TY - GEN A1 - Munz, Martin A1 - Sturm, Heinz ED - Bhushan, B. T1 - Nanomechanical Characterization of Structural and Pressure-Sensitive Adhesives T2 - Applied scanning probe methods / 7: Biomimetics and industrial applications (NanoScience and technology) KW - Scanning Force Microscopy KW - Modulated Lateral Force Microscopy KW - Stiffness KW - Friction KW - Interface/Interphase Interdiffusion PY - 2007 SN - 3-540-37320-9 DO - https://doi.org/10.1007/978-3-540-37321-6_8 VL - 7 SP - 301 EP - 347 PB - Springer CY - Berlin AN - OPUS4-14974 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Munz, Martin A1 - Chung, Jae Un A1 - Kalinka, Gerhard ED - Possart, W. T1 - Mapping Epoxy Interphases T2 - Adhesion : current research and applications T2 - 7th European Conference on Adhesion ; 7th EURADH CY - Freiberg, Germany DA - 2004-09-01 KW - Interface KW - Interphase KW - Epoxy KW - Copper (Cu) KW - Polyvinylpyrrolidone (PVP) KW - AFM/SFM KW - DSI KW - EDX/EDS KW - Stiffness KW - Modulus KW - Interdiffusion PY - 2005 SN - 3-527-31263-3 VL - 7 SP - 103 EP - 123 PB - Wiley-VCH CY - Weinheim AN - OPUS4-10894 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -