TY - CONF A1 - Merchel, Silke T1 - Non- Destructive Investigations of Dürer's Silver Point Drawings by Pixe and SY-XRF T2 - 7th International Conference on Non-Destructive Testing and Microanalysis for the Diagnostics and Conservation of the Cultural and Environmental Heritage, Congress Centre Elzenveld CY - Antwerp, Belgium DA - 2002-06-02 PY - 2002 AN - OPUS4-2982 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Merchel, Silke T1 - Pflichtprogramm der BAM an der BAMline T2 - 2. Seminar zur Nutzung des Wellen-längenschieber-Messplatzes bei BESSY II CY - Berlin, Germany DA - 2001-11-08 PY - 2001 AN - OPUS4-2985 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -