dense layer covered by porous one constituted of nanoparticles of truncated bipyramidal shape. This layered system serves as the matrix for the perovskite. EDX spectral maps on cross sections of specimen have shown that Pb and I are distributed homogeneously throughout the porous layers C, ZrO2, and TiO2. SEM/EDX data show that 20 weeks of ambient daylight did not change significantly the in‐depth distribution of the elemental composition of Pb and I throughout the entire solar cell system. It was confirmed with EDX that nanoparticles identified in high‐resolution SEM micrographs contain mainly Pb and I, indicating these to be the perovskite crystals. However, a compositional and chemical altering began in the near‐surface region of the outermost ~10 nm after 2 months of illumination which was observed with XPS. T2 - ECASIA 2017 CY - Montpellier, France DA - 24.09.2017 KW - Solar Cell KW - SEM KW - EDX KW - XPS KW - layered system PY - 2018 U6 - https://doi.org/10.1002/sia.6410 SN - 0142-2421 SN - 1096-9918 VL - 50 IS - 11 SP - 1234 EP - 1238 PB - John Wiley & Sons, Ltd. AN - OPUS4-46394 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -